JP2001124815A5 - - Google Patents
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- Publication number
- JP2001124815A5 JP2001124815A5 JP2000272879A JP2000272879A JP2001124815A5 JP 2001124815 A5 JP2001124815 A5 JP 2001124815A5 JP 2000272879 A JP2000272879 A JP 2000272879A JP 2000272879 A JP2000272879 A JP 2000272879A JP 2001124815 A5 JP2001124815 A5 JP 2001124815A5
- Authority
- JP
- Japan
- Prior art keywords
- inspection device
- contact point
- contact points
- grid
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims 17
- 239000000758 substrate Substances 0.000 claims 2
- 238000003491 array Methods 0.000 claims 1
- 238000010292 electrical insulation Methods 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19943388.7 | 1999-09-10 | ||
| DE19943388A DE19943388B4 (de) | 1999-09-10 | 1999-09-10 | Vorrichtung zum Prüfen von Leiterplatten |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2001124815A JP2001124815A (ja) | 2001-05-11 |
| JP2001124815A5 true JP2001124815A5 (enExample) | 2005-03-03 |
| JP4031185B2 JP4031185B2 (ja) | 2008-01-09 |
Family
ID=7921540
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000272879A Expired - Fee Related JP4031185B2 (ja) | 1999-09-10 | 2000-09-08 | プリント回路基板検査器 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6445173B1 (enExample) |
| EP (1) | EP1083434A3 (enExample) |
| JP (1) | JP4031185B2 (enExample) |
| DE (1) | DE19943388B4 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10223867B4 (de) * | 2002-05-29 | 2006-07-06 | Elco Europe Gmbh | Leiterplatten-Prüfeinheit |
| DE102006059429A1 (de) | 2006-12-15 | 2008-06-26 | Atg Luther & Maelzer Gmbh | Modul für eine Prüfvorrichtung zum Testen von Leiterplatten |
| DE102008006130A1 (de) | 2008-01-25 | 2009-07-30 | Atg Luther & Maelzer Gmbh | Modul für einen Paralleltester zum Prüfen von Leiterplatten |
| DE102009004555A1 (de) | 2009-01-14 | 2010-09-30 | Atg Luther & Maelzer Gmbh | Verfahren zum Prüfen von Leiterplatten |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3340179C1 (de) | 1983-11-07 | 1985-05-09 | MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH | Anordnung an einem Leiterplattenpruefgeraet zur Anpassung der Abstaende von Kontakten |
| DE3340180C1 (de) | 1983-11-07 | 1985-05-15 | MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH | Kontaktfeldanordnung fuer ein rechnergesteuertes Leiterplattenpruefgeraet |
| DE3630548A1 (de) | 1986-09-08 | 1988-03-10 | Mania Gmbh | Vorrichtung zum elektronischen pruefen von leiterplatten mit kontaktpunkten im 1/20 zoll-raster |
| DE3717528A1 (de) * | 1987-05-25 | 1988-12-15 | Martin Maelzer | Leiterplattenpruefgeraet |
| DE3806792A1 (de) | 1988-02-29 | 1989-09-07 | Siemens Ag | Vorrichtung zum pruefen von leiterplatten |
| DE3806793A1 (de) | 1988-02-29 | 1989-09-07 | Siemens Ag | Adaptereinrichtung fuer eine vorrichtung zum pruefen von leiterplatten |
| DE19507127A1 (de) * | 1995-03-01 | 1996-09-12 | Test Plus Electronic Gmbh | Adaptersystem für Baugruppen-Platinen, zu verwenden in einer Prüfeinrichtung |
| US5764069A (en) | 1995-10-30 | 1998-06-09 | International Faster Corporation | High density grid for testing circuit boards |
| DE19718637A1 (de) * | 1997-05-02 | 1998-11-05 | Atg Test Systems Gmbh | Vorrichtung und Verfahren zum Prüfen von Leiterplatten |
| US6154863A (en) * | 1996-10-28 | 2000-11-28 | Atg Test Systems Gmbh | Apparatus and method for testing non-componented printed circuit boards |
-
1999
- 1999-09-10 DE DE19943388A patent/DE19943388B4/de not_active Expired - Fee Related
-
2000
- 2000-08-25 EP EP00118531A patent/EP1083434A3/de not_active Withdrawn
- 2000-09-06 US US09/656,088 patent/US6445173B1/en not_active Expired - Lifetime
- 2000-09-08 JP JP2000272879A patent/JP4031185B2/ja not_active Expired - Fee Related
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