ES8204209A1 - Una instalacion de memoria mejorada de transistor de efecto de campo - Google Patents

Una instalacion de memoria mejorada de transistor de efecto de campo

Info

Publication number
ES8204209A1
ES8204209A1 ES502489A ES502489A ES8204209A1 ES 8204209 A1 ES8204209 A1 ES 8204209A1 ES 502489 A ES502489 A ES 502489A ES 502489 A ES502489 A ES 502489A ES 8204209 A1 ES8204209 A1 ES 8204209A1
Authority
ES
Spain
Prior art keywords
floating gate
disposed
gate
control
cells
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES502489A
Other languages
English (en)
Other versions
ES502489A0 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of ES502489A0 publication Critical patent/ES502489A0/es
Publication of ES8204209A1 publication Critical patent/ES8204209A1/es
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
    • G11C16/0416—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a single floating gate transistor and no select transistor, e.g. UV EPROM
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/788—Field effect transistors with field effect produced by an insulated gate with floating gate
    • H01L29/7881—Programmable transistors with only two possible levels of programmation
    • H01L29/7882—Programmable transistors with only two possible levels of programmation charging by injection of carriers through a conductive insulator, e.g. Poole-Frankel conduction

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Non-Volatile Memory (AREA)
  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)

Abstract

INSTALACION DE MEMORIA O SISTEMA DE ALMACENAMIENTO DE RANSISTORES DE EFECTO DE CAMPO QUE PUEDE UTILIZARSE EN MEMORIAS FIJAS, PROGRAMABLES Y BORRABLES ELECTRICAMENTE, O EN MEMORIAS ESTABLES DE ACCESO ALEATORIO. CONSTA DE UN TRANSMISOR DE EFECTO DE CAMPO (10), QUE COMPRENDE UN ELECTRODO DE CONTROL FLOTANTE (22) Y UN PRIMER (26) Y SEGUNDO (30) ELECTRODOS DE CONTROL; DE UN INYECTOR DE CARGA (28) DISPUESTO ENTRE EL PRIMER ELECTRODO DE CONTROL (26) Y DICHO ELECTRODO DE CONTROL FLOTANTE (22); DE UN CONDENSADOR DISPUESTO ENTRE EL SEGUNDO ELECTRODO DE CONTROL (30) Y DICHO ELECTRODO DE CONTROL FLOTANTE (22), Y DE MEDIOS QUE APLICAN IMPULSOS DE CONTROL AL SEGUNDO ELECTRODO DE CONTROL (30) PARA CONTROLAR LA CARGA PRESENTE EN DICHO ELECTRODO DE CONTROL FLORANTE (22).
ES502489A 1980-05-27 1981-05-26 Una instalacion de memoria mejorada de transistor de efecto de campo Expired ES8204209A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/153,359 US4334292A (en) 1980-05-27 1980-05-27 Low voltage electrically erasable programmable read only memory

Publications (2)

Publication Number Publication Date
ES502489A0 ES502489A0 (es) 1982-04-01
ES8204209A1 true ES8204209A1 (es) 1982-04-01

Family

ID=22546878

Family Applications (1)

Application Number Title Priority Date Filing Date
ES502489A Expired ES8204209A1 (es) 1980-05-27 1981-05-26 Una instalacion de memoria mejorada de transistor de efecto de campo

Country Status (8)

Country Link
US (1) US4334292A (es)
EP (1) EP0040701B1 (es)
JP (1) JPS5710977A (es)
AU (1) AU540886B2 (es)
BR (1) BR8103000A (es)
CA (1) CA1149064A (es)
DE (1) DE3176835D1 (es)
ES (1) ES8204209A1 (es)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4380057A (en) * 1980-10-27 1983-04-12 International Business Machines Corporation Electrically alterable double dense memory
JPS57204172A (en) * 1981-06-08 1982-12-14 Ibm Field effect transistor
US4939559A (en) * 1981-12-14 1990-07-03 International Business Machines Corporation Dual electron injector structures using a conductive oxide between injectors
US4535349A (en) * 1981-12-31 1985-08-13 International Business Machines Corporation Non-volatile memory cell using a crystalline storage element with capacitively coupled sensing
JPS5960797A (ja) * 1982-09-30 1984-04-06 Toshiba Corp 不揮発性半導体メモリ装置
JPS59110215U (ja) * 1983-01-13 1984-07-25 サンデン株式会社 車輌用空気調和装置の制御回路
US4795719A (en) * 1984-05-15 1989-01-03 Waferscale Integration, Inc. Self-aligned split gate eprom process
US4868629A (en) * 1984-05-15 1989-09-19 Waferscale Integration, Inc. Self-aligned split gate EPROM
US4639893A (en) * 1984-05-15 1987-01-27 Wafer Scale Integration, Inc. Self-aligned split gate EPROM
JPS6113671A (ja) * 1984-06-25 1986-01-21 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション メモリのチヤ−ジ記憶構造
US4717943A (en) * 1984-06-25 1988-01-05 International Business Machines Charge storage structure for nonvolatile memories
US4665417A (en) * 1984-09-27 1987-05-12 International Business Machines Corporation Non-volatile dynamic random access memory cell
US4729115A (en) * 1984-09-27 1988-03-01 International Business Machines Corporation Non-volatile dynamic random access memory cell
JPS6180866A (ja) * 1984-09-27 1986-04-24 インタ−ナショナル　ビジネス　マシ−ンズ　コ−ポレ−ション 不揮発性半導体メモリ・セル
US4616245A (en) * 1984-10-29 1986-10-07 Ncr Corporation Direct-write silicon nitride EEPROM cell
US4665503A (en) * 1985-01-15 1987-05-12 Massachusetts Institute Of Technology Non-volatile memory devices
US4861976A (en) * 1988-06-06 1989-08-29 American Telephone And Telegraph Company, At&T Bell Laboratories Optical or opto-electronic device having a trapping layer in contact with a semiconductive layer
KR920001402B1 (ko) * 1988-11-29 1992-02-13 삼성전자 주식회사 불휘발성 반도체 기억소자
US5258095A (en) * 1989-01-20 1993-11-02 Fujitsu Limited Method for producing a device having an insulator sandwiched between two semiconductor layers
JPH0777240B2 (ja) * 1989-01-20 1995-08-16 富士通株式会社 半導体装置の製造方法
ATE101752T1 (de) * 1989-03-31 1994-03-15 Philips Nv Eprom, der eine mehrfache verwendung der bitleitungskontakte ermoeglicht.
US5122985A (en) * 1990-04-16 1992-06-16 Giovani Santin Circuit and method for erasing eeprom memory arrays to prevent over-erased cells
JPH05102438A (ja) * 1991-10-04 1993-04-23 Mitsubishi Electric Corp 不揮発性半導体記憶装置
US5138576A (en) * 1991-11-06 1992-08-11 Altera Corporation Method and apparatus for erasing an array of electrically erasable EPROM cells
US5359571A (en) * 1993-01-27 1994-10-25 Yu Shih Chiang Memory array having a plurality of address partitions
KR0149528B1 (ko) * 1994-05-25 1998-10-01 김주용 반도체 소자의 콘트롤 게이트 전극 형성방법
US5818082A (en) * 1996-03-04 1998-10-06 Advanced Micro Devices, Inc. E2 PROM device having erase gate in oxide isolation region in shallow trench and method of manufacture thereof
US5703809A (en) * 1996-10-01 1997-12-30 Microchip Technology Incorporated Overcharge/discharge voltage regulator for EPROM memory array
US7569882B2 (en) * 2003-12-23 2009-08-04 Interuniversitair Microelektronica Centrum (Imec) Non-volatile multibit memory cell and method of manufacturing thereof
US7092288B2 (en) 2004-02-04 2006-08-15 Atmel Corporation Non-volatile memory array with simultaneous write and erase feature
US7020020B1 (en) * 2004-09-21 2006-03-28 Atmel Corporation Low voltage non-volatile memory cells using twin bit line current sensing
US7414460B1 (en) 2006-03-31 2008-08-19 Integrated Device Technology, Inc. System and method for integrated circuit charge recycling

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3825946A (en) * 1971-01-15 1974-07-23 Intel Corp Electrically alterable floating gate device and method for altering same
US3972059A (en) * 1973-12-28 1976-07-27 International Business Machines Corporation Dielectric diode, fabrication thereof, and charge store memory therewith
JPS51117838A (en) * 1975-04-10 1976-10-16 Shindengen Electric Mfg Co Ltd Semiconductor memory device
US4161039A (en) * 1976-12-15 1979-07-10 Siemens Aktiengesellschaft N-Channel storage FET
US4104675A (en) * 1977-06-21 1978-08-01 International Business Machines Corporation Moderate field hole and electron injection from one interface of MIM or MIS structures
US4274012A (en) * 1979-01-24 1981-06-16 Xicor, Inc. Substrate coupled floating gate memory cell

Also Published As

Publication number Publication date
EP0040701A1 (en) 1981-12-02
ES502489A0 (es) 1982-04-01
US4334292A (en) 1982-06-08
AU7007581A (en) 1981-12-03
DE3176835D1 (en) 1988-09-08
EP0040701B1 (en) 1988-08-03
BR8103000A (pt) 1982-02-02
AU540886B2 (en) 1984-12-06
JPS5710977A (en) 1982-01-20
CA1149064A (en) 1983-06-28
JPH0130313B2 (es) 1989-06-19

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 19971201