DE3752358D1 - Ionenstrahlabtastverfahren und vorrichtung - Google Patents

Ionenstrahlabtastverfahren und vorrichtung

Info

Publication number
DE3752358D1
DE3752358D1 DE3752358T DE3752358T DE3752358D1 DE 3752358 D1 DE3752358 D1 DE 3752358D1 DE 3752358 T DE3752358 T DE 3752358T DE 3752358 T DE3752358 T DE 3752358T DE 3752358 D1 DE3752358 D1 DE 3752358D1
Authority
DE
Germany
Prior art keywords
ion
scanned
scaning
target object
ion ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE3752358T
Other languages
English (en)
Other versions
DE3752358T2 (de
Inventor
W Berrian
E Kaim
W Vanderpot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Varian Semiconductor Equipment Associates Inc
Original Assignee
Varian Semiconductor Equipment Associates Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Varian Semiconductor Equipment Associates Inc filed Critical Varian Semiconductor Equipment Associates Inc
Publication of DE3752358D1 publication Critical patent/DE3752358D1/de
Application granted granted Critical
Publication of DE3752358T2 publication Critical patent/DE3752358T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H01J2237/317—Processing objects on a microscale
    • H01J2237/31701—Ion implantation
    • H01J2237/31703—Dosimetry

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE3752358T 1986-04-09 1987-04-08 Ionenstrahlabtastverfahren und vorrichtung Expired - Lifetime DE3752358T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US84978686A 1986-04-09 1986-04-09
US2586087A 1987-03-16 1987-03-16
PCT/US1987/000804 WO1987006391A1 (en) 1986-04-09 1987-04-08 Ion beam scanning method and apparatus

Publications (2)

Publication Number Publication Date
DE3752358D1 true DE3752358D1 (de) 2002-12-19
DE3752358T2 DE3752358T2 (de) 2003-03-27

Family

ID=26700250

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3752358T Expired - Lifetime DE3752358T2 (de) 1986-04-09 1987-04-08 Ionenstrahlabtastverfahren und vorrichtung

Country Status (5)

Country Link
EP (2) EP1253620A3 (de)
JP (2) JP2699170B2 (de)
AT (1) ATE227884T1 (de)
DE (1) DE3752358T2 (de)
WO (1) WO1987006391A1 (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4980562A (en) * 1986-04-09 1990-12-25 Varian Associates, Inc. Method and apparatus for high efficiency scanning in an ion implanter
GB2216714B (en) * 1988-03-11 1992-10-14 Ulvac Corp Ion implanter system
SE463055B (sv) * 1989-02-10 1990-10-01 Scanditronix Ab Anordning foer att bestraala artiklar med elektroner samt magnetisk lins foer avboejning av straalar av laddade partiklar, saerskilt elektroner
JPH077658B2 (ja) * 1989-05-15 1995-01-30 日新電機株式会社 イオン注入装置
JPH0770296B2 (ja) * 1989-05-15 1995-07-31 日新電機株式会社 イオン注入装置
GB9005204D0 (en) * 1990-03-08 1990-05-02 Superion Ltd Apparatus and methods relating to scanning ion beams
US5051600A (en) * 1990-08-17 1991-09-24 Raychem Corporation Particle beam generator
US5132544A (en) * 1990-08-29 1992-07-21 Nissin Electric Company Ltd. System for irradiating a surface with atomic and molecular ions using two dimensional magnetic scanning
US5311028A (en) * 1990-08-29 1994-05-10 Nissin Electric Co., Ltd. System and method for producing oscillating magnetic fields in working gaps useful for irradiating a surface with atomic and molecular ions
KR970002681B1 (ko) * 1990-10-03 1997-03-08 이턴 코오포레이숀 이온비임주입시스템과 그방법 및 이온비임을 편향시키는 정전렌즈
US5091655A (en) * 1991-02-25 1992-02-25 Eaton Corporation Reduced path ion beam implanter
US6423976B1 (en) * 1999-05-28 2002-07-23 Applied Materials, Inc. Ion implanter and a method of implanting ions
EP1285456A2 (de) * 2000-05-15 2003-02-26 Varian Semiconductor Equipment Associates Inc. Abrasterung hoher effizienz in ionenimplantierungsgeräten
KR100594220B1 (ko) * 2000-08-09 2006-06-30 삼성전자주식회사 이온 주입 장치
JP2004508680A (ja) * 2000-09-07 2004-03-18 ダイアモンド　セミコンダクタ　グループ　エルエルシー 磁場走査および／または荷電粒子ビーム切換のための装置
US6956223B2 (en) * 2002-04-10 2005-10-18 Applied Materials, Inc. Multi-directional scanning of movable member and ion beam monitoring arrangement therefor
JP4877555B2 (ja) * 2004-04-05 2012-02-15 アクセリス テクノロジーズ インコーポレーテッド イオンビーム中を通過してワークピースをスキャンするための往復駆動装置
US7109499B2 (en) * 2004-11-05 2006-09-19 Varian Semiconductor Equipment Associates, Inc. Apparatus and methods for two-dimensional ion beam profiling
US7078707B1 (en) * 2005-01-04 2006-07-18 Axcelis Technologies, Inc. Ion beam scanning control methods and systems for ion implantation uniformity
JP2007123056A (ja) 2005-10-28 2007-05-17 Matsushita Electric Ind Co Ltd イオン注入装置とそのイオン注入制御方法
JP5085887B2 (ja) * 2006-05-30 2012-11-28 株式会社Ｓｅｎ ビーム処理装置及びビーム処理方法
JP2009055057A (ja) * 2008-10-24 2009-03-12 Panasonic Corp イオン注入装置とそのイオン注入制御方法
US20110272567A1 (en) * 2010-05-05 2011-11-10 Axcelis Technologies, Inc. Throughput Enhancement for Scanned Beam Ion Implanters
JP5767983B2 (ja) 2012-01-27 2015-08-26 住友重機械イオンテクノロジー株式会社 イオン注入方法及びイオン注入装置
JP5808706B2 (ja) * 2012-03-29 2015-11-10 住友重機械イオンテクノロジー株式会社 イオン注入装置及びその制御方法
JP5941377B2 (ja) * 2012-08-31 2016-06-29 住友重機械イオンテクノロジー株式会社 イオン注入方法およびイオン注入装置
JP6195538B2 (ja) 2014-04-25 2017-09-13 住友重機械イオンテクノロジー株式会社 イオン注入方法及びイオン注入装置
US9679745B2 (en) * 2015-10-14 2017-06-13 Varian Semiconductor Equipment Associates, Inc. Controlling an ion beam in a wide beam current operation range

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3122631A (en) * 1960-02-05 1964-02-25 Atlas Werke Ag Apparatus for focusing a line type ion beam on a mass spectrometer analyzer
DE1190226B (de) * 1961-12-09 1965-04-01 Akashi Seisakusho Kk Roentgenstrahl-Mikroanalysator
GB1280013A (en) * 1969-09-05 1972-07-05 Atomic Energy Authority Uk Improvements in or relating to apparatus bombarding a target with ions
US3816748A (en) * 1972-04-28 1974-06-11 Alpha Ind Inc Ion accelerator employing crossed-field selector
US4021675A (en) * 1973-02-20 1977-05-03 Hughes Aircraft Company System for controlling ion implantation dosage in electronic materials
JPS5836464B2 (ja) * 1975-09-12 1983-08-09 株式会社島津製作所 シツリヨウブンセキソウチ
JPS53102677A (en) * 1977-02-18 1978-09-07 Hitachi Ltd Ion beam radiating unit
JPS5457862A (en) * 1977-10-17 1979-05-10 Hitachi Ltd Ion-beam irradiation device
NL182924C (nl) * 1978-05-12 1988-06-01 Philips Nv Inrichting voor het implanteren van ionen in een trefplaat.
JPS55124936A (en) * 1979-03-22 1980-09-26 Hitachi Ltd Control method of beam current in ion drive
US4276477A (en) * 1979-09-17 1981-06-30 Varian Associates, Inc. Focusing apparatus for uniform application of charged particle beam
JPS56126918A (en) * 1980-03-11 1981-10-05 Hitachi Ltd Injecting device for ion
JPS57182956A (en) * 1981-05-07 1982-11-11 Hitachi Ltd Ion-implantation device
US4447773A (en) * 1981-06-22 1984-05-08 California Institute Of Technology Ion beam accelerator system
US4433247A (en) * 1981-09-28 1984-02-21 Varian Associates, Inc. Beam sharing method and apparatus for ion implantation
JPS59230242A (ja) * 1983-06-10 1984-12-24 Hitachi Ltd イオン打込装置
JPS60124344A (ja) * 1983-12-08 1985-07-03 Nec Corp イオン注入装置
US4539217A (en) * 1984-06-27 1985-09-03 Eaton Corporation Dose control method
US4587433A (en) * 1984-06-27 1986-05-06 Eaton Corporation Dose control apparatus
JPH0630237B2 (ja) * 1984-09-10 1994-04-20 株式会社日立製作所 イオン打込み装置
JPS61220264A (ja) * 1985-03-26 1986-09-30 Hitachi Ltd イオン打込装置
JPS61267250A (ja) * 1985-05-20 1986-11-26 Fuji Electric Co Ltd イオン注入装置
EP0287630A4 (de) * 1986-10-08 1989-07-25 Varian Associates Verfahren und vorrichtung zum abtasten mit konstantem einfallswinkel in ionenstrahlsystemen.

Also Published As

Publication number Publication date
ATE227884T1 (de) 2002-11-15
JPH01500310A (ja) 1989-02-02
EP1253620A2 (de) 2002-10-30
JP2699170B2 (ja) 1998-01-19
DE3752358T2 (de) 2003-03-27
EP0263876A4 (en) 1991-10-09
JPH10116581A (ja) 1998-05-06
JP3153784B2 (ja) 2001-04-09
EP1253620A3 (de) 2008-05-07
EP0263876A1 (de) 1988-04-20
WO1987006391A1 (en) 1987-10-22
EP0263876B1 (de) 2002-11-13

Similar Documents

Publication Publication Date Title
DE3752358D1 (de) Ionenstrahlabtastverfahren und vorrichtung
DE3034779C2 (de)
US4367411A (en) Unitary electromagnet for double deflection scanning of charged particle beam
GB2116357B (en) Beam scanning method and apparatus for ion implantation
JPS57136335A (en) Method and device for treating article with fine focused electron beam
DE69018018D1 (de) Verfahren und Gerät zur Erzeugung eines elliptisch verteilten Ionenstrahls.
CA2099685A1 (en) Focused Ion Beam Implantation Apparatus
EP1024519A3 (de) Ionenimplantierung mittels konischer, magnetischer Abtastung
ATE81566T1 (de) Schnelle parallelabtastung mit ionenstrahlen mit einer bipolaren magnetischen linse mit uneinheitlichem feld.
JPS57182956A (en) Ion-implantation device
EP0377298A3 (de) Einen Ionenstrahl mit gleichmässigem Querschnitt verwendende Vorrichtung
GB2007394B (en) Method and apparatus for automatically focusing an electron beam in a scanning beam device
JPS55103729A (en) Electron beam ringraphic device
WO2002052609A3 (en) Compact beamline and ion implanter system using same
DE3020281C2 (de) Vorrichtung zur Doppelablenk-Abtastung eines Partikelstrahls
EP0378077A3 (de) Verfahren und Vorrichtung zur Analysierung durch Ionenmassenspektroskopie
JPS6428837A (en) Defect inspection device
SE8900460L (sv) Anordning foer bestraalning samt lins
JPS5632722A (en) Ion implanting apparatus
SU780820A1 (ru) Устройство дл формировани импульсных равномерных полей облучени электронами
JPS57133629A (en) Electron beam annealing device
JPS6489136A (en) Ion implanting apparatus and ion implanting method
AT381600B (de) Elektromagnetische anordnung zum fokussieren und ablenken von elektronenstrahlen
JPS5297786A (en) X-ray analyzer
JPS55144577A (en) Energy analyzer for electron ray

Legal Events

Date Code Title Description
8364 No opposition during term of opposition