ITMI930784A0 - Metodo ed insieme di circuiti per cancellare una memoria a semiconduttori non volatile comprendente ridondanza di righe - Google Patents
Metodo ed insieme di circuiti per cancellare una memoria a semiconduttori non volatile comprendente ridondanza di righeInfo
- Publication number
- ITMI930784A0 ITMI930784A0 ITMI930784A ITMI930784A ITMI930784A0 IT MI930784 A0 ITMI930784 A0 IT MI930784A0 IT MI930784 A ITMI930784 A IT MI930784A IT MI930784 A ITMI930784 A IT MI930784A IT MI930784 A0 ITMI930784 A0 IT MI930784A0
- Authority
- IT
- Italy
- Prior art keywords
- erasing
- circuits
- semiconductor memory
- memory including
- volatile semiconductor
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
- G11C29/816—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout
- G11C29/82—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout for EEPROMs
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
- G11C16/16—Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/871,485 US5327383A (en) | 1992-04-21 | 1992-04-21 | Method and circuitry for erasing a nonvolatile semiconductor memory incorporating row redundancy |
Publications (3)
Publication Number | Publication Date |
---|---|
ITMI930784A0 true ITMI930784A0 (it) | 1993-04-21 |
ITMI930784A1 ITMI930784A1 (it) | 1994-10-21 |
IT1272355B IT1272355B (it) | 1997-06-23 |
Family
ID=25357554
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ITMI930784A IT1272355B (it) | 1992-04-21 | 1993-04-21 | Metodo ed insieme di circuiti per cancellare una memoria a semiconduttori non volatile comprendente ridondanza di righe |
Country Status (3)
Country | Link |
---|---|
US (1) | US5327383A (it) |
JP (1) | JPH06318398A (it) |
IT (1) | IT1272355B (it) |
Families Citing this family (48)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6222762B1 (en) * | 1992-01-14 | 2001-04-24 | Sandisk Corporation | Multi-state memory |
US5657332A (en) * | 1992-05-20 | 1997-08-12 | Sandisk Corporation | Soft errors handling in EEPROM devices |
JP2856621B2 (ja) * | 1993-02-24 | 1999-02-10 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 一括消去型不揮発性メモリおよびそれを用いる半導体ディスク装置 |
US5513136A (en) * | 1993-09-27 | 1996-04-30 | Intel Corporation | Nonvolatile memory with blocks and circuitry for selectively protecting the blocks for memory operations |
GB2283342B (en) * | 1993-10-26 | 1998-08-12 | Intel Corp | Programmable code store circuitry for a nonvolatile semiconductor memory device |
US5438546A (en) * | 1994-06-02 | 1995-08-01 | Intel Corporation | Programmable redundancy scheme suitable for single-bit state and multibit state nonvolatile memories |
US5537357A (en) * | 1994-06-27 | 1996-07-16 | Intel Corporation | Method for preconditioning a nonvolatile memory array |
US5490109A (en) * | 1994-06-28 | 1996-02-06 | Intel Corporation | Method and apparatus for preventing over-erasure of flash EEPROM memory devices |
US5517138A (en) * | 1994-09-30 | 1996-05-14 | Intel Corporation | Dual row selection using multiplexed tri-level decoder |
US5491660A (en) * | 1994-11-18 | 1996-02-13 | Texas Instruments Incorporated | On-chip operation control for memories |
MY121210A (en) * | 1995-02-24 | 2006-01-28 | Intel Corp | Nonvolatile memory with output mode configuration |
JP3145894B2 (ja) * | 1995-03-10 | 2001-03-12 | 日本電気株式会社 | 電気的に書込み・消去可能な不揮発性半導体記憶装置 |
US5890193A (en) * | 1995-07-28 | 1999-03-30 | Micron Technology, Inc. | Architecture for state machine for controlling internal operations of flash memory |
US6041389A (en) * | 1995-11-16 | 2000-03-21 | E Cirrus Logic, Inc. | Memory architecture using content addressable memory, and systems and methods using the same |
JP3976839B2 (ja) | 1996-07-09 | 2007-09-19 | 株式会社ルネサステクノロジ | 不揮発性メモリシステムおよび不揮発性半導体メモリ |
US6009016A (en) * | 1996-07-09 | 1999-12-28 | Hitachi, Ltd. | Nonvolatile memory system semiconductor memory and writing method |
GB9614551D0 (en) * | 1996-07-11 | 1996-09-04 | Memory Corp Plc | Memory system |
US5835413A (en) * | 1996-12-20 | 1998-11-10 | Intel Corporation | Method for improved data retention in a nonvolatile writeable memory by sensing and reprogramming cell voltage levels |
US5787039A (en) * | 1997-03-06 | 1998-07-28 | Macronix International Co., Ltd. | Low current floating gate programming with bit-by-bit verification |
US5909449A (en) * | 1997-09-08 | 1999-06-01 | Invox Technology | Multibit-per-cell non-volatile memory with error detection and correction |
JP3228225B2 (ja) * | 1998-06-01 | 2001-11-12 | 日本電気株式会社 | 記憶装置の消去装置、記憶装置の消去方法及びそのプログラムを記憶した記憶媒体 |
US6381174B1 (en) | 2001-03-12 | 2002-04-30 | Micron Technology, Inc. | Non-volatile memory device with redundant columns |
US6711056B2 (en) | 2001-03-12 | 2004-03-23 | Micron Technology, Inc. | Memory with row redundancy |
US6469932B2 (en) * | 2001-03-12 | 2002-10-22 | Micron Technology, Inc. | Memory with row redundancy |
US6584017B2 (en) * | 2001-04-05 | 2003-06-24 | Saifun Semiconductors Ltd. | Method for programming a reference cell |
US7120068B2 (en) * | 2002-07-29 | 2006-10-10 | Micron Technology, Inc. | Column/row redundancy architecture using latches programmed from a look up table |
US6888731B2 (en) * | 2002-11-29 | 2005-05-03 | Mosaid Technologies Incorporated | Method and apparatus for replacing defective rows in a semiconductor memory array |
US6771541B1 (en) | 2003-02-25 | 2004-08-03 | Nexflash Technologies, Inc. | Method and apparatus for providing row redundancy in nonvolatile semiconductor memory |
US7012835B2 (en) | 2003-10-03 | 2006-03-14 | Sandisk Corporation | Flash memory data correction and scrub techniques |
US7173852B2 (en) * | 2003-10-03 | 2007-02-06 | Sandisk Corporation | Corrected data storage and handling methods |
US7395404B2 (en) * | 2004-12-16 | 2008-07-01 | Sandisk Corporation | Cluster auto-alignment for storing addressable data packets in a non-volatile memory array |
US7315916B2 (en) * | 2004-12-16 | 2008-01-01 | Sandisk Corporation | Scratch pad block |
US7886204B2 (en) * | 2006-09-27 | 2011-02-08 | Sandisk Corporation | Methods of cell population distribution assisted read margining |
US7716538B2 (en) * | 2006-09-27 | 2010-05-11 | Sandisk Corporation | Memory with cell population distribution assisted read margining |
US7457167B2 (en) * | 2006-10-26 | 2008-11-25 | Atmel Corporation | Method for preventing over-erasing of unused column redundant memory cells in a flash memory having single-transistor memory cells |
US7477547B2 (en) * | 2007-03-28 | 2009-01-13 | Sandisk Corporation | Flash memory refresh techniques triggered by controlled scrub data reads |
US7573773B2 (en) * | 2007-03-28 | 2009-08-11 | Sandisk Corporation | Flash memory with data refresh triggered by controlled scrub data reads |
KR100898039B1 (ko) * | 2007-05-21 | 2009-05-19 | 삼성전자주식회사 | 불휘발성 반도체 메모리 장치 및 그것의 프로그램 방법 |
US8243532B2 (en) * | 2010-02-09 | 2012-08-14 | Infineon Technologies Ag | NVM overlapping write method |
US8687421B2 (en) | 2011-11-21 | 2014-04-01 | Sandisk Technologies Inc. | Scrub techniques for use with dynamic read |
US9146882B2 (en) * | 2013-02-04 | 2015-09-29 | International Business Machines Corporation | Securing the contents of a memory device |
US9230689B2 (en) | 2014-03-17 | 2016-01-05 | Sandisk Technologies Inc. | Finding read disturbs on non-volatile memories |
US9552171B2 (en) | 2014-10-29 | 2017-01-24 | Sandisk Technologies Llc | Read scrub with adaptive counter management |
US9978456B2 (en) | 2014-11-17 | 2018-05-22 | Sandisk Technologies Llc | Techniques for reducing read disturb in partially written blocks of non-volatile memory |
US9349479B1 (en) | 2014-11-18 | 2016-05-24 | Sandisk Technologies Inc. | Boundary word line operation in nonvolatile memory |
US9449700B2 (en) | 2015-02-13 | 2016-09-20 | Sandisk Technologies Llc | Boundary word line search and open block read methods with reduced read disturb |
US9653154B2 (en) | 2015-09-21 | 2017-05-16 | Sandisk Technologies Llc | Write abort detection for multi-state memories |
FR3044818B1 (fr) * | 2015-12-02 | 2018-03-30 | Stmicroelectronics (Rousset) Sas | Procede de gestion d'une ligne defectueuse du plan memoire d'une memoire non volatile et dispositif de memoire correspondant |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4943948A (en) * | 1986-06-05 | 1990-07-24 | Motorola, Inc. | Program check for a non-volatile memory |
US5053990A (en) * | 1988-02-17 | 1991-10-01 | Intel Corporation | Program/erase selection for flash memory |
US5222046A (en) * | 1988-02-17 | 1993-06-22 | Intel Corporation | Processor controlled command port architecture for flash memory |
KR900019027A (ko) * | 1988-05-23 | 1990-12-22 | 미다 가쓰시게 | 불휘발성 반도체 기억장치 |
JP2698834B2 (ja) * | 1988-11-22 | 1998-01-19 | 株式会社日立製作所 | 不揮発性記憶装置 |
US5031142A (en) * | 1989-02-10 | 1991-07-09 | Intel Corporation | Reset circuit for redundant memory using CAM cells |
US5077691A (en) * | 1989-10-23 | 1991-12-31 | Advanced Micro Devices, Inc. | Flash EEPROM array with negative gate voltage erase operation |
US5113373A (en) * | 1990-08-06 | 1992-05-12 | Advanced Micro Devices, Inc. | Power control circuit |
KR940006611B1 (ko) * | 1990-08-20 | 1994-07-23 | 삼성전자 주식회사 | 전기적으로 소거 및 프로그램이 가능한 반도체 메모리장치의 자동 소거 최적화회로 및 방법 |
US5237535A (en) * | 1991-10-09 | 1993-08-17 | Intel Corporation | Method of repairing overerased cells in a flash memory |
-
1992
- 1992-04-21 US US07/871,485 patent/US5327383A/en not_active Expired - Lifetime
-
1993
- 1993-04-21 IT ITMI930784A patent/IT1272355B/it active IP Right Grant
- 1993-04-21 JP JP11665993A patent/JPH06318398A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
ITMI930784A1 (it) | 1994-10-21 |
US5327383A (en) | 1994-07-05 |
JPH06318398A (ja) | 1994-11-15 |
IT1272355B (it) | 1997-06-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
0001 | Granted | ||
TA | Fee payment date (situation as of event date), data collected since 19931001 |
Effective date: 19970328 |