JPS5618439A - Semiconductor device consisting of different ic - Google Patents
Semiconductor device consisting of different icInfo
- Publication number
- JPS5618439A JPS5618439A JP9452079A JP9452079A JPS5618439A JP S5618439 A JPS5618439 A JP S5618439A JP 9452079 A JP9452079 A JP 9452079A JP 9452079 A JP9452079 A JP 9452079A JP S5618439 A JPS5618439 A JP S5618439A
- Authority
- JP
- Japan
- Prior art keywords
- different
- ics
- defective
- oblong
- read
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0207—Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Abstract
PURPOSE:To obtain an improved yield by a method wherein a size and a shape of the IC of a component element are determined in a way that a unit, having two or more of ICs performing different functions arranged on a chip with prescribed functions, can be cut into an oblong in general appearance. CONSTITUTION:In the case of 1 chip microcomputer, a prescribed function is obtained by having four different IC combinations: They are a central processing unit called microprocessor and its associated section (MPU), and exclusive-for-read- out memory (ROM), a write-in and read-out memory (RWM) and an interface adapter (PIA) to be used with peripheral units. These four different ICs are arranged on the same wafer so that the whole of them will make an oblong shape when combined. In the case when there is a defective IC, all the ICs including the defective one are scribed in order to make an oblong shape in general appearance. As a result, an automatic wire-connection using a machine can be performed, thereby enabling to have an improved yield.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9452079A JPS5618439A (en) | 1979-07-25 | 1979-07-25 | Semiconductor device consisting of different ic |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9452079A JPS5618439A (en) | 1979-07-25 | 1979-07-25 | Semiconductor device consisting of different ic |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5618439A true JPS5618439A (en) | 1981-02-21 |
Family
ID=14112597
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9452079A Pending JPS5618439A (en) | 1979-07-25 | 1979-07-25 | Semiconductor device consisting of different ic |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5618439A (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63220542A (en) * | 1987-03-09 | 1988-09-13 | Nec Corp | Manufacture of semiconductor device |
JPS63293852A (en) * | 1987-05-26 | 1988-11-30 | Nec Corp | Master slice integrated circuit |
JPH04218943A (en) * | 1991-04-19 | 1992-08-10 | Toshiba Corp | Manufacture of large-scale integrated circuit device |
EP0516185A2 (en) * | 1987-04-22 | 1992-12-02 | Hitachi, Ltd. | Wafer-scale semiconductor integrated circuit device |
US5309011A (en) * | 1987-04-22 | 1994-05-03 | Hitachi, Ltd. | Wafer scale or full wafer memory system, packaging method thereof, and wafer processing method employed therein |
JP2010219189A (en) * | 2009-03-16 | 2010-09-30 | Fujitsu Semiconductor Ltd | Production method and design device of semiconductor device |
JP5956708B1 (en) * | 2015-11-30 | 2016-07-27 | 株式会社PEZY Computing | DIE AND PACKAGE, DIE MANUFACTURING METHOD, AND PACKAGE GENERATION METHOD |
WO2017094092A1 (en) * | 2015-11-30 | 2017-06-08 | 株式会社PEZY Computing | Die and package |
-
1979
- 1979-07-25 JP JP9452079A patent/JPS5618439A/en active Pending
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63220542A (en) * | 1987-03-09 | 1988-09-13 | Nec Corp | Manufacture of semiconductor device |
EP0516185A2 (en) * | 1987-04-22 | 1992-12-02 | Hitachi, Ltd. | Wafer-scale semiconductor integrated circuit device |
US5309011A (en) * | 1987-04-22 | 1994-05-03 | Hitachi, Ltd. | Wafer scale or full wafer memory system, packaging method thereof, and wafer processing method employed therein |
JPS63293852A (en) * | 1987-05-26 | 1988-11-30 | Nec Corp | Master slice integrated circuit |
JPH04218943A (en) * | 1991-04-19 | 1992-08-10 | Toshiba Corp | Manufacture of large-scale integrated circuit device |
JP2010219189A (en) * | 2009-03-16 | 2010-09-30 | Fujitsu Semiconductor Ltd | Production method and design device of semiconductor device |
JP5956708B1 (en) * | 2015-11-30 | 2016-07-27 | 株式会社PEZY Computing | DIE AND PACKAGE, DIE MANUFACTURING METHOD, AND PACKAGE GENERATION METHOD |
WO2017094091A1 (en) * | 2015-11-30 | 2017-06-08 | 株式会社PEZY Computing | Die and package, and manufacturing method for die and producing method for package |
WO2017094092A1 (en) * | 2015-11-30 | 2017-06-08 | 株式会社PEZY Computing | Die and package |
US10691634B2 (en) | 2015-11-30 | 2020-06-23 | Pezy Computing K.K. | Die and package |
US10818638B2 (en) | 2015-11-30 | 2020-10-27 | Pezy Computing K.K. | Die and package |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE3067661D1 (en) | Interconnection device for integrated semiconductor circuits, and process for its manufacture | |
JPS52101062A (en) | Percentage indicator | |
DE2964965D1 (en) | Semiconductor chip with improved ability for testing the large scale integrated circuits | |
DE3382311D1 (en) | Online-monitor. | |
JPS5618439A (en) | Semiconductor device consisting of different ic | |
JPS57179997A (en) | Semiconductor memory | |
JPS57190343A (en) | Semiconductor integrated circuit | |
JPS54123054A (en) | Test piece processor | |
JPS5338373A (en) | Ic for watch | |
JPS55127655A (en) | Data processing terminal equipment | |
JPS5440082A (en) | Semiconductor test device | |
JPS5773954A (en) | Integrated circuit | |
JPS5727041A (en) | Large-scale integrated circuit having testing function | |
JPS5318972A (en) | Monitoring method of wafer positioning state by probes | |
JPS5396781A (en) | Integrated circuit device | |
JPS51138358A (en) | Electronic circuit testing apparatus | |
JPS5360169A (en) | Semiconductor integrated circuit device | |
JPS5444480A (en) | Package for integrated circuit | |
JPS5570754A (en) | Large scale integrated circuit element | |
JPS56158442A (en) | Wafer test device | |
JPS5412678A (en) | Simultaneous measurement method for integrated circuit device | |
JPS52138849A (en) | Logic integrated circuit | |
JPS5366520A (en) | All wave rectifying device | |
JPS52145263A (en) | Watch with calculator | |
JPS52115188A (en) | Prober |