EP2104752A2 - Verfahren zur stabilisierung und funktionalisierung von porösen metallischen schichten - Google Patents
Verfahren zur stabilisierung und funktionalisierung von porösen metallischen schichtenInfo
- Publication number
- EP2104752A2 EP2104752A2 EP07821232A EP07821232A EP2104752A2 EP 2104752 A2 EP2104752 A2 EP 2104752A2 EP 07821232 A EP07821232 A EP 07821232A EP 07821232 A EP07821232 A EP 07821232A EP 2104752 A2 EP2104752 A2 EP 2104752A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- carbide
- silicide
- ceramic material
- oxide
- metallic matrix
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000000034 method Methods 0.000 title claims abstract description 26
- 230000000087 stabilizing effect Effects 0.000 title claims abstract description 5
- 239000011159 matrix material Substances 0.000 claims abstract description 64
- 229910010293 ceramic material Inorganic materials 0.000 claims abstract description 55
- 239000011148 porous material Substances 0.000 claims abstract description 32
- 239000002243 precursor Substances 0.000 claims abstract description 18
- 239000004065 semiconductor Substances 0.000 claims abstract description 12
- 239000000126 substance Substances 0.000 claims abstract description 6
- 239000000725 suspension Substances 0.000 claims description 25
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 11
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 10
- 229910021332 silicide Inorganic materials 0.000 claims description 8
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 claims description 8
- 239000000203 mixture Substances 0.000 claims description 7
- 239000002245 particle Substances 0.000 claims description 7
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N Iron oxide Chemical compound [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 claims description 6
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 6
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims description 6
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 6
- 239000000919 ceramic Substances 0.000 claims description 6
- 239000002904 solvent Substances 0.000 claims description 6
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 claims description 5
- 229910052697 platinum Inorganic materials 0.000 claims description 5
- 239000000377 silicon dioxide Substances 0.000 claims description 5
- 230000006641 stabilisation Effects 0.000 claims description 5
- 238000011105 stabilization Methods 0.000 claims description 5
- MRELNEQAGSRDBK-UHFFFAOYSA-N lanthanum(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[La+3].[La+3] MRELNEQAGSRDBK-UHFFFAOYSA-N 0.000 claims description 4
- -1 neobarbide Chemical compound 0.000 claims description 4
- 229910052758 niobium Inorganic materials 0.000 claims description 4
- 239000010955 niobium Substances 0.000 claims description 4
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims description 4
- 229910052715 tantalum Inorganic materials 0.000 claims description 4
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 4
- WEAMLHXSIBDPGN-UHFFFAOYSA-N (4-hydroxy-3-methylphenyl) thiocyanate Chemical compound CC1=CC(SC#N)=CC=C1O WEAMLHXSIBDPGN-UHFFFAOYSA-N 0.000 claims description 3
- INZDTEICWPZYJM-UHFFFAOYSA-N 1-(chloromethyl)-4-[4-(chloromethyl)phenyl]benzene Chemical compound C1=CC(CCl)=CC=C1C1=CC=C(CCl)C=C1 INZDTEICWPZYJM-UHFFFAOYSA-N 0.000 claims description 3
- QIJNJJZPYXGIQM-UHFFFAOYSA-N 1lambda4,2lambda4-dimolybdacyclopropa-1,2,3-triene Chemical compound [Mo]=C=[Mo] QIJNJJZPYXGIQM-UHFFFAOYSA-N 0.000 claims description 3
- 229910052582 BN Inorganic materials 0.000 claims description 3
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 claims description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 229910039444 MoC Inorganic materials 0.000 claims description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 3
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 3
- 229910026551 ZrC Inorganic materials 0.000 claims description 3
- OTCHGXYCWNXDOA-UHFFFAOYSA-N [C].[Zr] Chemical compound [C].[Zr] OTCHGXYCWNXDOA-UHFFFAOYSA-N 0.000 claims description 3
- TWRSDLOICOIGRH-UHFFFAOYSA-N [Si].[Si].[Hf] Chemical compound [Si].[Si].[Hf] TWRSDLOICOIGRH-UHFFFAOYSA-N 0.000 claims description 3
- VKTGMGGBYBQLGR-UHFFFAOYSA-N [Si].[V].[V].[V] Chemical compound [Si].[V].[V].[V] VKTGMGGBYBQLGR-UHFFFAOYSA-N 0.000 claims description 3
- 239000002253 acid Substances 0.000 claims description 3
- 239000000654 additive Substances 0.000 claims description 3
- 229910045601 alloy Inorganic materials 0.000 claims description 3
- 239000000956 alloy Substances 0.000 claims description 3
- CAVCGVPGBKGDTG-UHFFFAOYSA-N alumanylidynemethyl(alumanylidynemethylalumanylidenemethylidene)alumane Chemical compound [Al]#C[Al]=C=[Al]C#[Al] CAVCGVPGBKGDTG-UHFFFAOYSA-N 0.000 claims description 3
- LKTZODAHLMBGLG-UHFFFAOYSA-N alumanylidynesilicon;$l^{2}-alumanylidenesilylidenealuminum Chemical compound [Si]#[Al].[Si]#[Al].[Al]=[Si]=[Al] LKTZODAHLMBGLG-UHFFFAOYSA-N 0.000 claims description 3
- YXTPWUNVHCYOSP-UHFFFAOYSA-N bis($l^{2}-silanylidene)molybdenum Chemical compound [Si]=[Mo]=[Si] YXTPWUNVHCYOSP-UHFFFAOYSA-N 0.000 claims description 3
- 150000001875 compounds Chemical class 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- WHJFNYXPKGDKBB-UHFFFAOYSA-N hafnium;methane Chemical compound C.[Hf] WHJFNYXPKGDKBB-UHFFFAOYSA-N 0.000 claims description 3
- 229910003437 indium oxide Inorganic materials 0.000 claims description 3
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 claims description 3
- 229910052741 iridium Inorganic materials 0.000 claims description 3
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 claims description 3
- NFFIWVVINABMKP-UHFFFAOYSA-N methylidynetantalum Chemical compound [Ta]#C NFFIWVVINABMKP-UHFFFAOYSA-N 0.000 claims description 3
- 229910021344 molybdenum silicide Inorganic materials 0.000 claims description 3
- 229910052759 nickel Inorganic materials 0.000 claims description 3
- 150000004767 nitrides Chemical class 0.000 claims description 3
- 229910052762 osmium Inorganic materials 0.000 claims description 3
- SYQBFIAQOQZEGI-UHFFFAOYSA-N osmium atom Chemical compound [Os] SYQBFIAQOQZEGI-UHFFFAOYSA-N 0.000 claims description 3
- 229910052763 palladium Inorganic materials 0.000 claims description 3
- 230000000737 periodic effect Effects 0.000 claims description 3
- 229910052702 rhenium Inorganic materials 0.000 claims description 3
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 claims description 3
- 229910052703 rhodium Inorganic materials 0.000 claims description 3
- 239000010948 rhodium Substances 0.000 claims description 3
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 claims description 3
- 229910010271 silicon carbide Inorganic materials 0.000 claims description 3
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims description 3
- 229910052709 silver Inorganic materials 0.000 claims description 3
- 239000004332 silver Substances 0.000 claims description 3
- 238000004544 sputter deposition Methods 0.000 claims description 3
- 239000004094 surface-active agent Substances 0.000 claims description 3
- 229910003468 tantalcarbide Inorganic materials 0.000 claims description 3
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 claims description 3
- 229910001887 tin oxide Inorganic materials 0.000 claims description 3
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims description 3
- 229910021341 titanium silicide Inorganic materials 0.000 claims description 3
- MTPVUVINMAGMJL-UHFFFAOYSA-N trimethyl(1,1,2,2,2-pentafluoroethyl)silane Chemical compound C[Si](C)(C)C(F)(F)C(F)(F)F MTPVUVINMAGMJL-UHFFFAOYSA-N 0.000 claims description 3
- UONOETXJSWQNOL-UHFFFAOYSA-N tungsten carbide Chemical compound [W+]#[C-] UONOETXJSWQNOL-UHFFFAOYSA-N 0.000 claims description 3
- WQJQOUPTWCFRMM-UHFFFAOYSA-N tungsten disilicide Chemical compound [Si]#[W]#[Si] WQJQOUPTWCFRMM-UHFFFAOYSA-N 0.000 claims description 3
- 229910021342 tungsten silicide Inorganic materials 0.000 claims description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 3
- 239000011787 zinc oxide Substances 0.000 claims description 3
- 229910001928 zirconium oxide Inorganic materials 0.000 claims description 3
- 229910021355 zirconium silicide Inorganic materials 0.000 claims description 3
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 2
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 claims description 2
- 230000000996 additive effect Effects 0.000 claims description 2
- NWAIGJYBQQYSPW-UHFFFAOYSA-N azanylidyneindigane Chemical compound [In]#N NWAIGJYBQQYSPW-UHFFFAOYSA-N 0.000 claims description 2
- 229910000420 cerium oxide Inorganic materials 0.000 claims description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 2
- UNASZPQZIFZUSI-UHFFFAOYSA-N methylidyneniobium Chemical compound [Nb]#C UNASZPQZIFZUSI-UHFFFAOYSA-N 0.000 claims description 2
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 claims description 2
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 claims description 2
- 239000012266 salt solution Substances 0.000 claims description 2
- HYXGAEYDKFCVMU-UHFFFAOYSA-N scandium oxide Chemical compound O=[Sc]O[Sc]=O HYXGAEYDKFCVMU-UHFFFAOYSA-N 0.000 claims description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 2
- 238000007740 vapor deposition Methods 0.000 claims description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims 2
- XMZRAKATLVGICG-UHFFFAOYSA-K N(=O)[O-].[In+3].N(=O)[O-].N(=O)[O-] Chemical compound N(=O)[O-].[In+3].N(=O)[O-].N(=O)[O-] XMZRAKATLVGICG-UHFFFAOYSA-K 0.000 claims 1
- NHWNVPNZGGXQQV-UHFFFAOYSA-J [Si+4].[O-]N=O.[O-]N=O.[O-]N=O.[O-]N=O Chemical compound [Si+4].[O-]N=O.[O-]N=O.[O-]N=O.[O-]N=O NHWNVPNZGGXQQV-UHFFFAOYSA-J 0.000 claims 1
- QLJCFNUYUJEXET-UHFFFAOYSA-K aluminum;trinitrite Chemical compound [Al+3].[O-]N=O.[O-]N=O.[O-]N=O QLJCFNUYUJEXET-UHFFFAOYSA-K 0.000 claims 1
- 239000003960 organic solvent Substances 0.000 claims 1
- XOUPWBJVJFQSLK-UHFFFAOYSA-J titanium(4+);tetranitrite Chemical compound [Ti+4].[O-]N=O.[O-]N=O.[O-]N=O.[O-]N=O XOUPWBJVJFQSLK-UHFFFAOYSA-J 0.000 claims 1
- MCMNRKCIXSYSNV-UHFFFAOYSA-N ZrO2 Inorganic materials O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 16
- 239000011248 coating agent Substances 0.000 description 10
- 238000000576 coating method Methods 0.000 description 10
- 239000007789 gas Substances 0.000 description 9
- 229910052751 metal Inorganic materials 0.000 description 9
- 239000002184 metal Substances 0.000 description 9
- 239000000243 solution Substances 0.000 description 9
- 238000010438 heat treatment Methods 0.000 description 8
- 230000008569 process Effects 0.000 description 7
- 239000002105 nanoparticle Substances 0.000 description 5
- 238000005245 sintering Methods 0.000 description 5
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 4
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- 229920000642 polymer Polymers 0.000 description 4
- OERNJTNJEZOPIA-UHFFFAOYSA-N zirconium nitrate Chemical compound [Zr+4].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O OERNJTNJEZOPIA-UHFFFAOYSA-N 0.000 description 4
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 3
- 230000002378 acidificating effect Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000002923 metal particle Substances 0.000 description 3
- 150000003839 salts Chemical class 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 235000012239 silicon dioxide Nutrition 0.000 description 3
- 229910052684 Cerium Inorganic materials 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 2
- 150000007513 acids Chemical class 0.000 description 2
- 230000000274 adsorptive effect Effects 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910001593 boehmite Inorganic materials 0.000 description 2
- 230000003197 catalytic effect Effects 0.000 description 2
- ZMIGMASIKSOYAM-UHFFFAOYSA-N cerium Chemical compound [Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce] ZMIGMASIKSOYAM-UHFFFAOYSA-N 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 238000007306 functionalization reaction Methods 0.000 description 2
- FAHBNUUHRFUEAI-UHFFFAOYSA-M hydroxidooxidoaluminium Chemical compound O[Al]=O FAHBNUUHRFUEAI-UHFFFAOYSA-M 0.000 description 2
- 229910052738 indium Inorganic materials 0.000 description 2
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 229910052746 lanthanum Inorganic materials 0.000 description 2
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 2
- 229910052749 magnesium Inorganic materials 0.000 description 2
- 239000011777 magnesium Substances 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 239000002086 nanomaterial Substances 0.000 description 2
- 239000003495 polar organic solvent Substances 0.000 description 2
- ZGSOBQAJAUGRBK-UHFFFAOYSA-N propan-2-olate;zirconium(4+) Chemical compound [Zr+4].CC(C)[O-].CC(C)[O-].CC(C)[O-].CC(C)[O-] ZGSOBQAJAUGRBK-UHFFFAOYSA-N 0.000 description 2
- 238000000197 pyrolysis Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000001149 thermolysis Methods 0.000 description 2
- 229910052718 tin Inorganic materials 0.000 description 2
- 239000011135 tin Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910052727 yttrium Inorganic materials 0.000 description 2
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 239000011701 zinc Substances 0.000 description 2
- 229910052726 zirconium Inorganic materials 0.000 description 2
- HNSDLXPSAYFUHK-UHFFFAOYSA-N 1,4-bis(2-ethylhexyl) sulfosuccinate Chemical compound CCCCC(CC)COC(=O)CC(S(O)(=O)=O)C(=O)OCC(CC)CCCC HNSDLXPSAYFUHK-UHFFFAOYSA-N 0.000 description 1
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 206010010144 Completed suicide Diseases 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 150000001242 acetic acid derivatives Chemical class 0.000 description 1
- 125000005595 acetylacetonate group Chemical group 0.000 description 1
- 238000005054 agglomeration Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 230000001476 alcoholic effect Effects 0.000 description 1
- VXAUWWUXCIMFIM-UHFFFAOYSA-M aluminum;oxygen(2-);hydroxide Chemical compound [OH-].[O-2].[Al+3] VXAUWWUXCIMFIM-UHFFFAOYSA-M 0.000 description 1
- 229920001400 block copolymer Polymers 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 238000001354 calcination Methods 0.000 description 1
- BVKZGUZCCUSVTD-UHFFFAOYSA-N carbonic acid Chemical compound OC(O)=O BVKZGUZCCUSVTD-UHFFFAOYSA-N 0.000 description 1
- 150000004649 carbonic acid derivatives Chemical class 0.000 description 1
- 150000001732 carboxylic acid derivatives Chemical class 0.000 description 1
- 238000005234 chemical deposition Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000000084 colloidal system Substances 0.000 description 1
- 230000007850 degeneration Effects 0.000 description 1
- 229940028356 diethylene glycol monobutyl ether Drugs 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 229910052735 hafnium Inorganic materials 0.000 description 1
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 1
- 150000004820 halides Chemical class 0.000 description 1
- 238000005470 impregnation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 150000001247 metal acetylides Chemical class 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 239000013528 metallic particle Substances 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 150000002823 nitrates Chemical class 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 150000002902 organometallic compounds Chemical class 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- JCGNDDUYTRNOFT-UHFFFAOYSA-N oxolane-2,4-dione Chemical compound O=C1COC(=O)C1 JCGNDDUYTRNOFT-UHFFFAOYSA-N 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920001451 polypropylene glycol Polymers 0.000 description 1
- 229910052706 scandium Inorganic materials 0.000 description 1
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 description 1
- 238000004062 sedimentation Methods 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 150000005621 tetraalkylammonium salts Chemical class 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical compound [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 1
- 238000005019 vapor deposition process Methods 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C26/00—Coating not provided for in groups C23C2/00 - C23C24/00
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1204—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
- C23C18/1208—Oxides, e.g. ceramics
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1229—Composition of the substrate
- C23C18/1241—Metallic substrates
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/125—Process of deposition of the inorganic material
- C23C18/1254—Sol or sol-gel processing
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/125—Process of deposition of the inorganic material
- C23C18/1295—Process of deposition of the inorganic material with after-treatment of the deposited inorganic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C24/00—Coating starting from inorganic powder
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/403—Cells and electrode assemblies
- G01N27/414—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
Definitions
- the invention relates to a method for stabilizing and functionalizing porous metallic layers, wherein the porous metallic layer comprises a matrix with pores contained therein.
- porous metallic layers are used, for example, as gate electrodes of semiconductor transistors.
- Transistors with such a porous gate electrode can be used for example as gas sensors.
- the porous metallic gate electrode is produced, for example, by wet-chemical deposition of nanomaterials. Gate electrodes made of nanomaterials may exhibit advantageous properties in terms of stability, gas sensitivity, and response time as compared to metallizations produced in conventional semiconductor processes, for example, by vapor deposition or sputtering. However, especially at higher temperatures, the structures of such electrodes can also degenerate, thereby impairing the function of the sensor. The degeneration of the electrodes results, for example, from sintering processes and a structural enlargement.
- the electrochemical properties of the electrodes are determined by the selection of the metal and the interface material, for example, the semiconductor device.
- the method according to the invention for the stabilization and functionalization of porous metallic layers, wherein the porous metallic layer comprises a matrix with pores contained therein comprises the following steps: (a) introducing ceramic material or precursors of the ceramic material into the pores of the metallic matrix,
- Porous metallic layers produced according to the invention can be used, for example, as gate electrodes of semiconductor transistors which are used as chemosensitive components, for example as gas sensors.
- the material for the metallic layer is preferably selected from platinum, palladium, iridium, nickel, gold, silver, rhodium, copper, osmium, rhenium and alloys thereof.
- the type of metallic layer has a significant influence on the chemosensitive function.
- high porosity of the metallic layer promotes desired sensor functions such as high sensitivity and fast response time.
- the selection of the ceramic material which is introduced into the pores, the electrochemical properties, that is, the sensitivity, selectivity and the operating range of the sensor can be adjusted.
- suitable ceramic materials are the oxides, nitrides, carbides or suicides of magnesium, aluminum, silicon, indium, tin, zinc, iron, titanium, zirconium, scanidum, yttrium, lanthanum, cerium, boron, tungsten, vanadium, tantalum. Niobium, hafnium or molybdenum and the mixtures of these compounds.
- the ceramic material is preferably selected from the group consisting of aluminum oxide, silicon oxide, indium oxide, tin oxide, zinc oxide, iron oxide, titanium oxide, zirconium oxide, scandium oxide, yttrium oxide, lanthanum oxide, cerium oxide, aluminum nitride, silicon nitride, indium nitride, titanium nitride, boron nitride, aluminum silicide, tungsten silicide, Vanadium silicide, tantalum silicide, niobium silicide, zirconium silicide, hafnium silicide, molybdenum silicide, titanium silicide, silicon carbide, aluminum carbide, tungsten carbide, vanadium carbide, tantalum carbide, niobium carbide, zirconium carbide, hafnium carbide, molybdenum carbide and titanium carbide, as well as mixtures of these compounds
- the ceramic material also promotes the adsorptive and catalytic properties of the metal.
- the above-mentioned ceramic materials themselves have adsorptive or catalytic properties that can be utilized.
- the ceramic material is introduced into the pores of the matrix by a wet-chemical method.
- the ceramic material may in this case be in the form of nanoparticles, for example, which are dispersed in a liquid and applied as a suspension to the metallic matrix.
- the suspension contains at least one stabilizer additive. This stabilizes the nanocolloids in the suspension. Sedimentation or agglomeration of the colloids is thus restricted or prevented.
- Suitable solvents in which the ceramic nanocolloids are dispersed are, for example, water, alcohol or other polar organic solvents and mixtures thereof.
- Suitable additives for stabilizing the suspension are, for example, acids, diethylene glycol monobutyl ether or surfactants.
- Suitable acids are, for example, hydrochloric acid, acetic acid, nitric acid, oxalic acid and hydroxycarboxylic acid.
- Suitable surfactants are, for example, AOT (bis (2-ethyl-1-hexyl) sulfosuccinate), polyethylene oxide-polypropylene oxide block copolymers and tetraalkylammonium salts.
- the ceramic nanoparticles preferably have an average diameter in the range of 1 to 1000 nm. Preferably, the average diameter is in the range of 2 to 250 nm.
- precursors of the ceramic material are introduced into the pores of the metallic matrix, they are preferably introduced as a suspension or as a solution.
- a precursor of a ceramic which is incorporated as a suspension is, for example, boehmite, a hydroxyaluminum oxide AIO (OH).
- the boehmite is introduced into the cavities of the metallic matrix in the form of nanoparticles in an acidic suspension.
- a subsequent heat treatment at a temperature in the range between 300 and 500 0 C converts the AIO (OH) nanoparticles in sintered Al 2 O 3 .
- the precursors of the ceramic material are introduced as a solution into the pores of the metallic matrix.
- Suitable precursors of the ceramic material are preferably dissolved metal salts which are converted in step (b) into their corresponding metal oxides.
- salt solutions of magnesium, aluminum, silicon, indium, tin, zinc, iron, titanium, zirconium, scandium, yttrium, lanthanum or cerium are introduced into the metallic matrix.
- These salts may be, for example, nitrates, oxinitrates, halides, carbonates, acetylacetonates, acetates, carboxylic acid derivatives, alcoholates or organometallic compounds.
- the precursor is transferred to the actual ceramic. This is done for example by calcination at a temperature in the range between 250 and 650 0 C or by other methods of a chemical or physical nature, such as acidic or basic treatment, treatment with reactive plasma or low-temperature treatment, especially drying.
- the application of the solutions or the suspension is realized, for example, by dipping, spin-coating, dispensing or thick-film printing of a paste.
- a multiple coating is possible.
- the amount of the ceramic material can be adjusted independently of the concentration of the fluid.
- Schich- tabfolen different ceramic materials can be produced.
- the ceramic material or precursors of the ceramic material into the pores of the metallic matrix, for example by sputtering processes or by vapor deposition processes.
- FIG. 1 shows a schematic representation of a metallic matrix with pores contained therein
- FIG. 2 shows a metallic matrix with pores contained therein, wherein the pores are filled with ceramic material
- Figure 3 is a schematic representation of a metallic matrix with pores contained therein, which are filled with ceramic material, wherein the metallic matrix is additionally covered with ceramic material.
- FIG. 1 shows a metallic matrix with cavities contained therein.
- a porous structure 1 contains a metallic matrix 3, in which pores 5 are formed. Through the pores 5 results in a sponge-like structure of the metallic matrix 3.
- a porous structure 1 as shown in Figure 1, is already known from the prior art.
- the metallic matrix 3 also contains at least one ceramic material in addition to the at least one metal.
- the metallic matrix 3 contains metal and ceramic material, it is necessary that the proportion of metal be so large as to ensure the electrical conductivity of the porous structure 1. This is particularly necessary when the porous structure 1 is used as a gate electrode for semiconductor transistors.
- metals of the 8th to 11th group of the Periodic Table of the Elements are preferably used. Particular preference is given to platinum, palladium, iridium, nickel, gold, silver, rhodium, copper, osmium, rhenium and alloys thereof.
- a suspension containing particles of the metallic material is applied to a carrier.
- the suspension also contains at least one organic component which can harden to a polymer matrix.
- the viscosity of the suspension can be adjusted.
- the application of the suspension takes place, for example, by dripping or printing. Any further, known to the expert Way to apply the suspension is also possible.
- the viscosity of the suspension is adjusted depending on the type of job.
- the suspension After the suspension has been applied, it is optionally pre-dried to remove the solvent. Furthermore, at least one organic component is cured to the polymer matrix. This is preferably also at elevated temperature. The particles of the metallic material are uniformly distributed in the polymer matrix. In a next step, the polymer matrix is removed. This is preferably done by a thermolysis or pyrolysis. Due to the temperatures which occur during the thermolysis or pyrolysis, the metallic particles which form the porous layer are sintered together. This creates a porous layer with evenly distributed pores.
- the metallic matrix 3 with the pores formed therein in any other manner known to those skilled in the art.
- the metal particles of the metallic matrix 3 may converge on an oxide surface.
- the oxidic surface is generally the surface of the semiconductor transistor on which the gate electrode is formed.
- the stabilization takes place by introducing ceramic material into the pores 5 of the metallic matrix 3. This is shown in FIG.
- the ceramic material 7 is, for example, introduced into the pores 5 by a wet-chemical method, as already described above.
- the ceramic material 7 is dispersed in a solvent and the suspension is applied to the porous structure 1.
- the suspension also penetrates into the pores 5 of the metallic matrix 3.
- a heat treatment is performed in which the ceramic material is sintered to the metallic matrix 3.
- the metallic matrix 3 and thus the porous structure 1 is stabilized.
- the sintering the ceramic material 7 in the pores 5 of the metallic matrix 3 the sintering paths of the metallic matrix 3 are closed. As a result, the convergence of metal particles observed in particular at relatively high temperatures is prevented or restricted.
- the ceramic material 7 can also be applied initially in the form of its precursors as a suspension or in solution to the metallic matrix 3.
- the precursors may be present on the one hand, for example, as nanoparticles or, on the other hand, may be dissolved in the form of the corresponding metal salts in a solvent.
- the heat treatment is carried out, for example, at a temperature in the range of 250 to 650 ° C. It is possible that the heat treatment lasts up to several hours.
- a coating 9 containing the ceramic material 7 is also possible for a coating 9 containing the ceramic material 7 to be applied to the metallic matrix 3. Also by the coating 9, which is applied to the metallic matrix 3, the metallic matrix 3 and thus the porous structure 1 is stabilized.
- the thickness of the coating 9 is generally in the range of 1 to 500 nm.
- the ceramic material 7 also gives a porous structure
- the metallic matrix 3 is also not sealed by the coating 9 or the filling of the pores 5 with the ceramic material 7 against surrounding gases.
- a 200 nm thick porous metallic matrix 23 of platinum with cavities 5 having a diameter in the range of approximately 5 to 500 nm is provided with a zirconium dioxide coating.
- a dilute alcoholic solution of zirconium tetraisopropoxide is added to the porous structure 1. This is followed by drying and heat treatment at 500 0 C in air. The zirconium tetraisopropoxide is converted to zirconia by the heat treatment.
- the cavities of the metallic matrix 3 are filled with zirconia.
- a coating 9 is produced on the metallic matrix 3 of zirconium dioxide.
- Example 2 Alternatively, to obtain a zirconia coating, it is also possible to use, for example, a dilute, acidic, aqueous-alcoholic solution of zirconium nitrate. In this case as well, the zirconium nitrate is converted into zirconia by the heat treatment.
- a layer of a dilute zirconia sol wherein the particle size of the zirconia particles is in the range between 2 and 50 nm, is applied to the metallic matrix 3 on platinum , then dried and burned out at 500 0 C in air.
- the zirconia sinters to the metallic matrix 3 and thus stabilizes the metallic matrix 3.
- tetraethyl orthosilicate is first dissolved in ethanol.
- the amount of tetraethyl orthosilicate is chosen to result in 1 wt% SiO 2 in the solution.
- This solution is pipetted onto the metallic matrix 3.
- the metallic matrix with the solution contained on it is heated to 250 0 C in the presence of air.
- the tetraethylorthosilicate is thereby converted into silicon dioxide.
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Abstract
Description
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE200610048906 DE102006048906A1 (de) | 2006-10-17 | 2006-10-17 | Verfahren zur Stabilisierung und Funktionalisierung von porösen metallischen Schichten |
| PCT/EP2007/060865 WO2008046785A2 (de) | 2006-10-17 | 2007-10-12 | Verfahren zur stabilisierung und funktionalisierung von porösen metallischen schichten |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP2104752A2 true EP2104752A2 (de) | 2009-09-30 |
Family
ID=39183155
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP07821232A Withdrawn EP2104752A2 (de) | 2006-10-17 | 2007-10-12 | Verfahren zur stabilisierung und funktionalisierung von porösen metallischen schichten |
Country Status (5)
| Country | Link |
|---|---|
| EP (1) | EP2104752A2 (de) |
| JP (1) | JP2010507018A (de) |
| CN (1) | CN101535526A (de) |
| DE (1) | DE102006048906A1 (de) |
| WO (1) | WO2008046785A2 (de) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102010001624A1 (de) | 2010-02-05 | 2011-08-11 | Robert Bosch GmbH, 70469 | Verfahren zur Detektion von zwei oder mehr Gasspezies |
| DE102010038725A1 (de) | 2010-07-30 | 2012-02-02 | Robert Bosch Gmbh | Vorrichtung und Verfahren zur Gasdetektion |
| US20140242374A1 (en) * | 2013-02-22 | 2014-08-28 | Infineon Technologies Ag | Porous Metal Coating |
| CN103231185B (zh) * | 2013-04-03 | 2014-12-10 | 株洲宏大高分子材料有限公司 | 一种HFSi焊销及其制备方法 |
| KR20180104070A (ko) * | 2016-02-24 | 2018-09-19 | 다나카 기킨조쿠 고교 가부시키가이샤 | 가스 센서 전극 형성용 금속 페이스트 |
| CN106350058B (zh) * | 2016-08-22 | 2019-01-22 | 上海朗研光电科技有限公司 | 基于纳米多孔金的荧光增强基底的制备方法 |
| EP3296428B1 (de) * | 2016-09-16 | 2019-05-15 | ATOTECH Deutschland GmbH | Verfahren zur abscheidung eines metalls oder einer metallischen legierung auf einer oberfläche |
| CN112028652B (zh) * | 2020-09-10 | 2021-11-02 | 刘树峰 | 一种超硅粉胶泥复合材料及其制备方法 |
| CN115772662B (zh) * | 2022-11-24 | 2024-09-20 | 西北有色金属研究院 | 一种多孔钯膜的制备方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| BE792075A (fr) * | 1971-11-30 | 1973-05-29 | Union Carbide Corp | Elements metalliques poreux a revetement ceramique et leur procede de realisation |
| JPH0752736B2 (ja) * | 1985-10-02 | 1995-06-05 | 工業技術院長 | 化合物半導体装置の製造方法 |
| GB8606045D0 (en) * | 1986-03-12 | 1986-04-16 | Emi Plc Thorn | Gas sensitive device |
| JPS63128246A (ja) * | 1986-11-19 | 1988-05-31 | Seitai Kinou Riyou Kagakuhin Shinseizou Gijutsu Kenkyu Kumiai | 電界効果トランジスタ型酸素ガスセンサ |
| US5186833A (en) * | 1991-10-10 | 1993-02-16 | Exxon Research And Engineering Company | Composite metal-ceramic membranes and their fabrication |
| GB9226916D0 (en) * | 1992-12-24 | 1993-02-17 | Atomic Energy Authority Uk | Process for making ceramic membrane filters |
| JP3883646B2 (ja) * | 1997-02-14 | 2007-02-21 | 日本碍子株式会社 | 膜の形成方法と膜形成部品 |
| ATE326558T1 (de) * | 2001-08-30 | 2006-06-15 | Aktina Ltd | Verfahren zur herstellung poröser keramik-metall verbundwerkstoffe und dadurch erhaltene verbundwerkstoffe |
| JP4429145B2 (ja) * | 2004-11-16 | 2010-03-10 | キヤノン株式会社 | 半導体素子の製造方法 |
| JP4555116B2 (ja) * | 2005-02-18 | 2010-09-29 | 大日本印刷株式会社 | 積層体 |
| DE102006000886B3 (de) * | 2005-11-15 | 2007-05-31 | Atech Innovations Gmbh | Verfahren zur Herstellung eines keramikbeschichteten metallischen Trägersubstrates |
-
2006
- 2006-10-17 DE DE200610048906 patent/DE102006048906A1/de not_active Withdrawn
-
2007
- 2007-10-12 EP EP07821232A patent/EP2104752A2/de not_active Withdrawn
- 2007-10-12 JP JP2009532777A patent/JP2010507018A/ja active Pending
- 2007-10-12 CN CNA2007800388689A patent/CN101535526A/zh active Pending
- 2007-10-12 WO PCT/EP2007/060865 patent/WO2008046785A2/de not_active Ceased
Non-Patent Citations (1)
| Title |
|---|
| See references of WO2008046785A2 * |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2010507018A (ja) | 2010-03-04 |
| WO2008046785A3 (de) | 2009-05-07 |
| DE102006048906A1 (de) | 2008-04-30 |
| CN101535526A (zh) | 2009-09-16 |
| WO2008046785A2 (de) | 2008-04-24 |
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