DE60036829D1 - Wafer-Poliervorrichtung und -verfahren - Google Patents
Wafer-Poliervorrichtung und -verfahrenInfo
- Publication number
- DE60036829D1 DE60036829D1 DE60036829T DE60036829T DE60036829D1 DE 60036829 D1 DE60036829 D1 DE 60036829D1 DE 60036829 T DE60036829 T DE 60036829T DE 60036829 T DE60036829 T DE 60036829T DE 60036829 D1 DE60036829 D1 DE 60036829D1
- Authority
- DE
- Germany
- Prior art keywords
- polishing apparatus
- wafer polishing
- wafer
- polishing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
- H01L21/67219—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one polishing chamber
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/06—Work supports, e.g. adjustable steadies
- B24B41/061—Work supports, e.g. adjustable steadies axially supporting turning workpieces, e.g. magnetically, pneumatically
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
Applications Claiming Priority (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6933699 | 1999-03-15 | ||
JP6933899 | 1999-03-15 | ||
JP6933699A JP2000263433A (ja) | 1999-03-15 | 1999-03-15 | ウェーハ搬送装置、ウェーハ研磨装置及びウェーハ製造方法 |
JP6933799 | 1999-03-15 | ||
JP6933899A JP2000263419A (ja) | 1999-03-15 | 1999-03-15 | ウェーハ研磨装置及びウェーハ製造方法 |
JP6933799A JP2000263424A (ja) | 1999-03-15 | 1999-03-15 | ウェーハ研磨装置及びウェーハ製造方法 |
JP13501999 | 1999-05-14 | ||
JP13501999A JP2000326218A (ja) | 1999-05-14 | 1999-05-14 | ウェーハ研磨装置及びウェーハ製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60036829D1 true DE60036829D1 (de) | 2007-12-06 |
DE60036829T2 DE60036829T2 (de) | 2008-08-07 |
Family
ID=27465114
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60036825T Expired - Lifetime DE60036825T2 (de) | 1999-03-15 | 2000-03-15 | Waferpoliervorrichtung und -verfahren |
DE60036829T Expired - Lifetime DE60036829T2 (de) | 1999-03-15 | 2000-03-15 | Wafer-Poliervorrichtung und -verfahren |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60036825T Expired - Lifetime DE60036825T2 (de) | 1999-03-15 | 2000-03-15 | Waferpoliervorrichtung und -verfahren |
Country Status (5)
Country | Link |
---|---|
US (1) | US6398906B1 (de) |
EP (2) | EP1495838B1 (de) |
KR (2) | KR100638290B1 (de) |
DE (2) | DE60036825T2 (de) |
TW (1) | TW467795B (de) |
Families Citing this family (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2085181A1 (de) * | 2000-07-31 | 2009-08-05 | Ebara Corporation | Substrathaltevorrichtung und Substratpoliervorrichtung |
JP2002100593A (ja) * | 2000-09-21 | 2002-04-05 | Nikon Corp | 研磨装置、これを用いた半導体デバイスの製造方法及びこの製造方法により製造された半導体デバイス |
US6769959B2 (en) * | 2002-01-15 | 2004-08-03 | Taiwan Semiconductor Manufacturing Co., Ltd | Method and system for slurry usage reduction in chemical mechanical polishing |
KR100481553B1 (ko) * | 2002-06-25 | 2005-04-07 | 동부아남반도체 주식회사 | 평탄화 장치 |
JP4756884B2 (ja) * | 2005-03-14 | 2011-08-24 | 信越半導体株式会社 | 半導体ウエーハ用の研磨ヘッド及び研磨装置並びに研磨方法 |
JP4814677B2 (ja) * | 2006-03-31 | 2011-11-16 | 株式会社荏原製作所 | 基板保持装置および研磨装置 |
JP2008277635A (ja) * | 2007-05-01 | 2008-11-13 | Tokyo Seimitsu Co Ltd | ウェハ研磨装置、ウェハ研磨システム及びウェハ研磨方法 |
US8602842B2 (en) * | 2010-03-12 | 2013-12-10 | Wayne O. Duescher | Three-point fixed-spindle floating-platen abrasive system |
US8647170B2 (en) | 2011-10-06 | 2014-02-11 | Wayne O. Duescher | Laser alignment apparatus for rotary spindles |
US8647171B2 (en) * | 2010-03-12 | 2014-02-11 | Wayne O. Duescher | Fixed-spindle floating-platen workpiece loader apparatus |
US8758088B2 (en) | 2011-10-06 | 2014-06-24 | Wayne O. Duescher | Floating abrading platen configuration |
US8696405B2 (en) | 2010-03-12 | 2014-04-15 | Wayne O. Duescher | Pivot-balanced floating platen lapping machine |
US8500515B2 (en) * | 2010-03-12 | 2013-08-06 | Wayne O. Duescher | Fixed-spindle and floating-platen abrasive system using spherical mounts |
US8647172B2 (en) | 2010-03-12 | 2014-02-11 | Wayne O. Duescher | Wafer pads for fixed-spindle floating-platen lapping |
US8641476B2 (en) | 2011-10-06 | 2014-02-04 | Wayne O. Duescher | Coplanar alignment apparatus for rotary spindles |
US8740668B2 (en) * | 2010-03-12 | 2014-06-03 | Wayne O. Duescher | Three-point spindle-supported floating abrasive platen |
EP3406402B1 (de) * | 2010-08-06 | 2021-06-30 | Applied Materials, Inc. | Substratkantenbearbeitung mit einem haltering |
US8337280B2 (en) | 2010-09-14 | 2012-12-25 | Duescher Wayne O | High speed platen abrading wire-driven rotary workholder |
US8430717B2 (en) | 2010-10-12 | 2013-04-30 | Wayne O. Duescher | Dynamic action abrasive lapping workholder |
JP2015500151A (ja) * | 2011-12-16 | 2015-01-05 | エルジー シルトロン インコーポレイテッド | ウェハーの研磨装置及びウェハーの研磨方法 |
US9011207B2 (en) | 2012-10-29 | 2015-04-21 | Wayne O. Duescher | Flexible diaphragm combination floating and rigid abrading workholder |
US9604339B2 (en) | 2012-10-29 | 2017-03-28 | Wayne O. Duescher | Vacuum-grooved membrane wafer polishing workholder |
US9039488B2 (en) | 2012-10-29 | 2015-05-26 | Wayne O. Duescher | Pin driven flexible chamber abrading workholder |
US8998678B2 (en) | 2012-10-29 | 2015-04-07 | Wayne O. Duescher | Spider arm driven flexible chamber abrading workholder |
US8845394B2 (en) | 2012-10-29 | 2014-09-30 | Wayne O. Duescher | Bellows driven air floatation abrading workholder |
US9199354B2 (en) | 2012-10-29 | 2015-12-01 | Wayne O. Duescher | Flexible diaphragm post-type floating and rigid abrading workholder |
US9233452B2 (en) | 2012-10-29 | 2016-01-12 | Wayne O. Duescher | Vacuum-grooved membrane abrasive polishing wafer workholder |
US8998677B2 (en) | 2012-10-29 | 2015-04-07 | Wayne O. Duescher | Bellows driven floatation-type abrading workholder |
TWI466755B (zh) * | 2013-01-24 | 2015-01-01 | 邁鈞機械工業股份有限公司 | Automatic lens grinding device |
US9604340B2 (en) * | 2013-12-13 | 2017-03-28 | Taiwan Semiconductor Manufacturing Co., Ltd. | Carrier head having abrasive structure on retainer ring |
KR102173323B1 (ko) | 2014-06-23 | 2020-11-04 | 삼성전자주식회사 | 캐리어 헤드, 화학적 기계식 연마 장치 및 웨이퍼 연마 방법 |
US10265829B2 (en) * | 2015-10-30 | 2019-04-23 | Taiwan Semiconductor Manufacturing Co., Ltd. | Chemical mechanical polishing system |
US10312128B2 (en) * | 2015-12-31 | 2019-06-04 | Taiwan Semiconductor Manufacturing Company Ltd. | Chemical-mechanical polish (CMP) devices, tools, and methods |
US10463205B2 (en) | 2016-07-01 | 2019-11-05 | Mercer International Inc. | Process for making tissue or towel products comprising nanofilaments |
US10570261B2 (en) | 2016-07-01 | 2020-02-25 | Mercer International Inc. | Process for making tissue or towel products comprising nanofilaments |
US10724173B2 (en) | 2016-07-01 | 2020-07-28 | Mercer International, Inc. | Multi-density tissue towel products comprising high-aspect-ratio cellulose filaments |
WO2018053458A1 (en) | 2016-09-19 | 2018-03-22 | Mercer International Inc. | Absorbent paper products having unique physical strength properties |
US10926378B2 (en) | 2017-07-08 | 2021-02-23 | Wayne O. Duescher | Abrasive coated disk islands using magnetic font sheet |
CN107685284B (zh) * | 2017-09-30 | 2020-05-01 | 德清晶生光电科技有限公司 | 一种光学器件均匀打磨的方法 |
CN107553315A (zh) * | 2017-09-30 | 2018-01-09 | 德清晶生光电科技有限公司 | 一种光学器件均匀打磨的方法 |
KR102185913B1 (ko) * | 2018-01-29 | 2020-12-03 | (주)미래컴퍼니 | 연마 장치 |
JP7273058B2 (ja) | 2018-04-12 | 2023-05-12 | マーサー インターナショナル インコーポレイテッド | 高アスペクト比セルロースフィラメントブレンドを改良する方法 |
KR20200070825A (ko) * | 2018-12-10 | 2020-06-18 | 삼성전자주식회사 | 연마 균일도를 제어할 수 있는 화학 기계적 연마 장치 |
US11691241B1 (en) * | 2019-08-05 | 2023-07-04 | Keltech Engineering, Inc. | Abrasive lapping head with floating and rigid workpiece carrier |
CN113103144B (zh) * | 2021-04-16 | 2023-01-24 | 长鑫存储技术有限公司 | 定位机构及研磨设备 |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5329732A (en) * | 1992-06-15 | 1994-07-19 | Speedfam Corporation | Wafer polishing method and apparatus |
JPH08281550A (ja) * | 1995-04-14 | 1996-10-29 | Sony Corp | 研磨装置及びその補正方法 |
JP2708022B2 (ja) * | 1995-08-21 | 1998-02-04 | 日本電気株式会社 | 研磨装置 |
KR100487590B1 (ko) * | 1995-08-21 | 2005-08-04 | 가부시키가이샤 에바라 세이사꾸쇼 | 폴리싱장치 |
KR100440417B1 (ko) * | 1995-10-23 | 2004-10-22 | 텍사스 인스트루먼츠 인코포레이티드 | 화학-기계적연마응용을위해패드컨디셔너와웨이퍼캐리어를통합시키는장치 |
JP3453977B2 (ja) * | 1995-12-28 | 2003-10-06 | 信越半導体株式会社 | ウェーハの研磨装置 |
JPH09225819A (ja) * | 1996-02-21 | 1997-09-02 | Shin Etsu Handotai Co Ltd | 被加工物の保持機構 |
JPH09314457A (ja) * | 1996-05-29 | 1997-12-09 | Speedfam Co Ltd | ドレッサ付き片面研磨装置 |
US5842912A (en) * | 1996-07-15 | 1998-12-01 | Speedfam Corporation | Apparatus for conditioning polishing pads utilizing brazed diamond technology |
US5664990A (en) * | 1996-07-29 | 1997-09-09 | Integrated Process Equipment Corp. | Slurry recycling in CMP apparatus |
JP3106418B2 (ja) * | 1996-07-30 | 2000-11-06 | 株式会社東京精密 | 研磨装置 |
US6221773B1 (en) * | 1996-09-13 | 2001-04-24 | Hitachi, Ltd. | Method for working semiconductor wafer |
US6019670A (en) * | 1997-03-10 | 2000-02-01 | Applied Materials, Inc. | Method and apparatus for conditioning a polishing pad in a chemical mechanical polishing system |
EP1327498B1 (de) * | 1997-04-08 | 2013-06-12 | Ebara Corporation | Poliervorrichtung |
US6004193A (en) * | 1997-07-17 | 1999-12-21 | Lsi Logic Corporation | Dual purpose retaining ring and polishing pad conditioner |
DE19839086B4 (de) * | 1997-09-01 | 2007-03-15 | United Microelectronics Corp. | Rückhaltering für eine chemisch-mechanische Poliervorrichtung und chemisch-mechanische Poliervorrichtung damit |
JP3076291B2 (ja) * | 1997-12-02 | 2000-08-14 | 日本電気株式会社 | 研磨装置 |
US6116992A (en) * | 1997-12-30 | 2000-09-12 | Applied Materials, Inc. | Substrate retaining ring |
US6143127A (en) * | 1998-05-14 | 2000-11-07 | Applied Materials, Inc. | Carrier head with a retaining ring for a chemical mechanical polishing system |
US6190494B1 (en) * | 1998-07-29 | 2001-02-20 | Micron Technology, Inc. | Method and apparatus for electrically endpointing a chemical-mechanical planarization process |
US6224472B1 (en) * | 1999-06-24 | 2001-05-01 | Samsung Austin Semiconductor, L.P. | Retaining ring for chemical mechanical polishing |
-
2000
- 2000-03-09 TW TW089104223A patent/TW467795B/zh not_active IP Right Cessation
- 2000-03-13 US US09/523,757 patent/US6398906B1/en not_active Expired - Lifetime
- 2000-03-14 KR KR1020000012646A patent/KR100638290B1/ko not_active IP Right Cessation
- 2000-03-15 DE DE60036825T patent/DE60036825T2/de not_active Expired - Lifetime
- 2000-03-15 DE DE60036829T patent/DE60036829T2/de not_active Expired - Lifetime
- 2000-03-15 EP EP04014353A patent/EP1495838B1/de not_active Expired - Lifetime
- 2000-03-15 EP EP00105312A patent/EP1037262B1/de not_active Expired - Lifetime
-
2006
- 2006-05-30 KR KR1020060048441A patent/KR100712584B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP1495838A1 (de) | 2005-01-12 |
EP1037262A2 (de) | 2000-09-20 |
EP1495838B1 (de) | 2007-10-17 |
DE60036829T2 (de) | 2008-08-07 |
US6398906B1 (en) | 2002-06-04 |
DE60036825D1 (de) | 2007-11-29 |
DE60036825T2 (de) | 2008-07-17 |
TW467795B (en) | 2001-12-11 |
KR100712584B1 (ko) | 2007-05-02 |
EP1037262B1 (de) | 2007-10-24 |
EP1037262A3 (de) | 2003-10-22 |
KR20060065624A (ko) | 2006-06-14 |
KR100638290B1 (ko) | 2006-10-27 |
KR20000062858A (ko) | 2000-10-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |