FR2835057B1 - Dispositif de visee et spectrometre d'emission a source plasma a couplage inductif comportant un tel dispositif - Google Patents

Dispositif de visee et spectrometre d'emission a source plasma a couplage inductif comportant un tel dispositif

Info

Publication number
FR2835057B1
FR2835057B1 FR0200774A FR0200774A FR2835057B1 FR 2835057 B1 FR2835057 B1 FR 2835057B1 FR 0200774 A FR0200774 A FR 0200774A FR 0200774 A FR0200774 A FR 0200774A FR 2835057 B1 FR2835057 B1 FR 2835057B1
Authority
FR
France
Prior art keywords
inductively coupled
coupled plasma
plasma source
transmission spectrometer
sighting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0200774A
Other languages
English (en)
Other versions
FR2835057A1 (fr
Inventor
Emmanuel Fretel
Marchand Alain Le
Christophe Pecheyran
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Jobin Yvon SAS
Original Assignee
Horiba Jobin Yvon SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Jobin Yvon SAS filed Critical Horiba Jobin Yvon SAS
Priority to FR0200774A priority Critical patent/FR2835057B1/fr
Priority to JP2003048215A priority patent/JP2003307491A/ja
Priority to US10/348,337 priority patent/US6876447B2/en
Publication of FR2835057A1 publication Critical patent/FR2835057A1/fr
Application granted granted Critical
Publication of FR2835057B1 publication Critical patent/FR2835057B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
FR0200774A 2002-01-22 2002-01-22 Dispositif de visee et spectrometre d'emission a source plasma a couplage inductif comportant un tel dispositif Expired - Fee Related FR2835057B1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR0200774A FR2835057B1 (fr) 2002-01-22 2002-01-22 Dispositif de visee et spectrometre d'emission a source plasma a couplage inductif comportant un tel dispositif
JP2003048215A JP2003307491A (ja) 2002-01-22 2003-01-20 照準装置及びそのような装置を含み誘導結合プラズマ源を有する発光分光計
US10/348,337 US6876447B2 (en) 2002-01-22 2003-01-22 Sighting device and emission spectrometer with inductively coupled plasma source comprising such a device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0200774A FR2835057B1 (fr) 2002-01-22 2002-01-22 Dispositif de visee et spectrometre d'emission a source plasma a couplage inductif comportant un tel dispositif

Publications (2)

Publication Number Publication Date
FR2835057A1 FR2835057A1 (fr) 2003-07-25
FR2835057B1 true FR2835057B1 (fr) 2004-08-20

Family

ID=27619601

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0200774A Expired - Fee Related FR2835057B1 (fr) 2002-01-22 2002-01-22 Dispositif de visee et spectrometre d'emission a source plasma a couplage inductif comportant un tel dispositif

Country Status (3)

Country Link
US (1) US6876447B2 (fr)
JP (1) JP2003307491A (fr)
FR (1) FR2835057B1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9997325B2 (en) * 2008-07-17 2018-06-12 Verity Instruments, Inc. Electron beam exciter for use in chemical analysis in processing systems

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2543761B2 (ja) * 1989-03-23 1996-10-16 セイコー電子工業株式会社 誘導結合プラズマ質量分析装置
GB9110960D0 (en) * 1991-05-21 1991-07-10 Logicflit Limited Mass spectrometer
JP3367719B2 (ja) * 1993-09-20 2003-01-20 株式会社日立製作所 質量分析計および静電レンズ
US5672868A (en) * 1996-02-16 1997-09-30 Varian Associates, Inc. Mass spectrometer system and method for transporting and analyzing ions
US6122050A (en) * 1998-02-26 2000-09-19 Cornell Research Foundation, Inc. Optical interface for a radially viewed inductively coupled argon plasma-Optical emission spectrometer

Also Published As

Publication number Publication date
FR2835057A1 (fr) 2003-07-25
US20030231307A1 (en) 2003-12-18
JP2003307491A (ja) 2003-10-31
US6876447B2 (en) 2005-04-05

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20091030