JPS5570754A - Large scale integrated circuit element - Google Patents

Large scale integrated circuit element

Info

Publication number
JPS5570754A
JPS5570754A JP14332878A JP14332878A JPS5570754A JP S5570754 A JPS5570754 A JP S5570754A JP 14332878 A JP14332878 A JP 14332878A JP 14332878 A JP14332878 A JP 14332878A JP S5570754 A JPS5570754 A JP S5570754A
Authority
JP
Japan
Prior art keywords
lsi
terminals
output
b1wbn
ctrl
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14332878A
Other languages
Japanese (ja)
Inventor
Tadashi Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP14332878A priority Critical patent/JPS5570754A/en
Publication of JPS5570754A publication Critical patent/JPS5570754A/en
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: To enable the test for peripheral test except for LSI, by providing the gate circuit possible for high impedance state viewed from the output side, between the output of LSI logic function and the terminals of LSI.
CONSTITUTION: The LSI package 1 has the input terminals A1WAm, output terminals B1WBn and control terminal CTRL. Between the logical function 2 and the output terminals B1WBn, the gate circuits C1WCn controlled with the control terminal CTRL are inserted. The gate circuits C1WCn outputs high, low level, and high impedance. The gate circuit delivers the output from the logic function 2 as it is to the output terminals B1WBn when CTRL is 1. When CTRL is 0, the terminals B1WBn are all at high impedance viewed from external. Thus, the test for the peripheral circuit can be conducted while mounting LSI.
COPYRIGHT: (C)1980,JPO&Japio
JP14332878A 1978-11-22 1978-11-22 Large scale integrated circuit element Pending JPS5570754A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14332878A JPS5570754A (en) 1978-11-22 1978-11-22 Large scale integrated circuit element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14332878A JPS5570754A (en) 1978-11-22 1978-11-22 Large scale integrated circuit element

Publications (1)

Publication Number Publication Date
JPS5570754A true JPS5570754A (en) 1980-05-28

Family

ID=15336220

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14332878A Pending JPS5570754A (en) 1978-11-22 1978-11-22 Large scale integrated circuit element

Country Status (1)

Country Link
JP (1) JPS5570754A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60174963A (en) * 1984-02-22 1985-09-09 Hitachi Ltd Electronic package testing circuit
US4691161A (en) * 1985-06-13 1987-09-01 Raytheon Company Configurable logic gate array
JPS62218882A (en) * 1986-03-20 1987-09-26 Fujitsu Ltd System for discriminating inferior lsi
US4752729A (en) * 1986-07-01 1988-06-21 Texas Instruments Incorporated Test circuit for VSLI integrated circuits

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60174963A (en) * 1984-02-22 1985-09-09 Hitachi Ltd Electronic package testing circuit
US4691161A (en) * 1985-06-13 1987-09-01 Raytheon Company Configurable logic gate array
JPS62218882A (en) * 1986-03-20 1987-09-26 Fujitsu Ltd System for discriminating inferior lsi
US4752729A (en) * 1986-07-01 1988-06-21 Texas Instruments Incorporated Test circuit for VSLI integrated circuits

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