NL172805B - DEVICE FOR BOMBARDING A TARGET WITH IONS. - Google Patents

DEVICE FOR BOMBARDING A TARGET WITH IONS.

Info

Publication number
NL172805B
NL172805B NLAANVRAGE7013146,A NL7013146A NL172805B NL 172805 B NL172805 B NL 172805B NL 7013146 A NL7013146 A NL 7013146A NL 172805 B NL172805 B NL 172805B
Authority
NL
Netherlands
Prior art keywords
bombarding
ions
target
Prior art date
Application number
NLAANVRAGE7013146,A
Other languages
Dutch (nl)
Other versions
NL172805C (en
NL7013146A (en
Original Assignee
Atomic Energy Authority Uk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atomic Energy Authority Uk filed Critical Atomic Energy Authority Uk
Publication of NL7013146A publication Critical patent/NL7013146A/xx
Publication of NL172805B publication Critical patent/NL172805B/en
Application granted granted Critical
Publication of NL172805C publication Critical patent/NL172805C/en

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01D—SEPARATION
    • B01D59/00—Separation of different isotopes of the same chemical element
    • B01D59/44—Separation by mass spectrography
    • B01D59/48—Separation by mass spectrography using electrostatic and magnetic fields
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/961—Ion beam source and generation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physical Vapour Deposition (AREA)
  • Welding Or Cutting Using Electron Beams (AREA)
NLAANVRAGE7013146,A 1969-09-05 1970-09-04 DEVICE FOR BOMBARDING A TARGET WITH IONS. NL172805C (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB44171/69A GB1280013A (en) 1969-09-05 1969-09-05 Improvements in or relating to apparatus bombarding a target with ions

Publications (3)

Publication Number Publication Date
NL7013146A NL7013146A (en) 1971-03-09
NL172805B true NL172805B (en) 1983-05-16
NL172805C NL172805C (en) 1983-10-17

Family

ID=10432104

Family Applications (1)

Application Number Title Priority Date Filing Date
NLAANVRAGE7013146,A NL172805C (en) 1969-09-05 1970-09-04 DEVICE FOR BOMBARDING A TARGET WITH IONS.

Country Status (6)

Country Link
US (1) US3689766A (en)
JP (1) JPS521159B1 (en)
DE (2) DE7032987U (en)
FR (1) FR2060966A5 (en)
GB (1) GB1280013A (en)
NL (1) NL172805C (en)

Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3983397A (en) * 1972-05-08 1976-09-28 Albert Richard D Selectable wavelength X-ray source
US3778626A (en) * 1972-07-28 1973-12-11 Western Electric Co Mechanical scan system for ion implantation
US4021675A (en) * 1973-02-20 1977-05-03 Hughes Aircraft Company System for controlling ion implantation dosage in electronic materials
US3993909A (en) * 1973-03-16 1976-11-23 U.S. Philips Corporation Substrate holder for etching thin films
DE2326279A1 (en) * 1973-05-23 1974-12-19 Siemens Ag ION BEAM HIGH-SPEED CIRCUIT TO ACHIEVE DEFINED SOLID DOCUMENTS THROUGH ION IMPLANTATION
US4033904A (en) * 1974-03-22 1977-07-05 Varian Associates, Inc. Interchangeable specimen trays and apparatus for a vacuum type testing system
JPS515961A (en) * 1974-07-03 1976-01-19 Dan Kagaku Kk KONSEISOSASOCHI
US4017403A (en) * 1974-07-31 1977-04-12 United Kingdom Atomic Energy Authority Ion beam separators
US4013262A (en) * 1974-12-13 1977-03-22 Varian Associates Rotary apparatus for moving workpieces through treatment beam with controlled angle of orientation and ion implanter incorporating such apparatus
US4024399A (en) * 1975-01-06 1977-05-17 Jersey Nuclear-Avco Isotopes, Inc. Method and apparatus for measuring vapor flow in isotope separation
FR2298880A1 (en) * 1975-01-22 1976-08-20 Commissariat Energie Atomique IONIC IMPLANTATION METHOD AND DEVICE
US4000426A (en) * 1975-05-15 1976-12-28 Aita Konstantinovna Zaitseva Apparatus for feeding parts in ion-beam machining
US4011449A (en) * 1975-11-05 1977-03-08 Ibm Corporation Apparatus for measuring the beam current of charged particle beam
DE2557685A1 (en) * 1975-12-20 1977-06-30 Ibm Deutschland PROCESS FOR PRODUCING A SCREENED PHOTOCONDUCTOR LAYER
CH607836A5 (en) * 1976-12-27 1978-11-15 Balzers Hochvakuum
US4234797A (en) * 1979-05-23 1980-11-18 Nova Associates, Inc. Treating workpieces with beams
US4258266A (en) * 1979-07-30 1981-03-24 Hughes Aircraft Company Ion implantation system
US4514636A (en) * 1979-09-14 1985-04-30 Eaton Corporation Ion treatment apparatus
JPS56126918A (en) * 1980-03-11 1981-10-05 Hitachi Ltd Injecting device for ion
US4361762A (en) * 1980-07-30 1982-11-30 Rca Corporation Apparatus and method for neutralizing the beam in an ion implanter
JPS58164134A (en) * 1982-03-24 1983-09-29 Hitachi Ltd Manufacturing method of semiconductor unit
US4517465A (en) * 1983-03-29 1985-05-14 Veeco/Ai, Inc. Ion implantation control system
US4587433A (en) * 1984-06-27 1986-05-06 Eaton Corporation Dose control apparatus
JPS6324536A (en) * 1986-01-29 1988-02-01 イ−トン　コ−ポレ−シヨン Apparatus and method for ion implantation
US4980562A (en) * 1986-04-09 1990-12-25 Varian Associates, Inc. Method and apparatus for high efficiency scanning in an ion implanter
JPS62295347A (en) * 1986-04-09 1987-12-22 イクリプス・イオン・テクノロジ−・インコ−ポレイテツド Ion beam fast parallel scanner
ATE227884T1 (en) * 1986-04-09 2002-11-15 Varian Semiconductor Equipment ION BEAM SCANNING METHOD AND APPARATUS
US4751393A (en) * 1986-05-16 1988-06-14 Varian Associates, Inc. Dose measurement and uniformity monitoring system for ion implantation
US4745281A (en) * 1986-08-25 1988-05-17 Eclipse Ion Technology, Inc. Ion beam fast parallel scanning having dipole magnetic lens with nonuniform field
US4804852A (en) * 1987-01-29 1989-02-14 Eaton Corporation Treating work pieces with electro-magnetically scanned ion beams
US4816693A (en) * 1987-08-21 1989-03-28 National Electrostatics Corp. Apparatus and method for uniform ion dose control
US5309064A (en) * 1993-03-22 1994-05-03 Armini Anthony J Ion source generator auxiliary device
US5981961A (en) * 1996-03-15 1999-11-09 Applied Materials, Inc. Apparatus and method for improved scanning efficiency in an ion implanter
US5852345A (en) * 1996-11-01 1998-12-22 Implant Sciences Corp. Ion source generator auxiliary device for phosphorus and arsenic beams
US5808416A (en) * 1996-11-01 1998-09-15 Implant Sciences Corp. Ion source generator auxiliary device
US6060715A (en) * 1997-10-31 2000-05-09 Applied Materials, Inc. Method and apparatus for ion beam scanning in an ion implanter
US6084241A (en) * 1998-06-01 2000-07-04 Motorola, Inc. Method of manufacturing semiconductor devices and apparatus therefor
US6677599B2 (en) * 2000-03-27 2004-01-13 Applied Materials, Inc. System and method for uniformly implanting a wafer with an ion beam
US6661016B2 (en) 2000-06-22 2003-12-09 Proteros, Llc Ion implantation uniformity correction using beam current control
US7547460B2 (en) 2000-09-15 2009-06-16 Varian Semiconductor Equipment Associates, Inc. Ion implanter optimizer scan waveform retention and recovery
JP4070602B2 (en) * 2000-11-22 2008-04-02 バリアン・セミコンダクター・エクイップメント・アソシエイツ・インコーポレイテッド Hybrid scanning system and method for ion implantation
US6710359B2 (en) 2001-03-23 2004-03-23 Varian Semiconductor Equipment Associates, Inc. Methods and apparatus for scanned beam uniformity adjustment in ion implanters
US20130114773A1 (en) * 2011-11-08 2013-05-09 Alexander R. Vaucher Superconducting neutron source
CN112361892A (en) * 2020-11-04 2021-02-12 山东战勤特种装备有限公司 Shooting intelligent confrontation automatic target scoring training method and device
CN112516797B (en) * 2020-12-01 2022-09-16 中国科学院近代物理研究所 Electrostatic focusing and accelerating system and method for isotope separation system

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL53538C (en) * 1937-02-18
US2348031A (en) * 1941-04-30 1944-05-02 Rca Corp Method of focusing electron microscopes
NL270945A (en) * 1961-03-02
NL276412A (en) * 1961-03-30
US3131300A (en) * 1962-11-16 1964-04-28 Thomas R Jeter Apparatus for reducing energy variations of a van de graaff ion beam
US3326176A (en) * 1964-10-27 1967-06-20 Nat Res Corp Work-registration device including ionic beam probe
US3358239A (en) * 1965-07-27 1967-12-12 Transformatoren & Roentgenwerk Equipment for controlling and monitoring the electron beam of a horizontaltype particle accelerator
US3434894A (en) * 1965-10-06 1969-03-25 Ion Physics Corp Fabricating solid state devices by ion implantation
US3547074A (en) * 1967-04-13 1970-12-15 Block Engineering Apparatus for forming microelements

Also Published As

Publication number Publication date
NL172805C (en) 1983-10-17
DE2043865A1 (en) 1971-03-11
FR2060966A5 (en) 1971-06-18
DE2043865C2 (en) 1983-08-04
NL7013146A (en) 1971-03-09
JPS521159B1 (en) 1977-01-12
DE7032987U (en) 1971-02-18
GB1280013A (en) 1972-07-05
US3689766A (en) 1972-09-05

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Legal Events

Date Code Title Description
V1 Lapsed because of non-payment of the annual fee