DE19780214T1 - Massenspektrometersystem und Verfahren zum Transportieren und Analysieren von Ionen - Google Patents

Massenspektrometersystem und Verfahren zum Transportieren und Analysieren von Ionen

Info

Publication number
DE19780214T1
DE19780214T1 DE19780214T DE19780214T DE19780214T1 DE 19780214 T1 DE19780214 T1 DE 19780214T1 DE 19780214 T DE19780214 T DE 19780214T DE 19780214 T DE19780214 T DE 19780214T DE 19780214 T1 DE19780214 T1 DE 19780214T1
Authority
DE
Germany
Prior art keywords
transporting
mass spectrometer
spectrometer system
analyzing ions
ions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19780214T
Other languages
English (en)
Other versions
DE19780214B4 (de
Inventor
Alex Mordehai
Jun Sidney E Buttril
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Varian Associates Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Varian Associates Inc filed Critical Varian Associates Inc
Publication of DE19780214T1 publication Critical patent/DE19780214T1/de
Application granted granted Critical
Publication of DE19780214B4 publication Critical patent/DE19780214B4/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE19780214T 1996-02-16 1997-02-12 Massenspektrometersystem und Verfahren zum Transportieren und Analysieren von Ionen Expired - Lifetime DE19780214B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/605,346 US5672868A (en) 1996-02-16 1996-02-16 Mass spectrometer system and method for transporting and analyzing ions
US08/605,346 1996-02-16
PCT/US1997/002214 WO1997030469A1 (en) 1996-02-16 1997-02-12 Mass spectrometer system and method for transporting and analyzing ions

Publications (2)

Publication Number Publication Date
DE19780214T1 true DE19780214T1 (de) 1998-05-07
DE19780214B4 DE19780214B4 (de) 2009-07-30

Family

ID=24423279

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19780214T Expired - Lifetime DE19780214B4 (de) 1996-02-16 1997-02-12 Massenspektrometersystem und Verfahren zum Transportieren und Analysieren von Ionen

Country Status (7)

Country Link
US (2) US5672868A (de)
JP (1) JP3993895B2 (de)
AU (1) AU750121B2 (de)
CA (1) CA2218158C (de)
DE (1) DE19780214B4 (de)
GB (1) GB2314967B (de)
WO (1) WO1997030469A1 (de)

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JP3650551B2 (ja) * 1999-09-14 2005-05-18 株式会社日立製作所 質量分析計
US6583407B1 (en) * 1999-10-29 2003-06-24 Agilent Technologies, Inc. Method and apparatus for selective ion delivery using ion polarity independent control
US6630665B2 (en) * 2000-10-03 2003-10-07 Mds Inc. Device and method preventing ion source gases from entering reaction/collision cells in mass spectrometry
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USRE39627E1 (en) * 2000-08-30 2007-05-15 Mds Inc. Device and method preventing ion source gases from entering reaction/collision cells in mass spectrometry
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US6642526B2 (en) * 2001-06-25 2003-11-04 Ionfinity Llc Field ionizing elements and applications thereof
US6610986B2 (en) * 2001-10-31 2003-08-26 Ionfinity Llc Soft ionization device and applications thereof
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DE10236344B4 (de) * 2002-08-08 2007-03-29 Bruker Daltonik Gmbh Ionisieren an Atmosphärendruck für massenspektrometrische Analysen
US7015466B2 (en) * 2003-07-24 2006-03-21 Purdue Research Foundation Electrosonic spray ionization method and device for the atmospheric ionization of molecules
DE102004053064B4 (de) * 2004-11-03 2007-11-08 Bruker Daltonik Gmbh Ionisierung durch Tröpfchenaufprall
WO2007078573A2 (en) * 2005-12-22 2007-07-12 Thermo Finnigan Llc Apparatus and method for pumping in an ion optical device
US7391019B2 (en) * 2006-07-21 2008-06-24 Thermo Finnigan Llc Electrospray ion source
US20080116370A1 (en) 2006-11-17 2008-05-22 Maurizio Splendore Apparatus and method for a multi-stage ion transfer tube assembly for use with mass spectrometry
US8288719B1 (en) * 2006-12-29 2012-10-16 Griffin Analytical Technologies, Llc Analytical instruments, assemblies, and methods
US8507850B2 (en) * 2007-05-31 2013-08-13 Perkinelmer Health Sciences, Inc. Multipole ion guide interface for reduced background noise in mass spectrometry
DE102007027352A1 (de) * 2007-06-11 2008-12-18 Oerlikon Leybold Vacuum Gmbh Massenspektrometer-Anordnung
WO2009070555A1 (en) * 2007-11-30 2009-06-04 Waters Technologies Corporation Devices and methods for performing mass analysis
US20090194679A1 (en) * 2008-01-31 2009-08-06 Agilent Technologies, Inc. Methods and apparatus for reducing noise in mass spectrometry
WO2010042303A1 (en) * 2008-10-06 2010-04-15 Shimadzu Corporation Curtain gas filter for mass- and mobility-analyzers that excludes ion-source gases and ions of high mobility
US20100154568A1 (en) * 2008-11-19 2010-06-24 Roth Michael J Analytical Instruments, Assemblies, and Methods
US20110260048A1 (en) * 2010-04-22 2011-10-27 Wouters Eloy R Ion Transfer Tube for a Mass Spectrometer Having a Resistive Tube Member and a Conductive Tube Member
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US20140166875A1 (en) * 2010-09-02 2014-06-19 Wayne State University Systems and methods for high throughput solvent assisted ionization inlet for mass spectrometry
WO2012031082A2 (en) * 2010-09-02 2012-03-08 University Of The Sciences In Philadelphia System and method for ionization of molecules for mass spectrometry and ion mobility spectrometry
WO2012058248A2 (en) 2010-10-25 2012-05-03 Wayne State University Systems and methods extending the laserspray ionization mass spectrometry concept from atmospheric pressure to vacuum
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US8796638B2 (en) 2011-06-08 2014-08-05 Mks Instruments, Inc. Mass spectrometry for a gas analysis with a two-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
US8450681B2 (en) * 2011-06-08 2013-05-28 Mks Instruments, Inc. Mass spectrometry for gas analysis in which both a charged particle source and a charged particle analyzer are offset from an axis of a deflector lens, resulting in reduced baseline signal offsets
US8796620B2 (en) 2011-06-08 2014-08-05 Mks Instruments, Inc. Mass spectrometry for gas analysis with a one-stage charged particle deflector lens between a charged particle source and a charged particle analyzer both offset from a central axis of the deflector lens
US9851333B2 (en) 2013-05-29 2017-12-26 Dionex Corporation Nebulizer for charged aerosol detection (CAD) system
US9558924B2 (en) 2014-12-09 2017-01-31 Morpho Detection, Llc Systems for separating ions and neutrals and methods of operating the same
US9368335B1 (en) * 2015-02-02 2016-06-14 Thermo Finnigan Llc Mass spectrometer
RU2634926C2 (ru) * 2015-12-23 2017-11-08 Общество с ограниченной ответственностью "Новые энергетические технологии" (ООО "НЭТ") Способ масс-спектрометрического анализа газообразных веществ
US10475634B2 (en) * 2017-04-12 2019-11-12 Graduate School At Shenzhen, Tsinghua University Vacuum electro-spray ion source and mass spectrometer
CN114242560A (zh) * 2021-11-02 2022-03-25 中国原子能科学研究院 一种用于排除同量异位素的激光光解装置及方法

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US3371204A (en) * 1966-09-07 1968-02-27 Bell & Howell Co Mass filter with one or more rod electrodes separated into a plurality of insulated segments
US3473020A (en) * 1967-06-19 1969-10-14 Bell & Howell Co Mass analyzer having series aligned curvilinear and rectilinear analyzer sections
US4023398A (en) * 1975-03-03 1977-05-17 John Barry French Apparatus for analyzing trace components
US4542293A (en) * 1983-04-20 1985-09-17 Yale University Process and apparatus for changing the energy of charged particles contained in a gaseous medium
EP0237259A3 (de) * 1986-03-07 1989-04-05 Finnigan Corporation Massenspektrometer
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US4977320A (en) * 1990-01-22 1990-12-11 The Rockefeller University Electrospray ionization mass spectrometer with new features
US5164593A (en) * 1991-02-28 1992-11-17 Kratos Analytical Limited Mass spectrometer system including an ion source operable under high pressure conditions, and a two-stage pumping arrangement
US5157260A (en) * 1991-05-17 1992-10-20 Finnian Corporation Method and apparatus for focusing ions in viscous flow jet expansion region of an electrospray apparatus
US5171990A (en) * 1991-05-17 1992-12-15 Finnigan Corporation Electrospray ion source with reduced neutral noise and method
US5179278A (en) * 1991-08-23 1993-01-12 Mds Health Group Limited Multipole inlet system for ion traps
JP2913924B2 (ja) * 1991-09-12 1999-06-28 株式会社日立製作所 質量分析の方法および装置
JP2902197B2 (ja) * 1992-02-04 1999-06-07 株式会社日立製作所 大気圧イオン化質量分析装置
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JP3367719B2 (ja) * 1993-09-20 2003-01-20 株式会社日立製作所 質量分析計および静電レンズ
JP3671354B2 (ja) * 1994-02-28 2005-07-13 アナリチカ オブ ブランフォード，インコーポレーテッド 質量分析用の多重極イオンガイド
US5495108A (en) * 1994-07-11 1996-02-27 Hewlett-Packard Company Orthogonal ion sampling for electrospray LC/MS
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Also Published As

Publication number Publication date
GB2314967B (en) 2000-12-06
AU2270097A (en) 1997-09-02
JPH11504467A (ja) 1999-04-20
CA2218158A1 (en) 1997-08-21
DE19780214B4 (de) 2009-07-30
WO1997030469A1 (en) 1997-08-21
AU750121B2 (en) 2002-07-11
GB2314967A (en) 1998-01-14
GB9721164D0 (en) 1997-12-03
US5818041A (en) 1998-10-06
JP3993895B2 (ja) 2007-10-17
US5672868A (en) 1997-09-30
CA2218158C (en) 2001-10-02

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8607 Notification of search results after publication
8127 New person/name/address of the applicant

Owner name: VARIAN, INC., PALO ALTO, CALIF., US

8364 No opposition during term of opposition
R082 Change of representative

Representative=s name: KAHLER, KAECK & MOLLEKOPF, 86899 LANDSBERG, DE

Representative=s name: KAHLER, KAECK & MOLLEKOPF, DE

R081 Change of applicant/patentee

Owner name: AGILENT TECHNOLOGIES INC., US

Free format text: FORMER OWNER: VARIAN, INC., PALO ALTO, US

Effective date: 20111130

Owner name: AGILENT TECHNOLOGIES INC., SANTA CLARA, US

Free format text: FORMER OWNER: VARIAN, INC., PALO ALTO, CALIF., US

Effective date: 20111130

R082 Change of representative

Representative=s name: BARTH, DANIEL, DIPL.-ING., DE

Effective date: 20111130

R082 Change of representative

Representative=s name: BARTH, DANIEL, DIPL.-ING., DE

R071 Expiry of right