DE69321165T2 - Verfahren zur Verwendung eines Massenspektrometers - Google Patents
Verfahren zur Verwendung eines MassenspektrometersInfo
- Publication number
- DE69321165T2 DE69321165T2 DE1993621165 DE69321165T DE69321165T2 DE 69321165 T2 DE69321165 T2 DE 69321165T2 DE 1993621165 DE1993621165 DE 1993621165 DE 69321165 T DE69321165 T DE 69321165T DE 69321165 T2 DE69321165 T2 DE 69321165T2
- Authority
- DE
- Germany
- Prior art keywords
- ions
- sample
- trap
- ion trap
- mass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000000034 method Methods 0.000 title claims description 79
- 150000002500 ions Chemical class 0.000 claims description 153
- 238000005040 ion trap Methods 0.000 claims description 65
- 239000003153 chemical reaction reagent Substances 0.000 claims description 54
- 239000007789 gas Substances 0.000 claims description 36
- 238000000451 chemical ionisation Methods 0.000 claims description 13
- 238000010894 electron beam technology Methods 0.000 claims description 10
- 230000005284 excitation Effects 0.000 claims description 8
- 238000006243 chemical reaction Methods 0.000 claims description 6
- 238000005070 sampling Methods 0.000 claims description 6
- 230000004044 response Effects 0.000 claims description 5
- 230000001419 dependent effect Effects 0.000 claims description 3
- 230000005404 monopole Effects 0.000 claims 1
- 238000002474 experimental method Methods 0.000 description 16
- 238000004458 analytical method Methods 0.000 description 13
- 230000000694 effects Effects 0.000 description 6
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 6
- 238000001228 spectrum Methods 0.000 description 5
- 230000035484 reaction time Effects 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000004949 mass spectrometry Methods 0.000 description 3
- 238000001819 mass spectrum Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000004885 tandem mass spectrometry Methods 0.000 description 3
- QPFMBZIOSGYJDE-UHFFFAOYSA-N 1,1,2,2-tetrachloroethane Chemical compound ClC(Cl)C(Cl)Cl QPFMBZIOSGYJDE-UHFFFAOYSA-N 0.000 description 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000012634 fragment Substances 0.000 description 2
- 238000000752 ionisation method Methods 0.000 description 2
- NNPPMTNAJDCUHE-UHFFFAOYSA-N isobutane Chemical compound CC(C)C NNPPMTNAJDCUHE-UHFFFAOYSA-N 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- UOCLXMDMGBRAIB-UHFFFAOYSA-N 1,1,1-trichloroethane Chemical compound CC(Cl)(Cl)Cl UOCLXMDMGBRAIB-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 238000004587 chromatography analysis Methods 0.000 description 1
- 238000001360 collision-induced dissociation Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- CKAPSXZOOQJIBF-UHFFFAOYSA-N hexachlorobenzene Chemical compound ClC1=C(Cl)C(Cl)=C(Cl)C(Cl)=C1Cl CKAPSXZOOQJIBF-UHFFFAOYSA-N 0.000 description 1
- 238000003987 high-resolution gas chromatography Methods 0.000 description 1
- 239000001282 iso-butane Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- RVZRBWKZFJCCIB-UHFFFAOYSA-N perfluorotributylamine Chemical compound FC(F)(F)C(F)(F)C(F)(F)C(F)(F)N(C(F)(F)C(F)(F)C(F)(F)C(F)(F)F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F RVZRBWKZFJCCIB-UHFFFAOYSA-N 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000000246 remedial effect Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
- H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/426—Methods for controlling ions
- H01J49/427—Ejection and selection methods
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US89099192A | 1992-05-29 | 1992-05-29 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE69321165D1 DE69321165D1 (de) | 1998-10-29 |
| DE69321165T2 true DE69321165T2 (de) | 1999-06-02 |
Family
ID=25397431
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE1993621165 Expired - Fee Related DE69321165T2 (de) | 1992-05-29 | 1993-05-28 | Verfahren zur Verwendung eines Massenspektrometers |
| DE1993628979 Expired - Fee Related DE69328979T2 (de) | 1992-05-29 | 1993-05-28 | Verfahren zum Betrieb von Ionenfallenmassenspektrometern |
| DE1993633589 Expired - Fee Related DE69333589T2 (de) | 1992-05-29 | 1993-05-28 | Verfahren zum Betreiben eines Ionenfallen-Massenspektrometers |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE1993628979 Expired - Fee Related DE69328979T2 (de) | 1992-05-29 | 1993-05-28 | Verfahren zum Betrieb von Ionenfallenmassenspektrometern |
| DE1993633589 Expired - Fee Related DE69333589T2 (de) | 1992-05-29 | 1993-05-28 | Verfahren zum Betreiben eines Ionenfallen-Massenspektrometers |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP0575777B1 (OSRAM) |
| JP (2) | JP3444429B2 (OSRAM) |
| CA (1) | CA2097211A1 (OSRAM) |
| DE (3) | DE69321165T2 (OSRAM) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5448061A (en) * | 1992-05-29 | 1995-09-05 | Varian Associates, Inc. | Method of space charge control for improved ion isolation in an ion trap mass spectrometer by dynamically adaptive sampling |
| US5291017A (en) * | 1993-01-27 | 1994-03-01 | Varian Associates, Inc. | Ion trap mass spectrometer method and apparatus for improved sensitivity |
| US5396064A (en) * | 1994-01-11 | 1995-03-07 | Varian Associates, Inc. | Quadrupole trap ion isolation method |
| DE4425384C1 (de) * | 1994-07-19 | 1995-11-02 | Bruker Franzen Analytik Gmbh | Verfahren zur stoßinduzierten Fragmentierung von Ionen in Ionenfallen |
| US5714755A (en) * | 1996-03-01 | 1998-02-03 | Varian Associates, Inc. | Mass scanning method using an ion trap mass spectrometer |
| DE19932839B4 (de) * | 1999-07-14 | 2007-10-11 | Bruker Daltonik Gmbh | Fragmentierung in Quadrupol-Ionenfallenmassenspektrometern |
| JP4384542B2 (ja) | 2004-05-24 | 2009-12-16 | 株式会社日立ハイテクノロジーズ | 質量分析装置 |
| DE102005061425B4 (de) * | 2005-12-22 | 2009-06-10 | Bruker Daltonik Gmbh | Rückgesteuerte Fragmentierung in Ionenfallen-Massenspektrometern |
| JP4996962B2 (ja) | 2007-04-04 | 2012-08-08 | 株式会社日立ハイテクノロジーズ | 質量分析装置 |
| GB201208733D0 (en) * | 2012-05-18 | 2012-07-04 | Micromass Ltd | Excitation of reagent molecules within a rf confined ion guide or ion trap to perform ion molecule, ion radical or ion-ion interaction experiments |
| DE102013213501A1 (de) * | 2013-07-10 | 2015-01-15 | Carl Zeiss Microscopy Gmbh | Massenspektrometer, dessen Verwendung, sowie Verfahren zur massenspektrometrischen Untersuchung eines Gasgemisches |
| US10985002B2 (en) * | 2019-06-11 | 2021-04-20 | Perkinelmer Health Sciences, Inc. | Ionization sources and methods and systems using them |
| CN114823276A (zh) * | 2022-05-31 | 2022-07-29 | 深圳至秦仪器有限公司 | 一种用于质谱的新型离子阱及质谱仪 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3650304T2 (de) * | 1985-05-24 | 1995-10-12 | Finnigan Corp | Betriebsverfahren für eine Ionenfalle. |
| US4686367A (en) * | 1985-09-06 | 1987-08-11 | Finnigan Corporation | Method of operating quadrupole ion trap chemical ionization mass spectrometry |
| DE3886922T2 (de) * | 1988-04-13 | 1994-04-28 | Bruker Franzen Analytik Gmbh | Methode zur Massenanalyse einer Probe mittels eines Quistors und zur Durchführung dieses Verfahrens entwickelter Quistor. |
| EP0362432A1 (en) * | 1988-10-07 | 1990-04-11 | Bruker Franzen Analytik GmbH | Improvement of a method of mass analyzing a sample |
| US5200613A (en) * | 1991-02-28 | 1993-04-06 | Teledyne Mec | Mass spectrometry method using supplemental AC voltage signals |
-
1993
- 1993-05-28 DE DE1993621165 patent/DE69321165T2/de not_active Expired - Fee Related
- 1993-05-28 EP EP19930108670 patent/EP0575777B1/en not_active Expired - Lifetime
- 1993-05-28 CA CA 2097211 patent/CA2097211A1/en not_active Abandoned
- 1993-05-28 DE DE1993628979 patent/DE69328979T2/de not_active Expired - Fee Related
- 1993-05-28 DE DE1993633589 patent/DE69333589T2/de not_active Expired - Fee Related
- 1993-05-31 JP JP15304193A patent/JP3444429B2/ja not_active Expired - Fee Related
-
2003
- 2003-05-22 JP JP2003145488A patent/JP2004004082A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JP2004004082A (ja) | 2004-01-08 |
| DE69328979T2 (de) | 2001-02-15 |
| DE69333589D1 (de) | 2004-09-16 |
| DE69333589T2 (de) | 2005-02-03 |
| CA2097211A1 (en) | 1993-11-30 |
| DE69321165D1 (de) | 1998-10-29 |
| DE69328979D1 (de) | 2000-08-10 |
| JP3444429B2 (ja) | 2003-09-08 |
| JPH0696727A (ja) | 1994-04-08 |
| EP0575777B1 (en) | 1998-09-23 |
| EP0575777A3 (OSRAM) | 1994-03-16 |
| EP0575777A2 (en) | 1993-12-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition | ||
| 8327 | Change in the person/name/address of the patent owner |
Owner name: VARIAN, INC., PALO ALTO, CALIF., US |
|
| 8339 | Ceased/non-payment of the annual fee |