DE69306051D1 - Halbleiterwandler - Google Patents
HalbleiterwandlerInfo
- Publication number
- DE69306051D1 DE69306051D1 DE69306051T DE69306051T DE69306051D1 DE 69306051 D1 DE69306051 D1 DE 69306051D1 DE 69306051 T DE69306051 T DE 69306051T DE 69306051 T DE69306051 T DE 69306051T DE 69306051 D1 DE69306051 D1 DE 69306051D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor converter
- converter
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
- G01L9/02—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning
- G01L9/06—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning of piezo-resistive devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L27/00—Testing or calibrating of apparatus for measuring fluid pressure
- G01L27/002—Calibrating, i.e. establishing true relation between transducer output value and value to be measured, zeroing, linearising or span error determination
- G01L27/005—Apparatus for calibrating pressure sensors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Measuring Fluid Pressure (AREA)
- Semiconductor Integrated Circuits (AREA)
- Pressure Sensors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4206071A JP2720718B2 (ja) | 1992-07-09 | 1992-07-09 | 半導体センサ装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69306051D1 true DE69306051D1 (de) | 1997-01-02 |
DE69306051T2 DE69306051T2 (de) | 1997-06-12 |
Family
ID=16517352
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69306051T Expired - Lifetime DE69306051T2 (de) | 1992-07-09 | 1993-07-08 | Halbleiterwandler |
Country Status (4)
Country | Link |
---|---|
US (1) | US5461584A (de) |
EP (1) | EP0578252B1 (de) |
JP (1) | JP2720718B2 (de) |
DE (1) | DE69306051T2 (de) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3459017B2 (ja) * | 1993-02-22 | 2003-10-20 | 直 柴田 | 半導体装置 |
US5561632A (en) * | 1994-01-26 | 1996-10-01 | Sony Corporation | Nonvolatile semiconductor flash memory |
US6845046B1 (en) | 1997-01-31 | 2005-01-18 | Renesas Technology Corp. | Microcomputer and microprocessor having flash memory operable from single external power supply |
US7023729B2 (en) * | 1997-01-31 | 2006-04-04 | Renesas Technology Corp. | Microcomputer and microprocessor having flash memory operable from single external power supply |
US5991221A (en) * | 1998-01-30 | 1999-11-23 | Hitachi, Ltd. | Microcomputer and microprocessor having flash memory operable from single external power supply |
DE19819265C1 (de) * | 1998-04-30 | 1999-08-19 | Micronas Intermetall Gmbh | Verfahren zum Parametrieren einer integrierten Schaltungsanordnung und integrierte Schaltungsanordnung hierfür |
EP1120828B1 (de) | 2000-01-28 | 2005-04-06 | STMicroelectronics S.r.l. | Verfahren und Vorrichtung zur Trimmung von elektronischen Schaltungen |
JP4723714B2 (ja) * | 2000-10-04 | 2011-07-13 | 株式会社東芝 | 半導体集積回路装置およびその検査方法 |
US6718275B2 (en) | 2001-03-19 | 2004-04-06 | Denso Corporation | Trimming circuit for a physical quantity sensor |
JP4764996B2 (ja) * | 2001-04-12 | 2011-09-07 | 富士電機株式会社 | 半導体物理量センサ装置 |
US7180798B2 (en) | 2001-04-12 | 2007-02-20 | Fuji Electric Co., Ltd. | Semiconductor physical quantity sensing device |
JP3963115B2 (ja) * | 2002-04-09 | 2007-08-22 | 富士電機デバイステクノロジー株式会社 | 半導体物理量センサ装置 |
US7828479B1 (en) * | 2003-04-08 | 2010-11-09 | National Semiconductor Corporation | Three-terminal dual-diode system for fully differential remote temperature sensors |
JP4759945B2 (ja) * | 2004-07-15 | 2011-08-31 | 株式会社ジェイテクト | 電気的トリミングシステム |
JP4074276B2 (ja) * | 2004-09-02 | 2008-04-09 | 株式会社東芝 | 半導体装置 |
JP2006078379A (ja) * | 2004-09-10 | 2006-03-23 | Tgk Co Ltd | 圧力センサおよびその製造方法 |
US7429129B2 (en) * | 2005-02-28 | 2008-09-30 | Standard Microsystems Corporation | Proportional settling time adjustment for diode voltage and temperature measurements dependent on forced level current |
JP2007078397A (ja) * | 2005-09-12 | 2007-03-29 | Mitsubishi Electric Corp | 半導体圧力センサ |
JP5035591B2 (ja) * | 2006-02-23 | 2012-09-26 | アイシン精機株式会社 | 端末制御システム |
DE102006022283A1 (de) | 2006-05-11 | 2007-11-15 | Micronas Gmbh | Monolithische Sensoranordnung bzw. Verfahren zum Ansteuern einer monolithischen Sensoranordnung |
US8212544B2 (en) * | 2007-08-13 | 2012-07-03 | SK hynix, Inc. | Semiconductor integrated circuit having level regulation for reference voltage |
JP5092930B2 (ja) * | 2008-06-24 | 2012-12-05 | 株式会社デンソー | センサ装置 |
JP5730527B2 (ja) * | 2010-10-08 | 2015-06-10 | シャープ株式会社 | 光検出装置、及び光検出装置を搭載した電子機器 |
CN103328932B (zh) * | 2011-02-28 | 2015-08-05 | 富士电机株式会社 | 半导体集成电路及半导体物理量传感装置 |
JP5796536B2 (ja) * | 2012-04-18 | 2015-10-21 | 株式会社デンソー | 電子回路 |
JP6264160B2 (ja) * | 2014-04-04 | 2018-01-24 | 富士電機株式会社 | 半導体物理量センサ装置 |
JP6324189B2 (ja) | 2014-04-24 | 2018-05-16 | ローム株式会社 | 半導体装置 |
JP6457734B2 (ja) * | 2014-04-24 | 2019-01-23 | ローム株式会社 | 半導体装置 |
WO2017164183A1 (ja) * | 2016-03-24 | 2017-09-28 | シチズンファインデバイス株式会社 | 圧電センサ |
DE112017000318B4 (de) * | 2016-06-03 | 2024-01-18 | Fuji Electric Co., Ltd. | Halbleitervorrichtung |
CN114705360B (zh) * | 2022-06-07 | 2022-08-23 | 中国空气动力研究与发展中心高速空气动力研究所 | 一种风洞稳定段压力传感器现场检测装置 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5213915B2 (de) * | 1972-02-14 | 1977-04-18 | ||
JPS5314412B2 (de) * | 1973-06-07 | 1978-05-17 | ||
JPS5399784A (en) * | 1977-02-10 | 1978-08-31 | Nec Corp | Integrated circuit device |
US4272753A (en) * | 1978-08-16 | 1981-06-09 | Harris Corporation | Integrated circuit fuse |
JPS6040870B2 (ja) * | 1982-08-10 | 1985-09-12 | 松下電工株式会社 | 電気かみそりの外刃 |
DE3234345A1 (de) * | 1982-09-16 | 1984-03-22 | Robert Bosch Gmbh, 7000 Stuttgart | Kodiersystem zur erfassung von informationen an werkstuecktraegern und dergleichen |
US4612499A (en) * | 1983-11-07 | 1986-09-16 | Texas Instruments Incorporated | Test input demultiplexing circuit |
DE3786487T2 (de) * | 1986-05-05 | 1993-11-18 | Texas Instruments Inc | Messfühler hoher Präzision. |
JPH0315345A (ja) * | 1988-04-28 | 1991-01-23 | Toshio Tanno | くるみ黒糖 |
US5081867A (en) * | 1988-09-30 | 1992-01-21 | Nec Corporation | Semiconductor sensor |
JPH0443425A (ja) * | 1990-06-08 | 1992-02-13 | Nec Corp | ファイル出力装置 |
US5080096A (en) * | 1990-07-06 | 1992-01-14 | Medtronic, Inc. | Method and apparatus for accessing a nonvolatile memory |
-
1992
- 1992-07-09 JP JP4206071A patent/JP2720718B2/ja not_active Expired - Lifetime
-
1993
- 1993-07-08 EP EP93110963A patent/EP0578252B1/de not_active Expired - Lifetime
- 1993-07-08 DE DE69306051T patent/DE69306051T2/de not_active Expired - Lifetime
- 1993-07-08 US US08/087,373 patent/US5461584A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69306051T2 (de) | 1997-06-12 |
EP0578252A3 (de) | 1994-02-16 |
EP0578252B1 (de) | 1996-11-20 |
JPH0629555A (ja) | 1994-02-04 |
EP0578252A2 (de) | 1994-01-12 |
US5461584A (en) | 1995-10-24 |
JP2720718B2 (ja) | 1998-03-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8320 | Willingness to grant licences declared (paragraph 23) |