HK1019930A1 - Assembly and method for testing integrated circuit devices - Google Patents

Assembly and method for testing integrated circuit devices

Info

Publication number
HK1019930A1
HK1019930A1 HK99105055A HK99105055A HK1019930A1 HK 1019930 A1 HK1019930 A1 HK 1019930A1 HK 99105055 A HK99105055 A HK 99105055A HK 99105055 A HK99105055 A HK 99105055A HK 1019930 A1 HK1019930 A1 HK 1019930A1
Authority
HK
Hong Kong
Prior art keywords
testing
integrated circuit
assembly
circuit device
circuit devices
Prior art date
Application number
HK99105055A
Other languages
English (en)
Inventor
Tord L Haulin
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Publication of HK1019930A1 publication Critical patent/HK1019930A1/xx

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
HK99105055A 1996-02-06 1999-11-04 Assembly and method for testing integrated circuit devices HK1019930A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US59597996A 1996-02-06 1996-02-06
PCT/SE1997/000068 WO1997029384A1 (en) 1996-02-06 1997-01-17 Assembly and method for testing integrated circuit devices

Publications (1)

Publication Number Publication Date
HK1019930A1 true HK1019930A1 (en) 2000-03-03

Family

ID=24385505

Family Applications (1)

Application Number Title Priority Date Filing Date
HK99105055A HK1019930A1 (en) 1996-02-06 1999-11-04 Assembly and method for testing integrated circuit devices

Country Status (11)

Country Link
US (1) US5996102A (xx)
EP (1) EP0882239B1 (xx)
JP (1) JP2000504830A (xx)
KR (1) KR19990082339A (xx)
CN (1) CN1084878C (xx)
AT (1) ATE433121T1 (xx)
AU (1) AU1678697A (xx)
CA (1) CA2245549C (xx)
DE (1) DE69739438D1 (xx)
HK (1) HK1019930A1 (xx)
WO (1) WO1997029384A1 (xx)

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US8230281B2 (en) * 2009-04-13 2012-07-24 Altera Corporation Techniques for boundary scan testing using transmitters and receivers
US9759772B2 (en) 2011-10-28 2017-09-12 Teradyne, Inc. Programmable test instrument
US10776233B2 (en) 2011-10-28 2020-09-15 Teradyne, Inc. Programmable test instrument
JP2013250250A (ja) * 2012-06-04 2013-12-12 Advantest Corp テスターハードウェアおよびそれを用いた試験システム
US9606183B2 (en) * 2012-10-20 2017-03-28 Advantest Corporation Pseudo tester-per-site functionality on natively tester-per-pin automatic test equipment for semiconductor test
CN103852709A (zh) * 2012-11-28 2014-06-11 英业达科技有限公司 电路板上电子元件与电路板功能检测的系统及其方法
US8839063B2 (en) * 2013-01-24 2014-09-16 Texas Instruments Incorporated Circuits and methods for dynamic allocation of scan test resources
JP2014235127A (ja) * 2013-06-04 2014-12-15 株式会社アドバンテスト 試験システム、制御プログラム、コンフィギュレーションデータの書込方法
US10073806B2 (en) * 2015-05-13 2018-09-11 Qualcomm Incorporated Apparatus and methods for providing a reconfigurable bidirectional front-end interface
CN109061280A (zh) * 2018-07-24 2018-12-21 北方电子研究院安徽有限公司 一种用于测试电流、电压的自动测试系统
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Also Published As

Publication number Publication date
CN1217062A (zh) 1999-05-19
CA2245549C (en) 2003-04-08
ATE433121T1 (de) 2009-06-15
KR19990082339A (ko) 1999-11-25
US5996102A (en) 1999-11-30
CA2245549A1 (en) 1997-08-14
DE69739438D1 (de) 2009-07-16
EP0882239B1 (en) 2009-06-03
WO1997029384A1 (en) 1997-08-14
AU1678697A (en) 1997-08-28
JP2000504830A (ja) 2000-04-18
EP0882239A1 (en) 1998-12-09
CN1084878C (zh) 2002-05-15

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Legal Events

Date Code Title Description
PF Patent in force
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20070117