DE69131099T2 - Analog-digitalwandler - Google Patents

Analog-digitalwandler

Info

Publication number
DE69131099T2
DE69131099T2 DE69131099T DE69131099T DE69131099T2 DE 69131099 T2 DE69131099 T2 DE 69131099T2 DE 69131099 T DE69131099 T DE 69131099T DE 69131099 T DE69131099 T DE 69131099T DE 69131099 T2 DE69131099 T2 DE 69131099T2
Authority
DE
Germany
Prior art keywords
input
terminal
voltage
output
bit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69131099T
Other languages
German (de)
English (en)
Other versions
DE69131099D1 (de
Inventor
Donald Jon Sauer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sarnoff Corp
Original Assignee
Sarnoff Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sarnoff Corp filed Critical Sarnoff Corp
Application granted granted Critical
Publication of DE69131099D1 publication Critical patent/DE69131099D1/de
Publication of DE69131099T2 publication Critical patent/DE69131099T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/1023—Offset correction
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
    • H03K5/2481—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors with at least one differential stage
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
    • H03K5/249—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors using clock signals
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/121—Interleaved, i.e. using multiple converters or converter parts for one channel
    • H03M1/1215—Interleaved, i.e. using multiple converters or converter parts for one channel using time-division multiplexing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/68—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Manipulation Of Pulses (AREA)
DE69131099T 1990-07-02 1991-07-02 Analog-digitalwandler Expired - Fee Related DE69131099T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB909014679A GB9014679D0 (en) 1990-07-02 1990-07-02 Sequential successive approximation a/d converter
PCT/US1991/004551 WO1992001336A1 (en) 1990-07-02 1991-07-02 Analog to digital converter

Publications (2)

Publication Number Publication Date
DE69131099D1 DE69131099D1 (de) 1999-05-12
DE69131099T2 true DE69131099T2 (de) 1999-11-04

Family

ID=10678554

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69131099T Expired - Fee Related DE69131099T2 (de) 1990-07-02 1991-07-02 Analog-digitalwandler
DE69133008T Expired - Fee Related DE69133008T2 (de) 1990-07-02 1991-07-02 Analog-Digital-Wandler und Vergleichschaltung dafür

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE69133008T Expired - Fee Related DE69133008T2 (de) 1990-07-02 1991-07-02 Analog-Digital-Wandler und Vergleichschaltung dafür

Country Status (7)

Country Link
US (1) US5262779A (enExample)
EP (2) EP0798864B1 (enExample)
JP (2) JP3338050B2 (enExample)
DE (2) DE69131099T2 (enExample)
ES (1) ES2129443T3 (enExample)
GB (1) GB9014679D0 (enExample)
WO (1) WO1992001336A1 (enExample)

Families Citing this family (54)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5546082A (en) * 1994-04-22 1996-08-13 Rosemount Analytical Inc. Measurement probe with improved analog-to-digital conversion
US5471208A (en) * 1994-05-20 1995-11-28 David Sarnoff Research Center, Inc. Reference ladder auto-calibration circuit for an analog to digital converter
US5638075A (en) * 1994-10-31 1997-06-10 Mitsubishi Denki Kabushiki Kaisha Successive approximation ADC with rounding to vary bit number output
US5543795A (en) * 1995-06-02 1996-08-06 Intermedics, Inc. Hybrid analog-to-digital convertor for low power applications, such as use in an implantable medical device
US5748134A (en) * 1996-03-01 1998-05-05 Ericsson Inc. Method and apparatus for converting an analog signal into digital format
US6389134B1 (en) 1997-04-22 2002-05-14 Silicon Laboratories, Inc. Call progress monitor circuitry and method for a communication system
US6408034B1 (en) 1997-04-22 2002-06-18 Silicon Laboratories, Inc. Framed delta sigma data with unlikely delta sigma data patterns
US6480602B1 (en) 1997-04-22 2002-11-12 Silicon Laboratories, Inc. Ring-detect interface circuitry and method for a communication system
US6167134A (en) 1997-04-22 2000-12-26 Silicon Laboratories, Inc. External resistor and method to minimize power dissipation in DC holding circuitry for a communication system
US6137827A (en) 1997-04-22 2000-10-24 Silicon Laboratories, Inc. Isolation system with digital communication across a capacitive barrier
US6516024B1 (en) 1997-04-22 2003-02-04 Silicon Laboratories Inc. Digital access arrangement circuitry and method for connecting to phone lines having a DC holding circuit with low distortion and current limiting
US6298133B1 (en) 1997-04-22 2001-10-02 Silicon Laboratories, Inc. Telephone line interface architecture using ringer inputs for caller ID data
US6144326A (en) 1997-04-22 2000-11-07 Silicon Laboratories, Inc. Digital isolation system with ADC offset calibration
US6359983B1 (en) 1997-04-22 2002-03-19 Silicon Laboratories, Inc. Digital isolation system with data scrambling
US6385235B1 (en) 1997-04-22 2002-05-07 Silicon Laboratories, Inc. Direct digital access arrangement circuitry and method for connecting to phone lines
US6430229B1 (en) 1997-04-22 2002-08-06 Silicon Laboratories Inc. Capacitive isolation system with digital communication and power transfer
US6587560B1 (en) 1997-04-22 2003-07-01 Silicon Laboratories Inc. Low voltage circuits powered by the phone line
US6307891B1 (en) 1997-04-22 2001-10-23 Silicon Laboratories, Inc. Method and apparatus for freezing a communication link during a disruptive event
US6289070B1 (en) 1997-04-22 2001-09-11 Silicon Laboratories, Inc. Digital isolation system with ADC offset calibration including coarse offset
US6456712B1 (en) 1997-04-22 2002-09-24 Silicon Laboratories Inc. Separation of ring detection functions across isolation barrier for minimum power
US6504864B1 (en) 1997-04-22 2003-01-07 Silicon Laboratories Inc. Digital access arrangement circuitry and method for connecting to phone lines having a second order DC holding circuit
US5870046A (en) 1997-04-22 1999-02-09 Silicon Laboratories Inc. Analog isolation system with digital communication across a capacitive barrier
US6442271B1 (en) 1997-04-22 2002-08-27 Silicon Laboratories, Inc. Digital isolation system with low power mode
US6442213B1 (en) * 1997-04-22 2002-08-27 Silicon Laboratories Inc. Digital isolation system with hybrid circuit in ADC calibration loop
US6498825B1 (en) 1997-04-22 2002-12-24 Silicon Laboratories Inc. Digital access arrangement circuitry and method for connecting to phone lines having a DC holding circuit with programmable current limiting
US5929667A (en) * 1997-06-10 1999-07-27 International Business Machines Corporation Method and apparatus for protecting circuits subjected to high voltage
US5955978A (en) * 1997-09-08 1999-09-21 Lsi Logic Corporation A/D converter with auto-zeroed latching comparator and method
US5914681A (en) * 1997-10-02 1999-06-22 Burr-Brown Corporation Fast wakeup biasing circuit for analog-to-digital converter
US6097244A (en) * 1998-12-17 2000-08-01 Centillium Communications, Inc. Highly-linear continuous-time filter for a 3-volt supply with PLL-controlled resistor and digitally-controlled capacitor
SE513434C2 (sv) * 1999-01-20 2000-09-11 Ericsson Telefon Ab L M Lågenergi PARALLELL ADC
SE517675C2 (sv) 2000-03-14 2002-07-02 Ericsson Telefon Ab L M Ett förfarande för A/D-omvandling samt ett A/D- omvandlingssystem
US6366231B1 (en) * 2000-04-10 2002-04-02 General Electric Company Integrate and fold analog-to-digital converter with saturation prevention
US6654594B1 (en) * 2000-05-30 2003-11-25 Motorola, Inc. Digitized automatic gain control system and methods for a controlled gain receiver
DE10066029B4 (de) * 2000-08-23 2005-11-10 Infineon Technologies Ag Analog/Digital-Wandler
US6559689B1 (en) 2000-10-02 2003-05-06 Allegro Microsystems, Inc. Circuit providing a control voltage to a switch and including a capacitor
JP4402108B2 (ja) * 2003-01-17 2010-01-20 エヌエックスピー ビー ヴィ アナログ・ディジタル変換装置、アナログ・ディジタル変換のための方法、又は当該変換装置がもたらされる信号処理システム
US7095354B2 (en) * 2004-08-12 2006-08-22 General Electric Company Very linear wide-range pipelined charge-to-digital converter
JP4827627B2 (ja) * 2006-06-16 2011-11-30 キヤノン株式会社 撮像装置及びその処理方法
US8212697B2 (en) 2010-06-15 2012-07-03 Csr Technology Inc. Methods of and arrangements for offset compensation of an analog-to-digital converter
US9160293B2 (en) 2013-09-07 2015-10-13 Robert C. Schober Analog amplifiers and comparators
ITMI20132037A1 (it) 2013-12-06 2015-06-07 St Microelectronics Int Nv Metodo per la correzione di errori digitali per convertitore analogico digitale binario ad approssimazioni successive.
KR102094469B1 (ko) 2013-12-10 2020-03-27 삼성전자주식회사 디지털-아날로그 변환 장치 및 방법
KR102188059B1 (ko) 2013-12-23 2020-12-07 삼성전자 주식회사 Ldo 레귤레이터, 전원 관리 시스템 및 ldo 전압 제어 방법
WO2015134037A1 (en) * 2014-03-07 2015-09-11 Intel Corporation Physically unclonable function circuit using resistive memory device
TWI566530B (zh) * 2014-11-03 2017-01-11 瑞昱半導體股份有限公司 連續逼近式類比至數位轉換器與轉換方法
US9543974B1 (en) * 2015-09-18 2017-01-10 Analog Devices, Inc. Reducing switching error in data converters
JP6445746B2 (ja) * 2016-12-21 2018-12-26 オリンパス株式会社 逐次比較型ａ／ｄ変換装置、撮像装置、内視鏡および設定方法
US9941894B1 (en) 2017-05-04 2018-04-10 Analog Devices Global Multiple string, multiple output digital to analog converter
US10782263B2 (en) 2017-05-04 2020-09-22 Analog Devices Global Systems and methods for determining the condition of a gas sensor
US10075179B1 (en) 2017-08-03 2018-09-11 Analog Devices Global Multiple string, multiple output digital to analog converter
US10454488B1 (en) * 2018-05-31 2019-10-22 Analog Devices Global Unlimited Company Variable speed comparator
US10291251B1 (en) * 2018-09-21 2019-05-14 Semiconductor Components Industries, Llc Imaging systems with sub-radix-2 charge sharing successive approximation register (SAR) analog-to-digital converters
US11558061B2 (en) * 2021-04-22 2023-01-17 Ciena Corporation ADC self-calibration with on-chip circuit and method
JP2024055052A (ja) * 2022-10-06 2024-04-18 株式会社ソシオネクスト 比較回路、アナログデジタル変換回路、及び半導体集積回路

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3781871A (en) * 1972-06-13 1973-12-25 Westinghouse Electric Corp Analog to digital converter
US4228423A (en) * 1977-12-30 1980-10-14 The United States Of America As Represented By The Secretary Of The Air Force Offset correction apparatus for a successive approximation A/D converter
US4262221A (en) * 1979-03-09 1981-04-14 Rca Corporation Voltage comparator
US4385286A (en) * 1980-07-18 1983-05-24 American Microsystems, Inc. Use of single reference voltage for analog to digital or digital to analog conversion of bipolar signals
EP0111230B1 (en) * 1982-11-26 1987-03-11 Nec Corporation Voltage comparator circuit
DE3276991D1 (en) * 1982-12-28 1987-09-17 Ibm Analog-digital converter
US4620179A (en) * 1983-08-29 1986-10-28 Harris Corporation Method for successive approximation A/D conversion
US4691189A (en) * 1986-05-23 1987-09-01 Rca Corporation Comparator with cascaded latches
ATE109325T1 (de) * 1988-09-30 1994-08-15 Siemens Ag Selbstkalibrierender a/d- und d/a-wandler.
CA2004317C (en) * 1988-12-07 1993-11-30 Noriyuki Tokuhiro Successive comparison type analog-to-digital converting apparatus
US4940981A (en) * 1989-02-08 1990-07-10 Burr-Brown Corporation Dual analog-to-digital converter with single successive approximation register
US4989003A (en) * 1989-06-19 1991-01-29 Rca Corporation Autozeroed set comparator circuitry
US5032744A (en) * 1989-10-31 1991-07-16 Vlsi Technology, Inc. High speed comparator with offset cancellation

Also Published As

Publication number Publication date
EP0537304A1 (en) 1993-04-21
EP0537304B1 (en) 1999-04-07
EP0537304A4 (enExample) 1995-01-18
JPH05509214A (ja) 1993-12-16
DE69131099D1 (de) 1999-05-12
EP0798864B1 (en) 2002-05-08
DE69133008D1 (de) 2002-06-13
JP3338050B2 (ja) 2002-10-28
WO1992001336A1 (en) 1992-01-23
DE69133008T2 (de) 2002-11-21
JP2002094377A (ja) 2002-03-29
EP0798864A1 (en) 1997-10-01
US5262779A (en) 1993-11-16
GB9014679D0 (en) 1990-08-22
ES2129443T3 (es) 1999-06-16

Similar Documents

Publication Publication Date Title
DE69131099T2 (de) Analog-digitalwandler
DE19946750B4 (de) Zweischritt-Analog-Digital-Wandler und -Verfahren
DE69320853T2 (de) Schaltung zur Analog-/Digital-Umwandlung
DE3642070C2 (enExample)
DE69313619T2 (de) Schaltungsanordnung zur analog-digital umsetzung
DE19732840C2 (de) Pipeline-Analog-Digital-Wandler
DE69523911T2 (de) Abtastschalter mit konstanter impedanz
DE3586187T2 (de) Analog-digital-wandler.
DE69928057T2 (de) Komparator and DA-Umsetzer mit geschalteten Kapazitäten
DE3136783C2 (de) Analog/Digital-Umsetzer
DE4002677A1 (de) Doppel-analog-digital-wandler mit einem einzigen folgeapproximationsregister
DE69528169T2 (de) Automatische kalibrierungsschaltung mit einer referenzskala für einen digital-analogen wandler
DE602005004343T2 (de) Schaltung mit geschalteten Kapazitäten und Pipeline-Analog-Digital-Wandler
DE2855584A1 (de) Taktgesteuerter praezisionsvergleicher
EP1603139A1 (de) Vorrichtung und Verfahren zur Kompensation von Fehlern in einer Sample-und-hold-Schaltung
DE102017110976B3 (de) Selbstoszillierender Mehrrampen-Umsetzer und Verfahren zum Umsetzen einer Kapazität in ein digitales Signal
DE102021132279A1 (de) Schaltung einschliesslich eines strom-digital-analogwandlers, verfahren zum betreiben eines strom-digital-analog-wandlers und zeitkontinuierlicher delta-sigma-wandler
DE102019112542A1 (de) Reservoirkondensator-basierter analog-digital-wandler
DE10154249C1 (de) Analog/Digital-Wandler
DE69221961T2 (de) Schaltung zur Korrektur von durch dielektrische Relaxation verursachte Fehler für Ladungswiederverteilung-AD-Wandler
DE2451983A1 (de) Digital-/analogwandler
DE3788270T2 (de) Analog-Digital-Wandler.
EP0881777A2 (de) Vorrichtung zur Digital-Analog-Wandlung mit hoher Linearität
DE69510413T2 (de) Komparator und Mehrfachvergleichs-A/D-Wandler unter Anwendung des Interpolationsprinzips
DE60129356T2 (de) Verfahren und gerät zur anwendung in systemen mit geschalteten kapazitäten

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee