DE3104468C2 - Röntgenfluoreszenzspektrometer - Google Patents
RöntgenfluoreszenzspektrometerInfo
- Publication number
- DE3104468C2 DE3104468C2 DE3104468A DE3104468A DE3104468C2 DE 3104468 C2 DE3104468 C2 DE 3104468C2 DE 3104468 A DE3104468 A DE 3104468A DE 3104468 A DE3104468 A DE 3104468A DE 3104468 C2 DE3104468 C2 DE 3104468C2
- Authority
- DE
- Germany
- Prior art keywords
- sample
- ray
- analyzed
- ray source
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000004876 x-ray fluorescence Methods 0.000 title claims abstract description 14
- 230000005855 radiation Effects 0.000 claims abstract description 31
- 239000013078 crystal Substances 0.000 claims abstract description 21
- 239000010405 anode material Substances 0.000 claims description 3
- 238000004458 analytical method Methods 0.000 abstract description 8
- 238000010521 absorption reaction Methods 0.000 abstract description 5
- 239000000126 substance Substances 0.000 abstract description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical group [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 229910052729 chemical element Inorganic materials 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910052770 Uranium Inorganic materials 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005272 metallurgy Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- -1 polypropylene Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- JFALSRSLKYAFGM-UHFFFAOYSA-N uranium(0) Chemical compound [U] JFALSRSLKYAFGM-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Dispersion Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/223,268 US4417355A (en) | 1981-01-08 | 1981-01-08 | X-Ray fluorescence spectrometer |
| DE3104468A DE3104468C2 (de) | 1981-01-08 | 1981-02-09 | Röntgenfluoreszenzspektrometer |
| FR8104341A FR2501379A1 (fr) | 1981-01-08 | 1981-03-04 | Spectrometre fluorescent a rayons x |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/223,268 US4417355A (en) | 1981-01-08 | 1981-01-08 | X-Ray fluorescence spectrometer |
| DE3104468A DE3104468C2 (de) | 1981-01-08 | 1981-02-09 | Röntgenfluoreszenzspektrometer |
| FR8104341A FR2501379A1 (fr) | 1981-01-08 | 1981-03-04 | Spectrometre fluorescent a rayons x |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE3104468A1 DE3104468A1 (de) | 1982-08-26 |
| DE3104468C2 true DE3104468C2 (de) | 1983-09-08 |
Family
ID=27189133
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE3104468A Expired DE3104468C2 (de) | 1981-01-08 | 1981-02-09 | Röntgenfluoreszenzspektrometer |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US4417355A (OSRAM) |
| DE (1) | DE3104468C2 (OSRAM) |
| FR (1) | FR2501379A1 (OSRAM) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FI873627A7 (fi) * | 1987-08-25 | 1989-02-22 | Leningradskoe Nauchno Proizvodstvennoe | Monikanavainen röntgenspektrometri |
| US4845729A (en) * | 1988-02-22 | 1989-07-04 | Elex Analytical Technologies Corp. | Method and apparatus for diagnosis of lead toxicity |
| US5014287A (en) * | 1990-04-18 | 1991-05-07 | Thornton Michael G | Portable x-ray fluorescence spectrometer for environmental monitoring of inorganic pollutants |
| US5280176A (en) * | 1992-11-06 | 1994-01-18 | The United States Of America As Represented By The Secretary Of Commerce | X-ray photoelectron emission spectrometry system |
| EP0623817B1 (en) * | 1993-04-23 | 1999-01-13 | Shimadzu Corporation | Local analysis of a specimen in an x-ray fluorescence spectrometer |
| RU94022820A (ru) * | 1994-06-14 | 1996-04-10 | К.В. Анисович | Рентгеновский флюоресцентный спектрометр |
| US5534106A (en) * | 1994-07-26 | 1996-07-09 | Kabushiki Kaisha Toshiba | Apparatus for processing semiconductor wafers |
| US5483568A (en) * | 1994-11-03 | 1996-01-09 | Kabushiki Kaisha Toshiba | Pad condition and polishing rate monitor using fluorescence |
| DE19820321B4 (de) * | 1998-05-07 | 2004-09-16 | Bruker Axs Gmbh | Kompaktes Röntgenspektrometer |
| US6781060B2 (en) * | 2002-07-26 | 2004-08-24 | X-Ray Optical Systems Incorporated | Electrical connector, a cable sleeve, and a method for fabricating an electrical connection |
| FR2895831B1 (fr) * | 2006-01-03 | 2009-06-12 | Alcatel Sa | Source compacte a faisceau de rayons x de tres grande brillance |
| US7440541B2 (en) * | 2006-12-27 | 2008-10-21 | Innov-X-Systems, Inc. | Dual source XRF system |
| US9708907B2 (en) | 2011-04-26 | 2017-07-18 | Baker Hughes Incorporated | Apparatus and method for estimating formation lithology using X-ray flourescence |
| DE102016210304B8 (de) * | 2016-06-10 | 2017-08-17 | Bruker Axs Gmbh | Messkammer für ein kompaktes Goniometer in einem Röntgenspektrometer |
| DE102017001484A1 (de) * | 2017-02-16 | 2018-08-16 | Fresenius Medical Care Deutschland Gmbh | Verfahren und Anordnung zum Kalibrieren von Vorrichtungen zur Erkennung von Blut oder Blutbestandteilen in einer Flüssigkeit |
| EA202092348A1 (ru) * | 2018-04-20 | 2021-02-15 | Оутотек (Финлэнд) Ой | Рентгеновский флуоресцентный анализатор и способ выполнения флуоресцентного анализа |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1068032B (OSRAM) * | 1956-06-01 | 1959-10-29 | ||
| GB901650A (en) * | 1958-06-16 | 1962-07-25 | Philips Electrical Ind Ltd | Improvements in or relating to x-ray spectrometers |
| US3042801A (en) * | 1959-12-30 | 1962-07-03 | United States Steel Corp | Apparatus for analyzing a sample of material |
| US3105902A (en) * | 1960-09-19 | 1963-10-01 | Standard Oil Co | Controlled atmosphere X-ray diffraction spectrometer |
| SU614367A1 (ru) * | 1975-09-26 | 1978-07-05 | Предприятие П/Я М-5659 | Флуоресцентный рентгеновский спектрометр |
-
1981
- 1981-01-08 US US06/223,268 patent/US4417355A/en not_active Expired - Fee Related
- 1981-02-09 DE DE3104468A patent/DE3104468C2/de not_active Expired
- 1981-03-04 FR FR8104341A patent/FR2501379A1/fr active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| DE3104468A1 (de) | 1982-08-26 |
| FR2501379A1 (fr) | 1982-09-10 |
| US4417355A (en) | 1983-11-22 |
| FR2501379B1 (OSRAM) | 1983-07-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OR8 | Request for search as to paragraph 43 lit. 1 sentence 1 patent law | ||
| 8110 | Request for examination paragraph 44 | ||
| 8105 | Search report available | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |