DE69605718T2 - Völlig selbstjustierter Submikrometer-Bipolartransistor mit einem Heteroübergang und Verfahren zu dessen Herstellung - Google Patents
Völlig selbstjustierter Submikrometer-Bipolartransistor mit einem Heteroübergang und Verfahren zu dessen HerstellungInfo
- Publication number
- DE69605718T2 DE69605718T2 DE69605718T DE69605718T DE69605718T2 DE 69605718 T2 DE69605718 T2 DE 69605718T2 DE 69605718 T DE69605718 T DE 69605718T DE 69605718 T DE69605718 T DE 69605718T DE 69605718 T2 DE69605718 T2 DE 69605718T2
- Authority
- DE
- Germany
- Prior art keywords
- submicrometer
- heterojunction
- aligned
- manufacture
- bipolar transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66234—Bipolar junction transistors [BJT]
- H01L29/6631—Bipolar junction transistors [BJT] with an active layer made of a group 13/15 material
- H01L29/66318—Heterojunction transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/73—Bipolar junction transistors
- H01L29/737—Hetero-junction transistors
- H01L29/7371—Vertical transistors
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/942—Masking
- Y10S438/944—Shadow
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Bipolar Transistors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/470,811 US5665614A (en) | 1995-06-06 | 1995-06-06 | Method for making fully self-aligned submicron heterojunction bipolar transistor |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69605718D1 DE69605718D1 (de) | 2000-01-27 |
DE69605718T2 true DE69605718T2 (de) | 2000-07-27 |
Family
ID=23869149
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69605718T Expired - Fee Related DE69605718T2 (de) | 1995-06-06 | 1996-05-30 | Völlig selbstjustierter Submikrometer-Bipolartransistor mit einem Heteroübergang und Verfahren zu dessen Herstellung |
Country Status (4)
Country | Link |
---|---|
US (2) | US5665614A (de) |
EP (1) | EP0747964B1 (de) |
JP (1) | JPH09102504A (de) |
DE (1) | DE69605718T2 (de) |
Families Citing this family (56)
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TW347597B (en) * | 1994-01-31 | 1998-12-11 | Mitsubishi Chem Corp | Method of forming a groove in a semiconductor laser diode and a semiconductor laser diode |
US5939738A (en) * | 1995-10-25 | 1999-08-17 | Texas Instruments Incorporated | Low base-resistance bipolar transistor |
US5736417A (en) * | 1996-05-13 | 1998-04-07 | Trw Inc. | Method of fabricating double photoresist layer self-aligned heterojunction bipolar transistor |
KR100257192B1 (ko) | 1998-01-26 | 2000-05-15 | 구자홍 | 이종접합 바이폴라 트랜지스터 |
US6379981B2 (en) * | 1998-03-27 | 2002-04-30 | Micron Technology, Inc. | Methods incorporating detectable atoms into etching processes |
JP3628873B2 (ja) * | 1998-04-28 | 2005-03-16 | 富士通株式会社 | 半導体装置及びその製造方法 |
US5907165A (en) * | 1998-05-01 | 1999-05-25 | Lucent Technologies Inc. | INP heterostructure devices |
JP2000021895A (ja) * | 1998-07-02 | 2000-01-21 | Sharp Corp | 半導体装置及びその製造方法 |
DE19834491A1 (de) | 1998-07-31 | 2000-02-03 | Daimler Chrysler Ag | Anordnung und Verfahren zur Herstellung eines Heterobipolartransistors |
US6287946B1 (en) * | 1999-05-05 | 2001-09-11 | Hrl Laboratories, Llc | Fabrication of low resistance, non-alloyed, ohmic contacts to InP using non-stoichiometric InP layers |
US6670653B1 (en) * | 1999-07-30 | 2003-12-30 | Hrl Laboratories, Llc | InP collector InGaAsSb base DHBT device and method of forming same |
JP2001127071A (ja) * | 1999-08-19 | 2001-05-11 | Hitachi Ltd | 半導体装置及びその製造方法 |
EP1094523A3 (de) * | 1999-10-21 | 2003-06-11 | Matsushita Electric Industrial Co., Ltd. | Lateraler Heteroübergangstransistor und Verfahren zur Herstellung |
US6566693B1 (en) * | 2000-09-19 | 2003-05-20 | Hrl Laboratories, Llc | Reduced capacitance scaled HBT using a separate base post layer |
US6541346B2 (en) | 2001-03-20 | 2003-04-01 | Roger J. Malik | Method and apparatus for a self-aligned heterojunction bipolar transistor using dielectric assisted metal liftoff process |
JP4703031B2 (ja) * | 2001-05-18 | 2011-06-15 | Okiセミコンダクタ株式会社 | 化合物半導体装置 |
KR20080103609A (ko) * | 2001-05-30 | 2008-11-27 | 에이에스엠 아메리카, 인코포레이티드 | 저온 로딩 및 소성 |
JP2003007840A (ja) * | 2001-06-25 | 2003-01-10 | Nec Corp | 半導体装置及び半導体装置製造方法 |
US6525348B1 (en) * | 2001-07-17 | 2003-02-25 | David C. Scott | Two terminal edge illuminated epilayer waveguide phototransistor |
DE10152089A1 (de) * | 2001-10-23 | 2003-05-08 | Infineon Technologies Ag | Verfahren zum Herstellen einer Halbleiter-Struktur |
KR100456037B1 (ko) * | 2001-10-24 | 2004-11-15 | 한국과학기술원 | 컬렉터의 역방향 선택적 식각을 이용한 이종접합 바이폴라 트랜지스터 제조방법 |
WO2003063228A1 (de) * | 2002-01-25 | 2003-07-31 | Mergeoptics Gmbh | Verfahren zum herstellen eines hetero-bipolar-transistors |
JP4015504B2 (ja) * | 2002-08-09 | 2007-11-28 | 株式会社ルネサステクノロジ | 半導体装置 |
US6949776B2 (en) * | 2002-09-26 | 2005-09-27 | Rockwell Scientific Licensing, Llc | Heterojunction bipolar transistor with dielectric assisted planarized contacts and method for fabricating |
DE10318422B4 (de) * | 2003-04-23 | 2006-08-10 | Infineon Technologies Ag | Hochfrequenz-Bipolartransistor mit Silizidregion und Verfahren zur Herstellung desselben |
US6806129B1 (en) * | 2003-05-09 | 2004-10-19 | Agilent Technologies, Inc. | Self-aligned process using indium gallium arsenide etching to form reentry feature in heterojunction bipolar transistors |
US6858887B1 (en) * | 2003-07-30 | 2005-02-22 | Innovative Technology Licensing Llc | BJT device configuration and fabrication method with reduced emitter width |
US7067898B1 (en) | 2004-05-25 | 2006-06-27 | Hrl Laboratories, Llc | Semiconductor device having a self-aligned base contact and narrow emitter |
US7259444B1 (en) | 2004-07-20 | 2007-08-21 | Hrl Laboratories, Llc | Optoelectronic device with patterned ion implant subcollector |
US7368764B1 (en) | 2005-04-18 | 2008-05-06 | Hrl Laboratories, Llc | Heterojunction bipolar transistor and method to make a heterojunction bipolar transistor |
US7300849B2 (en) * | 2005-11-04 | 2007-11-27 | Atmel Corporation | Bandgap engineered mono-crystalline silicon cap layers for SiGe HBT performance enhancement |
US7439558B2 (en) | 2005-11-04 | 2008-10-21 | Atmel Corporation | Method and system for controlled oxygen incorporation in compound semiconductor films for device performance enhancement |
US20070102729A1 (en) * | 2005-11-04 | 2007-05-10 | Enicks Darwin G | Method and system for providing a heterojunction bipolar transistor having SiGe extensions |
US7651919B2 (en) * | 2005-11-04 | 2010-01-26 | Atmel Corporation | Bandgap and recombination engineered emitter layers for SiGe HBT performance optimization |
JPWO2007058265A1 (ja) * | 2005-11-18 | 2009-05-07 | 独立行政法人科学技術振興機構 | バイポーラトランジスタ及びその製造方法 |
US8278176B2 (en) * | 2006-06-07 | 2012-10-02 | Asm America, Inc. | Selective epitaxial formation of semiconductor films |
US7789965B2 (en) * | 2006-09-19 | 2010-09-07 | Asm Japan K.K. | Method of cleaning UV irradiation chamber |
US20080289650A1 (en) * | 2007-05-24 | 2008-11-27 | Asm America, Inc. | Low-temperature cleaning of native oxide |
US7759199B2 (en) * | 2007-09-19 | 2010-07-20 | Asm America, Inc. | Stressor for engineered strain on channel |
US7871937B2 (en) | 2008-05-16 | 2011-01-18 | Asm America, Inc. | Process and apparatus for treating wafers |
US8367528B2 (en) * | 2009-11-17 | 2013-02-05 | Asm America, Inc. | Cyclical epitaxial deposition and etch |
US9885123B2 (en) | 2011-03-16 | 2018-02-06 | Asm America, Inc. | Rapid bake of semiconductor substrate with upper linear heating elements perpendicular to horizontal gas flow |
US8809170B2 (en) | 2011-05-19 | 2014-08-19 | Asm America Inc. | High throughput cyclical epitaxial deposition and etch process |
US8546230B2 (en) | 2011-11-15 | 2013-10-01 | International Business Machines Corporation | Bipolar transistor with a collector having a protected outer edge portion for reduced based-collector junction capacitance and a method of forming the transistor |
US8603883B2 (en) | 2011-11-16 | 2013-12-10 | International Business Machines Corporation | Interface control in a bipolar junction transistor |
US9059138B2 (en) | 2012-01-25 | 2015-06-16 | International Business Machines Corporation | Heterojunction bipolar transistor with reduced sub-collector length, method of manufacture and design structure |
US8932931B2 (en) | 2012-02-13 | 2015-01-13 | International Business Machines Corporation | Self-aligned emitter-base region |
US9099397B1 (en) * | 2012-03-22 | 2015-08-04 | Hrl Laboratories, Llc | Fabrication of self aligned base contacts for bipolar transistors |
US9530708B1 (en) | 2013-05-31 | 2016-12-27 | Hrl Laboratories, Llc | Flexible electronic circuit and method for manufacturing same |
US9059196B2 (en) | 2013-11-04 | 2015-06-16 | International Business Machines Corporation | Bipolar junction transistors with self-aligned terminals |
US9111986B2 (en) | 2014-01-09 | 2015-08-18 | International Business Machines Corporation | Self-aligned emitter-base-collector bipolar junction transistors with a single crystal raised extrinsic base |
US9312370B2 (en) * | 2014-06-10 | 2016-04-12 | Globalfoundries Inc. | Bipolar transistor with extrinsic base region and methods of fabrication |
US9570564B2 (en) | 2014-08-05 | 2017-02-14 | Globalfoundries Inc. | Self-aligned emitter-base bipolar junction transistor with reduced base resistance and base-collector capacitance |
US9892958B2 (en) | 2014-12-02 | 2018-02-13 | Globalfoundries Inc. | Contact module for optimizing emitter and contact resistance |
US20160169833A1 (en) * | 2014-12-11 | 2016-06-16 | International Business Machines Corporation | Biosensor based on heterojunction bipolar transistor |
US10622465B2 (en) * | 2017-12-20 | 2020-04-14 | Qualcomm Incorporated | Heterojunction bipolar transistor (HBT) |
Family Cites Families (23)
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JPS6348863A (ja) * | 1986-08-19 | 1988-03-01 | Matsushita Electric Ind Co Ltd | ヘテロ接合バイポ−ラトランジスタの製造方法 |
JPS63124465A (ja) * | 1986-11-13 | 1988-05-27 | Nec Corp | バイポ−ラトランジスタの製造方法 |
US5124270A (en) * | 1987-09-18 | 1992-06-23 | Kabushiki Kaisha Toshiba | Bipolar transistor having external base region |
JPH01238161A (ja) * | 1988-03-18 | 1989-09-22 | Fujitsu Ltd | 半導体装置及びその製造方法 |
CA1318418C (en) * | 1988-09-28 | 1993-05-25 | Richard Norman Nottenburg | Heterostructure bipolar transistor |
JP3057679B2 (ja) * | 1988-10-05 | 2000-07-04 | ソニー株式会社 | ヘテロ接合バイポーラトランジスタ及びその製造方法 |
US5106766A (en) * | 1989-07-11 | 1992-04-21 | At&T Bell Laboratories | Method of making a semiconductor device that comprises p-type III-V semiconductor material |
US5001534A (en) * | 1989-07-11 | 1991-03-19 | At&T Bell Laboratories | Heterojunction bipolar transistor |
JPH03108399A (ja) * | 1989-09-21 | 1991-05-08 | Fuji Photo Film Co Ltd | 電装ボックス |
JPH03108339A (ja) * | 1989-09-22 | 1991-05-08 | Hitachi Ltd | ヘテロ接合バイポーラトランジスタおよびその製造方法 |
JPH03291942A (ja) * | 1990-04-09 | 1991-12-24 | Fujitsu Ltd | ヘテロ接合半導体装置の製造方法 |
JP2765208B2 (ja) * | 1990-08-20 | 1998-06-11 | 松下電器産業株式会社 | ヘテロ接合バイポーラトランジスタおよびその製造方法 |
EP0478923B1 (de) * | 1990-08-31 | 1997-11-05 | Texas Instruments Incorporated | Verfahren zum Herstellen selbst-ausrichtender bipolarer Transistoren mit Heteroübergang |
US5270223A (en) * | 1991-06-28 | 1993-12-14 | Texas Instruments Incorporated | Multiple layer wide bandgap collector structure for bipolar transistors |
JPH05175225A (ja) * | 1991-12-20 | 1993-07-13 | Nippon Telegr & Teleph Corp <Ntt> | ヘテロ接合バイポーラトランジスタの製造方法 |
JPH05243257A (ja) * | 1992-03-02 | 1993-09-21 | Sumitomo Electric Ind Ltd | 完全自己整合InP系HBT |
EP0562272A3 (en) * | 1992-03-23 | 1994-05-25 | Texas Instruments Inc | Microwave heterojunction bipolar transistors with emitters designed for high power applications and method for fabricating same |
US5298438A (en) * | 1992-08-31 | 1994-03-29 | Texas Instruments Incorporated | Method of reducing extrinsic base-collector capacitance in bipolar transistors |
JPH06132297A (ja) * | 1992-10-19 | 1994-05-13 | Fujitsu Ltd | 半導体装置の製造方法 |
US5434091A (en) * | 1992-10-30 | 1995-07-18 | Texas Instruments Incorporated | Method for making collector up bipolar transistors having reducing junction capacitance and increasing current gain |
JPH06267969A (ja) * | 1993-03-17 | 1994-09-22 | Fujitsu Ltd | 積層型半導体装置の製造方法 |
US5445976A (en) * | 1994-08-09 | 1995-08-29 | Texas Instruments Incorporated | Method for producing bipolar transistor having reduced base-collector capacitance |
US5485025A (en) * | 1994-12-02 | 1996-01-16 | Texas Instruments Incorporated | Depleted extrinsic emitter of collector-up heterojunction bipolar transistor |
-
1995
- 1995-06-06 US US08/470,811 patent/US5665614A/en not_active Expired - Lifetime
-
1996
- 1996-05-30 DE DE69605718T patent/DE69605718T2/de not_active Expired - Fee Related
- 1996-05-30 EP EP96108617A patent/EP0747964B1/de not_active Expired - Lifetime
- 1996-06-06 JP JP8144701A patent/JPH09102504A/ja active Pending
- 1996-10-31 US US08/740,581 patent/US5729033A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5665614A (en) | 1997-09-09 |
DE69605718D1 (de) | 2000-01-27 |
JPH09102504A (ja) | 1997-04-15 |
EP0747964A2 (de) | 1996-12-11 |
EP0747964B1 (de) | 1999-12-22 |
US5729033A (en) | 1998-03-17 |
EP0747964A3 (de) | 1997-12-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |