DE3856019D1 - Integrierte Halbleiterschaltungen Vorrichtung von Scheibengrösse - Google Patents

Integrierte Halbleiterschaltungen Vorrichtung von Scheibengrösse

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Publication number
DE3856019D1
DE3856019D1 DE3856019T DE3856019T DE3856019D1 DE 3856019 D1 DE3856019 D1 DE 3856019D1 DE 3856019 T DE3856019 T DE 3856019T DE 3856019 T DE3856019 T DE 3856019T DE 3856019 D1 DE3856019 D1 DE 3856019D1
Authority
DE
Germany
Prior art keywords
integrated semiconductor
semiconductor circuits
slice size
circuits device
slice
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3856019T
Other languages
English (en)
Other versions
DE3856019T2 (de
Inventor
Masanori Tazunoki
Hiromitsu Mishimagi
Makoto Homma
Toshiyuki Sakuta
Hisashi Nakamura
Keiji Sasaki
Minoru Enomoto
Toshihiko Satoh
Kuniso Sahara
Shigeo Kuroda
Kanji Otsuka
Masao Kawamura
Hinoko Kurosawa
Kazuya Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP62097330A external-priority patent/JPS63263734A/ja
Priority claimed from JP62097331A external-priority patent/JPS63263735A/ja
Priority claimed from JP62097326A external-priority patent/JPS63263747A/ja
Priority claimed from JP62097329A external-priority patent/JPS63263736A/ja
Priority claimed from JP62099779A external-priority patent/JPS63266700A/ja
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of DE3856019D1 publication Critical patent/DE3856019D1/de
Publication of DE3856019T2 publication Critical patent/DE3856019T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • H01L23/538Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
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    • H01L2924/14Integrated circuits
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    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16152Cap comprising a cavity for hosting the device, e.g. U-shaped cap
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3025Electromagnetic shielding

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Packaging Frangible Articles (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Semiconductor Memories (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
DE3856019T 1987-04-22 1988-04-08 Integrierte Halbleiterschaltungen Vorrichtung von Scheibengrösse Expired - Fee Related DE3856019T2 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP62097330A JPS63263734A (ja) 1987-04-22 1987-04-22 半導体集積回路の実装装置
JP62097331A JPS63263735A (ja) 1987-04-22 1987-04-22 半導体集積回路の実装装置
JP62097326A JPS63263747A (ja) 1987-04-22 1987-04-22 実装基板の製造方法
JP62097329A JPS63263736A (ja) 1987-04-22 1987-04-22 半導体装置
JP62099779A JPS63266700A (ja) 1987-04-24 1987-04-24 ウエハ大半導体集積回路装置

Publications (2)

Publication Number Publication Date
DE3856019D1 true DE3856019D1 (de) 1997-10-09
DE3856019T2 DE3856019T2 (de) 1998-04-02

Family

ID=27525857

Family Applications (2)

Application Number Title Priority Date Filing Date
DE88303160T Expired - Fee Related DE3882074T2 (de) 1987-04-22 1988-04-08 Verpackung von integrierten Halbleiterschaltungen.
DE3856019T Expired - Fee Related DE3856019T2 (de) 1987-04-22 1988-04-08 Integrierte Halbleiterschaltungen Vorrichtung von Scheibengrösse

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE88303160T Expired - Fee Related DE3882074T2 (de) 1987-04-22 1988-04-08 Verpackung von integrierten Halbleiterschaltungen.

Country Status (5)

Country Link
EP (2) EP0516185B1 (de)
KR (2) KR960012649B1 (de)
DE (2) DE3882074T2 (de)
HK (2) HK28096A (de)
SG (1) SG36588G (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5598031A (en) * 1993-06-23 1997-01-28 Vlsi Technology, Inc. Electrically and thermally enhanced package using a separate silicon substrate
EP0705485A1 (de) * 1993-06-23 1996-04-10 Vlsi Technology, Inc. Elektrisch und thermisch verbesserte packung durch benutzung eines separaten siliziumsubstrats
KR19980064369A (ko) * 1996-12-19 1998-10-07 윌리엄비.켐플러 메모리 모듈, 메모리 탑 및 메모리 모듈 구성 방법
JP2001102523A (ja) * 1999-09-28 2001-04-13 Sony Corp 薄膜デバイスおよびその製造方法
JP2003229517A (ja) * 2002-01-31 2003-08-15 Fujitsu Hitachi Plasma Display Ltd 半導体チップ実装基板及びフラットディスプレイ

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3908155A (en) * 1974-04-19 1975-09-23 Ibm Wafer circuit package
DE2611749C3 (de) * 1976-03-19 1980-11-13 Siemens Ag, 1000 Berlin Und 8000 Muenchen Halbleiteranordnung mit einem über Spannbolzen durch Druck kontaktierbaren Halbleiterbauelement
JPS5618439A (en) * 1979-07-25 1981-02-21 Fujitsu Ltd Semiconductor device consisting of different ic
JPH0620107B2 (ja) * 1985-09-25 1994-03-16 日本電気株式会社 半導体装置

Also Published As

Publication number Publication date
EP0288186A3 (en) 1990-05-23
DE3882074D1 (de) 1993-08-05
EP0516185A2 (de) 1992-12-02
EP0516185B1 (de) 1997-09-03
KR880013223A (ko) 1988-11-30
HK28096A (en) 1996-02-23
KR930020560A (ko) 1993-10-20
DE3856019T2 (de) 1998-04-02
KR970001885B1 (en) 1997-02-18
EP0516185A3 (en) 1993-03-17
KR960012649B1 (en) 1996-09-23
HK1003348A1 (en) 1998-10-23
SG36588G (en) 1995-09-01
EP0288186A2 (de) 1988-10-26
DE3882074T2 (de) 1993-10-07
EP0288186B1 (de) 1993-06-30

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