DE60116268D1 - Hochdurchsatzscreening-mikroskop mit autofokus-einrichtung - Google Patents

Hochdurchsatzscreening-mikroskop mit autofokus-einrichtung

Info

Publication number
DE60116268D1
DE60116268D1 DE60116268T DE60116268T DE60116268D1 DE 60116268 D1 DE60116268 D1 DE 60116268D1 DE 60116268 T DE60116268 T DE 60116268T DE 60116268 T DE60116268 T DE 60116268T DE 60116268 D1 DE60116268 D1 DE 60116268D1
Authority
DE
Germany
Prior art keywords
autofocusing
image
plane
microscope
focus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60116268T
Other languages
English (en)
Other versions
DE60116268T2 (de
Inventor
Jan Leblans
Doninck Arthur Van
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Janssen Infectious Diseases Diagnostics BVBA
Original Assignee
Tibotec BVBA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tibotec BVBA filed Critical Tibotec BVBA
Publication of DE60116268D1 publication Critical patent/DE60116268D1/de
Application granted granted Critical
Publication of DE60116268T2 publication Critical patent/DE60116268T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/244—Devices for focusing using image analysis techniques

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)
  • Eye Examination Apparatus (AREA)
  • Developing Agents For Electrophotography (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Inorganic Insulating Materials (AREA)
  • Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
DE60116268T 2000-03-08 2001-03-08 Hochdurchsatzscreening-mikroskop mit autofokus-einrichtung Expired - Fee Related DE60116268T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US521618 2000-03-08
US09/521,618 US6974938B1 (en) 2000-03-08 2000-03-08 Microscope having a stable autofocusing apparatus
PCT/EP2001/002807 WO2001067154A2 (en) 2000-03-08 2001-03-08 A microscope suitable for high-throughput screening having an autofocusing apparatus

Publications (2)

Publication Number Publication Date
DE60116268D1 true DE60116268D1 (de) 2006-02-02
DE60116268T2 DE60116268T2 (de) 2006-09-07

Family

ID=24077439

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60116268T Expired - Fee Related DE60116268T2 (de) 2000-03-08 2001-03-08 Hochdurchsatzscreening-mikroskop mit autofokus-einrichtung

Country Status (14)

Country Link
US (2) US6974938B1 (de)
EP (1) EP1264205B1 (de)
JP (1) JP2003526814A (de)
AT (1) ATE314672T1 (de)
AU (1) AU779909B2 (de)
CA (1) CA2400841A1 (de)
DE (1) DE60116268T2 (de)
DK (1) DK1264205T3 (de)
ES (1) ES2256207T3 (de)
NO (1) NO20024302L (de)
NZ (1) NZ520525A (de)
PT (1) PT1264205E (de)
TW (1) TW594045B (de)
WO (1) WO2001067154A2 (de)

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6974938B1 (en) 2000-03-08 2005-12-13 Tibotec Bvba Microscope having a stable autofocusing apparatus
DE10106698A1 (de) * 2001-02-14 2002-08-29 Leica Microsystems Verfahren und Vorrichtung zum automatischen Fokussieren eines optischen Gerätes
GB0200844D0 (en) * 2002-01-15 2002-03-06 Solexa Ltd Linear response auto focussing device and method
US7583380B2 (en) * 2003-03-11 2009-09-01 Koninklijke Philips Electronics N.V. Spectroscopic analysis apparatus and method with excitation system and focus monitoring system
US7196300B2 (en) * 2003-07-18 2007-03-27 Rudolph Technologies, Inc. Dynamic focusing method and apparatus
JP4914715B2 (ja) 2004-06-21 2012-04-11 オリンパス株式会社 倒立顕微鏡システム
US7276720B2 (en) * 2004-07-19 2007-10-02 Helicos Biosciences Corporation Apparatus and methods for analyzing samples
US20060012793A1 (en) * 2004-07-19 2006-01-19 Helicos Biosciences Corporation Apparatus and methods for analyzing samples
JP2008520975A (ja) * 2004-11-16 2008-06-19 ヘリコス バイオサイエンシーズ コーポレイション Ｔｉｒｆ単分子分析および核酸を配列決定する方法
JP2006145810A (ja) * 2004-11-19 2006-06-08 Canon Inc 自動焦点装置、レーザ加工装置およびレーザ割断装置
JP4790420B2 (ja) * 2006-01-12 2011-10-12 オリンパス株式会社 自動焦点機構を備えた顕微鏡およびその調整方法
US7700903B2 (en) * 2006-06-09 2010-04-20 Wdi Wise Device Inc. Method and apparatus for the auto-focussing infinity corrected microscopes
US7826977B2 (en) * 2006-08-25 2010-11-02 The Trustees Of Columbia University In The City Of New York Systems and methods for high-speed image scanning
US9255348B2 (en) 2006-08-25 2016-02-09 The Trustees Of Columbia University In The City Of New York Systems and methods for biodosimetry with biochip using gene expression signatures
JP5172204B2 (ja) * 2007-05-16 2013-03-27 大塚電子株式会社 光学特性測定装置およびフォーカス調整方法
WO2009041918A1 (en) * 2007-09-26 2009-04-02 Agency For Science, Technology And Research A method and system for generating an entirely well-focused image of a large three-dimensional scene
DE102008018864B4 (de) 2008-04-15 2022-01-05 Carl Zeiss Microscopy Gmbh Mikroskop mit Haltefokus-Steuerung
JP5696396B2 (ja) 2010-08-16 2015-04-08 ソニー株式会社 顕微鏡及びゴースト除去方法
TWI452336B (zh) * 2010-11-15 2014-09-11 Univ China Medical 顯微掃瞄系統及其方法
DE102011003807A1 (de) 2011-02-08 2012-08-09 Leica Microsystems Cms Gmbh Mikroskop mit Autofokuseinrichtung und Verfahren zur Autofokussierung bei Mikroskopen
JP4919307B1 (ja) 2011-05-13 2012-04-18 レーザーテック株式会社 基板検査装置及びマスク検査装置
DE102011055294B4 (de) * 2011-11-11 2013-11-07 Leica Microsystems Cms Gmbh Mikroskopische Einrichtung und Verfahren zur dreidimensionalen Lokalisierung von punktförmigen Objekten in einer Probe
EP2972208B1 (de) 2013-03-15 2018-06-13 Iris International, Inc. Verfahren und zusammensetzung zum einfärben und behandeln von proben
US9857361B2 (en) 2013-03-15 2018-01-02 Iris International, Inc. Flowcell, sheath fluid, and autofocus systems and methods for particle analysis in urine samples
BR112015021902B1 (pt) 2013-03-15 2021-06-15 Iris International, Inc Líquido para alinhamento de partícula e organela intracelular
DE102013219544A1 (de) * 2013-09-27 2015-04-02 Siemens Aktiengesellschaft Durchflusseinrichtung für ein Spektrometersystem und Verfahren zum Betreiben einer solchen
GB201318919D0 (en) * 2013-10-25 2013-12-11 Isis Innovation Compact microscope
GB2537786B (en) * 2014-03-05 2021-03-03 Hitachi High Tech Corp Microspectroscopy device
TWI571341B (zh) * 2014-12-04 2017-02-21 Metal Ind Res And Dev Centre An auto focus system and method that can focus on beam sensitivity
JP2018508821A (ja) * 2015-01-30 2018-03-29 モレキュラー デバイシーズ， エルエルシー ハイコンテント撮像システムおよびハイコンテント撮像システムを動作させる方法
GB201507021D0 (en) 2015-04-24 2015-06-10 Isis Innovation Compact microscope
NL2018857B1 (en) * 2017-05-05 2018-11-09 Illumina Inc Systems and methods for improved focus tracking using a light source configuration
NL2018854B1 (en) 2017-05-05 2018-11-14 Illumina Inc Systems and methodes for improved focus tracking using blocking structures
NL2018853B1 (en) 2017-05-05 2018-11-14 Illumina Inc Systems and methods for improved focus tracking using a hybrid mode light source
EP3441812B1 (de) 2017-08-11 2020-07-01 Tecan Trading Ag Muster-basiertes autofokus-verfahren für ein mikroskop
EP3474060A1 (de) * 2017-10-23 2019-04-24 Max-Delbrück-Centrum für Molekulare Medizin in der Helmholtz-Gemeinschaft Autofokussteuerung eines mikroskops mit einer elektrisch abstimmbaren linse
WO2019165480A1 (en) * 2018-02-26 2019-08-29 Caliber Imaging & Diagnostics, Inc. System and method for macroscopic and microscopic imaging ex-vivo tissue
EP3614192A1 (de) * 2018-08-20 2020-02-26 Till GmbH Mikroskopvorrichtung
DE102019113975B4 (de) * 2019-05-24 2023-10-19 Abberior Instruments Gmbh Verfahren und Vorrichtung zum Überwachen des Fokuszustands eines Mikroskops sowie Mikroskop
WO2021077075A1 (en) * 2019-10-19 2021-04-22 SequLITE Genomics US, Inc. Virtual fiducials
EP3816611B1 (de) * 2019-10-29 2023-01-25 Leica Microsystems CMS GmbH Mikroskop und verfahren zur bestimmung einer aberration in einem mikroskop
US20220067953A1 (en) * 2020-09-02 2022-03-03 International Business Machines Corporation Reflection-based monoscopic depth perception
CN114280769A (zh) * 2020-12-28 2022-04-05 深圳同舟光电科技有限公司 一种高灵敏度光学成像系统、方法和装置
CN115150519B (zh) * 2022-09-05 2022-12-23 武汉精立电子技术有限公司 一种基于线扫描的自动聚焦系统、方法及应用

Family Cites Families (64)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE354721B (de) 1970-12-30 1973-03-19 Johansson C Ab
DE2102922C3 (de) 1971-01-22 1978-08-24 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Anordnung zum selbsttätigen Fokussieren auf in optischen Geräten zu betrachtende Objekte
GB1401179A (en) 1971-09-22 1975-07-16 Image Analysing Computers Ltd Automated image analysis employing automatic fucussing
DE2423136C3 (de) 1974-05-13 1982-07-29 Fa. Carl Zeiss, 7920 Heidenheim Vorrichtung zur automatischen Fokussierung von Stereomikroskopen
DE2615841C3 (de) 1976-04-10 1978-10-19 Fa. Carl Zeiss, 7920 Heidenheim Verfahren zum automatischen Nachführen der Scharfeinstellung eines mit einer Fernsehkamera ausgerüsteten Mikroskops
DE2644341C2 (de) 1976-10-01 1984-08-02 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Verfahren und Anordnungen zur automatischen Verwirklichung des Köhler'schen Beleuchtungsprinzipes
AT351797B (de) 1976-12-22 1979-08-10 Philips Nv Verfahren zum herstellen einer rotierend antreibbaren magnetkopfanordnung und nach einem solchen verfahren hergestellte magnetkopf- anordnung
JPS5576310A (en) 1978-12-05 1980-06-09 Nippon Kogaku Kk <Nikon> Automatic focusing device
US4387975A (en) * 1979-10-31 1983-06-14 Ricoh Company, Ltd. Automatic focusing position detection apparatus
GB2076176B (en) 1980-05-19 1983-11-23 Vickers Ltd Focusing optical apparatus
JPS5764712A (en) 1980-10-09 1982-04-20 Hitachi Ltd Detector for focusing position
US4433235A (en) 1980-10-09 1984-02-21 Hitachi, Ltd. Focusing position detecting device in optical magnifying and observing apparatus
JPS57192909A (en) 1981-05-25 1982-11-27 Hitachi Ltd Automatic focusing device for optical system expanding obserbation apparatus
JPS57108811A (en) * 1980-12-26 1982-07-07 Hitachi Ltd Optical focus position detector
JPS58160907A (ja) 1982-03-19 1983-09-24 Nippon Kogaku Kk <Nikon> 顕微鏡用焦点検出装置
DE3219503C2 (de) * 1982-05-25 1985-08-08 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Vorrichtung zum selbsttätigen Fokussieren auf in optischen Geräten zu betrachtende Objekte
GB2129955B (en) 1982-11-02 1986-07-09 Martock Design Ltd Adjustable mountings
EP0116753B1 (de) * 1982-12-07 1987-06-24 Secretary of State for Trade and Industry in Her Britannic Majesty's Gov. of the U.K. of Great Britain and Northern Ireland Vorrichtung zum Fokussieren von Licht auf einer Oberfläche
DE3446727C2 (de) 1983-08-10 1986-12-04 Fa. Carl Zeiss, 7920 Heidenheim Autofokuseinrichtung für Mikroskope
DE3328821C2 (de) 1983-08-10 1986-10-02 Fa. Carl Zeiss, 7920 Heidenheim Autofokus für Mikroskope
US4600832A (en) 1983-10-28 1986-07-15 Nanometrics Incorporated Method and apparatus for automatic optical focusing on an optically discernible feature on an object
DE3339970A1 (de) 1983-11-04 1985-05-15 Karl Süss KG, Präzisionsgeräte für Wissenschaft und Industrie GmbH & Co, 8046 Garching Einrichtung zum automatischen fokussieren von optischen geraeten
JPS60118814A (ja) 1983-11-30 1985-06-26 Nippon Kogaku Kk <Nikon> 落射照明型顕微鏡装置
US4639587A (en) 1984-02-22 1987-01-27 Kla Instruments Corporation Automatic focusing system for a microscope
JPS60217322A (ja) 1984-04-13 1985-10-30 Nippon Kogaku Kk <Nikon> 焦点検出装置
US4766302A (en) * 1984-05-17 1988-08-23 Minolta Camera Kabushiki Kaisha Focus detecting device including means for determining a priority of correlation calculations
DE3521047C1 (de) 1985-06-12 1986-09-04 C. Reichert Optische Werke Ag, Wien Mikroskop
JPS61143709A (ja) 1985-09-21 1986-07-01 Nippon Kogaku Kk <Nikon> 焦点調節装置
US4935612A (en) 1986-05-16 1990-06-19 Reichert Jung Optische Werks, A.G. Autofocus system and method of using the same
DE3707487A1 (de) 1986-05-16 1987-11-26 Reichert Optische Werke Ag Verfahren zur autofokussierung von mikroskopen und mikroskope mit einer autofokussierung
CH671902A5 (de) * 1987-02-09 1989-10-13 Elpatronic Ag
FR2620537B1 (fr) 1987-09-14 1991-07-26 Micro Controle Dispositif optique a mise au point automatique et appareil optique comportant un tel dispositif
DE3739223A1 (de) 1987-11-19 1989-06-01 Reichert Optische Werke Ag Verfahren zur autofokussierung von mikroskopen und mikroskope mit einer autofokussierung
EP0330404B1 (de) * 1988-02-20 1994-11-30 Fujitsu Limited Chipkarten
DE3828381C2 (de) 1988-08-20 1997-09-11 Zeiss Carl Fa Verfahren und Einrichtung zur automatischen Fokussierung eines optischen Systems
US4945220A (en) 1988-11-16 1990-07-31 Prometrix Corporation Autofocusing system for microscope having contrast detection means
FR2640040B1 (fr) * 1988-12-05 1994-10-28 Micro Controle Procede et dispositif de mesure optique
JP2561160B2 (ja) 1989-11-06 1996-12-04 富士写真フイルム株式会社 走査型顕微鏡
US5122648A (en) 1990-06-01 1992-06-16 Wyko Corporation Apparatus and method for automatically focusing an interference microscope
WO1992006359A1 (en) 1990-10-09 1992-04-16 Metronics, Inc. Laser autofocus apparatus and method
JP3136661B2 (ja) * 1991-06-24 2001-02-19 株式会社ニコン 自動焦点調節装置
DE4128669A1 (de) 1991-08-29 1993-03-04 Zeiss Carl Jena Gmbh Dreidimensional verstellbare deckenaufhaengung fuer operationsmikroskope
US5434703A (en) 1991-10-09 1995-07-18 Fuji Photo Optical Co., Ltd. Binocular stereomicroscope
DE4133788A1 (de) 1991-10-11 1993-04-15 Leica Ag Verfahren zur autofokussierung von mikroskopen und autofokussystem fuer mikroskope
DE4134481C2 (de) * 1991-10-18 1998-04-09 Zeiss Carl Fa Operationsmikroskop zur rechnergestützten, stereotaktischen Mikrochirurgie
US5483079A (en) 1992-11-24 1996-01-09 Nikon Corporation Apparatus for detecting an in-focus position of a substrate surface having a movable light intercepting member and a thickness detector
US5483055A (en) 1994-01-18 1996-01-09 Thompson; Timothy V. Method and apparatus for performing an automatic focus operation for a microscope
JPH0772378A (ja) 1993-09-02 1995-03-17 Nikon Corp 合焦装置
US5557097A (en) 1994-09-20 1996-09-17 Neopath, Inc. Cytological system autofocus integrity checking apparatus
JP3458017B2 (ja) 1994-12-28 2003-10-20 オリンパス光学工業株式会社 顕微鏡自動焦点位置検出装置
JP3872836B2 (ja) 1996-04-17 2007-01-24 オリンパス株式会社 手術用顕微鏡
US5804813A (en) 1996-06-06 1998-09-08 National Science Council Of Republic Of China Differential confocal microscopy
FR2750221A1 (fr) 1996-06-25 1997-12-26 Lemaire Christian Dispositif de caracterisation de mise au point de microscope optique
CH692254A5 (de) 1996-06-29 2002-04-15 Zeiss Carl Mikroskop mit einer Autofokus-Anordnung.
US5811821A (en) 1996-08-09 1998-09-22 Park Scientific Instruments Single axis vibration reducing system
JPH1096848A (ja) 1996-09-20 1998-04-14 Olympus Optical Co Ltd 自動焦点検出装置
JPH10161195A (ja) * 1996-12-02 1998-06-19 Sony Corp オートフォーカス方法及びオートフォーカス装置
DE19654208C2 (de) * 1996-12-24 2001-05-10 Leica Microsystems Mikroskop
US5995143A (en) 1997-02-07 1999-11-30 Q3Dm, Llc Analog circuit for an autofocus microscope system
JP3825869B2 (ja) 1997-03-19 2006-09-27 キヤノン株式会社 能動除振装置
DE69836017T2 (de) 1997-05-16 2007-06-06 Sanyo Electric Co., Ltd., Moriguchi Automatische fokusiereinrichtung
JP3019835B2 (ja) * 1998-04-22 2000-03-13 日本電気株式会社 焦点検出装置
US6974938B1 (en) 2000-03-08 2005-12-13 Tibotec Bvba Microscope having a stable autofocusing apparatus
US6611374B2 (en) * 2002-01-31 2003-08-26 General Instrument Corporation Optical amplifier controller having adjustable slew-rate limiter

Also Published As

Publication number Publication date
ES2256207T3 (es) 2006-07-16
AU779909B2 (en) 2005-02-17
US7016110B2 (en) 2006-03-21
US20030142398A1 (en) 2003-07-31
CA2400841A1 (en) 2001-09-13
NZ520525A (en) 2004-09-24
PT1264205E (pt) 2006-05-31
NO20024302D0 (no) 2002-09-09
WO2001067154A2 (en) 2001-09-13
US6974938B1 (en) 2005-12-13
DE60116268T2 (de) 2006-09-07
JP2003526814A (ja) 2003-09-09
ATE314672T1 (de) 2006-01-15
NO20024302L (no) 2002-09-09
TW594045B (en) 2004-06-21
AU4069401A (en) 2001-09-17
WO2001067154A3 (en) 2002-01-10
EP1264205A2 (de) 2002-12-11
EP1264205B1 (de) 2005-12-28
DK1264205T3 (da) 2006-05-08

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