AU2001291171A1 - Manipulator for a test head with active compliance - Google Patents

Manipulator for a test head with active compliance

Info

Publication number
AU2001291171A1
AU2001291171A1 AU2001291171A AU9117101A AU2001291171A1 AU 2001291171 A1 AU2001291171 A1 AU 2001291171A1 AU 2001291171 A AU2001291171 A AU 2001291171A AU 9117101 A AU9117101 A AU 9117101A AU 2001291171 A1 AU2001291171 A1 AU 2001291171A1
Authority
AU
Australia
Prior art keywords
force
test head
load
manipulator
imbalance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001291171A
Inventor
Henri M. Akouka
Alyn R. Holt
Nil O. Ny
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
InTest Corp
Original Assignee
InTest IP Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by InTest IP Corp filed Critical InTest IP Corp
Publication of AU2001291171A1 publication Critical patent/AU2001291171A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Manipulator (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Supporting Of Heads In Record-Carrier Devices (AREA)
  • Cable Accessories (AREA)

Abstract

A load, such as an electronic test head, is supported. A force sensor detects a force received from the load, the force resulting from the load being imbalanced such that a torque is created about a rotational axis of the load. A source of force provides a counter force relative to the load in response to the force detected by the force sensor. A method of docking an electronic test head held in a test head manipulator to an electronic device handler is also provided. The method of docking includes measuring a magnitude of an imbalance force along or about at least one of a plurality of motion axes of the test head manipulator; and providing a counter force to the imbalance force.
AU2001291171A 2000-09-22 2001-09-20 Manipulator for a test head with active compliance Abandoned AU2001291171A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US23459800P 2000-09-22 2000-09-22
US60/234,598 2000-09-22
US30122801P 2001-06-27 2001-06-27
US60/301,228 2001-06-27
PCT/US2001/029530 WO2002025292A2 (en) 2000-09-22 2001-09-20 Manipulator for a test head with active compliance

Publications (1)

Publication Number Publication Date
AU2001291171A1 true AU2001291171A1 (en) 2002-04-02

Family

ID=26928107

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001291171A Abandoned AU2001291171A1 (en) 2000-09-22 2001-09-20 Manipulator for a test head with active compliance

Country Status (12)

Country Link
US (2) US7084358B2 (en)
EP (1) EP1322965B1 (en)
JP (1) JP2004523729A (en)
KR (1) KR20030043966A (en)
CN (2) CN1306277C (en)
AT (1) ATE338952T1 (en)
AU (1) AU2001291171A1 (en)
DE (2) DE60122911T2 (en)
HK (1) HK1095884A1 (en)
MY (2) MY127154A (en)
TW (1) TW515893B (en)
WO (1) WO2002025292A2 (en)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2002368253A1 (en) * 2002-10-02 2004-04-23 Intest Ip Corp. Test head positioning apparatus
US7235964B2 (en) * 2003-03-31 2007-06-26 Intest Corporation Test head positioning system and method
WO2005015245A2 (en) 2003-08-06 2005-02-17 Intest Corporation Test head positioning system
EP1947466B1 (en) * 2003-08-06 2012-07-04 inTEST Corporation Test head positioning system
DE102004018474A1 (en) * 2004-04-16 2005-11-10 Esmo Ag Heavy duty manipulator especially for testing ICs has a movable tower mounted on a support platform and with integral damping
US7913971B2 (en) * 2005-04-29 2011-03-29 Cameron International Corporation Hydraulic override
US20070099555A1 (en) * 2005-11-03 2007-05-03 Beauchamp Dale A Pneumatic animal confinement house air inlet actuation system and method
DE102005057508B4 (en) * 2005-12-01 2011-11-17 Multitest Elektronische Systeme Gmbh Docking device for coupling a handling device with a test head for electronic components
US7598725B2 (en) * 2005-12-30 2009-10-06 Teradyne, Inc. Alignment receptacle of a sensor adapted to interact with a pin to generate position data along at least two transverse axes for docking a test head
TWI439709B (en) 2006-12-29 2014-06-01 Intest Corp Manupulator and load positioning system for translating load along axis of translation
US8350584B2 (en) * 2006-12-29 2013-01-08 Intest Corporation Test head positioning system and method
US9889239B2 (en) 2007-03-23 2018-02-13 Allegiance Corporation Fluid collection and disposal system and related methods
AU2008232361B2 (en) 2007-03-23 2013-05-16 Allegiance Corporation Fluid collection and disposal system and related methods
JP5427343B2 (en) * 2007-04-20 2014-02-26 任天堂株式会社 Game controller
CN101680911B (en) * 2007-05-07 2014-06-18 英泰斯特股份有限公司 Cradle and cable handler for a test head manipulator
US7602562B2 (en) 2007-05-21 2009-10-13 Electro Scientific Industries, Inc. Fluid counterbalance for a laser lens used to scribe an electronic component substrate
FR2931451B1 (en) * 2008-05-22 2010-12-17 Fmc Technologies Sa CONTROL DEVICE FOR SYSTEM FOR LOADING AND / OR UNLOADING FLUIDS
WO2011008961A1 (en) * 2009-07-15 2011-01-20 Allegiance Corporation Fluid collection and disposal system and related methods
CN101987448B (en) * 2009-08-07 2012-09-05 坤霖精密有限公司 Improved conveying arm overload mechanism of automatic feeding machine
US8408082B2 (en) * 2009-11-18 2013-04-02 General Electric Company Apparatus to measure fluids in a conduit
US20140317453A1 (en) 2011-07-12 2014-10-23 Intest Corporation Method and apparatus for docking a test head with a peripheral
JP5221719B2 (en) * 2011-08-18 2013-06-26 ファナック株式会社 Positioning device that performs retraction using air balance
DE102014207457A1 (en) * 2014-04-08 2015-10-08 Siemens Aktiengesellschaft Arrangement, test bench and method for testing a point machine
US9454911B2 (en) * 2014-07-30 2016-09-27 The Boeing Company Flight control test simulator system and method
US9506961B2 (en) 2014-12-04 2016-11-29 Chicony Power Technology Co., Ltd. Power supply detection apparatus and detecting method thereof
US10094854B2 (en) * 2015-10-23 2018-10-09 Teradyne, Inc. Manipulator in automatic test equipment
WO2018193229A1 (en) * 2017-04-19 2018-10-25 Renishaw Plc Positioning apparatus
CN108226647B (en) * 2018-04-13 2024-05-24 南方电网科学研究院有限责任公司 Measuring device for impedance of power line access point
CN108548685B (en) * 2018-04-26 2024-08-06 广东产品质量监督检验研究院（国家质量技术监督局广州电气安全检验所、广东省试验认证研究院、华安实验室） Triaxial six-direction test loading method based on robot static flexibility test device
FR3080880B1 (en) * 2018-05-04 2020-09-04 Safran Landing Systems ROTARY LOCKING DEVICE WITH IMPULSE CONTROL
KR102202035B1 (en) * 2020-09-03 2021-01-12 주식회사 프로이천 Auto-Probe Apparatus
TWI737558B (en) * 2020-12-25 2021-08-21 致茂電子股份有限公司 Electronic device testing apparatus capable of autonomously compensating unflatness of contact surface between a test head and a device under test
US11498207B2 (en) 2021-01-08 2022-11-15 Teradyne, Inc. Test head manipulator configured to address uncontrolled test head rotation
CN114325325B (en) * 2021-12-29 2023-12-01 日月新半导体(昆山)有限公司 Apparatus for testing integrated circuit products

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5149029A (en) * 1982-08-25 1992-09-22 Intest Corporation Electronic test head positioner for test systems
US4705447A (en) * 1983-08-11 1987-11-10 Intest Corporation Electronic test head positioner for test systems
US4527942A (en) * 1982-08-25 1985-07-09 Intest Corporation Electronic test head positioner for test systems
JPS61197079A (en) * 1985-02-28 1986-09-01 Toyota Motor Corp Chipping-resistant coated film and its formation
US4696197A (en) 1986-04-11 1987-09-29 Lockheed Corporation System for counterbalancing tool mount loads in a machine tool
JP2514820B2 (en) * 1986-11-25 1996-07-10 東京エレクトロン 株式会社 Wafer prober
JP2578084B2 (en) * 1986-11-25 1997-02-05 東京エレクトロン株式会社 Wafer prober
US4893047A (en) * 1988-09-20 1990-01-09 Honda Electronic Co., Ltd. Ultrasonic driving device
JPH0785921B2 (en) * 1991-07-15 1995-09-20 徳寿工業株式会社 Insulation sheet for coating
JP2967798B2 (en) * 1993-12-16 1999-10-25 株式会社東京精密 Wafer prober
US5606262A (en) * 1995-06-07 1997-02-25 Teradyne, Inc. Manipulator for automatic test equipment test head
CN2279238Y (en) * 1996-10-17 1998-04-22 华南理工大学 Closed current type open-power gearing experimental table
US6006616A (en) * 1997-07-11 1999-12-28 Credence Systems Corporation Semiconductor tester with power assist for vertical test head movement
US6271657B1 (en) * 1997-07-25 2001-08-07 Advantest Corporation Test head positioner for semiconductor device testing apparatus
US5949002A (en) * 1997-11-12 1999-09-07 Teradyne, Inc. Manipulator for automatic test equipment with active compliance
MY144519A (en) * 2000-03-01 2011-09-30 Intest Corp Vertical counter balanced test head manipulator
AU2002368253A1 (en) * 2002-10-02 2004-04-23 Intest Ip Corp. Test head positioning apparatus

Also Published As

Publication number Publication date
DE06014164T1 (en) 2007-06-06
EP1322965A2 (en) 2003-07-02
WO2002025292A2 (en) 2002-03-28
KR20030043966A (en) 2003-06-02
DE60122911D1 (en) 2006-10-19
WO2002025292B1 (en) 2003-02-20
JP2004523729A (en) 2004-08-05
CN101788643A (en) 2010-07-28
WO2002025292A3 (en) 2002-10-03
TW515893B (en) 2003-01-01
CN1484767A (en) 2004-03-24
CN1306277C (en) 2007-03-21
US7340972B2 (en) 2008-03-11
EP1322965B1 (en) 2006-09-06
US20060156836A1 (en) 2006-07-20
DE60122911T2 (en) 2007-02-22
MY147595A (en) 2012-12-31
HK1095884A1 (en) 2007-05-18
MY127154A (en) 2006-11-30
US7084358B2 (en) 2006-08-01
ATE338952T1 (en) 2006-09-15
US20050020402A1 (en) 2005-01-27

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