HK1095884A1 - Apparatus and method for balancing and for providing a compliant range to a test head - Google Patents

Apparatus and method for balancing and for providing a compliant range to a test head

Info

Publication number
HK1095884A1
HK1095884A1 HK07103581.2A HK07103581A HK1095884A1 HK 1095884 A1 HK1095884 A1 HK 1095884A1 HK 07103581 A HK07103581 A HK 07103581A HK 1095884 A1 HK1095884 A1 HK 1095884A1
Authority
HK
Hong Kong
Prior art keywords
force
test head
load
providing
balancing
Prior art date
Application number
HK07103581.2A
Other languages
English (en)
Inventor
Henri M Akouka
Alyn R Holt
Nil O Ny
Original Assignee
Intest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intest Corp filed Critical Intest Corp
Publication of HK1095884A1 publication Critical patent/HK1095884A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Manipulator (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Supporting Of Heads In Record-Carrier Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Cable Accessories (AREA)
HK07103581.2A 2000-09-22 2007-04-03 Apparatus and method for balancing and for providing a compliant range to a test head HK1095884A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US23459800P 2000-09-22 2000-09-22
US30122801P 2001-06-27 2001-06-27

Publications (1)

Publication Number Publication Date
HK1095884A1 true HK1095884A1 (en) 2007-05-18

Family

ID=26928107

Family Applications (1)

Application Number Title Priority Date Filing Date
HK07103581.2A HK1095884A1 (en) 2000-09-22 2007-04-03 Apparatus and method for balancing and for providing a compliant range to a test head

Country Status (12)

Country Link
US (2) US7084358B2 (xx)
EP (1) EP1322965B1 (xx)
JP (1) JP2004523729A (xx)
KR (1) KR20030043966A (xx)
CN (2) CN1306277C (xx)
AT (1) ATE338952T1 (xx)
AU (1) AU2001291171A1 (xx)
DE (2) DE60122911T2 (xx)
HK (1) HK1095884A1 (xx)
MY (2) MY127154A (xx)
TW (1) TW515893B (xx)
WO (1) WO2002025292A2 (xx)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4511354B2 (ja) * 2002-10-02 2010-07-28 インテスト コーポレイション テストヘッドを位置決めするための位置決め装置、テストヘッドを位置決めする方法、および電子テストシステムのテストヘッドのための位置決め装置
US7235964B2 (en) * 2003-03-31 2007-06-26 Intest Corporation Test head positioning system and method
EP1947466B1 (en) * 2003-08-06 2012-07-04 inTEST Corporation Test head positioning system
SG137846A1 (en) * 2003-08-06 2007-12-28 Intest Corp Test head positioning system
DE102004018474A1 (de) * 2004-04-16 2005-11-10 Esmo Ag Manipulator
US7913971B2 (en) * 2005-04-29 2011-03-29 Cameron International Corporation Hydraulic override
US20070099555A1 (en) * 2005-11-03 2007-05-03 Beauchamp Dale A Pneumatic animal confinement house air inlet actuation system and method
DE102005057508B4 (de) * 2005-12-01 2011-11-17 Multitest Elektronische Systeme Gmbh Dockingvorrichtung zum Kuppeln einer Handhabungsvorrichtung mit einem Testkopf für elektronische Bauelemente
US7598725B2 (en) * 2005-12-30 2009-10-06 Teradyne, Inc. Alignment receptacle of a sensor adapted to interact with a pin to generate position data along at least two transverse axes for docking a test head
TWI439709B (zh) * 2006-12-29 2014-06-01 Intest Corp 用於使負載沿平移軸線平移之操縱器與負載定位系統
EP2104862B1 (en) * 2006-12-29 2012-08-08 inTEST Corporation Test head positioning system and method
US9889239B2 (en) 2007-03-23 2018-02-13 Allegiance Corporation Fluid collection and disposal system and related methods
US8500706B2 (en) 2007-03-23 2013-08-06 Allegiance Corporation Fluid collection and disposal system having interchangeable collection and other features and methods relating thereto
JP5427343B2 (ja) * 2007-04-20 2014-02-26 任天堂株式会社 ゲームコントローラ
US8763962B2 (en) * 2007-05-07 2014-07-01 Intest Corporation Cradle and cable handler for a test head manipulator
US7602562B2 (en) 2007-05-21 2009-10-13 Electro Scientific Industries, Inc. Fluid counterbalance for a laser lens used to scribe an electronic component substrate
FR2931451B1 (fr) * 2008-05-22 2010-12-17 Fmc Technologies Sa Dispositif de commande pour systeme de chargement et/ou dechargement de fluides
WO2011008961A1 (en) * 2009-07-15 2011-01-20 Allegiance Corporation Fluid collection and disposal system and related methods
CN101987448B (zh) * 2009-08-07 2012-09-05 坤霖精密有限公司 自动送料机的改进型输送臂超负荷机构
US8408082B2 (en) * 2009-11-18 2013-04-02 General Electric Company Apparatus to measure fluids in a conduit
EP2732298A1 (en) 2011-07-12 2014-05-21 Intest Corporation Method and apparatus for docking a test head with a peripheral
JP5221719B2 (ja) * 2011-08-18 2013-06-26 ファナック株式会社 エアバランスを利用して退避動作を行う位置決め装置
DE102014207457A1 (de) * 2014-04-08 2015-10-08 Siemens Aktiengesellschaft Anordnung, Prüfstand und Verfahren zur Prüfung eines Weichenantriebs
US9454911B2 (en) * 2014-07-30 2016-09-27 The Boeing Company Flight control test simulator system and method
US9506961B2 (en) 2014-12-04 2016-11-29 Chicony Power Technology Co., Ltd. Power supply detection apparatus and detecting method thereof
US10094854B2 (en) * 2015-10-23 2018-10-09 Teradyne, Inc. Manipulator in automatic test equipment
CN110537074A (zh) * 2017-04-19 2019-12-03 瑞尼斯豪公司 测量设备平衡件
CN108226647B (zh) * 2018-04-13 2024-05-24 南方电网科学研究院有限责任公司 一种对电力线接入点阻抗的测量装置
CN108548685A (zh) * 2018-04-26 2018-09-18 广东产品质量监督检验研究院（国家质量技术监督局广州电气安全检验所、广东省试验认证研究院、华安实验室） 一种机器人静态柔顺性测试装置
FR3080880B1 (fr) * 2018-05-04 2020-09-04 Safran Landing Systems Dispositif de verrouillage a verrou rotatif a commande impulsionnelle
KR102202035B1 (ko) * 2020-09-03 2021-01-12 주식회사 프로이천 오토 프로브장치
TWI737558B (zh) * 2020-12-25 2021-08-21 致茂電子股份有限公司 可自主補償測試頭與待測件間接觸界面平整度之電子元件檢測設備
US11498207B2 (en) 2021-01-08 2022-11-15 Teradyne, Inc. Test head manipulator configured to address uncontrolled test head rotation
CN114325325B (zh) * 2021-12-29 2023-12-01 日月新半导体(昆山)有限公司 用于测试集成电路产品的装置

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US5149029A (en) * 1982-08-25 1992-09-22 Intest Corporation Electronic test head positioner for test systems
US4705447A (en) * 1983-08-11 1987-11-10 Intest Corporation Electronic test head positioner for test systems
US4527942A (en) * 1982-08-25 1985-07-09 Intest Corporation Electronic test head positioner for test systems
JPS61197079A (ja) * 1985-02-28 1986-09-01 Toyota Motor Corp 耐チツピング性塗膜及びその形成方法
US4696197A (en) * 1986-04-11 1987-09-29 Lockheed Corporation System for counterbalancing tool mount loads in a machine tool
JP2514820B2 (ja) * 1986-11-25 1996-07-10 東京エレクトロン 株式会社 ウエハプロ−バ
JP2578084B2 (ja) * 1986-11-25 1997-02-05 東京エレクトロン株式会社 ウエハプローバ
US4893047A (en) * 1988-09-20 1990-01-09 Honda Electronic Co., Ltd. Ultrasonic driving device
JPH0785921B2 (ja) * 1991-07-15 1995-09-20 徳寿工業株式会社 被覆用断熱シート
JP2967798B2 (ja) * 1993-12-16 1999-10-25 株式会社東京精密 ウエハプローバ
US5606262A (en) * 1995-06-07 1997-02-25 Teradyne, Inc. Manipulator for automatic test equipment test head
CN2279238Y (zh) * 1996-10-17 1998-04-22 华南理工大学 封闭电流式开放功率型齿轮传动实验台
US6006616A (en) * 1997-07-11 1999-12-28 Credence Systems Corporation Semiconductor tester with power assist for vertical test head movement
US6271657B1 (en) * 1997-07-25 2001-08-07 Advantest Corporation Test head positioner for semiconductor device testing apparatus
US5949002A (en) * 1997-11-12 1999-09-07 Teradyne, Inc. Manipulator for automatic test equipment with active compliance
MY138984A (en) * 2000-03-01 2009-08-28 Intest Corp Vertical counter balanced test head manipulator
JP4511354B2 (ja) * 2002-10-02 2010-07-28 インテスト コーポレイション テストヘッドを位置決めするための位置決め装置、テストヘッドを位置決めする方法、および電子テストシステムのテストヘッドのための位置決め装置

Also Published As

Publication number Publication date
CN1306277C (zh) 2007-03-21
US7340972B2 (en) 2008-03-11
DE60122911D1 (de) 2006-10-19
CN101788643A (zh) 2010-07-28
ATE338952T1 (de) 2006-09-15
EP1322965B1 (en) 2006-09-06
CN1484767A (zh) 2004-03-24
WO2002025292B1 (en) 2003-02-20
US20060156836A1 (en) 2006-07-20
KR20030043966A (ko) 2003-06-02
WO2002025292A2 (en) 2002-03-28
US20050020402A1 (en) 2005-01-27
WO2002025292A3 (en) 2002-10-03
DE06014164T1 (de) 2007-06-06
EP1322965A2 (en) 2003-07-02
AU2001291171A1 (en) 2002-04-02
MY147595A (en) 2012-12-31
MY127154A (en) 2006-11-30
JP2004523729A (ja) 2004-08-05
TW515893B (en) 2003-01-01
US7084358B2 (en) 2006-08-01
DE60122911T2 (de) 2007-02-22

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20160920