ITMI20021609A1 - Dispositivo circuito e procedimento per la generazione di tensioni duali impiegando una pompa di carica singola - Google Patents

Dispositivo circuito e procedimento per la generazione di tensioni duali impiegando una pompa di carica singola

Info

Publication number
ITMI20021609A1
ITMI20021609A1 IT2002MI001609A ITMI20021609A ITMI20021609A1 IT MI20021609 A1 ITMI20021609 A1 IT MI20021609A1 IT 2002MI001609 A IT2002MI001609 A IT 2002MI001609A IT MI20021609 A ITMI20021609 A IT MI20021609A IT MI20021609 A1 ITMI20021609 A1 IT MI20021609A1
Authority
IT
Italy
Prior art keywords
procedure
generation
circuit device
charge pump
single charge
Prior art date
Application number
IT2002MI001609A
Other languages
English (en)
Inventor
Seong-Jin Jang
Young-Hyun Jun
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of ITMI20021609A1 publication Critical patent/ITMI20021609A1/it

Links

Classifications

    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02MAPPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M3/00Conversion of dc power input into dc power output
    • H02M3/02Conversion of dc power input into dc power output without intermediate conversion into ac
    • H02M3/04Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
    • H02M3/06Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider
    • H02M3/07Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/145Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02MAPPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00Details of apparatus for conversion
    • H02M1/0003Details of control, feedback or regulation circuits
    • H02M1/0041Control circuits in which a clock signal is selectively enabled or disabled
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02MAPPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00Details of apparatus for conversion
    • H02M1/0083Converters characterised by their input or output configuration
    • H02M1/009Converters characterised by their input or output configuration having two or more independently controlled outputs
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02MAPPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M3/00Conversion of dc power input into dc power output
    • H02M3/02Conversion of dc power input into dc power output without intermediate conversion into ac
    • H02M3/04Conversion of dc power input into dc power output without intermediate conversion into ac by static converters
    • H02M3/06Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider
    • H02M3/07Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
    • H02M3/071Conversion of dc power input into dc power output without intermediate conversion into ac by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps adapted to generate a negative voltage output from a positive voltage source

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Dram (AREA)
  • Dc-Dc Converters (AREA)
IT2002MI001609A 2001-07-23 2002-07-22 Dispositivo circuito e procedimento per la generazione di tensioni duali impiegando una pompa di carica singola ITMI20021609A1 (it)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US30721301P 2001-07-23 2001-07-23
US10/096,345 US6654296B2 (en) 2001-07-23 2002-03-12 Devices, circuits and methods for dual voltage generation using single charge pump

Publications (1)

Publication Number Publication Date
ITMI20021609A1 true ITMI20021609A1 (it) 2004-01-22

Family

ID=26791603

Family Applications (1)

Application Number Title Priority Date Filing Date
IT2002MI001609A ITMI20021609A1 (it) 2001-07-23 2002-07-22 Dispositivo circuito e procedimento per la generazione di tensioni duali impiegando una pompa di carica singola

Country Status (7)

Country Link
US (1) US6654296B2 (it)
JP (2) JP4334830B2 (it)
KR (1) KR100455389B1 (it)
DE (1) DE10234388B4 (it)
GB (1) GB2382194B (it)
IT (1) ITMI20021609A1 (it)
TW (1) TWI222081B (it)

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US7178004B2 (en) 2003-01-31 2007-02-13 Yan Polansky Memory array programming circuit and a method for using the circuit
US6888763B1 (en) * 2003-02-04 2005-05-03 Advanced Micro Devices, Inc. Compensated oscillator circuit for charge pumps
US6885244B2 (en) 2003-03-24 2005-04-26 Saifun Semiconductors Ltd. Operational amplifier with fast rise time
US6906966B2 (en) 2003-06-16 2005-06-14 Saifun Semiconductors Ltd. Fast discharge for program and verification
US7050319B2 (en) * 2003-12-03 2006-05-23 Micron Technology, Inc. Memory architecture and method of manufacture and operation thereof
US8339102B2 (en) 2004-02-10 2012-12-25 Spansion Israel Ltd System and method for regulating loading on an integrated circuit power supply
US7176728B2 (en) * 2004-02-10 2007-02-13 Saifun Semiconductors Ltd High voltage low power driver
US7652930B2 (en) 2004-04-01 2010-01-26 Saifun Semiconductors Ltd. Method, circuit and system for erasing one or more non-volatile memory cells
US7256438B2 (en) * 2004-06-08 2007-08-14 Saifun Semiconductors Ltd MOS capacitor with reduced parasitic capacitance
US7187595B2 (en) * 2004-06-08 2007-03-06 Saifun Semiconductors Ltd. Replenishment for internal voltage
US7190212B2 (en) * 2004-06-08 2007-03-13 Saifun Semiconductors Ltd Power-up and BGREF circuitry
US7382178B2 (en) 2004-07-09 2008-06-03 Mosaid Technologies Corporation Systems and methods for minimizing static leakage of an integrated circuit
US7154794B2 (en) * 2004-10-08 2006-12-26 Lexmark International, Inc. Memory regulator system with test mode
US7638850B2 (en) 2004-10-14 2009-12-29 Saifun Semiconductors Ltd. Non-volatile memory structure and method of fabrication
US8053812B2 (en) 2005-03-17 2011-11-08 Spansion Israel Ltd Contact in planar NROM technology
KR100612944B1 (ko) * 2005-04-29 2006-08-14 주식회사 하이닉스반도체 반도체 소자
US8400841B2 (en) 2005-06-15 2013-03-19 Spansion Israel Ltd. Device to program adjacent storage cells of different NROM cells
US7286417B2 (en) * 2005-06-21 2007-10-23 Micron Technology, Inc. Low power dissipation voltage generator
KR100748555B1 (ko) * 2005-06-28 2007-08-10 삼성전자주식회사 반도체 메모리 장치의 기판 바이어스 전압 발생 회로
US7804126B2 (en) 2005-07-18 2010-09-28 Saifun Semiconductors Ltd. Dense non-volatile memory array and method of fabrication
US7668017B2 (en) 2005-08-17 2010-02-23 Saifun Semiconductors Ltd. Method of erasing non-volatile memory cells
JP2007103863A (ja) * 2005-10-07 2007-04-19 Nec Electronics Corp 半導体デバイス
US7808818B2 (en) 2006-01-12 2010-10-05 Saifun Semiconductors Ltd. Secondary injection for NROM
US7760554B2 (en) 2006-02-21 2010-07-20 Saifun Semiconductors Ltd. NROM non-volatile memory and mode of operation
US7692961B2 (en) 2006-02-21 2010-04-06 Saifun Semiconductors Ltd. Method, circuit and device for disturb-control of programming nonvolatile memory cells by hot-hole injection (HHI) and by channel hot-electron (CHE) injection
US8253452B2 (en) 2006-02-21 2012-08-28 Spansion Israel Ltd Circuit and method for powering up an integrated circuit and an integrated circuit utilizing same
US7701779B2 (en) 2006-04-27 2010-04-20 Sajfun Semiconductors Ltd. Method for programming a reference cell
KR100757933B1 (ko) * 2006-07-20 2007-09-11 주식회사 하이닉스반도체 반도체 집적 회로의 내부 전압 생성 장치 및 방법
TWI327816B (en) 2007-04-27 2010-07-21 Mstar Semiconductor Inc A voltage providing circuit and a related method of which
JP4951786B2 (ja) * 2007-05-10 2012-06-13 ルネサスエレクトロニクス株式会社 半導体記憶装置
KR100863019B1 (ko) * 2007-06-22 2008-10-13 주식회사 하이닉스반도체 반도체 집적 회로의 내부 전압 생성 장치
KR100902060B1 (ko) * 2008-05-08 2009-06-15 주식회사 하이닉스반도체 반도체 메모리 장치의 펌핑 전압 생성 회로 및 방법
US8068356B2 (en) * 2008-05-28 2011-11-29 Taiwan Semiconductor Manufacturing Co., Ltd. Low power one-shot boost circuit
KR100956780B1 (ko) * 2008-09-09 2010-05-12 주식회사 하이닉스반도체 펌핑전압 발생 장치
KR100961210B1 (ko) 2008-11-04 2010-06-09 주식회사 하이닉스반도체 제어신호생성회로 및 이를 이용하는 센스앰프회로
KR101610825B1 (ko) * 2009-02-19 2016-04-11 삼성전자주식회사 래치-업 현상을 방지할 수 있는 cmos 차지 펌프
KR101890427B1 (ko) * 2011-12-28 2018-08-22 에스케이하이닉스 주식회사 내부전압생성회로
JP7393369B2 (ja) * 2021-01-20 2023-12-06 フタバ産業株式会社 抵抗スポット溶接装置

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Also Published As

Publication number Publication date
US20030016565A1 (en) 2003-01-23
GB2382194A (en) 2003-05-21
US6654296B2 (en) 2003-11-25
JP2003059269A (ja) 2003-02-28
GB2382194B (en) 2004-04-07
KR20030011238A (ko) 2003-02-07
KR100455389B1 (ko) 2004-11-06
JP4334830B2 (ja) 2009-09-30
JP4809452B2 (ja) 2011-11-09
DE10234388A1 (de) 2003-02-20
JP2009151931A (ja) 2009-07-09
DE10234388B4 (de) 2007-10-25
GB0215042D0 (en) 2002-08-07
TWI222081B (en) 2004-10-11

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