DE602006019010D1 - Speicheranordnung und auffrisch-justierverfahren - Google Patents

Speicheranordnung und auffrisch-justierverfahren

Info

Publication number
DE602006019010D1
DE602006019010D1 DE602006019010T DE602006019010T DE602006019010D1 DE 602006019010 D1 DE602006019010 D1 DE 602006019010D1 DE 602006019010 T DE602006019010 T DE 602006019010T DE 602006019010 T DE602006019010 T DE 602006019010T DE 602006019010 D1 DE602006019010 D1 DE 602006019010D1
Authority
DE
Germany
Prior art keywords
memory arrangement
adjustment procedure
refresh adjustment
refresh
procedure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006019010T
Other languages
English (en)
Inventor
Takatsugu Sasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Publication of DE602006019010D1 publication Critical patent/DE602006019010D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406—Management or control of the refreshing or charge-regeneration cycles
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
    • G06F11/106—Correcting systematically all correctable errors, i.e. scrubbing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
    • G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2211/00—Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C2211/401—Indexing scheme relating to cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C2211/406—Refreshing of dynamic cells
    • G11C2211/4062—Parity or ECC in refresh operations

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Dram (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
DE602006019010T 2006-10-20 2006-10-20 Speicheranordnung und auffrisch-justierverfahren Active DE602006019010D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2006/320911 WO2008047443A1 (fr) 2006-10-20 2006-10-20 Dispositif à mémoire et procédé de réglage de rafraîchissement

Publications (1)

Publication Number Publication Date
DE602006019010D1 true DE602006019010D1 (de) 2011-01-27

Family

ID=39313702

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006019010T Active DE602006019010D1 (de) 2006-10-20 2006-10-20 Speicheranordnung und auffrisch-justierverfahren

Country Status (7)

Country Link
US (1) US8539310B2 (de)
EP (1) EP2075706B1 (de)
JP (1) JP5018783B2 (de)
KR (1) KR101046304B1 (de)
CN (1) CN101529396B (de)
DE (1) DE602006019010D1 (de)
WO (1) WO2008047443A1 (de)

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JP5531656B2 (ja) * 2010-02-08 2014-06-25 富士通株式会社 ストレージ装置、パトロール方法、パトロールプログラム及びストレージシステム
US8793440B2 (en) * 2010-06-17 2014-07-29 Microsoft Corporation Error detection for files
US8621324B2 (en) 2010-12-10 2013-12-31 Qualcomm Incorporated Embedded DRAM having low power self-correction capability
US20140137211A1 (en) * 2011-06-27 2014-05-15 Nec Corporation Apparatus-specific information generation device, apparatus-specific information generation method, terminal apparatus, and authentication system
US8776094B2 (en) 2011-08-11 2014-07-08 Microsoft Corporation Runtime system
KR101962874B1 (ko) 2012-04-24 2019-03-27 삼성전자주식회사 메모리 장치, 메모리 컨트롤러, 메모리 시스템 및 이의 동작 방법
JP5910332B2 (ja) 2012-06-07 2016-04-27 富士通株式会社 情報処理装置、試験方法、およびプログラム
JP2014059831A (ja) * 2012-09-19 2014-04-03 Nec Computertechno Ltd メモリリフレッシュ装置、情報処理システム、メモリリフレッシュ方法、および、コンピュータ・プログラム
KR20140042362A (ko) * 2012-09-28 2014-04-07 에스케이하이닉스 주식회사 반도체 장치 및 그 동작 방법
CN103049713B (zh) * 2012-12-20 2016-12-07 华为技术有限公司 对存储设备中数据进行巡检的方法、设备及系统
CN103903312B (zh) * 2012-12-27 2016-08-10 中国移动通信集团河南有限公司 自动巡检的执行方法和装置
CN103218274B (zh) * 2013-03-15 2016-12-28 华为技术有限公司 一种预防故障累加的方法和固态硬盘
JP2015082234A (ja) * 2013-10-23 2015-04-27 株式会社デンソー 電子制御装置、および、これを用いた電動パワーステアリング装置
WO2015106162A1 (en) 2014-01-09 2015-07-16 SanDisk Technologies, Inc. Selective copyback for on die buffered non-volatile memory
CN103957137A (zh) * 2014-05-07 2014-07-30 李正文 自动时间周期可变自适应巡检方法
US9495242B2 (en) 2014-07-30 2016-11-15 International Business Machines Corporation Adaptive error correction in a memory system
US9583219B2 (en) 2014-09-27 2017-02-28 Qualcomm Incorporated Method and apparatus for in-system repair of memory in burst refresh
US10635504B2 (en) 2014-10-16 2020-04-28 Microsoft Technology Licensing, Llc API versioning independent of product releases
CN104615503B (zh) * 2015-01-14 2018-10-30 广东华晟数据固态存储有限公司 降低对存储器接口性能影响的闪存错误检测方法及装置
CN104572336B (zh) * 2015-01-14 2018-01-26 广东省电子信息产业集团有限公司 一种闪存错误检测方法及装置
KR102373544B1 (ko) 2015-11-06 2022-03-11 삼성전자주식회사 요청 기반의 리프레쉬를 수행하는 메모리 장치, 메모리 시스템 및 메모리 장치의 동작방법
US9823964B2 (en) 2015-12-08 2017-11-21 Nvidia Corporation Method for memory scrub of DRAM with internal error correcting code (ECC) bits during either memory activate and/or precharge operation
US9880900B2 (en) 2015-12-08 2018-01-30 Nvidia Corporation Method for scrubbing and correcting DRAM memory data with internal error-correcting code (ECC) bits contemporaneously during self-refresh state
US10049006B2 (en) 2015-12-08 2018-08-14 Nvidia Corporation Controller-based memory scrub for DRAMs with internal error-correcting code (ECC) bits contemporaneously during auto refresh or by using masked write commands
CN106126118A (zh) * 2016-06-20 2016-11-16 青岛海信移动通信技术股份有限公司 存储装置寿命的检测方法及电子设备
CN106910528B (zh) * 2017-02-27 2020-05-29 郑州云海信息技术有限公司 一种固态硬盘数据巡检的优化方法及装置
US11004495B2 (en) * 2017-12-18 2021-05-11 SK Hynix Inc. Data storage device and operating method thereof
KR102606873B1 (ko) * 2018-04-30 2023-11-29 에스케이하이닉스 주식회사 리프레시 동작을 제어하기 위한 메모리 컨트롤러 및 이를 포함하는 메모리 시스템
US11119850B2 (en) * 2018-06-29 2021-09-14 International Business Machines Corporation Determining when to perform error checking of a storage unit by using a machine learning module
KR20200076846A (ko) * 2018-12-20 2020-06-30 에스케이하이닉스 주식회사 메모리 장치에 저장된 데이터의 에러를 검출하는 장치 및 그 동작 방법
CN110412473A (zh) * 2019-08-02 2019-11-05 上海安趋信息科技有限公司 可变巡检周期的电池数据巡检仪及巡检方法
JP2022095257A (ja) * 2020-12-16 2022-06-28 キオクシア株式会社 メモリシステム
CN113223603B (zh) * 2021-05-31 2022-12-06 西安紫光国芯半导体有限公司 存储器刷新控制方法、装置、控制电路及存储器件

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US7032142B2 (en) * 2001-11-22 2006-04-18 Fujitsu Limited Memory circuit having parity cell array
US7320100B2 (en) * 2003-05-20 2008-01-15 Cray Inc. Apparatus and method for memory with bit swapping on the fly and testing
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JP2005191400A (ja) * 2003-12-26 2005-07-14 Fuji Film Microdevices Co Ltd 固体撮像素子及び固体撮像素子の製造方法
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KR100714487B1 (ko) * 2005-11-29 2007-05-07 삼성전자주식회사 동적 메모리 장치 및 그 리프레쉬 주기 결정 방법
WO2009011052A1 (ja) * 2007-07-18 2009-01-22 Fujitsu Limited メモリリフレッシュ装置およびメモリリフレッシュ方法
US8639964B2 (en) * 2010-03-17 2014-01-28 Dell Products L.P. Systems and methods for improving reliability and availability of an information handling system

Also Published As

Publication number Publication date
WO2008047443A1 (fr) 2008-04-24
JP5018783B2 (ja) 2012-09-05
JPWO2008047443A1 (ja) 2010-02-18
US8539310B2 (en) 2013-09-17
EP2075706A1 (de) 2009-07-01
CN101529396A (zh) 2009-09-09
US20090204752A1 (en) 2009-08-13
KR101046304B1 (ko) 2011-07-05
EP2075706B1 (de) 2010-12-15
CN101529396B (zh) 2011-07-13
EP2075706A4 (de) 2009-11-18
KR20090050103A (ko) 2009-05-19

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Legal Events

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8328 Change in the person/name/address of the agent

Representative=s name: SEEGER SEEGER LINDNER PARTNERSCHAFT PATENTANWAELTE