JPH10135161A5 - - Google Patents
Info
- Publication number
- JPH10135161A5 JPH10135161A5 JP1996288243A JP28824396A JPH10135161A5 JP H10135161 A5 JPH10135161 A5 JP H10135161A5 JP 1996288243 A JP1996288243 A JP 1996288243A JP 28824396 A JP28824396 A JP 28824396A JP H10135161 A5 JPH10135161 A5 JP H10135161A5
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- wafer
- polished surface
- oxide film
- cleaning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP28824396A JPH10135161A (ja) | 1996-10-30 | 1996-10-30 | ウエーハの研磨方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP28824396A JPH10135161A (ja) | 1996-10-30 | 1996-10-30 | ウエーハの研磨方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH10135161A JPH10135161A (ja) | 1998-05-22 |
| JPH10135161A5 true JPH10135161A5 (enExample) | 2004-08-26 |
Family
ID=17727695
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP28824396A Pending JPH10135161A (ja) | 1996-10-30 | 1996-10-30 | ウエーハの研磨方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH10135161A (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19842709A1 (de) * | 1998-09-17 | 2000-03-30 | Siemens Ag | Polierflüssigkeit zum Polieren von Bauelementen, vorzugsweise Wafern, insbesondere zum Chemisch-Mechanischen Polieren derartiger Bauelemente |
| JP4294816B2 (ja) * | 1999-11-11 | 2009-07-15 | スピードファム株式会社 | シリコンウエハの表面処理方法,無臭シリコンウエハ製造方法,シリコンウエハの酸化膜形成方法,酸化シリコンウエハ製造方法,酸素活性種雰囲気形成装置,及び平坦化処理システム |
| JP2001196339A (ja) * | 2000-01-11 | 2001-07-19 | Ind Technol Res Inst | オンラインのcmp後洗浄方法 |
| TW479289B (en) * | 2001-04-24 | 2002-03-11 | United Microelectronics Corp | Method to remove contaminant on wafer surface after chemical mechanical polishing |
| JP2005166925A (ja) * | 2003-12-02 | 2005-06-23 | Tokyo Seimitsu Co Ltd | ウェーハ加工方法およびウェーハ加工装置 |
| JP5622445B2 (ja) * | 2010-06-10 | 2014-11-12 | ラピスセミコンダクタ株式会社 | 研削方法及び研削装置 |
| JP5641401B2 (ja) * | 2010-07-26 | 2014-12-17 | 三菱化学株式会社 | Iii族窒化物結晶基板の製造方法 |
-
1996
- 1996-10-30 JP JP28824396A patent/JPH10135161A/ja active Pending
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