DE68911374D1 - LSI-System mit einer Vielzahl von auf einer Karte montierten LSI-Schaltungschips. - Google Patents

LSI-System mit einer Vielzahl von auf einer Karte montierten LSI-Schaltungschips.

Info

Publication number
DE68911374D1
DE68911374D1 DE89304922T DE68911374T DE68911374D1 DE 68911374 D1 DE68911374 D1 DE 68911374D1 DE 89304922 T DE89304922 T DE 89304922T DE 68911374 T DE68911374 T DE 68911374T DE 68911374 D1 DE68911374 D1 DE 68911374D1
Authority
DE
Germany
Prior art keywords
lsi
card
large number
circuit chips
chips mounted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE89304922T
Other languages
English (en)
Other versions
DE68911374T2 (de
Inventor
Takeshi Kono
Tatsuro Shintamagawa Yoshimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Publication of DE68911374D1 publication Critical patent/DE68911374D1/de
Application granted granted Critical
Publication of DE68911374T2 publication Critical patent/DE68911374T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2818—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE89304922T 1988-05-19 1989-05-16 LSI-System mit einer Vielzahl von auf einer Karte montierten LSI-Schaltungschips. Expired - Fee Related DE68911374T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63123405A JPH0746130B2 (ja) 1988-05-19 1988-05-19 Ｌｓｉシステム

Publications (2)

Publication Number Publication Date
DE68911374D1 true DE68911374D1 (de) 1994-01-27
DE68911374T2 DE68911374T2 (de) 1994-04-14

Family

ID=14859743

Family Applications (1)

Application Number Title Priority Date Filing Date
DE89304922T Expired - Fee Related DE68911374T2 (de) 1988-05-19 1989-05-16 LSI-System mit einer Vielzahl von auf einer Karte montierten LSI-Schaltungschips.

Country Status (7)

Country Link
US (1) US4949033A (de)
EP (1) EP0343828B1 (de)
JP (1) JPH0746130B2 (de)
KR (1) KR920004536B1 (de)
AU (1) AU596767B2 (de)
CA (1) CA1301950C (de)
DE (1) DE68911374T2 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0394183A (ja) * 1989-05-19 1991-04-18 Fujitsu Ltd 半導体集積回路の試験方法及び回路
JP2760157B2 (ja) * 1991-01-23 1998-05-28 日本電気株式会社 Ｌｓｉテスト方法
WO1992019052A1 (en) * 1991-04-19 1992-10-29 Vlsi Technology, Inc. Mappable test structure for gate array circuit and method for testing the same
JPH05307619A (ja) * 1991-05-16 1993-11-19 Nec Corp マイクロプロセッサのａｃ特性測定方法
JP2936807B2 (ja) * 1991-07-12 1999-08-23 日本電気株式会社 集積回路
TWI269223B (en) * 2005-04-25 2006-12-21 Via Tech Inc Method and related apparatus for calibrating signal driving parameters between chips
JP6003129B2 (ja) * 2012-03-19 2016-10-05 富士通株式会社 描画装置、描画方法および描画プログラム

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3833853A (en) * 1973-04-13 1974-09-03 Honeywell Inf Systems Method and apparatus for testing printed wiring boards having integrated circuits
DE2437673C3 (de) * 1974-08-05 1978-04-27 Siemens Ag, 1000 Berlin Und 8000 Muenchen Vorrichtung zum Prüfen von Innenlagen mehrlagiger Leiterplatten
JPS53125771A (en) * 1977-04-08 1978-11-02 Toshiba Corp Measuring unit for semiconductor
US4443278A (en) * 1981-05-26 1984-04-17 International Business Machines Corporation Inspection of multilayer ceramic circuit modules by electrical inspection of green specimens
GB2104669A (en) * 1981-08-06 1983-03-09 Int Computers Ltd Apparatus for testing electronic devices
FR2557701B1 (fr) * 1983-12-28 1986-04-11 Crouzet Sa Dispositif de controle de continuite des circuits imprimes
JPS6173075A (ja) * 1984-09-19 1986-04-15 Hitachi Ltd Ｌｓｉ論理状態抽出方式
US4748403A (en) * 1986-02-05 1988-05-31 Hewlett-Packard Company Apparatus for measuring circuit element characteristics with VHF signal
JPS63133072A (ja) * 1986-11-26 1988-06-04 Fujitsu Ltd Ｌｓｉシステムテスト方式

Also Published As

Publication number Publication date
EP0343828B1 (de) 1993-12-15
KR920004536B1 (en) 1992-06-08
KR900019186A (ko) 1990-12-24
AU3486289A (en) 1989-11-23
JPH0746130B2 (ja) 1995-05-17
JPH01292272A (ja) 1989-11-24
US4949033A (en) 1990-08-14
EP0343828A1 (de) 1989-11-29
CA1301950C (en) 1992-05-26
AU596767B2 (en) 1990-05-10
DE68911374T2 (de) 1994-04-14

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee