FR2060966A5 - - Google Patents
Info
- Publication number
- FR2060966A5 FR2060966A5 FR7032232A FR7032232A FR2060966A5 FR 2060966 A5 FR2060966 A5 FR 2060966A5 FR 7032232 A FR7032232 A FR 7032232A FR 7032232 A FR7032232 A FR 7032232A FR 2060966 A5 FR2060966 A5 FR 2060966A5
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01D—SEPARATION
- B01D59/00—Separation of different isotopes of the same chemical element
- B01D59/44—Separation by mass spectrography
- B01D59/48—Separation by mass spectrography using electrostatic and magnetic fields
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/961—Ion beam source and generation
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physical Vapour Deposition (AREA)
- Welding Or Cutting Using Electron Beams (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB44171/69A GB1280013A (en) | 1969-09-05 | 1969-09-05 | Improvements in or relating to apparatus bombarding a target with ions |
Publications (1)
Publication Number | Publication Date |
---|---|
FR2060966A5 true FR2060966A5 (en) | 1971-06-18 |
Family
ID=10432104
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7032232A Expired FR2060966A5 (en) | 1969-09-05 | 1970-09-04 |
Country Status (6)
Country | Link |
---|---|
US (1) | US3689766A (en) |
JP (1) | JPS521159B1 (en) |
DE (2) | DE7032987U (en) |
FR (1) | FR2060966A5 (en) |
GB (1) | GB1280013A (en) |
NL (1) | NL172805C (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112516797A (en) * | 2020-12-01 | 2021-03-19 | 中国科学院近代物理研究所 | Electrostatic focusing and accelerating system and method for isotope separation system |
Families Citing this family (44)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3983397A (en) * | 1972-05-08 | 1976-09-28 | Albert Richard D | Selectable wavelength X-ray source |
US3778626A (en) * | 1972-07-28 | 1973-12-11 | Western Electric Co | Mechanical scan system for ion implantation |
US4021675A (en) * | 1973-02-20 | 1977-05-03 | Hughes Aircraft Company | System for controlling ion implantation dosage in electronic materials |
US3993909A (en) * | 1973-03-16 | 1976-11-23 | U.S. Philips Corporation | Substrate holder for etching thin films |
DE2326279A1 (en) * | 1973-05-23 | 1974-12-19 | Siemens Ag | ION BEAM HIGH-SPEED CIRCUIT TO ACHIEVE DEFINED SOLID DOCUMENTS THROUGH ION IMPLANTATION |
US4033904A (en) * | 1974-03-22 | 1977-07-05 | Varian Associates, Inc. | Interchangeable specimen trays and apparatus for a vacuum type testing system |
JPS515961A (en) * | 1974-07-03 | 1976-01-19 | Dan Kagaku Kk | KONSEISOSASOCHI |
US4017403A (en) * | 1974-07-31 | 1977-04-12 | United Kingdom Atomic Energy Authority | Ion beam separators |
US4013262A (en) * | 1974-12-13 | 1977-03-22 | Varian Associates | Rotary apparatus for moving workpieces through treatment beam with controlled angle of orientation and ion implanter incorporating such apparatus |
US4024399A (en) * | 1975-01-06 | 1977-05-17 | Jersey Nuclear-Avco Isotopes, Inc. | Method and apparatus for measuring vapor flow in isotope separation |
FR2298880A1 (en) * | 1975-01-22 | 1976-08-20 | Commissariat Energie Atomique | IONIC IMPLANTATION METHOD AND DEVICE |
US4000426A (en) * | 1975-05-15 | 1976-12-28 | Aita Konstantinovna Zaitseva | Apparatus for feeding parts in ion-beam machining |
US4011449A (en) * | 1975-11-05 | 1977-03-08 | Ibm Corporation | Apparatus for measuring the beam current of charged particle beam |
DE2557685A1 (en) * | 1975-12-20 | 1977-06-30 | Ibm Deutschland | PROCESS FOR PRODUCING A SCREENED PHOTOCONDUCTOR LAYER |
CH607836A5 (en) * | 1976-12-27 | 1978-11-15 | Balzers Hochvakuum | |
US4234797A (en) * | 1979-05-23 | 1980-11-18 | Nova Associates, Inc. | Treating workpieces with beams |
US4258266A (en) * | 1979-07-30 | 1981-03-24 | Hughes Aircraft Company | Ion implantation system |
US4514636A (en) * | 1979-09-14 | 1985-04-30 | Eaton Corporation | Ion treatment apparatus |
JPS56126918A (en) * | 1980-03-11 | 1981-10-05 | Hitachi Ltd | Injecting device for ion |
US4361762A (en) * | 1980-07-30 | 1982-11-30 | Rca Corporation | Apparatus and method for neutralizing the beam in an ion implanter |
JPS58164134A (en) * | 1982-03-24 | 1983-09-29 | Hitachi Ltd | Manufacturing method of semiconductor unit |
US4517465A (en) * | 1983-03-29 | 1985-05-14 | Veeco/Ai, Inc. | Ion implantation control system |
US4587433A (en) * | 1984-06-27 | 1986-05-06 | Eaton Corporation | Dose control apparatus |
JPS6324536A (en) * | 1986-01-29 | 1988-02-01 | イ−トン コ−ポレ−シヨン | Apparatus and method for ion implantation |
US4980562A (en) * | 1986-04-09 | 1990-12-25 | Varian Associates, Inc. | Method and apparatus for high efficiency scanning in an ion implanter |
JPS62295347A (en) * | 1986-04-09 | 1987-12-22 | イクリプス・イオン・テクノロジ−・インコ−ポレイテツド | Ion beam fast parallel scanner |
ATE227884T1 (en) * | 1986-04-09 | 2002-11-15 | Varian Semiconductor Equipment | ION BEAM SCANNING METHOD AND APPARATUS |
US4751393A (en) * | 1986-05-16 | 1988-06-14 | Varian Associates, Inc. | Dose measurement and uniformity monitoring system for ion implantation |
US4745281A (en) * | 1986-08-25 | 1988-05-17 | Eclipse Ion Technology, Inc. | Ion beam fast parallel scanning having dipole magnetic lens with nonuniform field |
US4804852A (en) * | 1987-01-29 | 1989-02-14 | Eaton Corporation | Treating work pieces with electro-magnetically scanned ion beams |
US4816693A (en) * | 1987-08-21 | 1989-03-28 | National Electrostatics Corp. | Apparatus and method for uniform ion dose control |
US5309064A (en) * | 1993-03-22 | 1994-05-03 | Armini Anthony J | Ion source generator auxiliary device |
US5981961A (en) * | 1996-03-15 | 1999-11-09 | Applied Materials, Inc. | Apparatus and method for improved scanning efficiency in an ion implanter |
US5852345A (en) * | 1996-11-01 | 1998-12-22 | Implant Sciences Corp. | Ion source generator auxiliary device for phosphorus and arsenic beams |
US5808416A (en) * | 1996-11-01 | 1998-09-15 | Implant Sciences Corp. | Ion source generator auxiliary device |
US6060715A (en) * | 1997-10-31 | 2000-05-09 | Applied Materials, Inc. | Method and apparatus for ion beam scanning in an ion implanter |
US6084241A (en) * | 1998-06-01 | 2000-07-04 | Motorola, Inc. | Method of manufacturing semiconductor devices and apparatus therefor |
US6677599B2 (en) * | 2000-03-27 | 2004-01-13 | Applied Materials, Inc. | System and method for uniformly implanting a wafer with an ion beam |
US6661016B2 (en) | 2000-06-22 | 2003-12-09 | Proteros, Llc | Ion implantation uniformity correction using beam current control |
US7547460B2 (en) | 2000-09-15 | 2009-06-16 | Varian Semiconductor Equipment Associates, Inc. | Ion implanter optimizer scan waveform retention and recovery |
JP4070602B2 (en) * | 2000-11-22 | 2008-04-02 | バリアン・セミコンダクター・エクイップメント・アソシエイツ・インコーポレイテッド | Hybrid scanning system and method for ion implantation |
US6710359B2 (en) | 2001-03-23 | 2004-03-23 | Varian Semiconductor Equipment Associates, Inc. | Methods and apparatus for scanned beam uniformity adjustment in ion implanters |
US20130114773A1 (en) * | 2011-11-08 | 2013-05-09 | Alexander R. Vaucher | Superconducting neutron source |
CN112361892A (en) * | 2020-11-04 | 2021-02-12 | 山东战勤特种装备有限公司 | Shooting intelligent confrontation automatic target scoring training method and device |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL53538C (en) * | 1937-02-18 | |||
US2348031A (en) * | 1941-04-30 | 1944-05-02 | Rca Corp | Method of focusing electron microscopes |
NL270945A (en) * | 1961-03-02 | |||
NL276412A (en) * | 1961-03-30 | |||
US3131300A (en) * | 1962-11-16 | 1964-04-28 | Thomas R Jeter | Apparatus for reducing energy variations of a van de graaff ion beam |
US3326176A (en) * | 1964-10-27 | 1967-06-20 | Nat Res Corp | Work-registration device including ionic beam probe |
US3358239A (en) * | 1965-07-27 | 1967-12-12 | Transformatoren & Roentgenwerk | Equipment for controlling and monitoring the electron beam of a horizontaltype particle accelerator |
US3434894A (en) * | 1965-10-06 | 1969-03-25 | Ion Physics Corp | Fabricating solid state devices by ion implantation |
US3547074A (en) * | 1967-04-13 | 1970-12-15 | Block Engineering | Apparatus for forming microelements |
-
1969
- 1969-09-05 GB GB44171/69A patent/GB1280013A/en not_active Expired
-
1970
- 1970-08-21 US US65941A patent/US3689766A/en not_active Expired - Lifetime
- 1970-09-04 NL NLAANVRAGE7013146,A patent/NL172805C/en not_active IP Right Cessation
- 1970-09-04 DE DE7032987U patent/DE7032987U/en not_active Expired
- 1970-09-04 DE DE2043865A patent/DE2043865C2/en not_active Expired
- 1970-09-04 FR FR7032232A patent/FR2060966A5/fr not_active Expired
- 1970-09-05 JP JP45078145A patent/JPS521159B1/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112516797A (en) * | 2020-12-01 | 2021-03-19 | 中国科学院近代物理研究所 | Electrostatic focusing and accelerating system and method for isotope separation system |
CN112516797B (en) * | 2020-12-01 | 2022-09-16 | 中国科学院近代物理研究所 | Electrostatic focusing and accelerating system and method for isotope separation system |
Also Published As
Publication number | Publication date |
---|---|
NL172805C (en) | 1983-10-17 |
DE2043865A1 (en) | 1971-03-11 |
DE2043865C2 (en) | 1983-08-04 |
NL7013146A (en) | 1971-03-09 |
JPS521159B1 (en) | 1977-01-12 |
DE7032987U (en) | 1971-02-18 |
NL172805B (en) | 1983-05-16 |
GB1280013A (en) | 1972-07-05 |
US3689766A (en) | 1972-09-05 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |