ES8701405A1 - Una unidad de memoria semiconductora no volatil,de aplica- cion a circuitos electronicos - Google Patents

Una unidad de memoria semiconductora no volatil,de aplica- cion a circuitos electronicos

Info

Publication number
ES8701405A1
ES8701405A1 ES540446A ES540446A ES8701405A1 ES 8701405 A1 ES8701405 A1 ES 8701405A1 ES 540446 A ES540446 A ES 540446A ES 540446 A ES540446 A ES 540446A ES 8701405 A1 ES8701405 A1 ES 8701405A1
Authority
ES
Spain
Prior art keywords
circuit
states
stable
read mode
nonvolatile latch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES540446A
Other languages
English (en)
Other versions
ES540446A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Raytheon Co
Original Assignee
Hughes Aircraft Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hughes Aircraft Co filed Critical Hughes Aircraft Co
Publication of ES540446A0 publication Critical patent/ES540446A0/es
Publication of ES8701405A1 publication Critical patent/ES8701405A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/412—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only
    • G11C11/4125—Cells incorporating circuit means for protecting against loss of information
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C14/00—Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/788—Field effect transistors with field effect produced by an insulated gate with floating gate
    • H01L29/7881—Programmable transistors with only two possible levels of programmation
    • H01L29/7883—Programmable transistors with only two possible levels of programmation charging by tunnelling of carriers, e.g. Fowler-Nordheim tunnelling
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
    • Y10S257/903—FET configuration adapted for use as static memory cell
    • Y10S257/904—FET configuration adapted for use as static memory cell with passive components,, e.g. polysilicon resistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Read Only Memory (AREA)
  • Non-Volatile Memory (AREA)
  • Surgical Instruments (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Particle Formation And Scattering Control In Inkjet Printers (AREA)
  • Debugging And Monitoring (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Peptides Or Proteins (AREA)
  • Reduction Or Emphasis Of Bandwidth Of Signals (AREA)
  • Amplifiers (AREA)
  • Semiconductor Memories (AREA)
  • Agricultural Chemicals And Associated Chemicals (AREA)
  • Treating Waste Gases (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)

Abstract

UNIDAD DE MEMORIA SEMICONDUCTORA NO VOLATIL. SE TRATA DE UN CIRCUITO (10) DE RETENCION BIESTABLE, QUE PUEDE PROGRAMARSE ELECTRICAMENTE PARA SER ESTABLE EN UNO DE SUS DOS ESTADOS PARA EL CASO DE QUE SE APLIQUE POTENCIA AL CIRCUITO. EL ESTADO SELECCIONADO PUEDE PROGRAMARSE, ESCOGIENDOSE CUALQUIERA DE LOS DOS PERMITIDOS DE FORMA INDISTINTA, NO CONSUMIENDOSE CORRIENTE CONTINUA DURANTE LA PROGRAMACION O LA LECTURA. EN EL MODO DE LECTURA, LOS POTENCIALES EN LOS NODOS DE CIRCUITO (28, 38, 58, 78) SON TALES QUE SE CONSIGNAN TIEMPOS LARGOS DE RETENCION DE DATOS. LA UNIDAD COMPRENDE DISPOSITIVOS DE TECNOLOGIA MOSFET. DE APLICACION A CIRCUITOS ELECTRONICOS CON REQUERIMIENTOS DE MEMORIA NO VOLATIL.
ES540446A 1984-02-17 1985-02-15 Una unidad de memoria semiconductora no volatil,de aplica- cion a circuitos electronicos Expired ES8701405A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/581,482 US4571704A (en) 1984-02-17 1984-02-17 Nonvolatile latch

Publications (2)

Publication Number Publication Date
ES540446A0 ES540446A0 (es) 1986-11-16
ES8701405A1 true ES8701405A1 (es) 1986-11-16

Family

ID=24325382

Family Applications (1)

Application Number Title Priority Date Filing Date
ES540446A Expired ES8701405A1 (es) 1984-02-17 1985-02-15 Una unidad de memoria semiconductora no volatil,de aplica- cion a circuitos electronicos

Country Status (15)

Country Link
US (1) US4571704A (es)
EP (1) EP0172879B1 (es)
JP (1) JPH0732241B2 (es)
AT (1) ATE43452T1 (es)
AU (1) AU564114B2 (es)
DE (1) DE3570546D1 (es)
DK (1) DK163392C (es)
ES (1) ES8701405A1 (es)
HK (1) HK76089A (es)
IL (1) IL74219A (es)
IN (1) IN162453B (es)
IT (1) IT1182206B (es)
NO (1) NO166986C (es)
SG (1) SG41689G (es)
WO (1) WO1985003798A1 (es)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4780750A (en) * 1986-01-03 1988-10-25 Sierra Semiconductor Corporation Electrically alterable non-volatile memory device
US4748593A (en) * 1986-09-08 1988-05-31 Ncr Corporation High speed nonvolatile memory cell
US4858185A (en) * 1988-01-28 1989-08-15 National Semiconductor Corporation Zero power, electrically alterable, nonvolatile latch
US5051951A (en) * 1989-11-06 1991-09-24 Carnegie Mellon University Static RAM memory cell using N-channel MOS transistors
US5097449A (en) * 1990-03-15 1992-03-17 Vlsi Technology, Inc. Non-volatile memory structure
JPH04232695A (ja) * 1990-08-06 1992-08-20 Hughes Aircraft Co Ｅｅｐｒｏｍアナログスイッチ
US5682345A (en) * 1995-07-28 1997-10-28 Micron Quantum Devices, Inc. Non-volatile data storage unit method of controlling same
US5627784A (en) * 1995-07-28 1997-05-06 Micron Quantum Devices, Inc. Memory system having non-volatile data storage structure for memory control parameters and method
US5801985A (en) 1995-07-28 1998-09-01 Micron Technology, Inc. Memory system having programmable control parameters
US5578515A (en) * 1995-11-06 1996-11-26 Hughes Aircraft Company Method for fabricating gate structure for nonvolatile memory device comprising an EEPROM and a latch transistor
US5793775A (en) * 1996-01-26 1998-08-11 Micron Quantum Devices, Inc. Low voltage test mode operation enable scheme with hardware safeguard
JPH11143379A (ja) * 1997-09-03 1999-05-28 Semiconductor Energy Lab Co Ltd 半導体表示装置補正システムおよび半導体表示装置の補正方法
US6141247A (en) * 1997-10-24 2000-10-31 Micron Technology, Inc. Non-volatile data storage unit and method of controlling same
US6163492A (en) * 1998-10-23 2000-12-19 Mosel Vitelic, Inc. Programmable latches that include non-volatile programmable elements
US6362675B1 (en) 1999-07-12 2002-03-26 Ramtron International Corporation Nonvolatile octal latch and D-type register
ITRM20010556A1 (it) * 2001-09-12 2003-03-12 Micron Technology Inc Decodificatore per decodificare i comandi di commutazione a modo di test di circuiti integrati.
US7145370B2 (en) * 2003-09-05 2006-12-05 Impinj, Inc. High-voltage switches in single-well CMOS processes
US7388420B2 (en) * 2004-03-30 2008-06-17 Impinj, Inc. Rewriteable electronic fuses
US7242614B2 (en) * 2004-03-30 2007-07-10 Impinj, Inc. Rewriteable electronic fuses
US7177182B2 (en) * 2004-03-30 2007-02-13 Impinj, Inc. Rewriteable electronic fuses
US7283390B2 (en) 2004-04-21 2007-10-16 Impinj, Inc. Hybrid non-volatile memory
US8111558B2 (en) * 2004-05-05 2012-02-07 Synopsys, Inc. pFET nonvolatile memory
US7257033B2 (en) * 2005-03-17 2007-08-14 Impinj, Inc. Inverter non-volatile memory cell and array system
US7679957B2 (en) * 2005-03-31 2010-03-16 Virage Logic Corporation Redundant non-volatile memory cell
KR100610490B1 (ko) * 2005-06-17 2006-08-08 매그나칩 반도체 유한회사 Ｅｅｐｒｏｍ 셀 및 ｅｅｐｒｏｍ 블록
US8122307B1 (en) 2006-08-15 2012-02-21 Synopsys, Inc. One time programmable memory test structures and methods
KR100812520B1 (ko) * 2007-02-06 2008-03-11 매그나칩 반도체 유한회사 반도체 메모리 장치
US7719896B1 (en) 2007-04-24 2010-05-18 Virage Logic Corporation Configurable single bit/dual bits memory
US7894261B1 (en) 2008-05-22 2011-02-22 Synopsys, Inc. PFET nonvolatile memory

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3618053A (en) * 1969-12-31 1971-11-02 Westinghouse Electric Corp Trapped charge memory cell
JPS51117838A (en) 1975-04-10 1976-10-16 Shindengen Electric Mfg Co Ltd Semiconductor memory device
JPS52141093A (en) 1976-05-19 1977-11-25 Nippon Koinko Kk Low frequency curing device
US4132904A (en) * 1977-07-28 1979-01-02 Hughes Aircraft Company Volatile/non-volatile logic latch circuit
US4103348A (en) * 1977-08-29 1978-07-25 Westinghouse Electric Corp. Volatile and nonvolatile random access memory cell
CH625075A5 (es) * 1978-02-22 1981-08-31 Centre Electron Horloger
US4185319A (en) * 1978-10-04 1980-01-22 Rca Corp. Non-volatile memory device
US4207615A (en) * 1978-11-17 1980-06-10 Intel Corporation Non-volatile ram cell
IT1224062B (it) * 1979-09-28 1990-09-26 Ates Componenti Elettron Metodo di programmazione per una memoria a semiconduttore non volatile elettricamente alterabile
GB2063601B (en) * 1979-11-12 1984-02-29 Hughes Microelectronics Ltd Non-volatile semiconductor memory circuits
US4387444A (en) * 1980-07-07 1983-06-07 Hughes Aircraft Company Non-volatile semiconductor memory cells
US4388704A (en) * 1980-09-30 1983-06-14 International Business Machines Corporation Non-volatile RAM cell with enhanced conduction insulators
US4403306A (en) * 1980-10-22 1983-09-06 Tokyo Shibaura Denki Kabushiki Kaisha Semiconductor memory operable as static RAM or EAROM
US4363110A (en) * 1980-12-22 1982-12-07 International Business Machines Corp. Non-volatile dynamic RAM cell
US4467451A (en) * 1981-12-07 1984-08-21 Hughes Aircraft Company Nonvolatile random access memory cell
US4408303A (en) * 1981-12-28 1983-10-04 Mostek Corporation Directly-coupled and capacitively coupled nonvolatile static RAM cell

Also Published As

Publication number Publication date
DK163392C (da) 1992-08-03
US4571704A (en) 1986-02-18
EP0172879A1 (en) 1986-03-05
ES540446A0 (es) 1986-11-16
NO853815L (no) 1985-09-27
IT1182206B (it) 1987-09-30
JPH0732241B2 (ja) 1995-04-10
HK76089A (en) 1989-09-29
DK401885D0 (da) 1985-09-03
JPS61501356A (ja) 1986-07-03
NO166986B (no) 1991-06-10
SG41689G (en) 1990-01-26
IT8547694A1 (it) 1986-08-15
EP0172879B1 (en) 1989-05-24
AU564114B2 (en) 1987-07-30
DE3570546D1 (en) 1989-06-29
IL74219A (en) 1988-04-29
WO1985003798A1 (en) 1985-08-29
NO166986C (no) 1991-09-18
DK401885A (da) 1985-09-03
AU3939085A (en) 1985-09-10
DK163392B (da) 1992-02-24
ATE43452T1 (de) 1989-06-15
IN162453B (es) 1988-05-28
IT8547694A0 (it) 1985-02-15

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 20000601