DE69311124D1 - Verfahren zur reduzierung von interferenzen in plasmaquellen-massenspektrometern - Google Patents

Verfahren zur reduzierung von interferenzen in plasmaquellen-massenspektrometern

Info

Publication number
DE69311124D1
DE69311124D1 DE69311124T DE69311124T DE69311124D1 DE 69311124 D1 DE69311124 D1 DE 69311124D1 DE 69311124 T DE69311124 T DE 69311124T DE 69311124 T DE69311124 T DE 69311124T DE 69311124 D1 DE69311124 D1 DE 69311124D1
Authority
DE
Germany
Prior art keywords
plasma source
mass spectrometers
source mass
reducing interferences
interferences
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69311124T
Other languages
English (en)
Other versions
DE69311124T2 (de
Inventor
Andrew Blackbird Close Dixon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thermo Instrument Systems Inc
Original Assignee
Thermo Instrument Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thermo Instrument Systems Inc filed Critical Thermo Instrument Systems Inc
Publication of DE69311124D1 publication Critical patent/DE69311124D1/de
Application granted granted Critical
Publication of DE69311124T2 publication Critical patent/DE69311124T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
    • H01J49/482—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with cylindrical mirrors

Landscapes

  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE69311124T 1992-09-15 1993-09-15 Verfahren zur reduzierung von interferenzen in plasmaquellen-massenspektrometern Expired - Fee Related DE69311124T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB929219457A GB9219457D0 (en) 1992-09-15 1992-09-15 Reducing interferences in plasma source mass spectrometers
PCT/GB1993/001949 WO1994007257A1 (en) 1992-09-15 1993-09-15 Reducing interferences in plasma source mass spectrometers

Publications (2)

Publication Number Publication Date
DE69311124D1 true DE69311124D1 (de) 1997-07-03
DE69311124T2 DE69311124T2 (de) 1997-09-18

Family

ID=10721901

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69311124T Expired - Fee Related DE69311124T2 (de) 1992-09-15 1993-09-15 Verfahren zur reduzierung von interferenzen in plasmaquellen-massenspektrometern

Country Status (7)

Country Link
US (1) US5514868A (de)
EP (1) EP0660966B1 (de)
JP (1) JP2922647B2 (de)
CA (1) CA2143669C (de)
DE (1) DE69311124T2 (de)
GB (2) GB9219457D0 (de)
WO (1) WO1994007257A1 (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5470324A (en) * 1993-07-01 1995-11-28 Baxter International Inc. Non-refluxing suction canister system and components therefor
US5725516A (en) * 1993-07-01 1998-03-10 Allegiance Healthcare Corp. Suction canister system
GB2308917B (en) * 1996-01-05 2000-04-12 Maxent Solutions Ltd Reducing interferences in elemental mass spectrometers
GB2315362A (en) * 1996-07-12 1998-01-28 Analytical Precision Ltd Mass spectrometers
JP3648906B2 (ja) * 1997-02-14 2005-05-18 株式会社日立製作所 イオントラップ質量分析計を用いた分析装置
GB9820210D0 (en) 1998-09-16 1998-11-11 Vg Elemental Limited Means for removing unwanted ions from an ion transport system and mass spectrometer
JP2000311650A (ja) * 1999-02-26 2000-11-07 Hitachi Ltd プラズマイオン源質量分析装置
CA2305071C (en) * 1999-04-12 2009-03-24 Mds Inc. High intensity ion source
CN100379462C (zh) 1999-11-09 2008-04-09 电气化学工业株式会社 一种包含难溶于水的可溶性纤维素衍生物的组织包被性医疗材料及其制造方法
JP4569049B2 (ja) * 2001-06-06 2010-10-27 株式会社島津製作所 質量分析装置
DE10297199T5 (de) * 2001-09-10 2004-08-12 Varian Australia Pty. Ltd., Mulgrave Vorrichtung und Verfahren zur Elementaren Massenspektrometrie
AU2002328668B2 (en) * 2001-09-10 2006-09-28 Agilent Technologies Australia (M) Pty Ltd Apparatus and method for elemental mass spectrometry
GB0210930D0 (en) 2002-05-13 2002-06-19 Thermo Electron Corp Improved mass spectrometer and mass filters therefor
US6794647B2 (en) * 2003-02-25 2004-09-21 Beckman Coulter, Inc. Mass analyzer having improved mass filter and ion detection arrangement
EP1609166A2 (de) 2003-03-31 2005-12-28 Beckman Coulter, Inc. Massenanalysierer mit der fähigkeit zur parallelen verarbeitung eines oder mehrerer analyte
US6777670B1 (en) 2003-03-31 2004-08-17 Beckman Coulter, Inc. Mass analyzer capable of parallel processing one or more analytes
US20060022147A1 (en) * 2004-08-02 2006-02-02 Nanya Technology Corporation Method and device of monitoring and controlling ion beam energy distribution
EP1920244A4 (de) * 2005-09-02 2011-09-14 Australian Nuclear Science Tec Isotopenverhältnis-massenspektrometer und verfahren zur bestimmung von isotopenverhältnissen
US7514676B1 (en) * 2005-09-30 2009-04-07 Battelle Memorial Insitute Method and apparatus for selective filtering of ions
US9697338B2 (en) 2011-10-21 2017-07-04 California Institute Of Technology High-resolution mass spectrometer and methods for determining the isotopic anatomy of organic and volatile molecules
GB2497799B (en) 2011-12-21 2016-06-22 Thermo Fisher Scient (Bremen) Gmbh Collision cell multipole
GB2561998A (en) 2012-10-10 2018-10-31 California Inst Of Techn Mass spectrometer, system comprising the same, and methods for determining isotopic anatomy of compounds
US20140138533A1 (en) * 2012-11-19 2014-05-22 Canon Kabushiki Kaisha Ion mass selector, ion irradiation device, surface analysis device, and ion mass selecting method
CN103529117B (zh) * 2013-05-02 2016-06-01 福建中烟工业有限责任公司 一种烟用内衬纸中钴含量的测定方法
JP6449541B2 (ja) * 2013-12-27 2019-01-09 アジレント・テクノロジーズ・インクＡｇｉｌｅｎｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｉｎｃ． プラズマ質量分析装置用イオン光学システム
JP7095579B2 (ja) * 2018-12-05 2022-07-05 株式会社島津製作所 質量分析装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2255302C3 (de) * 1972-11-11 1980-09-11 Leybold-Heraeus Gmbh, 5000 Koeln Einrichtung für die Sekundär-Ionen-Massenspektroskopie
CA1245778A (en) * 1985-10-24 1988-11-29 John B. French Mass analyzer system with reduced drift
GB8527438D0 (en) * 1985-11-07 1985-12-11 Vg Instr Group Charged particle energy analyser
GB8813149D0 (en) * 1988-06-03 1988-07-06 Vg Instr Group Mass spectrometer
GB8901975D0 (en) * 1989-01-30 1989-03-22 Vg Instr Group Plasma mass spectrometer
GB9105073D0 (en) * 1991-03-11 1991-04-24 Vg Instr Group Isotopic-ratio plasma mass spectrometer
DE4305363A1 (de) * 1993-02-23 1994-08-25 Hans Bernhard Dr Linden Massenspektrometer zur flugzeitabhängigen Massentrennung

Also Published As

Publication number Publication date
GB9219457D0 (en) 1992-10-28
GB2285170B (en) 1995-11-29
EP0660966A1 (de) 1995-07-05
GB2285170A (en) 1995-06-28
EP0660966B1 (de) 1997-05-28
CA2143669C (en) 1999-12-28
DE69311124T2 (de) 1997-09-18
US5514868A (en) 1996-05-07
WO1994007257A1 (en) 1994-03-31
GB9504236D0 (en) 1995-04-26
JPH08505258A (ja) 1996-06-04
JP2922647B2 (ja) 1999-07-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee