EP0208894A2 - Spectromètre de masses à temps de vol avec Un réflecteur d'ions - Google Patents

Spectromètre de masses à temps de vol avec Un réflecteur d'ions Download PDF

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Publication number
EP0208894A2
EP0208894A2 EP86107585A EP86107585A EP0208894A2 EP 0208894 A2 EP0208894 A2 EP 0208894A2 EP 86107585 A EP86107585 A EP 86107585A EP 86107585 A EP86107585 A EP 86107585A EP 0208894 A2 EP0208894 A2 EP 0208894A2
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EP
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Prior art keywords
electrode
electrodes
reflector
brake
time
Prior art date
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Application number
EP86107585A
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German (de)
English (en)
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EP0208894B1 (fr
EP0208894A3 (en
Inventor
Rüdiger Dr. Frey
Edward William Prof. Dr. Schlag
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Bruker Biospin GmbH
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Bruker Analytische Messtechnik GmbH
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Publication of EP0208894A3 publication Critical patent/EP0208894A3/de
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/405—Time-of-flight spectrometers characterised by the reflectron, e.g. curved field, electrode shapes

Definitions

  • the invention relates to a time-of-flight mass spectrometer with an ion reflector which has a reflector electrode and two parallel brake electrodes which are arranged at a distance from it and define a braking field.
  • time-of-flight mass spectrometer is known from US Pat. No. 3,727,047.
  • a similar time-of-flight mass spectrometer is also described in DE-OS 34 28 944.
  • the ion reflector of these known time-of-flight mass spectrometers formed by grid electrodes has the purpose of time-of-flight differences compensate, which are due to different initial energies of the accelerated ions, thereby improving the mass resolving power of the spectrometer.
  • time-of-flight mass spectrometers provided with such an ion reflector do not yet meet the requirements with regard to sensitivity and resolving power, such as are to be placed on a device which is suitable as a general laboratory device and is also intended to allow mass spectrometric examinations for the not particularly specialized expert.
  • the invention is therefore based on the object of improving the known time-of-flight mass spectrometers so that they have improved resolution and sensitivity with a simple structure.
  • a focusing electrode is arranged between the rear brake electrode adjacent to the reflector electrode and the reflector electrode, which is designed as a grating-free ring diaphragm and is at a higher potential than the linear potential increase from the rear brake field electrode to the reflector electrode corresponds.
  • the brake electrodes In the previously known time-of-flight mass spectrometers, it was considered necessary to design the brake electrodes as a grid, because a very homogeneous electric field was regarded as necessary in order to ensure the same time focusing over the entire beam cross section. In fact, however, it has been found that the inhomogeneity caused by the focusing electrode can be set in such a way that both optimal temporal and optimal geometric focusing can be achieved. Such optimal conditions can also be achieved if the brake electrodes as well as the focusing electrode are designed as gridless ring diaphragms.
  • the design of the brake electrodes as grating-free ring diaphragms is not only possible, but rather also extremely advantageous, because it avoids expensive and highly sensitive components such as the grating and also avoids the transmission losses caused by such grating. Even if such grid electrodes have a transmittance as high as 80% for the ion beam, the ion beam suffers attenuation to 40% of the original intensity when passing through such grids four times, which leads to a corresponding loss of sensitivity.
  • the design of the brake electrodes as gridless ring diaphragms consequently achieves both a simplification and an increase in the sensitivity of the time-of-flight mass spectrometer.
  • the conscious generation of an inhomogeneous electric field in the area of the brake electrodes also offers the possibility of influencing the inhomogeneity of the electric field through the geometry of the brake electrodes. It has proven to be particularly advantageous if the front brake electrode has a larger hole diameter than the rear one.
  • the electrode potentials can be established in a known manner by the resistors of a voltage divider, by means of which the electrodes of the ion reflector which are adjacent to one another are electrically connected to one another.
  • the time-of-flight mass spectrometer shown schematically in FIG. 1 comprises an ion source 1 and a detector 2, which are connected to one another by flight paths 3, 4 forming an acute angle. In the area of the intersection of the two flight paths 3, 4 there is an ion reflector 5. All components are located within an evacuable housing 6.
  • the ion reflector 5 comprises two brake electrodes 7, 8, which are located at the entrance of the ion reflector 5 and of which the front brake electrode 7 delimits the flight routes 3, 4 in which the electric field has no gradient.
  • a focusing electrode 10 is arranged between the rear brake electrode 8 and the reflector electrode 9, which results in the formation of an inhomogeneous electric field that forms an electrostatic lens for geometrically focusing the ion beam onto the detector 2.
  • the two brake electrodes 17, 18 are designed as grid electrodes. Between the rear brake electrode 18 and the reflector electrode 19 formed by a flat plate there is the focusing electrode 20. The focusing electrode 20 is located between the focusing electrode 20 and the reflector electrode 19. There are two linearizing electrodes 21 and 22. The outer diameter of all electrodes is 200 mm.
  • the structure of the ion reflector is characterized by the following values:
  • the ion reflector shown in FIG. 3 has brake electrodes 27, 28 instead of the brake electrodes 17, 18, which are also designed as ring diaphragms. Furthermore, three linearizing electrodes 31, 32, 33 designed as ring diaphragms are arranged between the focusing electrode 30 and the reflector electrode, which is again designed as a closed plate. The following values apply to the electrodes of the ion reflector according to FIG. 3:
  • Both ion reflectors result in a perfect temporal and spatial focusing for an ion energy of 680 V, an angle of incidence of the ion trajectory of 4 ° and a length of the drift distance of 165 cm.
  • the course of the equipotential surfaces leading to focusing, which result in a lens effect, and the focusing effect on the ion beam are shown in FIGS. 2 and 3 by the potential lines 34 and the path lines 35, respectively.
  • This ion reflector comprises electrodes 41 to 46 in the form of ring diaphragms which are mounted on a carrier plate 48 by means of short ceramic tubes 49.
  • the carrier plate 48 with the .electrode system is arranged within a vacuum vessel 52 which has a pipe socket 53 for connecting a vacuum pump and a flange 54 for connecting the housing to the other components of the time-of-flight mass spectrometer.
  • the vacuum vessel 52 has, at the end opposite the flange 54, a carrier flange 51 to which the carrier plate 48 is fastened with the electrode system and which has vacuum feedthroughs 50 which allow defined potentials to be applied to the electrodes.
  • the vacuum feedthroughs 50 serve to apply a voltage to a voltage divider that is contra stands 47 is formed, each of which connects two of the adjacent electrodes 41 to 46.
  • the values of the resistors 47 are selected so that the potential distribution shown in the table below results.
  • This table also shows the internal diameter and the axis position of the electrodes. With an inner diameter of the vacuum vessel 52 of 200 mm, the outer diameter of the orifices here is 170 mm.
  • the desired temporal and spatial focus is again achieved for an ion energy of 680 eV, an ion beam incidence angle of 4 ° and a length of the drift distance of 165 cm.

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
EP86107585A 1985-07-10 1986-06-04 Spectromètre de masses à temps de vol avec Un réflecteur d'ions Expired - Lifetime EP0208894B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19853524536 DE3524536A1 (de) 1985-07-10 1985-07-10 Flugzeit-massenspektrometer mit einem ionenreflektor
DE3524536 1985-07-10

Publications (3)

Publication Number Publication Date
EP0208894A2 true EP0208894A2 (fr) 1987-01-21
EP0208894A3 EP0208894A3 (en) 1988-09-21
EP0208894B1 EP0208894B1 (fr) 1991-10-23

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ID=6275348

Family Applications (1)

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EP86107585A Expired - Lifetime EP0208894B1 (fr) 1985-07-10 1986-06-04 Spectromètre de masses à temps de vol avec Un réflecteur d'ions

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US (1) US4731532A (fr)
EP (1) EP0208894B1 (fr)
DE (2) DE3524536A1 (fr)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4742224A (en) * 1986-12-22 1988-05-03 American Telephone And Telegraph Company At&T Bell Laboratories Charged particle energy filter
US4810883A (en) * 1985-05-31 1989-03-07 Turner David W Device for providing an energy filtered charge particle image
EP0373550A2 (fr) * 1988-12-14 1990-06-20 Forschungszentrum Jülich Gmbh Spectromètre de masse à temps de vol à résolution et transmission élevées
DE10005698B4 (de) * 2000-02-09 2007-03-01 Bruker Daltonik Gmbh Gitterloses Reflektor-Flugzeitmassenspektrometer für orthogonalen Ioneneinschuss
DE102018122960A1 (de) 2017-09-28 2019-03-28 Bruker Daltonik Gmbh Breitbandig hohe Massenauflösungen in Reflektor-Flugzeitmassenspektrometern

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DE3726952A1 (de) * 1987-08-13 1989-02-23 Kutscher Roland Dipl Phys Ionenreflektoren mit neuen elektrodengeometrien zur zeit- und ortsfokussierung von ionenstrahlen
DE3920566A1 (de) * 1989-06-23 1991-01-10 Bruker Franzen Analytik Gmbh Ms-ms-flugzeit-massenspektrometer
GB8915972D0 (en) * 1989-07-12 1989-08-31 Kratos Analytical Ltd An ion mirror for a time-of-flight mass spectrometer
US5026988A (en) * 1989-09-19 1991-06-25 Vanderbilt University Method and apparatus for time of flight medium energy particle scattering
US5017780A (en) * 1989-09-20 1991-05-21 Roland Kutscher Ion reflector
US5070240B1 (en) * 1990-08-29 1996-09-10 Univ Brigham Young Apparatus and methods for trace component analysis
US5210412A (en) * 1991-01-31 1993-05-11 Wayne State University Method for analyzing an organic sample
US5168158A (en) * 1991-03-29 1992-12-01 The United States Of America As Represented By The United States Department Of Energy Linear electric field mass spectrometry
US5202563A (en) * 1991-05-16 1993-04-13 The Johns Hopkins University Tandem time-of-flight mass spectrometer
US5144127A (en) * 1991-08-02 1992-09-01 Williams Evan R Surface induced dissociation with reflectron time-of-flight mass spectrometry
US5160840A (en) * 1991-10-25 1992-11-03 Vestal Marvin L Time-of-flight analyzer and method
DE4442348C2 (de) * 1994-11-29 1998-08-27 Bruker Franzen Analytik Gmbh Verfahren und Vorrichtung zur verbesserten Massenauflösung eines Flugzeit-Massenspektrometers mit Ionenreflektor
US6002127A (en) * 1995-05-19 1999-12-14 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US5742049A (en) * 1995-12-21 1998-04-21 Bruker-Franzen Analytik Gmbh Method of improving mass resolution in time-of-flight mass spectrometry
US5814813A (en) * 1996-07-08 1998-09-29 The Johns Hopkins University End cap reflection for a time-of-flight mass spectrometer and method of using the same
US5955730A (en) * 1997-06-26 1999-09-21 Comstock, Inc. Reflection time-of-flight mass spectrometer
US6008491A (en) * 1997-10-15 1999-12-28 The United States Of America As Represented By The United States Department Of Energy Time-of-flight SIMS/MSRI reflectron mass analyzer and method
GB9802115D0 (en) 1998-01-30 1998-04-01 Shimadzu Res Lab Europe Ltd Time-of-flight mass spectrometer
US5969350A (en) * 1998-03-17 1999-10-19 Comstock, Inc. Maldi/LDI time-of-flight mass spectrometer
US5994695A (en) * 1998-05-29 1999-11-30 Hewlett-Packard Company Optical path devices for mass spectrometry
AU750860B2 (en) * 1998-09-23 2002-08-01 Agilent Technologies Australia (M) Pty Ltd Ion Optical system for a mass spectrometer
US6614021B1 (en) 1998-09-23 2003-09-02 Varian Australian Pty Ltd Ion optical system for a mass spectrometer
US6518569B1 (en) 1999-06-11 2003-02-11 Science & Technology Corporation @ Unm Ion mirror
DE19940932A1 (de) * 1999-08-27 2001-03-01 Alban Kellerbauer Einrichtung zur Transformation eines Primär-Ionenstrahls hoher Energie in einen Ionenstrahl niedriger Energie
US6744040B2 (en) 2001-06-13 2004-06-01 Bruker Daltonics, Inc. Means and method for a quadrupole surface induced dissociation quadrupole time-of-flight mass spectrometer
JP3797200B2 (ja) * 2001-11-09 2006-07-12 株式会社島津製作所 飛行時間型質量分析装置
DE10156604A1 (de) * 2001-11-17 2003-05-28 Bruker Daltonik Gmbh Raumwinkelfokussierender Reflektor für Flugzeitmassenspektrometer
US6888130B1 (en) 2002-05-30 2005-05-03 Marc Gonin Electrostatic ion trap mass spectrometers
US6818887B2 (en) * 2002-11-25 2004-11-16 DRäGERWERK AKTIENGESELLSCHAFT Reflector for a time-of-flight mass spectrometer
US7157701B2 (en) * 2004-05-20 2007-01-02 Mississippi State University Research And Technology Corporation Compact time-of-flight mass spectrometer
GB2426120A (en) * 2005-05-11 2006-11-15 Polaron Plc A reflectron for use in a three-dimensional atom probe
DE102008058144B4 (de) * 2008-11-20 2011-07-14 Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, 14109 Elektrostatischer Energieanalysator für geladene Teilchen, Spektrometer und Monochromator mit einem solchen Analysator
GB2476964A (en) 2010-01-15 2011-07-20 Anatoly Verenchikov Electrostatic trap mass spectrometer
EP2355129B1 (fr) 2010-01-29 2013-01-09 Helmholtz-Zentrum Geesthacht Zentrum für Material- und Küstenforschung GmbH Reflecteur pour un spectromètre de masse à temps de vol
CN103201821B (zh) * 2010-09-08 2015-08-26 株式会社岛津制作所 飞行时间型质量分析装置
CN103907171B (zh) 2011-10-28 2017-05-17 莱克公司 静电离子镜
EP2908329B1 (fr) * 2012-10-10 2022-01-12 Shimadzu Corporation Spectromètre de masse à temps de vol
GB2526450B (en) 2013-03-14 2021-08-04 Leco Corp Multi-reflecting mass spectrometer
GB201408392D0 (en) * 2014-05-12 2014-06-25 Shimadzu Corp Mass Analyser
GB201507363D0 (en) 2015-04-30 2015-06-17 Micromass Uk Ltd And Leco Corp Multi-reflecting TOF mass spectrometer
GB201520130D0 (en) 2015-11-16 2015-12-30 Micromass Uk Ltd And Leco Corp Imaging mass spectrometer
GB201520134D0 (en) 2015-11-16 2015-12-30 Micromass Uk Ltd And Leco Corp Imaging mass spectrometer
GB201520540D0 (en) 2015-11-23 2016-01-06 Micromass Uk Ltd And Leco Corp Improved ion mirror and ion-optical lens for imaging
GB201613988D0 (en) 2016-08-16 2016-09-28 Micromass Uk Ltd And Leco Corp Mass analyser having extended flight path
GB2567794B (en) 2017-05-05 2023-03-08 Micromass Ltd Multi-reflecting time-of-flight mass spectrometers
GB2563571B (en) 2017-05-26 2023-05-24 Micromass Ltd Time of flight mass analyser with spatial focussing
WO2019030475A1 (fr) 2017-08-06 2019-02-14 Anatoly Verenchikov Spectromètre de masse à multipassage
US11295944B2 (en) 2017-08-06 2022-04-05 Micromass Uk Limited Printed circuit ion mirror with compensation
EP3662501A1 (fr) 2017-08-06 2020-06-10 Micromass UK Limited Miroir ionique servant à des spectromètres de masse à réflexion multiple
WO2019030477A1 (fr) 2017-08-06 2019-02-14 Anatoly Verenchikov Accélérateur pour spectromètres de masse à passages multiples
US11081332B2 (en) 2017-08-06 2021-08-03 Micromass Uk Limited Ion guide within pulsed converters
CN111164731B (zh) 2017-08-06 2022-11-18 英国质谱公司 进入多通道质谱分析仪的离子注入
WO2019030473A1 (fr) 2017-08-06 2019-02-14 Anatoly Verenchikov Champs servant à des sm tof à réflexion multiple
GB201806507D0 (en) 2018-04-20 2018-06-06 Verenchikov Anatoly Gridless ion mirrors with smooth fields
GB201807605D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201807626D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB201810573D0 (en) 2018-06-28 2018-08-15 Verenchikov Anatoly Multi-pass mass spectrometer with improved duty cycle
GB201901411D0 (en) 2019-02-01 2019-03-20 Micromass Ltd Electrode assembly for mass spectrometer
CN112435914B (zh) * 2020-12-28 2024-10-11 安图实验仪器(郑州)有限公司 离子质量分析器

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4810883A (en) * 1985-05-31 1989-03-07 Turner David W Device for providing an energy filtered charge particle image
US4742224A (en) * 1986-12-22 1988-05-03 American Telephone And Telegraph Company At&T Bell Laboratories Charged particle energy filter
EP0373550A2 (fr) * 1988-12-14 1990-06-20 Forschungszentrum Jülich Gmbh Spectromètre de masse à temps de vol à résolution et transmission élevées
EP0373550A3 (fr) * 1988-12-14 1991-05-22 Forschungszentrum Jülich Gmbh Spectromètre de masse à temps de vol à résolution et transmission élevées
DE10005698B4 (de) * 2000-02-09 2007-03-01 Bruker Daltonik Gmbh Gitterloses Reflektor-Flugzeitmassenspektrometer für orthogonalen Ioneneinschuss
DE102018122960A1 (de) 2017-09-28 2019-03-28 Bruker Daltonik Gmbh Breitbandig hohe Massenauflösungen in Reflektor-Flugzeitmassenspektrometern

Also Published As

Publication number Publication date
DE3524536A1 (de) 1987-01-22
DE3682127D1 (de) 1991-11-28
EP0208894B1 (fr) 1991-10-23
EP0208894A3 (en) 1988-09-21
US4731532A (en) 1988-03-15

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