DE69331210T2 - Integriertes Speicherschaltungsgerät - Google Patents
Integriertes SpeicherschaltungsgerätInfo
- Publication number
- DE69331210T2 DE69331210T2 DE69331210T DE69331210T DE69331210T2 DE 69331210 T2 DE69331210 T2 DE 69331210T2 DE 69331210 T DE69331210 T DE 69331210T DE 69331210 T DE69331210 T DE 69331210T DE 69331210 T2 DE69331210 T2 DE 69331210T2
- Authority
- DE
- Germany
- Prior art keywords
- circuit device
- memory circuit
- integrated memory
- integrated
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4096—Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
- G11C29/846—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by choosing redundant lines at an output stage
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/408—Address circuits
- G11C11/4087—Address decoders, e.g. bit - or word line decoders; Multiple line decoders
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4093—Input/output [I/O] data interface arrangements, e.g. data buffers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Databases & Information Systems (AREA)
- Dram (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4230587A JP2975777B2 (ja) | 1992-08-28 | 1992-08-28 | 集積回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69331210D1 DE69331210D1 (de) | 2002-01-10 |
DE69331210T2 true DE69331210T2 (de) | 2002-06-27 |
Family
ID=16910083
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69331210T Expired - Fee Related DE69331210T2 (de) | 1992-08-28 | 1993-08-27 | Integriertes Speicherschaltungsgerät |
Country Status (5)
Country | Link |
---|---|
US (1) | US5428573A (de) |
EP (1) | EP0584832B1 (de) |
JP (1) | JP2975777B2 (de) |
KR (1) | KR970001670B1 (de) |
DE (1) | DE69331210T2 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3161254B2 (ja) * | 1994-11-25 | 2001-04-25 | 株式会社日立製作所 | 同期式メモリ装置 |
JPH08221975A (ja) * | 1995-02-17 | 1996-08-30 | Toshiba Corp | 半導体メモリ回路 |
US6035369A (en) | 1995-10-19 | 2000-03-07 | Rambus Inc. | Method and apparatus for providing a memory with write enable information |
JPH09293388A (ja) * | 1996-04-24 | 1997-11-11 | Toshiba Corp | 半導体記憶装置 |
US6209071B1 (en) | 1996-05-07 | 2001-03-27 | Rambus Inc. | Asynchronous request/synchronous data dynamic random access memory |
KR100200930B1 (ko) * | 1996-12-06 | 1999-06-15 | 윤종용 | 버스트 모드동작에 적합한 반도체 메모리 장치의 로우 디코더 |
JPH117792A (ja) * | 1997-06-19 | 1999-01-12 | Mitsubishi Electric Corp | 半導体記憶装置 |
JP2001155485A (ja) * | 1999-11-29 | 2001-06-08 | Mitsubishi Electric Corp | 半導体記憶装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0799616B2 (ja) * | 1984-08-30 | 1995-10-25 | 三菱電機株式会社 | 半導体記憶装置 |
JPH0736269B2 (ja) * | 1985-08-30 | 1995-04-19 | 株式会社日立製作所 | 半導体記憶装置 |
JPS6265300A (ja) * | 1985-09-18 | 1987-03-24 | Toshiba Corp | 半導体記憶装置 |
JP2698834B2 (ja) * | 1988-11-22 | 1998-01-19 | 株式会社日立製作所 | 不揮発性記憶装置 |
US5255228A (en) * | 1989-01-10 | 1993-10-19 | Matsushita Electronics Corporation | Semiconductor memory device with redundancy circuits |
DE4118804C2 (de) * | 1990-06-08 | 1996-01-04 | Toshiba Kawasaki Kk | Serienzugriff-Speicheranordnung |
-
1992
- 1992-08-28 JP JP4230587A patent/JP2975777B2/ja not_active Expired - Fee Related
-
1993
- 1993-08-27 DE DE69331210T patent/DE69331210T2/de not_active Expired - Fee Related
- 1993-08-27 EP EP93113750A patent/EP0584832B1/de not_active Expired - Lifetime
- 1993-08-28 KR KR1019930017025A patent/KR970001670B1/ko not_active IP Right Cessation
- 1993-08-30 US US08/113,072 patent/US5428573A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0584832B1 (de) | 2001-11-28 |
EP0584832A3 (de) | 1998-01-21 |
DE69331210D1 (de) | 2002-01-10 |
US5428573A (en) | 1995-06-27 |
JP2975777B2 (ja) | 1999-11-10 |
JPH0676564A (ja) | 1994-03-18 |
EP0584832A2 (de) | 1994-03-02 |
KR940004655A (ko) | 1994-03-15 |
KR970001670B1 (ko) | 1997-02-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |