JP2000515630A - 分析システムおよび分析方法 - Google Patents
分析システムおよび分析方法Info
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- JP2000515630A JP2000515630A JP10507997A JP50799798A JP2000515630A JP 2000515630 A JP2000515630 A JP 2000515630A JP 10507997 A JP10507997 A JP 10507997A JP 50799798 A JP50799798 A JP 50799798A JP 2000515630 A JP2000515630 A JP 2000515630A
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- B01L3/50273—Containers for the purpose of retaining a material to be analysed, e.g. test tubes with fluid transport, e.g. in multi-compartment structures by integrated microfluidic structures, i.e. dimensions of channels and chambers are such that surface tension forces are important, e.g. lab-on-a-chip characterised by the means or forces applied to move the fluids
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N2035/00178—Special arrangements of analysers
- G01N2035/00326—Analysers with modular structure
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/11—Automated chemical analysis
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/25—Chemistry: analytical and immunological testing including sample preparation
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/25—Chemistry: analytical and immunological testing including sample preparation
- Y10T436/2575—Volumetric liquid transfer
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Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.少なくとも一つのインターフェース構成要素を内部に含むベースインターフ ェースアレイを有する取り付け領域を有するベースユニットと、 該取り付け領域に取り外し可能に取り付けられるように構成されている、アダ プタであって、該アダプタが該取り付け領域、基板取り付け領域、および少なく とも一つのインターフェース構成要素を内部に有するアダプタ−基板間インター フェースに取り付けられると、該ベースインターフェースアレイ内の対応するイ ンターフェース構成要素と嵌合するように配置された少なくとも一つのインター フェース構成要素を含むアダプタ−ベース間インターフェースアレイを含む、ア ダプタと、 該アダプタの該基板取り付け領域に取り外し可能に取り付けられるように構成 されている基板であって、該基板が該基板取り付け領域に取り付けられると、該 アダプタ−基板間インターフェースアレイ中の対応するインターフェース構成要 素と嵌合するように配置される少なくとも一つのインターフェース構成要素を含 む基板インターフェースアレイを有する基板と、 を備えた、物質を取り扱うためのシステム。 2.前記ベースインターフェースアレイが、電力源、アナログ信号コネクタ、デ ィジタル信号コネクタ、エネルギー伝達源、電気/電気化学信号検出器、pH検出 器およびエネルギー放出検出器からなるグループから選択される少なくとも一つ のインターフェース構成要素を含む、請求項1に記載の分析システム。 3.前記アダプタ−基板間アレイが、電力源、アナログ信号コネクタ、ディジタ ル信号コネクタ、エネルギー伝達源、pH検出器、エネルギー放出検出器および電 気/電気化学信号検出器からなるグループから選択される少なくとも一つのイン ターフェース構成要素を含む、請求項1に記載の分析システム。 4.前記エネルギー伝達源が、光源、音響エネルギー源、熱源、冷却源および圧 力源からなるグループから選択される、請求項1または2に記載の分析システム 。 5.前記ベースユニットが、ディジタルプロセッサを備える、請求項1に記載の 分析システム。 6.前記ベースインターフェースアレイが、前記アダプタの前記アダプタ−ベー ス間インターフェースアレイ上の電力電極と嵌合するように配置された少なくと も電力電極と、該アダプタの該アダプタ−ベース間インターフェースアレイ上の 電気信号電極と嵌合するように配置された少なくとも電気信号電極とを備え、該 電力電極は該アダプタに電力を供給し、該信号電極は前記ベースユニットと該ア ダプタとの間でデータ伝送を提供する、請求項1に記載の分析システム。 7.前記ベースユニット上の前記取り付け領域が、該ベースユニットの表面に形 成されたレセプタクルを備える、請求項1に記載の分析システム。 8.前記レセプタクルが、前記アダプタと嵌合する周辺サンプルサイズを有する 、請求項7に記載の分析システム。 9.前記レセプタクル内に前記アダプタを固定するためのラッチを前記ベースユ ニット上にさらに備える、請求項7に記載の分析システム。 10.前記ベースユニット上の前記取り付け領域が、該ベースユニットに取り付け られる別個の構成要素を備える、請求項1に記載の分析システム。 11.前記基板が、上面、底面およびそれらの間の内部領域を有し、該内部領域が 複数の容器を接続する複数の中規模のチャネルを有し、流れバイアス素子が、プ ローブの貫入を可能にする、該基板の外側表面に露出されている電極端子および /または該基板上のアクセスポイントを備えている、請求項1に記載の分析シス テム。 12.前記基板が前記容器の少なくともいくつかの上に開口部を有し、それによっ て前記アダプタ−基板間インターフェースアレイへのプローブの直接貫入を可能 にする、請求項9に記載の分析システム。 13.前記アダプタ−基板間インターフェースアレイが、前記基板上の前記露出さ れた電極端子と嵌合するパターンで配置された複数の電極を含む、請求項11に記 載の分析システム。 14.前記アダプタ−基板間インターフェースアレイが、少なくとも一つの付加的 なインターフェース構成要素を含む、請求項3に記載の分析システム。 15.前記付加的な構成要素が電磁気放射線源を備え、前記基板が該電磁気放射線 に対して透明な領域を含み、該基板が前記アダプタ上の前記基板取り付け領域内 に取り付けられると、該透明領域が該放射線源と位置合わせされる、請求項14に 記載の分析システム。 16.前記基板が前記取り付け領域内に取り付けられると、前記透明領域から放出 された放射線を受け取るように前記アダプタ−基板間インターフェースアレイ内 に配置された電磁気放射線検出器をさらに備える、請求項15に記載の分析システ ム。 17.前記アダプタ上の前記取り付け領域が、該アダプタの表面に形成されたレセ プタクルを備え、該レセプタクルが前記基板の外周サンプルサイズに対応する周 辺サンプルサイズを有する、請求項1に記載の分析システム。 18.前記レセプタクル内に前記基板を固定するためのラッチを前記アダプタ上に さらに備える、請求項17に記載の分析システム。 19.命令を含むコンピュータ読み出し可能なコードを格納する有形媒体をさらに 備え、該命令は、コンピュータが前記ベースユニットとインターフェースをとる ことを可能にし、かつ、前記ベースユニット上で受け取られたアダプタによって 保持される基板上に存在するサンプルに該ベースユニットが行なうアッセイを制 御することを可能にする、請求項1に記載の分析システム。 20.少なくとも一つのインターフェース構成要素を内部に含むベースインターフ ェースアレイを有する取り付け領域を有するベースユニットと、 少なくとも一つのインターフェース構成要素を内部に含むインターフェースア レイを有する基板と、 該ベースユニットの該取り付け領域に取り外し可能に取り付けられるように構 成され、該基板を取り外し可能に受け入れるための取り付け領域を有するアダプ タであって、該アダプタは、該ベースユニットに対して固定位置で該基板を保持 し、かつ、(i)該ベースインターフェースアレイ中の該インターフェース構成要 素から該基板への接続経路、あるいは(ii)該基板アレイ中の該インターフェース 構成要素から該ベースユニットへの接続経路の少なくとも一つを提供する、アダ プタと、 を備える、分析システム。 21.前記アダプタがエネルギー配分ネットワークを含み、前記ベースインターフ ェースアレイ中の前記インターフェース構成要素がエネルギー源であり、前記基 板アレイが、該アダプタ中の該エネルギー配分ネットワークに結合する複数のエ ネルギーコネクタを備える、請求項20に記載の分析システム。 22.前記ベースインターフェースアレイがエネルギー放出検出器を備え、前記基 板アレイがエネルギー伝達領域を含み、前記アダプタが前記ベースユニットの前 記取り付け領域上に装着され、前記基板が該アダプタの前記取り付け領域上に装 着されると、該アダプタは該エネルギー放出検出器を該エネルギー伝達領域と位 置合わせする、請求項20に記載の分析システム。 23.ベースインターフェースアレイを有する取り付け領域を有するベースユニッ トと、基板インターフェースアレイを有する基板との組み合わせで用いるための アダプタであって、該アダプタが、 該ベースユニット上の該取り付け領域と、該基板が該アダプタの取り付け領域 に取り付けられると前記基板インターフェースアレイ中の対応する領域と嵌合す るように配置された流れバイアスコネクタを少なくとも含むアダプタ−基板間イ ンターフェースアレイを有する基板取り付け領域とに、該アダプタが取り付けら れると、該ベースインターフェースアレイ中の対応するコネクタと嵌合するよう に配置された電力コネクタおよび信号コネクタの少なくとも一つを含むアダプタ −ベース間インターフェースアレイを有するアダプタ本体、 を備えた、アダプタ。 24.前記アダプタ−基板間インターフェースアレイが、電力源、アナログ信号コ ネクタ、ディジタル信号コネクタ、エネルギー伝達源、電気/電気化学信号検出 器、pH検出器およびエネルギー放出検出器からなるグループから選択される少な くとも一つの付加的なインターフェース構成要素を含む、請求項23に記載のアダ プタ。 25.前記付加的な構成要素が電磁気放射線源を備え、前記基板が該電磁気放射線 に対して透明な領域を含み、該基板が前記アダプタ上の前記基板取り付け領域内 に取り付けられると該透明領域が該放射線源と位置合わせされる、請求項24に記 載のアダプタ。 26.前記基板が前記取り付け領域内に取り付けられると、前記透明領域から放出 された放射線を受け取るように、前記アダプタ−基板間インターフェースアレイ 内に配置された電磁気放射線検出器をさらに備えた、請求項25に記載のアダプタ 。 27.前記アダプタ上の前記取り付け領域が、該アダプタの表面に形成されたレセ プタクルを備え、該レセプタクルが、前記基板の外周サンプルサイズに対応する 周辺サンプルサイズを有する、請求項23に記載のアダプタ。 28.前記レセプタクル内に前記基板を固定するためのラッチを前記アダプタ上に さらに備える、請求項27に記載のアダプタ。 29.請求項23に記載のアダプタと、 命令を含むコンピュータ読み出し可能なコードを格納するための有形媒体と、 を備え、 該命令によって、コンピュータの前記ベースユニットとのインターフェースに よる連結、および該ベースユニット上で受容されるアダプタによって保持される 基板上に存在するサンプルに該ベースユニットが行うアッセイの制御が可能にな る、システム。 30.コンピュータと、アダプタ取り付け領域を有するベースユニットと、アダプ タとの組み合わせで用いるためのシステムであって、該システムは、 分析されるサンプルを受け取り得る、該アダプタ上に取り付けられるように適 合される基板と、 該コンピュータの該ベースユニットとのインターフェースによる連結、および 該ベースユニット上で受容されるアダプタによって保持される基板上に存在する サンプルに該ベースユニットが行なうアッセイの制御を可能にする命令を含むコ ンピュータ読み出し可能なコードと、 を備えたシステム。 31.コンピュータと、アダプタ取り付け領域を有するベースユニットと、基板取 り付け領域を有するアダプタと、処理される物質を受け取ることが可能な基板と の組み合わせで用いるためのコンピュータプログラム製品であって、該コンピュ ータプログラム製品は、命令を含むコンピュータ読み出し可能なコードを格納す る有形媒体を備え、該命令によって、コンピュータの該ベースユニットとのイン ターフェースによる連結、および該ベースユニット上で受容されるアダプタによ って保持される物質基板上に存在するサンプルに該ベースユニットが行う処理の 制御が可能になる、コンピュータプログラム製品。 32.分析システムを構成するための方法であって、該方法は、 少なくとも一つのインターフェース構成要素を内部に含む取り付け領域を有す るベースユニットを提供するステップと、 アダプタ上のインターフェース構成要素が該ベースユニット上の対応するイン ターフェース構成要素と嵌合するように、該ベースユニットの該取り付け領域に 該アダプタを取り外し可能に取り付けるステップであって、該アダプタは、少な くとも一つのインターフェース構成要素を内部に有する基板取り付け領域を含む 、ステップと、 該基板上のインターフェース構成要素が該アダプタ上の対応するインターフェ ース構成要素と嵌合するように、該アダプタ上の該基板取り付け領域に基板を取 り外し可能に取り付けるステップと、 を包含する、方法。 33.前記アダプタを前記ベースユニット中のレセプタクル内に配置することによ って、該アダプタが該ベースユニットに取り外し可能に取り付けられる、請求項 32に記載の方法。 34.前記基板を前記アダプタ中のレセプタクル内に配置することによって、該基 板が該アダプタに取り外し可能に取り付けられる、請求項32に記載の方法。 35.前記基板が、複数の容器および流れバイアス領域を接続する、該容器あるい はチャネルの少なくともいくつかに位置する複数のチャネルを有する、請求項32 に記載の方法。 36.前記ベースユニットから前記アダプタへ流れ制御信号を導くステップと、 該流れ制御信号に応答して前記アダプタ中の流れバイアス領域にエネルギーを 与え、それによって前記基板上の対応する流れバイアス領域にエネルギーが与え られ、前記チャネルを通る前記容器間の流れが制御されるステップと、 をさらに包含する、請求項35に記載の方法。 37.前記エネルギーを与えるステップが、前記流れバイアス領域を電気的にバイ アスすることを含む、請求項36に記載の方法。 38.前記エネルギーを与えるステップが、前記流れバイアス領域を音響的に駆動 することを含む、請求項36に記載の方法。 39.前記導くステップおよび前記エネルギーを与えるステップが、前記ベースユ ニットに接続されたコンピュータへのコンピュータ読み出し可能な命令を提供す ることを含む、請求項36に記載の方法。 40.前記アダプタが少なくとも電磁気放射線源をさらに備え、前記方法が、前記 ベースユニットから前記アダプタへ電磁気放射線源制御信号を導くステップをさ らに包含する、請求項32に記載の方法。 41.前記アダプタが、電磁気放射線検出器をさらに備え、前記方法が、前記基板 から放出された放射線に応答して該アダプタ中に信号を生成するステップと、該 信号を前記ベースユニットに導くステップとをさらに包含する、請求項40に記載 の方法。 42.前記信号を生成するステップおよび前記信号を導くステップが、前記ベース ユニットに接続されたコンピュータにコンピュータ読み出し可能命令を与えるこ とを含む、請求項41に記載の方法。
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- 1997-07-31 CN CN97196974A patent/CN1096297C/zh not_active Expired - Lifetime
- 1997-07-31 AU AU38156/97A patent/AU717981B2/en not_active Ceased
- 1997-07-31 EP EP04003585A patent/EP1426109A1/en not_active Ceased
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- 1997-08-01 ZA ZA9706887A patent/ZA976887B/xx unknown
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JP2005043079A (ja) * | 2003-07-23 | 2005-02-17 | Hitachi Ltd | マイクロ分光計測装置及びマイクロ化学システム |
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US8465637B2 (en) | 2006-11-21 | 2013-06-18 | Medimate Holding B.V. | Ion sensor for fluid and method for its manufacture |
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JP2011519019A (ja) * | 2008-03-20 | 2011-06-30 | コーニング インコーポレイテッド | モジュール式マイクロ流体システムおよびモジュール式マイクロ流体システムの構築方法 |
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JP2013156268A (ja) * | 2013-03-28 | 2013-08-15 | Medimate Holding B V | 液体で満たされてシールされたチャネルを有する測定試料ハンドリング・デバイス |
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Also Published As
Publication number | Publication date |
---|---|
EP0952890B1 (en) | 2005-06-29 |
DE69733663D1 (de) | 2005-08-04 |
US20020192112A1 (en) | 2002-12-19 |
AU717981B2 (en) | 2000-04-06 |
ATE298631T1 (de) | 2005-07-15 |
CN1226845A (zh) | 1999-08-25 |
ZA976887B (en) | 1998-05-11 |
US6432720B2 (en) | 2002-08-13 |
EP1426109A1 (en) | 2004-06-09 |
US20020015667A1 (en) | 2002-02-07 |
US5955028A (en) | 1999-09-21 |
US6399025B1 (en) | 2002-06-04 |
TW350914B (en) | 1999-01-21 |
EP0952890A1 (en) | 1999-11-03 |
CA2259929C (en) | 2007-01-09 |
US6071478A (en) | 2000-06-06 |
AU3815697A (en) | 1998-02-25 |
WO1998005424A1 (en) | 1998-02-12 |
JP3686932B2 (ja) | 2005-08-24 |
CA2259929A1 (en) | 1998-02-12 |
DE69733663T2 (de) | 2006-05-04 |
CN1096297C (zh) | 2002-12-18 |
US6503757B1 (en) | 2003-01-07 |
US6399023B1 (en) | 2002-06-04 |
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