ATE447184T1 - Auf indikation beruhendes datenträgermodul für die indikation von untersuchungresultaten - Google Patents

Auf indikation beruhendes datenträgermodul für die indikation von untersuchungresultaten

Info

Publication number
ATE447184T1
ATE447184T1 AT01925578T AT01925578T ATE447184T1 AT E447184 T1 ATE447184 T1 AT E447184T1 AT 01925578 T AT01925578 T AT 01925578T AT 01925578 T AT01925578 T AT 01925578T AT E447184 T1 ATE447184 T1 AT E447184T1
Authority
AT
Austria
Prior art keywords
indication
test
data carrier
module
based data
Prior art date
Application number
AT01925578T
Other languages
English (en)
Inventor
Thomas Burger
Michael Cernusca
Original Assignee
Nxp Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nxp Bv filed Critical Nxp Bv
Application granted granted Critical
Publication of ATE447184T1 publication Critical patent/ATE447184T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/303—Contactless testing of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/3025—Wireless interface with the DUT

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
AT01925578T 2000-05-29 2001-05-03 Auf indikation beruhendes datenträgermodul für die indikation von untersuchungresultaten ATE447184T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP00890171 2000-05-29
PCT/EP2001/005001 WO2001092902A1 (en) 2000-05-29 2001-05-03 Data carrier module having indication means for indicating the result of a test operation

Publications (1)

Publication Number Publication Date
ATE447184T1 true ATE447184T1 (de) 2009-11-15

Family

ID=8175937

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01925578T ATE447184T1 (de) 2000-05-29 2001-05-03 Auf indikation beruhendes datenträgermodul für die indikation von untersuchungresultaten

Country Status (7)

Country Link
US (1) US6721912B2 (de)
EP (1) EP1194787B1 (de)
JP (1) JP2003535342A (de)
CN (1) CN1208627C (de)
AT (1) ATE447184T1 (de)
DE (1) DE60140289D1 (de)
WO (1) WO2001092902A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4624361B2 (ja) * 2003-10-29 2011-02-02 エヌエックスピー ビー ヴィ 自動送信モードのアクティベーションを備える通信パートナ機器
US7466157B2 (en) * 2004-02-05 2008-12-16 Formfactor, Inc. Contactless interfacing of test signals with a device under test
US20050276341A1 (en) * 2004-06-14 2005-12-15 Infineon Technologies Ag Method and apparatus for transmitting and/or receiving data
US7164353B2 (en) * 2004-12-22 2007-01-16 Avery Dennison Corporation Method and system for testing RFID devices
JP4949653B2 (ja) 2005-07-21 2012-06-13 株式会社リコー 半導体装置
JP4867239B2 (ja) * 2005-09-05 2012-02-01 カシオ計算機株式会社 情報処理装置、自己診断方法及びプログラム
EP1966618B1 (de) * 2005-12-20 2012-08-22 Nxp B.V. Schaltung und datenträger mit hochfrequenzschnittstelle
CN102554968A (zh) * 2012-01-18 2012-07-11 欧朗科技（苏州）有限公司 自动敲板边装置
US10743691B2 (en) 2018-08-09 2020-08-18 Christopher Gaines Portable assistive shoe donning and doffing device

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5673028A (en) * 1993-01-07 1997-09-30 Levy; Henry A. Electronic component failure indicator
US5570035A (en) * 1995-01-31 1996-10-29 The United States Of America As Represented By The Secretary Of The Army Built-in self test indicator for an integrated circuit package
US5974577A (en) * 1996-04-24 1999-10-26 Micron Technology, Inc. Integrated circuit with voltage over-stress indicating circuit
JPH1183938A (ja) * 1997-09-08 1999-03-26 Mitsubishi Electric Corp 半導体装置用テストボードおよびそれを用いた半導体装置の評価試験方法
US6085334A (en) * 1998-04-17 2000-07-04 Motorola, Inc. Method and apparatus for testing an integrated memory device
ATE287543T1 (de) * 1998-08-21 2005-02-15 Koninkl Philips Electronics Nv Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger
US6448802B1 (en) * 1998-12-21 2002-09-10 Intel Corporation Photosensors for testing an integrated circuit

Also Published As

Publication number Publication date
DE60140289D1 (de) 2009-12-10
EP1194787B1 (de) 2009-10-28
WO2001092902A1 (en) 2001-12-06
JP2003535342A (ja) 2003-11-25
CN1208627C (zh) 2005-06-29
US20020000812A1 (en) 2002-01-03
US6721912B2 (en) 2004-04-13
CN1380982A (zh) 2002-11-20
EP1194787A1 (de) 2002-04-10

Similar Documents

Publication Publication Date Title
DE19781528T1 (de) Testgerät für integrierte Schaltungselemente
ATE287543T1 (de) Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger
FR2603704B1 (fr) Procede pour tester un support portant plusieurs circuits integres a fonctionnement numerique, circuit integre propre a etre monte sur un support a tester ainsi, et support pourvu de plusieurs circuits integres de ce genre
WO2001079863A3 (en) Method and apparatus for testing signal paths between an integrated circuit wafer and a wafer tester
EP0849743A3 (de) Speicherschaltungen mit eingebautem Selbsttest
MY124258A (en) Method of testing electronic components and testing apparatus for electronic components
CH694831A5 (de) Vorrichtung zur Prüfung vereinzelter Halbleiterchips.
ATE447184T1 (de) Auf indikation beruhendes datenträgermodul für die indikation von untersuchungresultaten
US4377003A (en) Testing device for electronic circuits and especially for portable radios
TW334607B (en) Method for high speed testing a semiconductor device
TW345685B (en) Semiconductor device with wafer burn-in and method therefor
MY135253A (en) Test apparatus
ATE376189T1 (de) Elektronischer schaltkreis und testverfahren
ATE238602T1 (de) Speichermodulsprüfeinrichtung mit verminderter ausgangstreiberimpendanz
DE602004000226D1 (de) Parallele Prüfung von Intergrierten Schaltungen
MY122055A (en) Method of testing integrated circuits
US6898543B2 (en) In-system testing of an oscillator
KR100608146B1 (ko) 반도체 장치 테스트용 프로브 카드
DE60105764D1 (de) Elektronischer chip für einen tragbaren gegenstand
MY128470A (en) Boundary-scan testing opto-electronic devices.
KR970004768Y1 (ko) 키보드를 이용한 자동써머리 회로
DE19981507D2 (de) Integrierte Schaltung mit eingebautem Baugruppentest
KR930017128A (ko) 집적 회로 장치 및 그 검사 방법
JPS5768047A (en) Probe card
KR970048547A (ko) 보드칩(chip on board) 테스트용 소켓

Legal Events

Date Code Title Description
RER Ceased as to paragraph 5 lit. 3 law introducing patent treaties