DE69228427T2 - Verfahren zur massenspektrometrie unter verwendung eines rauschfreien signals - Google Patents

Verfahren zur massenspektrometrie unter verwendung eines rauschfreien signals

Info

Publication number
DE69228427T2
DE69228427T2 DE69228427T DE69228427T DE69228427T2 DE 69228427 T2 DE69228427 T2 DE 69228427T2 DE 69228427 T DE69228427 T DE 69228427T DE 69228427 T DE69228427 T DE 69228427T DE 69228427 T2 DE69228427 T2 DE 69228427T2
Authority
DE
Germany
Prior art keywords
ions
signal
combined
mass spectrometry
noise
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69228427T
Other languages
English (en)
Other versions
DE69228427D1 (de
Inventor
Paul Kelley
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Application granted granted Critical
Publication of DE69228427D1 publication Critical patent/DE69228427D1/de
Publication of DE69228427T2 publication Critical patent/DE69228427T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/428—Applying a notched broadband signal
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/429—Scanning an electric parameter, e.g. voltage amplitude or frequency

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE69228427T 1991-12-18 1992-11-10 Verfahren zur massenspektrometrie unter verwendung eines rauschfreien signals Expired - Lifetime DE69228427T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/809,767 US5206507A (en) 1991-02-28 1991-12-18 Mass spectrometry method using filtered noise signal
PCT/US1992/009938 WO1993012536A1 (en) 1991-12-18 1992-11-10 Mass spectrometry method using filtered noise signal

Publications (2)

Publication Number Publication Date
DE69228427D1 DE69228427D1 (de) 1999-03-25
DE69228427T2 true DE69228427T2 (de) 1999-10-28

Family

ID=25202168

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69228427T Expired - Lifetime DE69228427T2 (de) 1991-12-18 1992-11-10 Verfahren zur massenspektrometrie unter verwendung eines rauschfreien signals

Country Status (7)

Country Link
US (1) US5206507A (de)
EP (1) EP0617837B1 (de)
JP (1) JP3084749B2 (de)
AT (1) ATE176742T1 (de)
CA (1) CA2125874C (de)
DE (1) DE69228427T2 (de)
WO (1) WO1993012536A1 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5134286A (en) * 1991-02-28 1992-07-28 Teledyne Cme Mass spectrometry method using notch filter
US5274233A (en) * 1991-02-28 1993-12-28 Teledyne Mec Mass spectrometry method using supplemental AC voltage signals
US5397894A (en) * 1993-05-28 1995-03-14 Varian Associates, Inc. Method of high mass resolution scanning of an ion trap mass spectrometer
US5479012A (en) * 1992-05-29 1995-12-26 Varian Associates, Inc. Method of space charge control in an ion trap mass spectrometer
DE4324233C1 (de) * 1993-07-20 1995-01-19 Bruker Franzen Analytik Gmbh Verfahren zur Auswahl der Reaktionspfade in Ionenfallen
US5572022A (en) * 1995-03-03 1996-11-05 Finnigan Corporation Method and apparatus of increasing dynamic range and sensitivity of a mass spectrometer
US5696376A (en) * 1996-05-20 1997-12-09 The Johns Hopkins University Method and apparatus for isolating ions in an ion trap with increased resolving power
US5793038A (en) * 1996-12-10 1998-08-11 Varian Associates, Inc. Method of operating an ion trap mass spectrometer
JP3756365B2 (ja) * 1999-12-02 2006-03-15 株式会社日立製作所 イオントラップ質量分析方法
JP4631219B2 (ja) * 2001-06-26 2011-02-16 株式会社島津製作所 イオントラップ型質量分析装置
JPWO2003041116A1 (ja) * 2001-11-07 2005-03-03 株式会社日立ハイテクノロジーズ 質量分析方法及びイオントラップ質量分析計
AU2002350343A1 (en) 2001-12-21 2003-07-15 Mds Inc., Doing Business As Mds Sciex Use of notched broadband waveforms in a linear ion trap
US6838665B2 (en) * 2002-09-26 2005-01-04 Hitachi High-Technologies Corporation Ion trap type mass spectrometer
JP3936908B2 (ja) * 2002-12-24 2007-06-27 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法
JP2005108578A (ja) * 2003-09-30 2005-04-21 Hitachi Ltd 質量分析装置
US7141784B2 (en) * 2004-05-24 2006-11-28 University Of Massachusetts Multiplexed tandem mass spectrometry
US7772549B2 (en) 2004-05-24 2010-08-10 University Of Massachusetts Multiplexed tandem mass spectrometry
US7498568B2 (en) * 2005-04-29 2009-03-03 Agilent Technologies, Inc. Real-time analysis of mass spectrometry data for identifying peptidic data of interest

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4540884A (en) * 1982-12-29 1985-09-10 Finnigan Corporation Method of mass analyzing a sample by use of a quadrupole ion trap
US4650999A (en) * 1984-10-22 1987-03-17 Finnigan Corporation Method of mass analyzing a sample over a wide mass range by use of a quadrupole ion trap
DE3688215T3 (de) * 1985-05-24 2005-08-25 Thermo Finnigan Llc, San Jose Steuerungsverfahren für eine Ionenfalle.
US4686367A (en) * 1985-09-06 1987-08-11 Finnigan Corporation Method of operating quadrupole ion trap chemical ionization mass spectrometry
US5107109A (en) * 1986-03-07 1992-04-21 Finnigan Corporation Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer
US4761545A (en) * 1986-05-23 1988-08-02 The Ohio State University Research Foundation Tailored excitation for trapped ion mass spectrometry
US4749860A (en) * 1986-06-05 1988-06-07 Finnigan Corporation Method of isolating a single mass in a quadrupole ion trap
US4818869A (en) * 1987-05-22 1989-04-04 Finnigan Corporation Method of isolating a single mass or narrow range of masses and/or enhancing the sensitivity of an ion trap mass spectrometer
US4771172A (en) * 1987-05-22 1988-09-13 Finnigan Corporation Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer operating in the chemical ionization mode
EP0336990B1 (de) * 1988-04-13 1994-01-05 Bruker Franzen Analytik GmbH Methode zur Massenanalyse einer Probe mittels eines Quistors und zur Durchführung dieses Verfahrens entwickelter Quistor
EP0362432A1 (de) * 1988-10-07 1990-04-11 Bruker Franzen Analytik GmbH Methode zur Massenanalyse einer Probe
ATE101942T1 (de) * 1989-02-18 1994-03-15 Bruker Franzen Analytik Gmbh Verfahren und geraet zur massenbestimmung von proben mittels eines quistors.
US5075547A (en) * 1991-01-25 1991-12-24 Finnigan Corporation Quadrupole ion trap mass spectrometer having two pulsed axial excitation input frequencies and method of parent and neutral loss scanning and selected reaction monitoring
US5134286A (en) * 1991-02-28 1992-07-28 Teledyne Cme Mass spectrometry method using notch filter
US5200613A (en) * 1991-02-28 1993-04-06 Teledyne Mec Mass spectrometry method using supplemental AC voltage signals
US5196699A (en) * 1991-02-28 1993-03-23 Teledyne Mec Chemical ionization mass spectrometry method using notch filter

Also Published As

Publication number Publication date
EP0617837A4 (en) 1996-05-22
EP0617837B1 (de) 1999-02-10
WO1993012536A1 (en) 1993-06-24
JPH07502371A (ja) 1995-03-09
ATE176742T1 (de) 1999-02-15
US5206507A (en) 1993-04-27
CA2125874C (en) 2002-06-04
DE69228427D1 (de) 1999-03-25
JP3084749B2 (ja) 2000-09-04
EP0617837A1 (de) 1994-10-05
CA2125874A1 (en) 1993-06-24

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