DE69835951D1 - Zusammensetzung zur entfernung von rückständen bei der halbleiterherstellung auf basis von ethylendiamintetraessigsäure oder ihrem ammoniumsalz sowie verfahren - Google Patents
Zusammensetzung zur entfernung von rückständen bei der halbleiterherstellung auf basis von ethylendiamintetraessigsäure oder ihrem ammoniumsalz sowie verfahrenInfo
- Publication number
- DE69835951D1 DE69835951D1 DE69835951T DE69835951T DE69835951D1 DE 69835951 D1 DE69835951 D1 DE 69835951D1 DE 69835951 T DE69835951 T DE 69835951T DE 69835951 T DE69835951 T DE 69835951T DE 69835951 D1 DE69835951 D1 DE 69835951D1
- Authority
- DE
- Germany
- Prior art keywords
- composition
- residue
- substrate
- ethylenediamine
- ammonium salt
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title abstract 3
- 239000004065 semiconductor Substances 0.000 title abstract 2
- PIICEJLVQHRZGT-UHFFFAOYSA-N Ethylenediamine Chemical compound NCCN PIICEJLVQHRZGT-UHFFFAOYSA-N 0.000 title 1
- 239000002253 acid Substances 0.000 title 1
- 150000003863 ammonium salts Chemical class 0.000 title 1
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000000758 substrate Substances 0.000 abstract 5
- 229920002120 photoresistant polymer Polymers 0.000 abstract 3
- KCXVZYZYPLLWCC-UHFFFAOYSA-N EDTA Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O KCXVZYZYPLLWCC-UHFFFAOYSA-N 0.000 abstract 2
- UGJCNRLBGKEGEH-UHFFFAOYSA-N sodium-binding benzofuran isophthalate Chemical compound COC1=CC=2C=C(C=3C(=CC(=CC=3)C(O)=O)C(O)=O)OC=2C=C1N(CCOCC1)CCOCCOCCN1C(C(=CC=1C=2)OC)=CC=1OC=2C1=CC=C(C(O)=O)C=C1C(O)=O UGJCNRLBGKEGEH-UHFFFAOYSA-N 0.000 abstract 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 abstract 1
- 238000004140 cleaning Methods 0.000 abstract 1
- 239000008367 deionised water Substances 0.000 abstract 1
- 229910021641 deionized water Inorganic materials 0.000 abstract 1
- 238000005272 metallurgy Methods 0.000 abstract 1
- 150000004767 nitrides Chemical class 0.000 abstract 1
- 239000002798 polar solvent Substances 0.000 abstract 1
- 229910052719 titanium Inorganic materials 0.000 abstract 1
- 239000010936 titanium Substances 0.000 abstract 1
- 238000009870 titanium metallurgy Methods 0.000 abstract 1
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/08—Cleaning involving contact with liquid the liquid having chemical or dissolving effect
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D9/00—Chemical paint or ink removers
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- C11D3/2058—Dihydric alcohols aromatic
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- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76885—By forming conductive members before deposition of protective insulating material, e.g. pillars, studs
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/24—Mineral surfaces, e.g. stones, frescoes, plasters, walls or concretes
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Organic Chemistry (AREA)
- Wood Science & Technology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Health & Medical Sciences (AREA)
- Emergency Medicine (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Detergent Compositions (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US833382 | 1997-04-04 | ||
US08/833,382 US6492311B2 (en) | 1990-11-05 | 1997-04-04 | Ethyenediaminetetraacetic acid or its ammonium salt semiconductor process residue removal composition and process |
PCT/US1998/005150 WO1998045399A1 (en) | 1997-04-04 | 1998-03-17 | Ethylenediaminetetraacetic acid or its ammonium salt semiconductor process residue removal composition and process |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69835951D1 true DE69835951D1 (de) | 2006-11-02 |
DE69835951T2 DE69835951T2 (de) | 2007-06-14 |
Family
ID=25264284
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69835951T Expired - Lifetime DE69835951T2 (de) | 1997-04-04 | 1998-03-17 | Zusammensetzung zur entfernung von rückständen bei der halbleiterherstellung auf basis von ethylendiamintetraessigsäure oder ihrem ammoniumsalz sowie verfahren |
Country Status (9)
Country | Link |
---|---|
US (2) | US6492311B2 (de) |
EP (1) | EP0975731B1 (de) |
JP (1) | JP4138891B2 (de) |
KR (1) | KR100386137B1 (de) |
AT (1) | ATE340243T1 (de) |
DE (1) | DE69835951T2 (de) |
SG (1) | SG120055A1 (de) |
TW (1) | TW416984B (de) |
WO (1) | WO1998045399A1 (de) |
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US20040134873A1 (en) * | 1996-07-25 | 2004-07-15 | Li Yao | Abrasive-free chemical mechanical polishing composition and polishing process containing same |
US6896826B2 (en) * | 1997-01-09 | 2005-05-24 | Advanced Technology Materials, Inc. | Aqueous cleaning composition containing copper-specific corrosion inhibitor for cleaning inorganic residues on semiconductor substrate |
US6231677B1 (en) * | 1998-02-27 | 2001-05-15 | Kanto Kagaku Kabushiki Kaisha | Photoresist stripping liquid composition |
JP3328250B2 (ja) | 1998-12-09 | 2002-09-24 | 岸本産業株式会社 | レジスト残渣除去剤 |
US6828289B2 (en) * | 1999-01-27 | 2004-12-07 | Air Products And Chemicals, Inc. | Low surface tension, low viscosity, aqueous, acidic compositions containing fluoride and organic, polar solvents for removal of photoresist and organic and inorganic etch residues at room temperature |
US6592433B2 (en) * | 1999-12-31 | 2003-07-15 | Intel Corporation | Method for defect reduction |
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KR20010113396A (ko) * | 2000-06-19 | 2001-12-28 | 주식회사 동진쎄미켐 | 암모늄 플로라이드를 함유하는 포토레지스트 리무버 조성물 |
US7456140B2 (en) * | 2000-07-10 | 2008-11-25 | Ekc Technology, Inc. | Compositions for cleaning organic and plasma etched residues for semiconductor devices |
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US20030022800A1 (en) * | 2001-06-14 | 2003-01-30 | Peters Darryl W. | Aqueous buffered fluoride-containing etch residue removers and cleaners |
KR100569533B1 (ko) * | 2001-10-25 | 2006-04-07 | 주식회사 하이닉스반도체 | 포토레지스트 세정용 조성물 |
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CN1659480A (zh) * | 2002-06-07 | 2005-08-24 | 马林克罗特贝克公司 | 用于微电子基底的清洁组合物 |
US20040050406A1 (en) * | 2002-07-17 | 2004-03-18 | Akshey Sehgal | Compositions and method for removing photoresist and/or resist residue at pressures ranging from ambient to supercritical |
KR100503231B1 (ko) * | 2002-10-22 | 2005-07-22 | 주식회사 엘지화학 | 반도체 및 tft-lcd용 세정제 조성물 |
US20040157759A1 (en) * | 2003-02-07 | 2004-08-12 | Buckeye International, Inc. | Stripper formulations and process |
US7192489B2 (en) * | 2003-05-01 | 2007-03-20 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method for polymer residue removal following metal etching |
GB2401604A (en) * | 2003-05-10 | 2004-11-17 | Reckitt Benckiser Nv | Water-softening product |
JP4142982B2 (ja) * | 2003-05-13 | 2008-09-03 | 株式会社Pfu | 画像読み取り装置 |
US7427361B2 (en) * | 2003-10-10 | 2008-09-23 | Dupont Air Products Nanomaterials Llc | Particulate or particle-bound chelating agents |
US7344988B2 (en) * | 2003-10-27 | 2008-03-18 | Dupont Air Products Nanomaterials Llc | Alumina abrasive for chemical mechanical polishing |
TWI362415B (en) * | 2003-10-27 | 2012-04-21 | Wako Pure Chem Ind Ltd | Novel detergent and method for cleaning |
US7419911B2 (en) * | 2003-11-10 | 2008-09-02 | Ekc Technology, Inc. | Compositions and methods for rapidly removing overfilled substrates |
US8338087B2 (en) * | 2004-03-03 | 2012-12-25 | Advanced Technology Materials, Inc | Composition and process for post-etch removal of photoresist and/or sacrificial anti-reflective material deposited on a substrate |
US8178482B2 (en) * | 2004-08-03 | 2012-05-15 | Avantor Performance Materials, Inc. | Cleaning compositions for microelectronic substrates |
US20060094612A1 (en) * | 2004-11-04 | 2006-05-04 | Mayumi Kimura | Post etch cleaning composition for use with substrates having aluminum |
KR101050953B1 (ko) * | 2004-12-30 | 2011-07-20 | 매그나칩 반도체 유한회사 | 티타늄 또는 탄탈륨계 폴리머 제거방법 |
KR101088568B1 (ko) * | 2005-04-19 | 2011-12-05 | 아반토르 퍼포먼스 머티리얼스, 인크. | 갈바닉 부식을 억제하는 비수성 포토레지스트 스트립퍼 |
CN100409416C (zh) * | 2005-12-06 | 2008-08-06 | 上海华虹Nec电子有限公司 | 消除金属连线上铜颗粒的方法 |
TW200927998A (en) * | 2007-09-06 | 2009-07-01 | Ekc Technology Inc | Compositions and method for treating a copper surface |
DE102007058829A1 (de) * | 2007-12-06 | 2009-06-10 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Textur- und Reinigungsmedium zur Oberflächenbehandlung von Wafern und dessen Verwendung |
US8101231B2 (en) | 2007-12-07 | 2012-01-24 | Cabot Corporation | Processes for forming photovoltaic conductive features from multiple inks |
SG173833A1 (en) | 2009-02-25 | 2011-09-29 | Avantor Performance Mat Inc | Stripping compositions for cleaning ion implanted photoresist from semiconductor device wafers |
JP5646882B2 (ja) * | 2009-09-30 | 2014-12-24 | 富士フイルム株式会社 | 洗浄組成物、洗浄方法、及び半導体装置の製造方法 |
US8101561B2 (en) | 2009-11-17 | 2012-01-24 | Wai Mun Lee | Composition and method for treating semiconductor substrate surface |
FR2965567B1 (fr) * | 2010-10-05 | 2013-12-27 | Arkema France | Composition de nettoyage de polymeres |
KR101922625B1 (ko) | 2012-07-03 | 2018-11-28 | 삼성디스플레이 주식회사 | 금속 배선 식각액 및 이를 이용한 금속 배선 형성 방법 |
US10233413B2 (en) * | 2015-09-23 | 2019-03-19 | Versum Materials Us, Llc | Cleaning formulations |
US20220380705A1 (en) * | 2019-09-27 | 2022-12-01 | Versum Materials Us, Llc | Composition For Removing Etch Residues, Methods Of Using And Use Thereof |
US11584900B2 (en) | 2020-05-14 | 2023-02-21 | Corrosion Innovations, Llc | Method for removing one or more of: coating, corrosion, salt from a surface |
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-
1997
- 1997-04-04 US US08/833,382 patent/US6492311B2/en not_active Expired - Fee Related
-
1998
- 1998-03-17 JP JP54278298A patent/JP4138891B2/ja not_active Expired - Fee Related
- 1998-03-17 SG SG200108124A patent/SG120055A1/en unknown
- 1998-03-17 EP EP98911697A patent/EP0975731B1/de not_active Expired - Lifetime
- 1998-03-17 WO PCT/US1998/005150 patent/WO1998045399A1/en active IP Right Grant
- 1998-03-17 AT AT98911697T patent/ATE340243T1/de not_active IP Right Cessation
- 1998-03-17 DE DE69835951T patent/DE69835951T2/de not_active Expired - Lifetime
- 1998-03-17 KR KR19997009102A patent/KR100386137B1/ko not_active IP Right Cessation
- 1998-03-23 TW TW087104387A patent/TW416984B/zh not_active IP Right Cessation
-
2000
- 2000-08-10 US US09/635,650 patent/US6367486B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20010006936A1 (en) | 2001-07-05 |
JP4138891B2 (ja) | 2008-08-27 |
SG120055A1 (en) | 2006-03-28 |
KR20010006024A (ko) | 2001-01-15 |
US6367486B1 (en) | 2002-04-09 |
KR100386137B1 (ko) | 2003-06-09 |
EP0975731B1 (de) | 2006-09-20 |
EP0975731A1 (de) | 2000-02-02 |
EP0975731A4 (de) | 2001-02-07 |
ATE340243T1 (de) | 2006-10-15 |
US6492311B2 (en) | 2002-12-10 |
WO1998045399A1 (en) | 1998-10-15 |
TW416984B (en) | 2001-01-01 |
JP2001526836A (ja) | 2001-12-18 |
DE69835951T2 (de) | 2007-06-14 |
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