GB1280013A - Improvements in or relating to apparatus bombarding a target with ions - Google Patents

Improvements in or relating to apparatus bombarding a target with ions

Info

Publication number
GB1280013A
GB1280013A GB44171/69A GB4417169A GB1280013A GB 1280013 A GB1280013 A GB 1280013A GB 44171/69 A GB44171/69 A GB 44171/69A GB 4417169 A GB4417169 A GB 4417169A GB 1280013 A GB1280013 A GB 1280013A
Authority
GB
United Kingdom
Prior art keywords
target
ion beam
window
holder
ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB44171/69A
Inventor
James Harry Freeman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UK Atomic Energy Authority
Original Assignee
UK Atomic Energy Authority
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by UK Atomic Energy Authority filed Critical UK Atomic Energy Authority
Priority to GB44171/69A priority Critical patent/GB1280013A/en
Priority to US65941A priority patent/US3689766A/en
Priority to FR7032232A priority patent/FR2060966A5/fr
Priority to DE7032987U priority patent/DE7032987U/en
Priority to DE2043865A priority patent/DE2043865C2/en
Priority to NLAANVRAGE7013146,A priority patent/NL172805C/en
Priority to JP45078145A priority patent/JPS521159B1/ja
Publication of GB1280013A publication Critical patent/GB1280013A/en
Expired legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01DSEPARATION
    • B01D59/00Separation of different isotopes of the same chemical element
    • B01D59/44Separation by mass spectrography
    • B01D59/48Separation by mass spectrography using electrostatic and magnetic fields
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/022Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/025Detectors specially adapted to particle spectrometers
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00Semiconductor device manufacturing: process
    • Y10S438/961Ion beam source and generation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physical Vapour Deposition (AREA)
  • Welding Or Cutting Using Electron Beams (AREA)

Abstract

1280013 Ion-beam apparatus UNITED KINGDOM ATOMIC ENERGY AUTHORITY 21 Aug 1970 [5 Sept 1969] 44171/69 Heading H1D [Also in Division G3] Apparatus for bombarding a target 89 with ions comprises an ion beam source, a magnet for deflecting the ion beam 91 towards a window, means for stabilizing the ion beam to maintain substantially constant the ion beam current passing through the window, a holder 87 for a target 89 behind the window, and drive means for imparting controlled movement to the target holder to scan the target through the ion beam according to a predetermined scan pattern. A cylindrical enclosure 81 with a pipe 82 for connection to a vacuum pump has a tubular extension 83 housing a lens assembly with a window or mass-defining slit of width equal to that of the target. Target holder 87 is secured to a lead screw 84 driven by a motor 85 controlled by a programmer 86. Rotation of the target holder is prevented by a torque resisting tube 88, but it is free to slide up and down as indicated by arrow B. The holder supports a plurality of racks filled with wafers 89. After implantation of one row of wafers the holder is indexed one step by fingers 92 and 93 engaging cam surfaces 94 and 95 fixed to the enclosure 81. The wafers may be heated by radiation or may be cooled by plates cooled with liquid nitrogen. An alternative embodiment (Figs. 2 to 5, not shown) comprises a magnetic separator as described in Specification 6,280,011, an ion source as described in Specification 6,280,012, and a target chamber in which means are provided for loading and unloading wafers to and from a carrier which is mounted on an X-Y drive mechanism which may be automatically programmed. The ion beam is swept over the window by superimposing an alternating voltage from a sweep generator on the stabilized D.C. supply to an accelerating electrode of the ion gun. The beam stabilizing means may comprise a probe (Fig. 1, not shown-see Division G3) which samples the ion beam at the window and passes a signal through an amplifier to a sweep control which controls the amplitude of the sweep in such a way as to tend to reduce variations in the ion beam intensity.
GB44171/69A 1969-09-05 1969-09-05 Improvements in or relating to apparatus bombarding a target with ions Expired GB1280013A (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
GB44171/69A GB1280013A (en) 1969-09-05 1969-09-05 Improvements in or relating to apparatus bombarding a target with ions
US65941A US3689766A (en) 1969-09-05 1970-08-21 Apparatus for bombarding a target with ions
FR7032232A FR2060966A5 (en) 1969-09-05 1970-09-04
DE7032987U DE7032987U (en) 1969-09-05 1970-09-04 DEVICE FOR ION Bombardment.
DE2043865A DE2043865C2 (en) 1969-09-05 1970-09-04 Device for bombarding a target with ions
NLAANVRAGE7013146,A NL172805C (en) 1969-09-05 1970-09-04 DEVICE FOR BOMBARDING A TARGET WITH IONS.
JP45078145A JPS521159B1 (en) 1969-09-05 1970-09-05

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB44171/69A GB1280013A (en) 1969-09-05 1969-09-05 Improvements in or relating to apparatus bombarding a target with ions

Publications (1)

Publication Number Publication Date
GB1280013A true GB1280013A (en) 1972-07-05

Family

ID=10432104

Family Applications (1)

Application Number Title Priority Date Filing Date
GB44171/69A Expired GB1280013A (en) 1969-09-05 1969-09-05 Improvements in or relating to apparatus bombarding a target with ions

Country Status (6)

Country Link
US (1) US3689766A (en)
JP (1) JPS521159B1 (en)
DE (2) DE2043865C2 (en)
FR (1) FR2060966A5 (en)
GB (1) GB1280013A (en)
NL (1) NL172805C (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4361762A (en) * 1980-07-30 1982-11-30 Rca Corporation Apparatus and method for neutralizing the beam in an ion implanter
CN112361892A (en) * 2020-11-04 2021-02-12 山东战勤特种装备有限公司 Shooting intelligent confrontation automatic target scoring training method and device

Families Citing this family (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3983397A (en) * 1972-05-08 1976-09-28 Albert Richard D Selectable wavelength X-ray source
US3778626A (en) * 1972-07-28 1973-12-11 Western Electric Co Mechanical scan system for ion implantation
US4021675A (en) * 1973-02-20 1977-05-03 Hughes Aircraft Company System for controlling ion implantation dosage in electronic materials
US3993909A (en) * 1973-03-16 1976-11-23 U.S. Philips Corporation Substrate holder for etching thin films
DE2326279A1 (en) * 1973-05-23 1974-12-19 Siemens Ag ION BEAM HIGH-SPEED CIRCUIT TO ACHIEVE DEFINED SOLID DOCUMENTS THROUGH ION IMPLANTATION
US4033904A (en) * 1974-03-22 1977-07-05 Varian Associates, Inc. Interchangeable specimen trays and apparatus for a vacuum type testing system
JPS515961A (en) * 1974-07-03 1976-01-19 Dan Kagaku Kk KONSEISOSASOCHI
US4017403A (en) * 1974-07-31 1977-04-12 United Kingdom Atomic Energy Authority Ion beam separators
US4013262A (en) * 1974-12-13 1977-03-22 Varian Associates Rotary apparatus for moving workpieces through treatment beam with controlled angle of orientation and ion implanter incorporating such apparatus
US4024399A (en) * 1975-01-06 1977-05-17 Jersey Nuclear-Avco Isotopes, Inc. Method and apparatus for measuring vapor flow in isotope separation
FR2298880A1 (en) * 1975-01-22 1976-08-20 Commissariat Energie Atomique IONIC IMPLANTATION METHOD AND DEVICE
US4000426A (en) * 1975-05-15 1976-12-28 Aita Konstantinovna Zaitseva Apparatus for feeding parts in ion-beam machining
US4011449A (en) * 1975-11-05 1977-03-08 Ibm Corporation Apparatus for measuring the beam current of charged particle beam
DE2557685A1 (en) * 1975-12-20 1977-06-30 Ibm Deutschland PROCESS FOR PRODUCING A SCREENED PHOTOCONDUCTOR LAYER
CH607836A5 (en) * 1976-12-27 1978-11-15 Balzers Hochvakuum
US4234797A (en) * 1979-05-23 1980-11-18 Nova Associates, Inc. Treating workpieces with beams
US4258266A (en) * 1979-07-30 1981-03-24 Hughes Aircraft Company Ion implantation system
US4514636A (en) * 1979-09-14 1985-04-30 Eaton Corporation Ion treatment apparatus
JPS56126918A (en) * 1980-03-11 1981-10-05 Hitachi Ltd Injecting device for ion
JPS58164134A (en) * 1982-03-24 1983-09-29 Hitachi Ltd Manufacturing method of semiconductor unit
US4517465A (en) * 1983-03-29 1985-05-14 Veeco/Ai, Inc. Ion implantation control system
US4587433A (en) * 1984-06-27 1986-05-06 Eaton Corporation Dose control apparatus
EP0237165A3 (en) * 1986-01-29 1991-04-17 Eaton Corporation Treating work pieces with electro-magnetically scanned ion beams
WO1987006391A1 (en) * 1986-04-09 1987-10-22 Eclipse Ion Technology, Inc. Ion beam scanning method and apparatus
US4922106A (en) * 1986-04-09 1990-05-01 Varian Associates, Inc. Ion beam scanning method and apparatus
US4980562A (en) * 1986-04-09 1990-12-25 Varian Associates, Inc. Method and apparatus for high efficiency scanning in an ion implanter
US4751393A (en) * 1986-05-16 1988-06-14 Varian Associates, Inc. Dose measurement and uniformity monitoring system for ion implantation
US4745281A (en) * 1986-08-25 1988-05-17 Eclipse Ion Technology, Inc. Ion beam fast parallel scanning having dipole magnetic lens with nonuniform field
US4804852A (en) * 1987-01-29 1989-02-14 Eaton Corporation Treating work pieces with electro-magnetically scanned ion beams
US4816693A (en) * 1987-08-21 1989-03-28 National Electrostatics Corp. Apparatus and method for uniform ion dose control
US5309064A (en) * 1993-03-22 1994-05-03 Armini Anthony J Ion source generator auxiliary device
US5981961A (en) * 1996-03-15 1999-11-09 Applied Materials, Inc. Apparatus and method for improved scanning efficiency in an ion implanter
US5852345A (en) * 1996-11-01 1998-12-22 Implant Sciences Corp. Ion source generator auxiliary device for phosphorus and arsenic beams
US5808416A (en) * 1996-11-01 1998-09-15 Implant Sciences Corp. Ion source generator auxiliary device
US6060715A (en) * 1997-10-31 2000-05-09 Applied Materials, Inc. Method and apparatus for ion beam scanning in an ion implanter
US6084241A (en) * 1998-06-01 2000-07-04 Motorola, Inc. Method of manufacturing semiconductor devices and apparatus therefor
US6677599B2 (en) * 2000-03-27 2004-01-13 Applied Materials, Inc. System and method for uniformly implanting a wafer with an ion beam
AU2001270133A1 (en) 2000-06-22 2002-01-02 Proteros, Llc Ion implantation uniformity correction using beam current control
US7547460B2 (en) 2000-09-15 2009-06-16 Varian Semiconductor Equipment Associates, Inc. Ion implanter optimizer scan waveform retention and recovery
CN100338720C (en) * 2000-11-22 2007-09-19 瓦里安半导体设备联合公司 Hybrid scanning system and methods for ion implantation
US6710359B2 (en) 2001-03-23 2004-03-23 Varian Semiconductor Equipment Associates, Inc. Methods and apparatus for scanned beam uniformity adjustment in ion implanters
US20130114773A1 (en) * 2011-11-08 2013-05-09 Alexander R. Vaucher Superconducting neutron source
CN112516797B (en) * 2020-12-01 2022-09-16 中国科学院近代物理研究所 Electrostatic focusing and accelerating system and method for isotope separation system

Family Cites Families (9)

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Publication number Priority date Publication date Assignee Title
BE426347A (en) * 1937-02-18
US2348031A (en) * 1941-04-30 1944-05-02 Rca Corp Method of focusing electron microscopes
NL270945A (en) * 1961-03-02
NL276412A (en) * 1961-03-30
US3131300A (en) * 1962-11-16 1964-04-28 Thomas R Jeter Apparatus for reducing energy variations of a van de graaff ion beam
US3326176A (en) * 1964-10-27 1967-06-20 Nat Res Corp Work-registration device including ionic beam probe
US3358239A (en) * 1965-07-27 1967-12-12 Transformatoren & Roentgenwerk Equipment for controlling and monitoring the electron beam of a horizontaltype particle accelerator
US3434894A (en) * 1965-10-06 1969-03-25 Ion Physics Corp Fabricating solid state devices by ion implantation
US3547074A (en) * 1967-04-13 1970-12-15 Block Engineering Apparatus for forming microelements

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4361762A (en) * 1980-07-30 1982-11-30 Rca Corporation Apparatus and method for neutralizing the beam in an ion implanter
CN112361892A (en) * 2020-11-04 2021-02-12 山东战勤特种装备有限公司 Shooting intelligent confrontation automatic target scoring training method and device

Also Published As

Publication number Publication date
US3689766A (en) 1972-09-05
DE2043865A1 (en) 1971-03-11
NL7013146A (en) 1971-03-09
JPS521159B1 (en) 1977-01-12
FR2060966A5 (en) 1971-06-18
DE2043865C2 (en) 1983-08-04
DE7032987U (en) 1971-02-18
NL172805C (en) 1983-10-17
NL172805B (en) 1983-05-16

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee