EP0208894A3 - Time-of-flight mass spectrometer with an ion reflector - Google Patents

Time-of-flight mass spectrometer with an ion reflector Download PDF

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Publication number
EP0208894A3
EP0208894A3 EP86107585A EP86107585A EP0208894A3 EP 0208894 A3 EP0208894 A3 EP 0208894A3 EP 86107585 A EP86107585 A EP 86107585A EP 86107585 A EP86107585 A EP 86107585A EP 0208894 A3 EP0208894 A3 EP 0208894A3
Authority
EP
European Patent Office
Prior art keywords
time
mass spectrometer
flight mass
ion reflector
reflector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP86107585A
Other languages
German (de)
Other versions
EP0208894B1 (en
EP0208894A2 (en
Inventor
Rudiger Dr. Frey
Edward William Prof. Dr. Schlag
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bruker Biospin GmbH
Original Assignee
Bruker Analytische Messtechnik GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=6275348&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=EP0208894(A3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Bruker Analytische Messtechnik GmbH filed Critical Bruker Analytische Messtechnik GmbH
Publication of EP0208894A2 publication Critical patent/EP0208894A2/en
Publication of EP0208894A3 publication Critical patent/EP0208894A3/en
Application granted granted Critical
Publication of EP0208894B1 publication Critical patent/EP0208894B1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/405—Time-of-flight spectrometers characterised by the reflectron, e.g. curved field, electrode shapes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
EP86107585A 1985-07-10 1986-06-04 Time-of-flight mass spectrometer with an ion reflector Expired - Lifetime EP0208894B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19853524536 DE3524536A1 (en) 1985-07-10 1985-07-10 FLIGHT TIME MASS SPECTROMETER WITH AN ION REFLECTOR
DE3524536 1985-07-10

Publications (3)

Publication Number Publication Date
EP0208894A2 EP0208894A2 (en) 1987-01-21
EP0208894A3 true EP0208894A3 (en) 1988-09-21
EP0208894B1 EP0208894B1 (en) 1991-10-23

Family

ID=6275348

Family Applications (1)

Application Number Title Priority Date Filing Date
EP86107585A Expired - Lifetime EP0208894B1 (en) 1985-07-10 1986-06-04 Time-of-flight mass spectrometer with an ion reflector

Country Status (3)

Country Link
US (1) US4731532A (en)
EP (1) EP0208894B1 (en)
DE (2) DE3524536A1 (en)

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EP0262129A1 (en) * 1985-05-31 1988-04-06 Kratos Analytical Limited Procedure and device for providing an energy filtered charged particle image
US4742224A (en) * 1986-12-22 1988-05-03 American Telephone And Telegraph Company At&T Bell Laboratories Charged particle energy filter
DE3726952A1 (en) * 1987-08-13 1989-02-23 Kutscher Roland Dipl Phys Ion reflectors having novel electrode geometries for temporal and spatial focusing of ion beams
DE3842044A1 (en) * 1988-12-14 1990-06-21 Forschungszentrum Juelich Gmbh FLIGHT TIME (MASS) SPECTROMETER WITH HIGH RESOLUTION AND TRANSMISSION
DE3920566A1 (en) * 1989-06-23 1991-01-10 Bruker Franzen Analytik Gmbh MS-MS FLIGHT TIME MASS SPECTROMETER
GB8915972D0 (en) * 1989-07-12 1989-08-31 Kratos Analytical Ltd An ion mirror for a time-of-flight mass spectrometer
US5026988A (en) * 1989-09-19 1991-06-25 Vanderbilt University Method and apparatus for time of flight medium energy particle scattering
US5017780A (en) * 1989-09-20 1991-05-21 Roland Kutscher Ion reflector
US5070240B1 (en) * 1990-08-29 1996-09-10 Univ Brigham Young Apparatus and methods for trace component analysis
US5210412A (en) * 1991-01-31 1993-05-11 Wayne State University Method for analyzing an organic sample
US5168158A (en) * 1991-03-29 1992-12-01 The United States Of America As Represented By The United States Department Of Energy Linear electric field mass spectrometry
US5202563A (en) * 1991-05-16 1993-04-13 The Johns Hopkins University Tandem time-of-flight mass spectrometer
US5144127A (en) * 1991-08-02 1992-09-01 Williams Evan R Surface induced dissociation with reflectron time-of-flight mass spectrometry
US5160840A (en) * 1991-10-25 1992-11-03 Vestal Marvin L Time-of-flight analyzer and method
DE4442348C2 (en) * 1994-11-29 1998-08-27 Bruker Franzen Analytik Gmbh Method and device for improved mass resolution of a time-of-flight mass spectrometer with ion reflector
US6002127A (en) * 1995-05-19 1999-12-14 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US5742049A (en) * 1995-12-21 1998-04-21 Bruker-Franzen Analytik Gmbh Method of improving mass resolution in time-of-flight mass spectrometry
US5814813A (en) * 1996-07-08 1998-09-29 The Johns Hopkins University End cap reflection for a time-of-flight mass spectrometer and method of using the same
US5955730A (en) * 1997-06-26 1999-09-21 Comstock, Inc. Reflection time-of-flight mass spectrometer
US6008491A (en) * 1997-10-15 1999-12-28 The United States Of America As Represented By The United States Department Of Energy Time-of-flight SIMS/MSRI reflectron mass analyzer and method
GB9802115D0 (en) 1998-01-30 1998-04-01 Shimadzu Res Lab Europe Ltd Time-of-flight mass spectrometer
US5969350A (en) * 1998-03-17 1999-10-19 Comstock, Inc. Maldi/LDI time-of-flight mass spectrometer
US5994695A (en) * 1998-05-29 1999-11-30 Hewlett-Packard Company Optical path devices for mass spectrometry
AU750860B2 (en) * 1998-09-23 2002-08-01 Agilent Technologies Australia (M) Pty Ltd Ion Optical system for a mass spectrometer
EP1116258B1 (en) * 1998-09-23 2015-12-09 Analytik Jena AG Ion optical system for a mass spectrometer
US6518569B1 (en) 1999-06-11 2003-02-11 Science & Technology Corporation @ Unm Ion mirror
DE19940932A1 (en) * 1999-08-27 2001-03-01 Alban Kellerbauer Transforming device for converting higher energy primary ion beam into lower energy ion beam has opening with radius that decreases with distance from entry point
DE10005698B4 (en) 2000-02-09 2007-03-01 Bruker Daltonik Gmbh Gridless reflector time-of-flight mass spectrometer for orthogonal ion injection
US6744040B2 (en) 2001-06-13 2004-06-01 Bruker Daltonics, Inc. Means and method for a quadrupole surface induced dissociation quadrupole time-of-flight mass spectrometer
JP3797200B2 (en) * 2001-11-09 2006-07-12 株式会社島津製作所 Time-of-flight mass spectrometer
DE10156604A1 (en) * 2001-11-17 2003-05-28 Bruker Daltonik Gmbh Spatial angle focusing reflector for flight time mass spectrometer has field between last annular aperture and terminating aperture made weaker than between preceding reflector apertures
US6888130B1 (en) 2002-05-30 2005-05-03 Marc Gonin Electrostatic ion trap mass spectrometers
US6818887B2 (en) * 2002-11-25 2004-11-16 DRäGERWERK AKTIENGESELLSCHAFT Reflector for a time-of-flight mass spectrometer
US7157701B2 (en) * 2004-05-20 2007-01-02 Mississippi State University Research And Technology Corporation Compact time-of-flight mass spectrometer
GB2426120A (en) * 2005-05-11 2006-11-15 Polaron Plc A reflectron for use in a three-dimensional atom probe
DE102008058144B4 (en) * 2008-11-20 2011-07-14 Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, 14109 Electrostatic energy analyzer for charged particles, spectrometer and monochromator with such an analyzer
GB2476964A (en) 2010-01-15 2011-07-20 Anatoly Verenchikov Electrostatic trap mass spectrometer
EP2355129B1 (en) 2010-01-29 2013-01-09 Helmholtz-Zentrum Geesthacht Zentrum für Material- und Küstenforschung GmbH Reflector for a time of flight mass spectrometer
JP5482905B2 (en) * 2010-09-08 2014-05-07 株式会社島津製作所 Time-of-flight mass spectrometer
CN103907171B (en) 2011-10-28 2017-05-17 莱克公司 Electrostatic ion mirrors
WO2014057777A1 (en) * 2012-10-10 2014-04-17 株式会社島津製作所 Time-of-flight mass spectrometer
JP6321132B2 (en) 2013-03-14 2018-05-09 レコ コーポレイションＬｅｃｏ Ｃｏｒｐｏｒａｔｉｏｎ Multiple reflection mass spectrometer
GB201408392D0 (en) * 2014-05-12 2014-06-25 Shimadzu Corp Mass Analyser
GB201507363D0 (en) 2015-04-30 2015-06-17 Micromass Uk Ltd And Leco Corp Multi-reflecting TOF mass spectrometer
GB201520134D0 (en) 2015-11-16 2015-12-30 Micromass Uk Ltd And Leco Corp Imaging mass spectrometer
GB201520130D0 (en) 2015-11-16 2015-12-30 Micromass Uk Ltd And Leco Corp Imaging mass spectrometer
GB201520540D0 (en) 2015-11-23 2016-01-06 Micromass Uk Ltd And Leco Corp Improved ion mirror and ion-optical lens for imaging
GB201613988D0 (en) 2016-08-16 2016-09-28 Micromass Uk Ltd And Leco Corp Mass analyser having extended flight path
GB2567794B (en) 2017-05-05 2023-03-08 Micromass Ltd Multi-reflecting time-of-flight mass spectrometers
GB2563571B (en) 2017-05-26 2023-05-24 Micromass Ltd Time of flight mass analyser with spatial focussing
US11817303B2 (en) 2017-08-06 2023-11-14 Micromass Uk Limited Accelerator for multi-pass mass spectrometers
US11205568B2 (en) 2017-08-06 2021-12-21 Micromass Uk Limited Ion injection into multi-pass mass spectrometers
US11049712B2 (en) 2017-08-06 2021-06-29 Micromass Uk Limited Fields for multi-reflecting TOF MS
WO2019030474A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov Printed circuit ion mirror with compensation
US11239067B2 (en) 2017-08-06 2022-02-01 Micromass Uk Limited Ion mirror for multi-reflecting mass spectrometers
WO2019030471A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov Ion guide within pulsed converters
WO2019030475A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov Multi-pass mass spectrometer
GB2568354B (en) 2017-09-28 2022-08-10 Bruker Daltonics Gmbh & Co Kg Wide-range high mass resolution in reflector time-of-flight mass spectrometers
GB201806507D0 (en) 2018-04-20 2018-06-06 Verenchikov Anatoly Gridless ion mirrors with smooth fields
GB201807626D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201807605D0 (en) 2018-05-10 2018-06-27 Micromass Ltd Multi-reflecting time of flight mass analyser
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB201810573D0 (en) 2018-06-28 2018-08-15 Verenchikov Anatoly Multi-pass mass spectrometer with improved duty cycle
GB201901411D0 (en) 2019-02-01 2019-03-20 Micromass Ltd Electrode assembly for mass spectrometer

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3423394A1 (en) * 1983-11-30 1985-06-05 Shimadzu Corp., Kyoto RUN TIME MASS SPECTROMETER

Family Cites Families (6)

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DE956450C (en) * 1953-11-25 1957-01-17 Tno mass spectrometry
US3727047A (en) * 1971-07-22 1973-04-10 Avco Corp Time of flight mass spectrometer comprising a reflecting means which equalizes time of flight of ions having same mass to charge ratio
US4072862A (en) * 1975-07-22 1978-02-07 Mamyrin Boris Alexandrovich Time-of-flight mass spectrometer
DE2540505A1 (en) * 1975-09-11 1977-03-24 Leybold Heraeus Gmbh & Co Kg FLIGHT TIME MASS SPECTROMETERS FOR IONS WITH DIFFERENT ENERGIES
DE3025764C2 (en) * 1980-07-08 1984-04-19 Hermann Prof. Dr. 6301 Fernwald Wollnik Time of flight mass spectrometer
US4611118A (en) * 1983-08-16 1986-09-09 Institut Kosmicheskish Issledovany Akademi Nauk Sss Time-of-flight ion mass analyzer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3423394A1 (en) * 1983-11-30 1985-06-05 Shimadzu Corp., Kyoto RUN TIME MASS SPECTROMETER

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
SOVIET PHYSICS TECHNICAL PHYSICS, Band 28, Nr. 10, Oktober 1983, Seiten 1250-1253, American Institute of Physics, New York, US; M.A. IVANOV et al.: "Mass reflectron for studying interaction between laser light and molecules in a supersonic gas jet" *

Also Published As

Publication number Publication date
EP0208894B1 (en) 1991-10-23
DE3682127D1 (en) 1991-11-28
EP0208894A2 (en) 1987-01-21
US4731532A (en) 1988-03-15
DE3524536A1 (en) 1987-01-22

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