DK0753745T3 - Reagensstyringsfremgangsmåde og apparat dertil - Google Patents

Reagensstyringsfremgangsmåde og apparat dertil

Info

Publication number
DK0753745T3
DK0753745T3 DK96110609T DK96110609T DK0753745T3 DK 0753745 T3 DK0753745 T3 DK 0753745T3 DK 96110609 T DK96110609 T DK 96110609T DK 96110609 T DK96110609 T DK 96110609T DK 0753745 T3 DK0753745 T3 DK 0753745T3
Authority
DK
Denmark
Prior art keywords
control method
reagent control
reagent
control
Prior art date
Application number
DK96110609T
Other languages
Danish (da)
English (en)
Inventor
Tomonori Mimura
Atsushi Takahashi
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of DK0753745T3 publication Critical patent/DK0753745T3/da

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • G01N35/00732Identification of carriers, materials or components in automatic analysers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00594Quality control, including calibration or testing of components of the analyser
    • G01N35/00613Quality control
    • G01N35/00663Quality control of consumables
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00594Quality control, including calibration or testing of components of the analyser
    • G01N35/00613Quality control
    • G01N35/00663Quality control of consumables
    • G01N2035/00673Quality control of consumables of reagents
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • G01N35/00732Identification of carriers, materials or components in automatic analysers
    • G01N2035/00742Type of codes
    • G01N2035/00752Type of codes bar codes
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00Chemistry: analytical and immunological testing
    • Y10T436/11Automated chemical analysis
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00Chemistry: analytical and immunological testing
    • Y10T436/11Automated chemical analysis
    • Y10T436/113332Automated chemical analysis with conveyance of sample along a test line in a container or rack
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00Chemistry: analytical and immunological testing
    • Y10T436/11Automated chemical analysis
    • Y10T436/115831Condition or time responsive

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
DK96110609T 1995-07-11 1996-07-01 Reagensstyringsfremgangsmåde og apparat dertil DK0753745T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17461695A JP3156550B2 (ja) 1995-07-11 1995-07-11 試薬管理の方法および装置

Publications (1)

Publication Number Publication Date
DK0753745T3 true DK0753745T3 (da) 2006-01-16

Family

ID=15981711

Family Applications (1)

Application Number Title Priority Date Filing Date
DK96110609T DK0753745T3 (da) 1995-07-11 1996-07-01 Reagensstyringsfremgangsmåde og apparat dertil

Country Status (7)

Country Link
US (1) US5719059A (de)
EP (1) EP0753745B1 (de)
JP (1) JP3156550B2 (de)
CN (1) CN1120371C (de)
DE (1) DE69635150T2 (de)
DK (1) DK0753745T3 (de)
TW (1) TW446821B (de)

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JP4484561B2 (ja) * 2004-03-26 2010-06-16 株式会社日立ハイテクノロジーズ 分析装置
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JP4832121B2 (ja) 2006-03-10 2011-12-07 シスメックス株式会社 分析システム
JP4871618B2 (ja) * 2006-03-14 2012-02-08 株式会社日立ハイテクノロジーズ 精度管理システム
CN101097222B (zh) * 2006-06-30 2012-08-29 希森美康株式会社 试样分析仪
CN101029898B (zh) * 2006-12-28 2011-01-12 郑州华芳科贸有限公司 测试杯转盘装置及全自动微量元素分析仪
JP5179890B2 (ja) * 2007-03-30 2013-04-10 シスメックス株式会社 試料分析装置
JP5244351B2 (ja) * 2007-09-13 2013-07-24 シスメックス株式会社 検体分析装置
EP2037281B1 (de) 2007-09-13 2018-10-10 Sysmex Corporation Probenanalysegerät
JP5379365B2 (ja) * 2007-09-18 2013-12-25 シスメックス株式会社 検体分析装置
JP2009074874A (ja) * 2007-09-19 2009-04-09 Sysmex Corp 検体分析用液体吸入装置および検体分析装置
JP5161547B2 (ja) * 2007-11-27 2013-03-13 株式会社東芝 自動分析装置
JP5669340B2 (ja) * 2008-01-23 2015-02-12 シスメックス株式会社 試料分析装置及び試料分析装置用プログラム
JP4659054B2 (ja) * 2008-02-27 2011-03-30 株式会社日立ハイテクノロジーズ 自動分析装置
JP5486160B2 (ja) * 2008-02-27 2014-05-07 シスメックス株式会社 検体分析装置及びその異常制御方法、並びに検体分析装置用プログラム
CN101556272B (zh) * 2008-04-11 2014-04-09 合世生医科技股份有限公司 生物感测仪及其数据传输的方法
JP2010019684A (ja) * 2008-07-10 2010-01-28 Olympus Corp 自動分析装置
JP5123111B2 (ja) * 2008-09-03 2013-01-16 株式会社東芝 自動分析装置
JP5280797B2 (ja) * 2008-10-27 2013-09-04 シスメックス株式会社 検体分析装置
JP5618489B2 (ja) * 2009-02-17 2014-11-05 シスメックス株式会社 分析装置、分析方法及びコンピュータプログラム
JP5355173B2 (ja) * 2009-03-27 2013-11-27 シスメックス株式会社 試薬調製装置および検体処理システム
EP2439539B1 (de) 2009-06-02 2019-05-01 Hitachi High-Technologies Corporation Automatische analysevorrichtung mit deaktivierung der auslesung von reagenzieninformationen
JP5587802B2 (ja) * 2010-03-30 2014-09-10 シスメックス株式会社 検体分析装置
JP5264851B2 (ja) * 2010-09-29 2013-08-14 シスメックス株式会社 自動分析装置及び試薬管理方法
JP5726239B2 (ja) * 2013-07-02 2015-05-27 シスメックス株式会社 検体分析装置及び検体分析装置用プログラム
JP6250967B2 (ja) * 2013-07-23 2017-12-20 東芝メディカルシステムズ株式会社 自動分析装置
JP2016125879A (ja) * 2014-12-26 2016-07-11 株式会社東芝 自動分析装置
CN107290560B (zh) * 2016-04-05 2022-08-30 深圳迈瑞生物医疗电子股份有限公司 用于多瓶试剂的试剂吸取方法、装置和样本分析仪
CN109690321B (zh) * 2016-09-16 2022-11-15 株式会社日立高新技术 自动分析装置、自动分析系统以及试剂清单的显示方法
JP7066344B2 (ja) * 2017-07-07 2022-05-13 キヤノンメディカルシステムズ株式会社 自動分析装置
CN107703319A (zh) * 2017-09-30 2018-02-16 深圳迈瑞生物医疗电子股份有限公司 生化分析仪的试剂余量管理方法及装置、生化分析仪、存储介质
CN111902722A (zh) * 2018-03-19 2020-11-06 凸版印刷株式会社 收容容器、试剂容器用盖材料、试剂容器及试剂盒
JP6843800B2 (ja) * 2018-06-19 2021-03-17 日本電子株式会社 自動分析装置、および自動分析方法
CN112639481A (zh) * 2018-10-26 2021-04-09 株式会社日立高新技术 自动分析装置
CN111239429A (zh) * 2018-11-29 2020-06-05 深圳迈瑞生物医疗电子股份有限公司 体外诊断仪、试剂管理装置及更换试剂的方法
WO2020175600A1 (ja) * 2019-02-28 2020-09-03 株式会社湯山製作所 薬箱払出装置
EP3933410B1 (de) * 2019-03-01 2023-08-16 Hitachi High-Tech Corporation Automatisierter analysator
JP7204878B2 (ja) * 2019-03-05 2023-01-16 株式会社日立ハイテク 自動分析装置および自動分析方法
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CN112858712B (zh) * 2019-11-28 2024-04-05 深圳市帝迈生物技术有限公司 试剂信息的导入方法、样本检测设备以及存储介质

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Also Published As

Publication number Publication date
US5719059A (en) 1998-02-17
EP0753745B1 (de) 2005-09-07
EP0753745A2 (de) 1997-01-15
DE69635150T2 (de) 2006-02-16
CN1153305A (zh) 1997-07-02
DE69635150D1 (de) 2005-10-13
CN1120371C (zh) 2003-09-03
EP0753745A3 (de) 1998-08-19
JP3156550B2 (ja) 2001-04-16
JPH0926425A (ja) 1997-01-28
TW446821B (en) 2001-07-21

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