ES2174123T3 - Puente de wheatstone con compensacion de gradiente de temperatura. - Google Patents

Puente de wheatstone con compensacion de gradiente de temperatura.

Info

Publication number
ES2174123T3
ES2174123T3 ES96941696T ES96941696T ES2174123T3 ES 2174123 T3 ES2174123 T3 ES 2174123T3 ES 96941696 T ES96941696 T ES 96941696T ES 96941696 T ES96941696 T ES 96941696T ES 2174123 T3 ES2174123 T3 ES 2174123T3
Authority
ES
Spain
Prior art keywords
same
wheatstone bridge
bridge
temperature gradient
bridges
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES96941696T
Other languages
English (en)
Inventor
Jean-Bernard Avisse
Jeanine Chiron
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Safran Aircraft Engines SAS
Original Assignee
Societe Nationale dEtude et de Construction de Moteurs dAviation SNECMA
SNECMA SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Societe Nationale dEtude et de Construction de Moteurs dAviation SNECMA, SNECMA SAS filed Critical Societe Nationale dEtude et de Construction de Moteurs dAviation SNECMA
Application granted granted Critical
Publication of ES2174123T3 publication Critical patent/ES2174123T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/20Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2268Arrangements for correcting or for compensating unwanted effects
    • G01L1/2281Arrangements for correcting or for compensating unwanted effects for temperature variations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/10AC or DC measuring bridges
    • G01R17/105AC or DC measuring bridges for measuring impedance or resistance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Force In General (AREA)
  • Measuring Fluid Pressure (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

LA TENSION DE SALIDA DE UN CIRCUITO ELECTRICO DEL TIPO PUENTE DE WHEATSTONE DOTADO DE CUATRO RESISTENCIAS PRINCIPALES (J 1 A J 4 ) DE MAS O MENOS EL MISMO VALOR OHMICO, R, Y EL MISMO COEFICIENTE DE TEMPERATURA DE RESISTENCIA, AL , SE HACE INSENSIBLE A LAS DIFERENCIAS DE TEMPERATURA EXISTENTES ENTRE LAS RAMAS DEL PUENTE MEDIANTE LA ADICION EN CADA UNA DE LAS RAMAS DE UN ELEMENTO DE COMPENSACION (R 1 A R 4 ) EN SERIE CON LA RESISTENCIA PRINCIPAL; CADA ELEMENTO DE COMPENSACION ESTA SITUADO FISICAMENTE MUY CERCA DE UNA RESISTENCIA PRINCIPAL SITUADA EN UNA DE LAS RAMAS ADYACENTES DEL PUENTE, A FIN DE PRESENTAR LA MISMA TEMPERATURA QUE ESTA. LOS ELEMENTOS DE COMPENSACION TIENEN EL MISMO VALOR OHMICO R Y EL MISMO CTR BE , CON R AL = R BE , SIENDO R INFERIOR A R, PREFERIBLEMENTE R/R 1/2, A FIN DE LIMITAR LA DISMINUCION DE SENSIBILIDAD DEL PUENTE DE WHEATSTONE.
ES96941696T 1995-12-04 1996-12-04 Puente de wheatstone con compensacion de gradiente de temperatura. Expired - Lifetime ES2174123T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9514295A FR2741951B1 (fr) 1995-12-04 1995-12-04 Pont de wheatstone avec compensation de gradient de temperature entre resistances principales du pont et application a un capteur de pression a jauges extensometriques

Publications (1)

Publication Number Publication Date
ES2174123T3 true ES2174123T3 (es) 2002-11-01

Family

ID=9485110

Family Applications (1)

Application Number Title Priority Date Filing Date
ES96941696T Expired - Lifetime ES2174123T3 (es) 1995-12-04 1996-12-04 Puente de wheatstone con compensacion de gradiente de temperatura.

Country Status (9)

Country Link
US (1) US6098464A (es)
EP (1) EP0866958B1 (es)
JP (1) JP2000515623A (es)
CN (1) CN1135377C (es)
CA (1) CA2238017C (es)
DE (1) DE69619858T2 (es)
ES (1) ES2174123T3 (es)
FR (1) FR2741951B1 (es)
WO (1) WO1997021083A1 (es)

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US6701790B2 (en) * 2002-06-13 2004-03-09 Mykrolis Corporation Temperature regulator for use with a pressure sensing device
JP2004205410A (ja) * 2002-12-26 2004-07-22 Takata Corp 荷重センサ及びシート重量計測装置
US6903561B2 (en) * 2003-04-08 2005-06-07 Delphi Technologies, Inc. Circuitry for measuring mechanical stress impressed on a printed circuit board
US6718830B1 (en) * 2003-05-20 2004-04-13 Honeywell International, Inc. Customized span compensation of SOI pressure sensor
US6888074B2 (en) * 2003-06-10 2005-05-03 The Flintec Group, Ltd. Compression column load cell
US7342185B2 (en) * 2003-06-10 2008-03-11 The Flintec Group, Ltd. Compression column load cell with compensation for off center loading errors
US7176698B2 (en) * 2003-10-10 2007-02-13 Primary Integration, Llc Voltage sensing device and associated method
EP2060884A1 (en) * 2006-09-05 2009-05-20 Ishida Co., Ltd. Load cell unit, weight checker, electronic weighting instrument, and weighting instrument
KR101460158B1 (ko) * 2008-11-20 2014-11-10 삼성전자주식회사 온도 변화에 강인한 휘스톤 브리지 최적화 장치 및 방법
DE102008054408A1 (de) * 2008-12-09 2010-06-10 Robert Bosch Gmbh Messbrücke, Messeinheit und drehbar gelagerter Spiegel
JP5718563B2 (ja) * 2009-11-03 2015-05-13 日本特殊陶業株式会社 圧力検出装置
WO2011128047A1 (en) * 2010-04-12 2011-10-20 Aktiebolaget Skf Load on object derived from natural-mode series modelling
CN101936791B (zh) * 2010-07-28 2011-11-16 四川蜀谷仪表科技有限公司 数字压力计
CN102226682A (zh) * 2011-03-29 2011-10-26 中国科学院电工研究所 一种用于聚变超导磁体的应变测量装置
JP5786884B2 (ja) 2012-04-23 2015-09-30 株式会社デンソー 磁気センサ
US9003897B2 (en) 2012-05-10 2015-04-14 Honeywell International Inc. Temperature compensated force sensor
JP6113581B2 (ja) 2013-06-12 2017-04-12 株式会社東芝 圧力センサ、音響マイク、血圧センサ及びタッチパネル
CN104236766B (zh) * 2013-06-13 2016-09-14 中国科学院上海微系统与信息技术研究所 封装应力与温漂自补偿的双悬浮式力敏传感器芯片及制备方法
US9429491B2 (en) * 2014-01-23 2016-08-30 Kulite Semiconductor Products, Inc. Compensating a sensor having thermal gradients
JP6316636B2 (ja) * 2014-03-31 2018-04-25 アズビル株式会社 角度センサの温度補償装置
US9714876B2 (en) * 2015-03-26 2017-07-25 Sensata Technologies, Inc. Semiconductor strain gauge
JP6835475B2 (ja) * 2015-07-08 2021-02-24 株式会社Soken 面圧センサ
DE102015222756A1 (de) * 2015-11-18 2017-05-18 Robert Bosch Gmbh Sensorelement für einen Drucksensor
US10101145B2 (en) * 2016-01-19 2018-10-16 Rosemount Aerospace Inc. Passive temperature error compensation for strain gauge pressure sensors
CN105975137B (zh) 2016-07-07 2020-11-03 上海天马微电子有限公司 一种触控显示面板及触控显示装置
CN106093513A (zh) * 2016-07-28 2016-11-09 富阳兴远仪器仪表经营部 一种能测量普通电阻、高阻、超高阻的电桥
CN107014401B (zh) * 2016-11-18 2019-12-31 清华四川能源互联网研究院 一种磁阻传感器温度补偿装置
CN106768217B (zh) * 2016-12-07 2019-02-19 锐马(福建)电气制造有限公司 一种应变式传感器温度补偿方法
JP7088067B2 (ja) 2019-02-15 2022-06-21 Tdk株式会社 圧力センサ
JP7139998B2 (ja) * 2019-02-25 2022-09-21 Tdk株式会社 圧力センサ
CN110864736B (zh) * 2019-11-22 2020-12-15 清华大学 柔性传感器应变及温度补偿方法和多感知集成传感器
CN111426413A (zh) * 2020-05-15 2020-07-17 罕王微电子(辽宁)有限公司 一种新型压力传感器及设计方法
CN111780658A (zh) * 2020-06-19 2020-10-16 北京科技大学 高能束粉床打印增材制造中零件变形实时测量装置及方法
CN111998976B (zh) * 2020-08-07 2022-03-25 维沃移动通信有限公司 压力传感器和电子设备
CN112484630B (zh) * 2020-12-09 2022-02-01 湖南启泰传感科技有限公司 一种薄膜电阻应变压力传感器及其布局优化方法
CN114720029B (zh) * 2022-03-11 2024-08-23 中国航发沈阳发动机研究所 一种多元拉杆结构的载荷测量装置及方法
CN115290293B (zh) * 2022-10-08 2022-12-13 中国航空工业集团公司沈阳空气动力研究所 降低轴向力测量元件零点温度效应的应变天平研制方法
CN115617188B (zh) * 2022-11-07 2023-05-23 荣耀终端有限公司 一种手写笔、手写笔的压感校准方法及设备系统

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US4174639A (en) * 1978-04-06 1979-11-20 American Chain & Cable Company, Inc. Bridge circuits
JPS57196124A (en) * 1981-05-27 1982-12-02 Toshiba Corp Load cell
US4444056A (en) * 1982-05-05 1984-04-24 Itt Corporation Temperature compensated circuit
US4565097A (en) * 1984-05-09 1986-01-21 Mark Telephone Products, Inc. Method and apparatus for transducer error cancellation
US4765188A (en) * 1986-11-24 1988-08-23 Bourns Instruments, Inc. Pressure transducer with integral digital temperature compensation
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JPH0412236A (ja) * 1990-04-28 1992-01-16 Nippon Seiki Co Ltd 歪抵抗装置
JPH04131721A (ja) * 1990-09-21 1992-05-06 Hitachi Constr Mach Co Ltd 応力センサ
JPH05256716A (ja) * 1992-03-13 1993-10-05 Mitsubishi Electric Corp 半導体装置
US5375474A (en) * 1992-08-12 1994-12-27 The United States Of America As Represented By The United States National Aeronautics And Space Administration Compensated high temperature strain gage
DE4227764A1 (de) * 1992-08-24 1994-03-03 Schenck Ag Carl Sensor zum Erfassen mechanischer Belastungen
JPH06148015A (ja) * 1992-11-05 1994-05-27 Toyota Motor Corp ブリッジ式センサ
JPH06167405A (ja) * 1992-11-27 1994-06-14 Omron Corp 圧力センサ
JPH06265427A (ja) * 1993-03-15 1994-09-22 Matsushita Electron Corp 半導体圧力変換器
JPH0783775A (ja) * 1993-09-14 1995-03-31 Toyoda Mach Works Ltd 半導体センサにおける温度補償回路
JPH07287033A (ja) * 1994-02-28 1995-10-31 Zexel Corp 抵抗ブリッジ回路の温度補償方法及び温度補償回路を備えた抵抗ブリッジ回路並びに加速度センサ
JP3365028B2 (ja) * 1994-03-14 2003-01-08 株式会社デンソー 圧力検出装置
JPH08136378A (ja) * 1994-11-07 1996-05-31 Tec Corp 薄膜ゲージ圧力計
ES2132628T3 (es) * 1994-12-02 1999-08-16 Getinge Ab Un metodo de compensacion de temperatura en sensores de presion.

Also Published As

Publication number Publication date
WO1997021083A1 (fr) 1997-06-12
CA2238017C (en) 2003-02-11
FR2741951A1 (fr) 1997-06-06
CA2238017A1 (en) 1997-06-12
JP2000515623A (ja) 2000-11-21
EP0866958B1 (fr) 2002-03-13
DE69619858D1 (de) 2002-04-18
FR2741951B1 (fr) 1998-02-20
US6098464A (en) 2000-08-08
DE69619858T2 (de) 2002-10-31
EP0866958A1 (fr) 1998-09-30
CN1203662A (zh) 1998-12-30
CN1135377C (zh) 2004-01-21

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