DE3586268D1 - Eingangs-schutzanordnung fuer vlsi-schaltungsanordnungen. - Google Patents

Eingangs-schutzanordnung fuer vlsi-schaltungsanordnungen.

Info

Publication number
DE3586268D1
DE3586268D1 DE8585400860T DE3586268T DE3586268D1 DE 3586268 D1 DE3586268 D1 DE 3586268D1 DE 8585400860 T DE8585400860 T DE 8585400860T DE 3586268 T DE3586268 T DE 3586268T DE 3586268 D1 DE3586268 D1 DE 3586268D1
Authority
DE
Germany
Prior art keywords
circuit arrangements
vlsi circuit
input protector
protector
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8585400860T
Other languages
English (en)
Other versions
DE3586268T2 (de
Inventor
Lin Chong Ming
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Digital Equipment Corp
Original Assignee
Digital Equipment Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Digital Equipment Corp filed Critical Digital Equipment Corp
Publication of DE3586268D1 publication Critical patent/DE3586268D1/de
Application granted granted Critical
Publication of DE3586268T2 publication Critical patent/DE3586268T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/50—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor for integrated circuit devices, e.g. power bus, number of leads
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/02—Bonding areas ; Manufacturing methods related thereto
    • H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H01L27/0266—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using field effect transistors as protective elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01014—Silicon [Si]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01015—Phosphorus [P]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01033—Arsenic [As]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01—Chemical elements
    • H01L2924/01082—Lead [Pb]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/12—Passive devices, e.g. 2 terminal devices
    • H01L2924/1203—Rectifying Diode
    • H01L2924/12033—Gunn diode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304—Transistor
    • H01L2924/1306—Field-effect transistor [FET]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304—Transistor
    • H01L2924/1306—Field-effect transistor [FET]
    • H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/14—Integrated circuits
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/1901—Structure
    • H01L2924/1904—Component type
    • H01L2924/19041—Component type being a capacitor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/1901—Structure
    • H01L2924/1904—Component type
    • H01L2924/19043—Component type being a resistor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/30105—Capacitance

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
DE8585400860T 1984-05-03 1985-05-02 Eingangs-schutzanordnung fuer vlsi-schaltungsanordnungen. Expired - Fee Related DE3586268T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US60666784A 1984-05-03 1984-05-03

Publications (2)

Publication Number Publication Date
DE3586268D1 true DE3586268D1 (de) 1992-08-06
DE3586268T2 DE3586268T2 (de) 1993-02-25

Family

ID=24428959

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585400860T Expired - Fee Related DE3586268T2 (de) 1984-05-03 1985-05-02 Eingangs-schutzanordnung fuer vlsi-schaltungsanordnungen.

Country Status (5)

Country Link
US (2) US4952994A (de)
EP (1) EP0161983B1 (de)
JP (1) JPS6134967A (de)
CA (1) CA1242532A (de)
DE (1) DE3586268T2 (de)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5276346A (en) * 1983-12-26 1994-01-04 Hitachi, Ltd. Semiconductor integrated circuit device having protective/output elements and internal circuits
US5610089A (en) * 1983-12-26 1997-03-11 Hitachi, Ltd. Method of fabrication of semiconductor integrated circuit device
JPS61144857A (ja) * 1984-12-19 1986-07-02 Nec Ic Microcomput Syst Ltd Ｍｏｓ型集積回路装置
US4734752A (en) * 1985-09-27 1988-03-29 Advanced Micro Devices, Inc. Electrostatic discharge protection device for CMOS integrated circuit outputs
JPS63119574A (ja) * 1986-11-07 1988-05-24 Toshiba Corp 半導体装置の製造方法
KR900008746B1 (ko) * 1986-11-19 1990-11-29 삼성전자 주식회사 접합 파괴장치 반도체장치
US5162888A (en) * 1989-05-12 1992-11-10 Western Digital Corporation High DC breakdown voltage field effect transistor and integrated circuit
JPH0373564A (ja) * 1989-08-14 1991-03-28 Nec Corp 半導体装置
GB2243485A (en) * 1990-04-27 1991-10-30 Motorola Gmbh Semiconductor device contact pads
FR2662303A1 (fr) * 1990-05-17 1991-11-22 Hello Sa Transistor mos a tension de seuil elevee.
KR920007171A (ko) * 1990-09-05 1992-04-28 김광호 고신뢰성 반도체장치
US5166557A (en) * 1991-01-02 1992-11-24 Texas Instruments Incorporated Gate array with built-in programming circuitry
KR920015549A (ko) * 1991-01-23 1992-08-27 김광호 반도체소자의 정전방전 보호장치
EP0517391A1 (de) * 1991-06-05 1992-12-09 STMicroelectronics, Inc. ESD-Schutzschaltung
US5401997A (en) * 1992-01-22 1995-03-28 Integrated Device Technology, Inc. ESD protection for poly resistor on oxide
JPH06342904A (ja) * 1992-03-03 1994-12-13 Nec Ic Microcomput Syst Ltd 半導体集積回路装置
DE4212876C2 (de) * 1992-04-17 1995-04-13 El Mos Elektronik In Mos Techn Integrierte Schaltung mit einer einen MOS-Eingangstransistor aufweisenden hochspannungsfesten Eingangsstufe
US5504362A (en) * 1992-12-22 1996-04-02 International Business Machines Corporation Electrostatic discharge protection device
JP3456242B2 (ja) * 1993-01-07 2003-10-14 セイコーエプソン株式会社 半導体装置及びその製造方法
US5404041A (en) * 1993-03-31 1995-04-04 Texas Instruments Incorporated Source contact placement for efficient ESD/EOS protection in grounded substrate MOS integrated circuit
US5455444A (en) * 1994-04-22 1995-10-03 United Microelectronics Corporation Double polysilicon electrostatic discharge protection device for SRAM and DRAM memory devices
US5538907A (en) * 1994-05-11 1996-07-23 Lsi Logic Corporation Method for forming a CMOS integrated circuit with electrostatic discharge protection
US6078083A (en) * 1994-05-16 2000-06-20 Texas Instruments Incorporated ESD protection circuit for dual 3V/5V supply devices using single thickness gate oxides
US5440162A (en) * 1994-07-26 1995-08-08 Rockwell International Corporation ESD protection for submicron CMOS circuits
JP2638537B2 (ja) * 1995-01-11 1997-08-06 日本電気株式会社 半導体装置
US6507074B2 (en) * 1995-11-30 2003-01-14 Micron Technology, Inc. Structure for ESD protection in semiconductor chips
WO1997020348A1 (en) 1995-11-30 1997-06-05 Micron Technology, Inc. Structure for esd protection in semiconductor chips
KR100203054B1 (ko) * 1995-12-02 1999-06-15 윤종용 개선된 정전기 방전 능력을 갖는 집적 회로
US5796638A (en) * 1996-06-24 1998-08-18 The Board Of Trustees Of The University Of Illinois Methods, apparatus and computer program products for synthesizing integrated circuits with electrostatic discharge capability and connecting ground rules faults therein
KR100240872B1 (ko) * 1997-02-17 2000-01-15 윤종용 정전기 방전 보호 회로 및 그것을 구비하는 집적 회로
US5872378A (en) * 1997-04-07 1999-02-16 International Business Machines Corporation Dual thin oxide ESD network for nonvolatile memory applications
JPH11274454A (ja) 1998-03-19 1999-10-08 Canon Inc 固体撮像装置及びその形成方法
JP3530414B2 (ja) * 1999-03-26 2004-05-24 三洋電機株式会社 半導体装置
US6285062B1 (en) * 1999-05-12 2001-09-04 Micron Technology, Inc. Adjustable high-trigger-voltage electrostatic discharge protection device
US6417541B1 (en) * 2001-01-12 2002-07-09 Chartered Semiconductor Manufacturing Ltd ESD protection network with field oxide device and bonding pad
GB2388259B (en) * 2002-04-30 2006-03-29 Zarlink Semiconductor Inc Compact high voltage ESD protection diode
EP1403927A1 (de) * 2002-09-30 2004-03-31 STMicroelectronics S.r.l. Mit Festwertspeicherzellen integrierter Hochspannungstransistor
KR102440181B1 (ko) * 2016-02-12 2022-09-06 에스케이하이닉스 주식회사 정전기방전 보호를 위한 게이트-커플드 엔모스 소자

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1514398A1 (de) * 1965-02-09 1969-09-11 Siemens Ag Halbleiteranordnung
US3395290A (en) * 1965-10-08 1968-07-30 Gen Micro Electronics Inc Protective circuit for insulated gate metal oxide semiconductor fieldeffect device
JPS54136278A (en) * 1978-04-14 1979-10-23 Nec Corp Semiconductor device
JPS54137286A (en) * 1978-04-17 1979-10-24 Nec Corp Semiconductor device
JPS5586159A (en) * 1978-12-22 1980-06-28 Fujitsu Ltd Protective circuit for mos semiconductor device
JPS5667962A (en) * 1979-11-07 1981-06-08 Mitsubishi Electric Corp Gate protection circuit of mos field effect transistor
US4400711A (en) * 1981-03-31 1983-08-23 Rca Corporation Integrated circuit protection device
JPS58119670A (ja) * 1982-01-11 1983-07-16 Nissan Motor Co Ltd 半導体装置
JPS5928370A (ja) * 1982-08-09 1984-02-15 Toshiba Corp 半導体装置
EP0106417B1 (de) * 1982-10-20 1988-12-28 Koninklijke Philips Electronics N.V. Integrierte Schaltung mit Eingangsschutzvorrichtung
JPS6058652A (ja) * 1983-09-12 1985-04-04 Nec Corp 半導体集積回路装置

Also Published As

Publication number Publication date
EP0161983B1 (de) 1992-07-01
EP0161983A2 (de) 1985-11-21
US5017985A (en) 1991-05-21
JPH0236071B2 (de) 1990-08-15
JPS6134967A (ja) 1986-02-19
CA1242532A (en) 1988-09-27
EP0161983A3 (en) 1987-09-30
DE3586268T2 (de) 1993-02-25
US4952994A (en) 1990-08-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee