JPS54123054A - Test piece processor - Google Patents
Test piece processorInfo
- Publication number
- JPS54123054A JPS54123054A JP3062878A JP3062878A JPS54123054A JP S54123054 A JPS54123054 A JP S54123054A JP 3062878 A JP3062878 A JP 3062878A JP 3062878 A JP3062878 A JP 3062878A JP S54123054 A JPS54123054 A JP S54123054A
- Authority
- JP
- Japan
- Prior art keywords
- test
- test piece
- unit
- tests
- units
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
PURPOSE: To improve the test processing efficiency by selectively connecting the respective pin terminals of a single test piece with a plurality of test units so that they may be subjected to the center control by a host data processor.
CONSTITUTION: A test piece 1 is selectively connected in a pin corresponding manner with a DC parametric test unit 4, a function test unit 5 and an AC test unit 6 and is tested. The test piece is tested solely or jointly by the respective test units 4, 5 and 6. These tests are centrally controlled by a host data processor 2. As a result, the tests such as a DC parametric test, a function test or an AC test can be accomplished at one time. The tesing conditions are preset by the unit 5, and the tests by the units 4 and 6 can be accomplished so that the efficiency of the test processing can be improved.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3062878A JPS54123054A (en) | 1978-03-17 | 1978-03-17 | Test piece processor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3062878A JPS54123054A (en) | 1978-03-17 | 1978-03-17 | Test piece processor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54123054A true JPS54123054A (en) | 1979-09-25 |
Family
ID=12309107
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3062878A Pending JPS54123054A (en) | 1978-03-17 | 1978-03-17 | Test piece processor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54123054A (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59111597A (en) * | 1982-12-16 | 1984-06-27 | 横河電機株式会社 | Test system |
JPS59111596A (en) * | 1982-12-16 | 1984-06-27 | 横河電機株式会社 | Test system |
JPS59163695A (en) * | 1983-03-07 | 1984-09-14 | 横河電機株式会社 | Testing system |
JPS60236240A (en) * | 1984-05-09 | 1985-11-25 | Mitsubishi Electric Corp | Semiconductor testing device |
JPS63191976A (en) * | 1987-02-05 | 1988-08-09 | Hitachi Electronics Eng Co Ltd | Ic inspecting device |
JPS63201527A (en) * | 1987-02-18 | 1988-08-19 | Anritsu Corp | Measuring instrument |
JPH01117518U (en) * | 1988-02-03 | 1989-08-08 | ||
JPH0317575A (en) * | 1989-06-14 | 1991-01-25 | Mitsubishi Electric Corp | Lsi testing apparatus |
-
1978
- 1978-03-17 JP JP3062878A patent/JPS54123054A/en active Pending
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59111597A (en) * | 1982-12-16 | 1984-06-27 | 横河電機株式会社 | Test system |
JPS59111596A (en) * | 1982-12-16 | 1984-06-27 | 横河電機株式会社 | Test system |
JPS59163695A (en) * | 1983-03-07 | 1984-09-14 | 横河電機株式会社 | Testing system |
JPH0564307B2 (en) * | 1983-03-07 | 1993-09-14 | Yokogawa Electric Corp | |
JPS60236240A (en) * | 1984-05-09 | 1985-11-25 | Mitsubishi Electric Corp | Semiconductor testing device |
JPS63191976A (en) * | 1987-02-05 | 1988-08-09 | Hitachi Electronics Eng Co Ltd | Ic inspecting device |
JPS63201527A (en) * | 1987-02-18 | 1988-08-19 | Anritsu Corp | Measuring instrument |
JPH0583126B2 (en) * | 1987-02-18 | 1993-11-24 | Anritsu Corp | |
JPH01117518U (en) * | 1988-02-03 | 1989-08-08 | ||
JPH0317575A (en) * | 1989-06-14 | 1991-01-25 | Mitsubishi Electric Corp | Lsi testing apparatus |
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