DE69328979D1 - Verfahren zum Betrieb von Ionenfallenmassenspektrometern - Google Patents

Verfahren zum Betrieb von Ionenfallenmassenspektrometern

Info

Publication number
DE69328979D1
DE69328979D1 DE69328979T DE69328979T DE69328979D1 DE 69328979 D1 DE69328979 D1 DE 69328979D1 DE 69328979 T DE69328979 T DE 69328979T DE 69328979 T DE69328979 T DE 69328979T DE 69328979 D1 DE69328979 D1 DE 69328979D1
Authority
DE
Germany
Prior art keywords
ion trap
mass spectrometers
trap mass
operating ion
operating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69328979T
Other languages
English (en)
Other versions
DE69328979T2 (de
Inventor
Gregory J Wells
Mingda Wang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Varian Inc
Original Assignee
Varian Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Varian Inc filed Critical Varian Inc
Publication of DE69328979D1 publication Critical patent/DE69328979D1/de
Application granted granted Critical
Publication of DE69328979T2 publication Critical patent/DE69328979T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE1993628979 1992-05-29 1993-05-28 Verfahren zum Betrieb von Ionenfallenmassenspektrometern Expired - Fee Related DE69328979T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US89099192A 1992-05-29 1992-05-29

Publications (2)

Publication Number Publication Date
DE69328979D1 true DE69328979D1 (de) 2000-08-10
DE69328979T2 DE69328979T2 (de) 2001-02-15

Family

ID=25397431

Family Applications (3)

Application Number Title Priority Date Filing Date
DE1993621165 Expired - Fee Related DE69321165T2 (de) 1992-05-29 1993-05-28 Verfahren zur Verwendung eines Massenspektrometers
DE1993628979 Expired - Fee Related DE69328979T2 (de) 1992-05-29 1993-05-28 Verfahren zum Betrieb von Ionenfallenmassenspektrometern
DE1993633589 Expired - Fee Related DE69333589T2 (de) 1992-05-29 1993-05-28 Verfahren zum Betreiben eines Ionenfallen-Massenspektrometers

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE1993621165 Expired - Fee Related DE69321165T2 (de) 1992-05-29 1993-05-28 Verfahren zur Verwendung eines Massenspektrometers

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE1993633589 Expired - Fee Related DE69333589T2 (de) 1992-05-29 1993-05-28 Verfahren zum Betreiben eines Ionenfallen-Massenspektrometers

Country Status (4)

Country Link
EP (1) EP0575777B1 (de)
JP (2) JP3444429B2 (de)
CA (1) CA2097211A1 (de)
DE (3) DE69321165T2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5448061A (en) * 1992-05-29 1995-09-05 Varian Associates, Inc. Method of space charge control for improved ion isolation in an ion trap mass spectrometer by dynamically adaptive sampling
US5291017A (en) * 1993-01-27 1994-03-01 Varian Associates, Inc. Ion trap mass spectrometer method and apparatus for improved sensitivity
US5396064A (en) * 1994-01-11 1995-03-07 Varian Associates, Inc. Quadrupole trap ion isolation method
DE4425384C1 (de) * 1994-07-19 1995-11-02 Bruker Franzen Analytik Gmbh Verfahren zur stoßinduzierten Fragmentierung von Ionen in Ionenfallen
US5714755A (en) * 1996-03-01 1998-02-03 Varian Associates, Inc. Mass scanning method using an ion trap mass spectrometer
DE19932839B4 (de) * 1999-07-14 2007-10-11 Bruker Daltonik Gmbh Fragmentierung in Quadrupol-Ionenfallenmassenspektrometern
JP4384542B2 (ja) 2004-05-24 2009-12-16 株式会社日立ハイテクノロジーズ 質量分析装置
DE102005061425B4 (de) * 2005-12-22 2009-06-10 Bruker Daltonik Gmbh Rückgesteuerte Fragmentierung in Ionenfallen-Massenspektrometern
JP4996962B2 (ja) 2007-04-04 2012-08-08 株式会社日立ハイテクノロジーズ 質量分析装置
DE102013213501A1 (de) 2013-07-10 2015-01-15 Carl Zeiss Microscopy Gmbh Massenspektrometer, dessen Verwendung, sowie Verfahren zur massenspektrometrischen Untersuchung eines Gasgemisches
US10985002B2 (en) * 2019-06-11 2021-04-20 Perkinelmer Health Sciences, Inc. Ionization sources and methods and systems using them

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0409362B1 (de) * 1985-05-24 1995-04-19 Finnigan Corporation Betriebsverfahren für eine Ionenfalle
US4686367A (en) * 1985-09-06 1987-08-11 Finnigan Corporation Method of operating quadrupole ion trap chemical ionization mass spectrometry
DE3886922T2 (de) * 1988-04-13 1994-04-28 Bruker Franzen Analytik Gmbh Methode zur Massenanalyse einer Probe mittels eines Quistors und zur Durchführung dieses Verfahrens entwickelter Quistor.
EP0362432A1 (de) * 1988-10-07 1990-04-11 Bruker Franzen Analytik GmbH Methode zur Massenanalyse einer Probe
US5200613A (en) * 1991-02-28 1993-04-06 Teledyne Mec Mass spectrometry method using supplemental AC voltage signals

Also Published As

Publication number Publication date
EP0575777A2 (de) 1993-12-29
DE69333589T2 (de) 2005-02-03
DE69321165T2 (de) 1999-06-02
DE69333589D1 (de) 2004-09-16
JPH0696727A (ja) 1994-04-08
JP2004004082A (ja) 2004-01-08
DE69328979T2 (de) 2001-02-15
DE69321165D1 (de) 1998-10-29
CA2097211A1 (en) 1993-11-30
JP3444429B2 (ja) 2003-09-08
EP0575777A3 (de) 1994-03-16
EP0575777B1 (de) 1998-09-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee