IL155395A0 - Layer transfer of low defect sige using an etch-back process - Google Patents
Layer transfer of low defect sige using an etch-back processInfo
- Publication number
- IL155395A0 IL155395A0 IL15539501A IL15539501A IL155395A0 IL 155395 A0 IL155395 A0 IL 155395A0 IL 15539501 A IL15539501 A IL 15539501A IL 15539501 A IL15539501 A IL 15539501A IL 155395 A0 IL155395 A0 IL 155395A0
- Authority
- IL
- Israel
- Prior art keywords
- etch
- back process
- layer transfer
- low defect
- sige
- Prior art date
Links
- 230000007547 defect Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
- H01L21/76251—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology using bonding techniques
- H01L21/76256—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology using bonding techniques using silicon etch back techniques, e.g. BESOI, ELTRAN
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
- H01L21/2003—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy characterised by the substrate
- H01L21/2007—Bonding of semiconductor wafers to insulating substrates or to semiconducting substrates using an intermediate insulating layer
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Recrystallisation Techniques (AREA)
- Junction Field-Effect Transistors (AREA)
- Thin Film Transistor (AREA)
- Bipolar Transistors (AREA)
- Element Separation (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/692,606 US6890835B1 (en) | 2000-10-19 | 2000-10-19 | Layer transfer of low defect SiGe using an etch-back process |
PCT/GB2001/004159 WO2002033746A1 (en) | 2000-10-19 | 2001-09-17 | Layer transfer of low defect sige using an etch-back process |
Publications (1)
Publication Number | Publication Date |
---|---|
IL155395A0 true IL155395A0 (en) | 2003-11-23 |
Family
ID=24781275
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL15539501A IL155395A0 (en) | 2000-10-19 | 2001-09-17 | Layer transfer of low defect sige using an etch-back process |
IL155395A IL155395A (en) | 2000-10-19 | 2003-04-11 | Transfer high-quality silicone-germanium layers using a process of repeat engraving |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL155395A IL155395A (en) | 2000-10-19 | 2003-04-11 | Transfer high-quality silicone-germanium layers using a process of repeat engraving |
Country Status (9)
Country | Link |
---|---|
US (4) | US6890835B1 (xx) |
EP (1) | EP1327263A1 (xx) |
JP (1) | JP2004512683A (xx) |
KR (1) | KR100613182B1 (xx) |
CN (1) | CN100472748C (xx) |
AU (1) | AU2001287881A1 (xx) |
IL (2) | IL155395A0 (xx) |
TW (1) | TW521395B (xx) |
WO (1) | WO2002033746A1 (xx) |
Families Citing this family (79)
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US7227176B2 (en) * | 1998-04-10 | 2007-06-05 | Massachusetts Institute Of Technology | Etch stop layer system |
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US6703688B1 (en) * | 2001-03-02 | 2004-03-09 | Amberwave Systems Corporation | Relaxed silicon germanium platform for high speed CMOS electronics and high speed analog circuits |
US6830976B2 (en) * | 2001-03-02 | 2004-12-14 | Amberwave Systems Corproation | Relaxed silicon germanium platform for high speed CMOS electronics and high speed analog circuits |
US6717213B2 (en) * | 2001-06-29 | 2004-04-06 | Intel Corporation | Creation of high mobility channels in thin-body SOI devices |
JP2003249641A (ja) * | 2002-02-22 | 2003-09-05 | Sharp Corp | 半導体基板、その製造方法及び半導体装置 |
US6995430B2 (en) | 2002-06-07 | 2006-02-07 | Amberwave Systems Corporation | Strained-semiconductor-on-insulator device structures |
US7074623B2 (en) * | 2002-06-07 | 2006-07-11 | Amberwave Systems Corporation | Methods of forming strained-semiconductor-on-insulator finFET device structures |
JP2004014856A (ja) * | 2002-06-07 | 2004-01-15 | Sharp Corp | 半導体基板の製造方法及び半導体装置の製造方法 |
US20030227057A1 (en) | 2002-06-07 | 2003-12-11 | Lochtefeld Anthony J. | Strained-semiconductor-on-insulator device structures |
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US7018910B2 (en) | 2002-07-09 | 2006-03-28 | S.O.I.Tec Silicon On Insulator Technologies S.A. | Transfer of a thin layer from a wafer comprising a buffer layer |
US6936869B2 (en) * | 2002-07-09 | 2005-08-30 | International Rectifier Corporation | Heterojunction field effect transistors using silicon-germanium and silicon-carbon alloys |
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JP5397079B2 (ja) * | 2009-08-11 | 2014-01-22 | ソニー株式会社 | 映像信号処理装置、エンハンスゲイン生成方法およびプログラム |
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US10418273B2 (en) * | 2015-10-13 | 2019-09-17 | Nanyang Technological University | Method of manufacturing a germanium-on-insulator substrate |
FR3049761B1 (fr) * | 2016-03-31 | 2018-10-05 | Soitec | Procede de fabrication d'une structure pour former un circuit integre monolithique tridimensionnel |
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KR101889352B1 (ko) | 2016-09-13 | 2018-08-20 | 한국과학기술연구원 | 변형된 저마늄을 포함하는 반도체 소자의 제조 방법 및 이에 의해 제조된 반도체 소자 |
FR3064398B1 (fr) * | 2017-03-21 | 2019-06-07 | Soitec | Structure de type semi-conducteur sur isolant, notamment pour un capteur d'image de type face avant, et procede de fabrication d'une telle structure |
CN107302037B (zh) * | 2017-06-12 | 2019-05-17 | 北京工业大学 | 基区Ge组分分段分布的SiGe/Si异质结光敏晶体管探测器 |
US11056382B2 (en) | 2018-03-19 | 2021-07-06 | Globalfoundries U.S. Inc. | Cavity formation within and under semiconductor devices |
CN108878263B (zh) * | 2018-06-25 | 2022-03-18 | 中国科学院微电子研究所 | 半导体结构与其制作方法 |
US20220130866A1 (en) * | 2019-03-04 | 2022-04-28 | Board Of Regents, The University Of Texas System | Silicon-On-Oxide-On-Silicon |
TWI788869B (zh) * | 2021-06-04 | 2023-01-01 | 合晶科技股份有限公司 | 高電子遷移率電晶體及其複合基板 |
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2000
- 2000-10-19 US US09/692,606 patent/US6890835B1/en not_active Expired - Fee Related
-
2001
- 2001-09-17 WO PCT/GB2001/004159 patent/WO2002033746A1/en active Application Filing
- 2001-09-17 CN CNB018176550A patent/CN100472748C/zh not_active Expired - Fee Related
- 2001-09-17 AU AU2001287881A patent/AU2001287881A1/en not_active Abandoned
- 2001-09-17 IL IL15539501A patent/IL155395A0/xx not_active IP Right Cessation
- 2001-09-17 KR KR1020037005157A patent/KR100613182B1/ko not_active IP Right Cessation
- 2001-09-17 JP JP2002537047A patent/JP2004512683A/ja not_active Withdrawn
- 2001-09-17 EP EP01967506A patent/EP1327263A1/en not_active Withdrawn
- 2001-10-16 TW TW090125554A patent/TW521395B/zh not_active IP Right Cessation
-
2003
- 2003-04-11 IL IL155395A patent/IL155395A/en not_active IP Right Cessation
-
2004
- 2004-09-23 US US10/948,421 patent/US7427773B2/en not_active Expired - Fee Related
-
2008
- 2008-07-29 US US12/181,489 patent/US20090026495A1/en not_active Abandoned
- 2008-07-29 US US12/181,613 patent/US7786468B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR20030051714A (ko) | 2003-06-25 |
US7786468B2 (en) | 2010-08-31 |
US20090267052A1 (en) | 2009-10-29 |
CN100472748C (zh) | 2009-03-25 |
AU2001287881A1 (en) | 2002-04-29 |
US20050104067A1 (en) | 2005-05-19 |
EP1327263A1 (en) | 2003-07-16 |
WO2002033746A1 (en) | 2002-04-25 |
KR100613182B1 (ko) | 2006-08-17 |
JP2004512683A (ja) | 2004-04-22 |
US6890835B1 (en) | 2005-05-10 |
US7427773B2 (en) | 2008-09-23 |
US20090026495A1 (en) | 2009-01-29 |
IL155395A (en) | 2007-05-15 |
CN1531751A (zh) | 2004-09-22 |
TW521395B (en) | 2003-02-21 |
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MM9K | Patent not in force due to non-payment of renewal fees |