DE602007009794D1 - Testapparat - Google Patents

Testapparat

Info

Publication number
DE602007009794D1
DE602007009794D1 DE602007009794T DE602007009794T DE602007009794D1 DE 602007009794 D1 DE602007009794 D1 DE 602007009794D1 DE 602007009794 T DE602007009794 T DE 602007009794T DE 602007009794 T DE602007009794 T DE 602007009794T DE 602007009794 D1 DE602007009794 D1 DE 602007009794D1
Authority
DE
Germany
Prior art keywords
section
cell
fail information
fail
block
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602007009794T
Other languages
English (en)
Inventor
Shinya Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE602007009794D1 publication Critical patent/DE602007009794D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56008—Error analysis, representation of errors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5602—Interface to device under test
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5606—Error catch memory

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Diaphragms For Electromechanical Transducers (AREA)
  • Beans For Foods Or Fodder (AREA)
  • Control And Other Processes For Unpacking Of Materials (AREA)
  • Dry Shavers And Clippers (AREA)
  • Steroid Compounds (AREA)
  • Lubricants (AREA)
DE602007009794T 2007-02-16 2007-02-16 Testapparat Active DE602007009794D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/052851 WO2008099502A1 (ja) 2007-02-16 2007-02-16 試験装置

Publications (1)

Publication Number Publication Date
DE602007009794D1 true DE602007009794D1 (de) 2010-11-25

Family

ID=39689761

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602007009794T Active DE602007009794D1 (de) 2007-02-16 2007-02-16 Testapparat

Country Status (8)

Country Link
US (1) US8074130B2 (de)
EP (1) EP1978527B1 (de)
JP (1) JP4472004B2 (de)
CN (1) CN101361140A (de)
AT (1) ATE484834T1 (de)
DE (1) DE602007009794D1 (de)
TW (1) TWI361349B (de)
WO (1) WO2008099502A1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7620861B2 (en) * 2007-05-31 2009-11-17 Kingtiger Technology (Canada) Inc. Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels
JP2010134979A (ja) * 2008-12-03 2010-06-17 Fujitsu Ltd 演算処理装置および記憶装置用試験装置の制御方法
JP4448895B1 (ja) * 2009-03-10 2010-04-14 株式会社アドバンテスト 試験装置および試験方法
KR101586046B1 (ko) * 2009-05-26 2016-01-18 삼성전자주식회사 저장 장치 및 그것의 읽기 방법
KR101288113B1 (ko) * 2009-07-13 2013-07-19 가부시키가이샤 어드밴티스트 시험 장치 및 구제 해석 방법
US8429470B2 (en) * 2010-03-10 2013-04-23 Micron Technology, Inc. Memory devices, testing systems and methods
TWI452879B (zh) * 2010-04-27 2014-09-11 Univ Nat Sun Yat Sen 特殊應用網路晶片之全晶片拓樸產生合成方法
JP2012221521A (ja) * 2011-04-06 2012-11-12 Advantest Corp メモリリペア解析装置、メモリリペア解析方法、および試験装置
CN103021468A (zh) * 2012-12-21 2013-04-03 上海宏力半导体制造有限公司 存储器的出错信息记录方法及冗余替代方法
KR102507774B1 (ko) * 2018-03-08 2023-03-09 에스케이하이닉스 주식회사 메모리 칩 및 그것을 포함하는 테스트 시스템

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60263528A (ja) * 1984-06-09 1985-12-27 Dainippon Screen Mfg Co Ltd ２値画像デ−タ圧縮方法
JPS6418606A (en) 1987-07-14 1989-01-23 Kyushu Electron Metal Manufacture of semi-conductor wafer
EP0424612A3 (en) * 1989-08-30 1992-03-11 International Business Machines Corporation Apparatus and method for real time data error capture and compression for redundancy analysis of a memory
KR0148153B1 (ko) * 1994-05-31 1998-09-15 김광호 비트스터핑 제거장치
JP3545535B2 (ja) 1996-05-29 2004-07-21 株式会社アドバンテスト 半導体メモリ試験方法および装置
JP3700797B2 (ja) * 1996-08-09 2005-09-28 株式会社アドバンテスト メモリ試験装置
JPH10125092A (ja) 1996-10-22 1998-05-15 Advantest Corp フラッシュメモリ試験装置
IL127063A0 (en) * 1997-03-24 1999-09-22 Advantest Corp Method of compressing and expanding data pattern and data pattern compressing and expanding apparatus
JP3558252B2 (ja) * 1997-11-10 2004-08-25 株式会社アドバンテスト 半導体メモリ試験装置
JPH11213695A (ja) * 1998-01-21 1999-08-06 Advantest Corp 半導体メモリ試験装置
DE10137332B4 (de) * 2001-07-31 2014-11-06 Qimonda Ag Verfahren und Anordnung zur Ausgabe von Fehlerinformationen aus Halbleitereinrichtungen
US7107501B2 (en) * 2002-05-31 2006-09-12 Infineon Technologies Ag Test device, test system and method for testing a memory circuit
US6973613B2 (en) * 2002-06-28 2005-12-06 Sun Microsystems, Inc. Error detection/correction code which detects and corrects component failure and which provides single bit error correction subsequent to component failure
CA2414632A1 (en) * 2002-12-18 2004-06-18 Logicvision, Inc. Method and circuit for collecting memory failure information
US7404109B2 (en) * 2003-06-12 2008-07-22 Verigy (Singapore) Pte. Ltd. Systems and methods for adaptively compressing test data
JP4704131B2 (ja) * 2005-07-04 2011-06-15 株式会社アドバンテスト 試験装置、及び試験方法

Also Published As

Publication number Publication date
US8074130B2 (en) 2011-12-06
WO2008099502A1 (ja) 2008-08-21
CN101361140A (zh) 2009-02-04
EP1978527A1 (de) 2008-10-08
US20080201621A1 (en) 2008-08-21
EP1978527A4 (de) 2009-06-17
TW200836056A (en) 2008-09-01
EP1978527B1 (de) 2010-10-13
JP4472004B2 (ja) 2010-06-02
TWI361349B (en) 2012-04-01
JPWO2008099502A1 (ja) 2010-05-27
ATE484834T1 (de) 2010-10-15

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