JP2001527294A5 - - Google Patents

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Publication number
JP2001527294A5
JP2001527294A5 JP2000525930A JP2000525930A JP2001527294A5 JP 2001527294 A5 JP2001527294 A5 JP 2001527294A5 JP 2000525930 A JP2000525930 A JP 2000525930A JP 2000525930 A JP2000525930 A JP 2000525930A JP 2001527294 A5 JP2001527294 A5 JP 2001527294A5
Authority
JP
Japan
Prior art keywords
readout
substrate
detector
board
contacts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000525930A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001527294A (ja
JP4112175B2 (ja
Filing date
Publication date
Priority claimed from GB9726765A external-priority patent/GB2332562B/en
Application filed filed Critical
Publication of JP2001527294A publication Critical patent/JP2001527294A/ja
Publication of JP2001527294A5 publication Critical patent/JP2001527294A5/ja
Application granted granted Critical
Publication of JP4112175B2 publication Critical patent/JP4112175B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

JP2000525930A 1997-12-18 1998-11-16 ハイブリッド半導体イメージング・デバイス Expired - Lifetime JP4112175B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB9726765.2 1997-12-18
GB9726765A GB2332562B (en) 1997-12-18 1997-12-18 Hybrid semiconductor imaging device
PCT/EP1998/007522 WO1999033116A1 (en) 1997-12-18 1998-11-16 Hybrid semiconductor imaging device

Publications (3)

Publication Number Publication Date
JP2001527294A JP2001527294A (ja) 2001-12-25
JP2001527294A5 true JP2001527294A5 (enExample) 2006-01-05
JP4112175B2 JP4112175B2 (ja) 2008-07-02

Family

ID=10823835

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000525930A Expired - Lifetime JP4112175B2 (ja) 1997-12-18 1998-11-16 ハイブリッド半導体イメージング・デバイス

Country Status (9)

Country Link
US (1) US6323475B1 (enExample)
EP (1) EP1042814B1 (enExample)
JP (1) JP4112175B2 (enExample)
AT (1) ATE469439T1 (enExample)
AU (1) AU1874599A (enExample)
DE (1) DE69841688D1 (enExample)
GB (1) GB2332562B (enExample)
IL (1) IL136704A (enExample)
WO (1) WO1999033116A1 (enExample)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19933471A1 (de) * 1999-07-20 2001-02-01 Daimler Chrysler Ag Bildaufnehmer mit integrierter Signalverarbeitung und Bildaufnahmeverfahren
US7189971B2 (en) * 2002-02-15 2007-03-13 Oy Ajat Ltd Radiation imaging device and system
US7170062B2 (en) * 2002-03-29 2007-01-30 Oy Ajat Ltd. Conductive adhesive bonded semiconductor substrates for radiation imaging devices
US6841784B2 (en) * 2002-07-02 2005-01-11 Ray Therapy Imaging Ab Radiation sensor device
US6844543B2 (en) * 2002-07-03 2005-01-18 The Regents Of The University Of California Quantitation of absorbed or deposited materials on a substrate that measures energy deposition
US7223981B1 (en) 2002-12-04 2007-05-29 Aguila Technologies Inc. Gamma ray detector modules
US7247858B2 (en) * 2003-04-10 2007-07-24 Agfa Healthcare, N.V. Method for creating a contiguous image using multiple X-ray imagers
DE10357135B4 (de) * 2003-12-06 2007-01-04 X-Fab Semiconductor Foundries Ag Fotodetektor mit Transimpendanzverstärker und Auswerteelektronik in monolithischer Integration und Herstellungsverfahren
US7217915B2 (en) * 2004-05-07 2007-05-15 Sun Microsystems, Inc. Method and apparatus for detecting the position of light which is incident to a semiconductor die
GB2441814B (en) 2006-09-07 2012-04-11 Detection Technology Oy Photodiode array output signal multiplexing
US20110001052A1 (en) * 2006-12-04 2011-01-06 Luc Struye Computed radiography system
JP2008277511A (ja) * 2007-04-27 2008-11-13 Fujifilm Corp 撮像素子及び撮像装置
US8368469B2 (en) * 2010-03-10 2013-02-05 Purdue Research Foundation Silicon-on-insulator high power amplifiers
WO2011145171A1 (ja) * 2010-05-18 2011-11-24 キヤノン株式会社 撮像システム及びその制御方法
WO2015125443A1 (ja) * 2014-02-19 2015-08-27 パナソニックＩｐマネジメント株式会社 受光デバイスおよびその製造方法
US20150276945A1 (en) * 2014-03-25 2015-10-01 Oy Ajat Ltd. Semiconductor bump-bonded x-ray imaging device
US10686003B2 (en) * 2015-12-31 2020-06-16 General Electric Company Radiation detector assembly
WO2018085602A1 (en) 2016-11-04 2018-05-11 Hologic, Inc. Medical imaging device and method of operating a medical imaging device
SE542767C2 (en) * 2018-05-15 2020-07-07 Xcounter Ab Sensor unit and radiation detector
RU2730045C2 (ru) * 2018-09-11 2020-08-14 Объединенный Институт Ядерных Исследований (Оияи) Гибридный пиксельный детектор ионизирующих излучений
EP3690490A1 (en) * 2019-02-04 2020-08-05 ams International AG X-ray detector component, x-ray detection module, imaging device and method for manufacturing an x-ray detector component
WO2020228935A1 (en) 2019-05-13 2020-11-19 Direct Conversion Ab Method of reading out data in a radiation detector, radiation detector and imaging apparatus

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2581251B1 (fr) * 1985-04-30 1987-09-11 Thomson Csf Dispositif d'aboutement optique de detecteurs photosensibles
EP0415541B1 (en) * 1989-07-29 1994-10-05 Shimadzu Corporation Semiconductor-based radiation image detector and its manufacturing method
FR2652655A1 (fr) 1989-10-04 1991-04-05 Commissariat Energie Atomique Dispositif matriciel de grandes dimensions pour la prise ou la restitution d'images.
US5245191A (en) * 1992-04-14 1993-09-14 The Board Of Regents Of The University Of Arizona Semiconductor sensor for gamma-ray tomographic imaging system
FR2693033B1 (fr) * 1992-06-30 1994-08-19 Commissariat Energie Atomique Dispositif d'imagerie de grande dimension.
US5336879A (en) 1993-05-28 1994-08-09 David Sarnoff Research Center, Inc. Pixel array having image forming pixel elements integral with peripheral circuit elements
GB2289983B (en) 1994-06-01 1996-10-16 Simage Oy Imaging devices,systems and methods
GB2305096B (en) 1995-08-29 1997-09-10 Simage Oy Imaging system and method

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