DE69508866T2 - Verfahren zur raumladungskontrolle in einem ionenfallemassenspektrometer - Google Patents
Verfahren zur raumladungskontrolle in einem ionenfallemassenspektrometerInfo
- Publication number
- DE69508866T2 DE69508866T2 DE69508866T DE69508866T DE69508866T2 DE 69508866 T2 DE69508866 T2 DE 69508866T2 DE 69508866 T DE69508866 T DE 69508866T DE 69508866 T DE69508866 T DE 69508866T DE 69508866 T2 DE69508866 T2 DE 69508866T2
- Authority
- DE
- Germany
- Prior art keywords
- spectrometer
- controlling space
- space charging
- ion case
- ion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/426—Methods for controlling ions
- H01J49/4265—Controlling the number of trapped ions; preventing space charge effects
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0027—Methods for using particle spectrometers
- H01J49/0031—Step by step routines describing the use of the apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/178,694 US5479012A (en) | 1992-05-29 | 1994-01-10 | Method of space charge control in an ion trap mass spectrometer |
PCT/US1995/000338 WO1995018670A1 (en) | 1994-01-10 | 1995-01-10 | A method of space charge control in an ion trap mass spectrometer |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69508866D1 DE69508866D1 (de) | 1999-05-12 |
DE69508866T2 true DE69508866T2 (de) | 1999-12-23 |
Family
ID=22653560
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69508866T Expired - Lifetime DE69508866T2 (de) | 1994-01-10 | 1995-01-10 | Verfahren zur raumladungskontrolle in einem ionenfallemassenspektrometer |
Country Status (4)
Country | Link |
---|---|
US (1) | US5479012A (de) |
EP (1) | EP0701471B1 (de) |
DE (1) | DE69508866T2 (de) |
WO (1) | WO1995018670A1 (de) |
Families Citing this family (39)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19501835C2 (de) * | 1995-01-21 | 1998-07-02 | Bruker Franzen Analytik Gmbh | Verfahren zur Anregung der Schwingungen von Ionen in Ionenfallen mit Frequenzgemischen |
DE19501823A1 (de) * | 1995-01-21 | 1996-07-25 | Bruker Franzen Analytik Gmbh | Verfahren zur Regelung der Erzeugungsraten für massenselektives Einspeichern von Ionen in Ionenfallen |
JP3385327B2 (ja) * | 1995-12-13 | 2003-03-10 | 株式会社日立製作所 | 三次元四重極質量分析装置 |
US5714755A (en) * | 1996-03-01 | 1998-02-03 | Varian Associates, Inc. | Mass scanning method using an ion trap mass spectrometer |
JP3294106B2 (ja) * | 1996-05-21 | 2002-06-24 | 株式会社日立製作所 | 三次元四重極質量分析法および装置 |
US6177668B1 (en) | 1996-06-06 | 2001-01-23 | Mds Inc. | Axial ejection in a multipole mass spectrometer |
US5729014A (en) * | 1996-07-11 | 1998-03-17 | Varian Associates, Inc. | Method for injection of externally produced ions into a quadrupole ion trap |
DE19709172B4 (de) * | 1997-03-06 | 2007-03-22 | Bruker Daltonik Gmbh | Verfahren der vergleichenden Analyse mit Ionenfallenmassenspektrometern |
US6147348A (en) * | 1997-04-11 | 2000-11-14 | University Of Florida | Method for performing a scan function on quadrupole ion trap mass spectrometers |
JPH1183803A (ja) * | 1997-09-01 | 1999-03-26 | Hitachi Ltd | マスマーカーの補正方法 |
WO2001015201A2 (en) * | 1999-08-26 | 2001-03-01 | University Of New Hampshire | Multiple stage mass spectrometer |
DE10027545C1 (de) * | 2000-06-02 | 2001-10-31 | Bruker Daltonik Gmbh | Regelung der Ionenfüllung in Ionenfallenmassenspektrometern |
JP3701182B2 (ja) | 2000-08-24 | 2005-09-28 | 株式会社日立製作所 | 出入管理方法及び出入管理システム |
US6627875B2 (en) * | 2001-04-23 | 2003-09-30 | Beyond Genomics, Inc. | Tailored waveform/charge reduction mass spectrometry |
JP3990889B2 (ja) * | 2001-10-10 | 2007-10-17 | 株式会社日立ハイテクノロジーズ | 質量分析装置およびこれを用いる計測システム |
US20040119014A1 (en) * | 2002-12-18 | 2004-06-24 | Alex Mordehai | Ion trap mass spectrometer and method for analyzing ions |
GB0312940D0 (en) * | 2003-06-05 | 2003-07-09 | Shimadzu Res Lab Europe Ltd | A method for obtaining high accuracy mass spectra using an ion trap mass analyser and a method for determining and/or reducing chemical shift in mass analysis |
GB2412486B (en) * | 2004-03-26 | 2009-01-14 | Thermo Finnigan Llc | Fourier transform mass spectrometer and method for generating a mass spectrum therefrom |
CA2570806A1 (en) | 2004-06-15 | 2006-01-05 | Griffin Analytical Technologies, Inc. | Analytical instruments, assemblies, and methods |
US7312441B2 (en) * | 2004-07-02 | 2007-12-25 | Thermo Finnigan Llc | Method and apparatus for controlling the ion population in a mass spectrometer |
US8680461B2 (en) * | 2005-04-25 | 2014-03-25 | Griffin Analytical Technologies, L.L.C. | Analytical instrumentation, apparatuses, and methods |
US7446310B2 (en) * | 2006-07-11 | 2008-11-04 | Thermo Finnigan Llc | High throughput quadrupolar ion trap |
US7456389B2 (en) * | 2006-07-11 | 2008-11-25 | Thermo Finnigan Llc | High throughput quadrupolar ion trap |
JP4369454B2 (ja) | 2006-09-04 | 2009-11-18 | 株式会社日立ハイテクノロジーズ | イオントラップ質量分析方法 |
US7992424B1 (en) | 2006-09-14 | 2011-08-09 | Griffin Analytical Technologies, L.L.C. | Analytical instrumentation and sample analysis methods |
US7842918B2 (en) * | 2007-03-07 | 2010-11-30 | Varian, Inc | Chemical structure-insensitive method and apparatus for dissociating ions |
US8334506B2 (en) | 2007-12-10 | 2012-12-18 | 1St Detect Corporation | End cap voltage control of ion traps |
US7629575B2 (en) * | 2007-12-19 | 2009-12-08 | Varian, Inc. | Charge control for ionic charge accumulation devices |
DE102008023694B4 (de) * | 2008-05-15 | 2010-12-30 | Bruker Daltonik Gmbh | Fragmentierung von Analytionen durch Ionenstoß in HF-Ionenfallen |
US7973277B2 (en) | 2008-05-27 | 2011-07-05 | 1St Detect Corporation | Driving a mass spectrometer ion trap or mass filter |
US7960690B2 (en) * | 2008-07-24 | 2011-06-14 | Thermo Finnigan Llc | Automatic gain control (AGC) method for an ion trap and a temporally non-uniform ion beam |
US8258462B2 (en) * | 2008-09-05 | 2012-09-04 | Thermo Finnigan Llc | Methods of calibrating and operating an ion trap mass analyzer to optimize mass spectral peak characteristics |
US8552365B2 (en) * | 2009-05-11 | 2013-10-08 | Thermo Finnigan Llc | Ion population control in a mass spectrometer having mass-selective transfer optics |
JP5916856B2 (ja) | 2011-07-11 | 2016-05-11 | ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド | 質量分析計の中の空間電荷を制御する方法 |
WO2014164198A1 (en) * | 2013-03-11 | 2014-10-09 | David Rafferty | Automatic gain control with defocusing lens |
US8969794B2 (en) | 2013-03-15 | 2015-03-03 | 1St Detect Corporation | Mass dependent automatic gain control for mass spectrometer |
JP6075311B2 (ja) * | 2014-03-24 | 2017-02-08 | 株式会社島津製作所 | イオントラップ質量分析装置及び該装置を用いた質量分析方法 |
US10026598B2 (en) * | 2016-01-04 | 2018-07-17 | Rohde & Schwarz Gmbh & Co. Kg | Signal amplitude measurement and calibration with an ion trap |
US10170290B2 (en) | 2016-05-24 | 2019-01-01 | Thermo Finnigan Llc | Systems and methods for grouping MS/MS transitions |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4540884A (en) * | 1982-12-29 | 1985-09-10 | Finnigan Corporation | Method of mass analyzing a sample by use of a quadrupole ion trap |
US4650999A (en) * | 1984-10-22 | 1987-03-17 | Finnigan Corporation | Method of mass analyzing a sample over a wide mass range by use of a quadrupole ion trap |
US5107109A (en) * | 1986-03-07 | 1992-04-21 | Finnigan Corporation | Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer |
US4749860A (en) * | 1986-06-05 | 1988-06-07 | Finnigan Corporation | Method of isolating a single mass in a quadrupole ion trap |
US4818869A (en) * | 1987-05-22 | 1989-04-04 | Finnigan Corporation | Method of isolating a single mass or narrow range of masses and/or enhancing the sensitivity of an ion trap mass spectrometer |
US5206507A (en) * | 1991-02-28 | 1993-04-27 | Teledyne Mec | Mass spectrometry method using filtered noise signal |
US5200613A (en) * | 1991-02-28 | 1993-04-06 | Teledyne Mec | Mass spectrometry method using supplemental AC voltage signals |
US5198665A (en) * | 1992-05-29 | 1993-03-30 | Varian Associates, Inc. | Quadrupole trap improved technique for ion isolation |
US5324939A (en) * | 1993-05-28 | 1994-06-28 | Finnigan Corporation | Method and apparatus for ejecting unwanted ions in an ion trap mass spectrometer |
-
1994
- 1994-01-10 US US08/178,694 patent/US5479012A/en not_active Expired - Lifetime
-
1995
- 1995-01-10 WO PCT/US1995/000338 patent/WO1995018670A1/en active IP Right Grant
- 1995-01-10 DE DE69508866T patent/DE69508866T2/de not_active Expired - Lifetime
- 1995-01-10 EP EP95908022A patent/EP0701471B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69508866D1 (de) | 1999-05-12 |
US5479012A (en) | 1995-12-26 |
WO1995018670A1 (en) | 1995-07-13 |
EP0701471A4 (de) | 1997-09-10 |
EP0701471A1 (de) | 1996-03-20 |
EP0701471B1 (de) | 1999-04-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: VARIAN, INC., PALO ALTO, CALIF., US |
|
R082 | Change of representative |
Ref document number: 701471 Country of ref document: EP Representative=s name: KAHLER, KAECK & MOLLEKOPF, 86899 LANDSBERG, DE |