DE2924244C2 - Röntgenfluoreszenz-Verfahren zum Messen des Gehaltes oder der Menge eines bestimmten Elementes in einer Probe mittels einer Röntgenröhre und Vorrichtung zur Durchführung des Verfahrens - Google Patents
Röntgenfluoreszenz-Verfahren zum Messen des Gehaltes oder der Menge eines bestimmten Elementes in einer Probe mittels einer Röntgenröhre und Vorrichtung zur Durchführung des VerfahrensInfo
- Publication number
- DE2924244C2 DE2924244C2 DE2924244A DE2924244A DE2924244C2 DE 2924244 C2 DE2924244 C2 DE 2924244C2 DE 2924244 A DE2924244 A DE 2924244A DE 2924244 A DE2924244 A DE 2924244A DE 2924244 C2 DE2924244 C2 DE 2924244C2
- Authority
- DE
- Germany
- Prior art keywords
- anode
- ray tube
- sample
- ray
- absorption
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 title claims description 13
- 238000004876 x-ray fluorescence Methods 0.000 title claims description 5
- 230000005855 radiation Effects 0.000 claims description 28
- 238000010521 absorption reaction Methods 0.000 claims description 20
- 239000010405 anode material Substances 0.000 claims description 14
- 229910052790 beryllium Inorganic materials 0.000 claims description 6
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 claims description 6
- 238000001228 spectrum Methods 0.000 claims description 4
- 239000011247 coating layer Substances 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 description 12
- 230000005284 excitation Effects 0.000 description 5
- 238000004458 analytical method Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- 238000001816 cooling Methods 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012921 fluorescence analysis Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 230000002285 radioactive effect Effects 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000004846 x-ray emission Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/10—Power supply arrangements for feeding the X-ray tube
- H05G1/12—Power supply arrangements for feeding the X-ray tube with DC or rectified single-phase AC or double-phase
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/08—Anodes; Anti cathodes
- H01J35/112—Non-rotating anodes
- H01J35/116—Transmissive anodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/16—Vessels; Containers; Shields associated therewith
- H01J35/18—Windows
- H01J35/186—Windows used as targets or X-ray converters
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SE7807078A SE415804B (sv) | 1978-06-21 | 1978-06-21 | Sett att medelst rontgenstralning meta halten eller mengden av ett forutbestemt grundemne i ett prov, samt anordning for utforande av settet |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE2924244A1 DE2924244A1 (de) | 1980-01-03 |
| DE2924244C2 true DE2924244C2 (de) | 1987-05-07 |
Family
ID=20335268
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2924244A Expired DE2924244C2 (de) | 1978-06-21 | 1979-06-15 | Röntgenfluoreszenz-Verfahren zum Messen des Gehaltes oder der Menge eines bestimmten Elementes in einer Probe mittels einer Röntgenröhre und Vorrichtung zur Durchführung des Verfahrens |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US4344181A (esLanguage) |
| JP (2) | JPS552991A (esLanguage) |
| AU (1) | AU522334B2 (esLanguage) |
| CA (1) | CA1139021A (esLanguage) |
| DE (1) | DE2924244C2 (esLanguage) |
| FI (1) | FI72814C (esLanguage) |
| FR (1) | FR2429425A1 (esLanguage) |
| GB (1) | GB2025040B (esLanguage) |
| NL (1) | NL7904500A (esLanguage) |
| SE (1) | SE415804B (esLanguage) |
| ZA (1) | ZA793095B (esLanguage) |
Families Citing this family (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE428974B (sv) * | 1979-02-07 | 1983-08-01 | Nils Johannes Baecklund | Sett att medelst rontgenstralning meta halten av ett forutbestemt emne i ett prov |
| US4484341A (en) * | 1981-10-02 | 1984-11-20 | Radiation Dynamics, Inc. | Method and apparatus for selectively radiating materials with electrons and X-rays |
| US4731804A (en) * | 1984-12-31 | 1988-03-15 | North American Philips Corporation | Window configuration of an X-ray tube |
| FR2600422B1 (fr) * | 1986-05-29 | 1989-10-13 | Instruments Sa | Appareil et procede d'analyses chimiques locales a la surface de materiaux solides par spectroscopie de photo-electrons x |
| GB8621983D0 (en) * | 1986-09-12 | 1986-10-22 | K X Technology Ltd | Ore analysis |
| US5442678A (en) * | 1990-09-05 | 1995-08-15 | Photoelectron Corporation | X-ray source with improved beam steering |
| US5153900A (en) * | 1990-09-05 | 1992-10-06 | Photoelectron Corporation | Miniaturized low power x-ray source |
| US5452720A (en) * | 1990-09-05 | 1995-09-26 | Photoelectron Corporation | Method for treating brain tumors |
| US5369679A (en) * | 1990-09-05 | 1994-11-29 | Photoelectron Corporation | Low power x-ray source with implantable probe for treatment of brain tumors |
| US5115457A (en) * | 1990-10-01 | 1992-05-19 | E. I. Du Pont De Nemours And Company | Method of determining titanium dioxide content in paint |
| US6377846B1 (en) | 1997-02-21 | 2002-04-23 | Medtronic Ave, Inc. | Device for delivering localized x-ray radiation and method of manufacture |
| EP0847249A4 (en) | 1995-08-24 | 2004-09-29 | Medtronic Ave Inc | X-RAYS CATHETER |
| EP0860181B1 (en) * | 1997-02-21 | 2004-04-28 | Medtronic Ave, Inc. | X-ray device having a dilatation structure for delivering localized radiation to an interior of a body |
| FI102697B (fi) * | 1997-06-26 | 1999-01-29 | Metorex Internat Oy | Polarisoitua herätesäteilyä hyödyntävä röntgenfluoresenssimittausjärje stely ja röntgenputki |
| US5854822A (en) * | 1997-07-25 | 1998-12-29 | Xrt Corp. | Miniature x-ray device having cold cathode |
| US6108402A (en) * | 1998-01-16 | 2000-08-22 | Medtronic Ave, Inc. | Diamond vacuum housing for miniature x-ray device |
| US6069938A (en) * | 1998-03-06 | 2000-05-30 | Chornenky; Victor Ivan | Method and x-ray device using pulse high voltage source |
| US6195411B1 (en) | 1999-05-13 | 2001-02-27 | Photoelectron Corporation | Miniature x-ray source with flexible probe |
| JP2003142294A (ja) * | 2001-10-31 | 2003-05-16 | Ge Medical Systems Global Technology Co Llc | 高電圧発生回路およびｘ線発生装置 |
| RU2272278C1 (ru) * | 2004-11-22 | 2006-03-20 | Государственное образовательное учреждение высшего профессионального образования Томский политехнический университет | Способ определения рения, рения в присутствии молибдена и вольфрама методом рентгенофлуоресцентного анализа |
| US9017664B2 (en) | 2006-12-15 | 2015-04-28 | Lifebond Ltd. | Gelatin-transglutaminase hemostatic dressings and sealants |
| EP2133069A1 (en) | 2008-06-12 | 2009-12-16 | Lifebond | Process for manufacture of gelatin solutions and products thereof |
| EP2543394A1 (en) * | 2008-06-18 | 2013-01-09 | Lifebond Ltd | A method for enzymatic cross-linking of a protein |
| EP2303344A2 (en) * | 2008-06-18 | 2011-04-06 | Lifebond Ltd | Methods and devices for use with sealants |
| WO2009153750A2 (en) * | 2008-06-18 | 2009-12-23 | Lifebond Ltd | Improved cross-linked compositions |
| BR112012015029A2 (pt) | 2009-12-22 | 2017-06-27 | Lifebond Ltd | matriz reticulada, método para controlar a formação de uma matriz, método ou matriz, método para vedar um tecido contra vazamento de um fluído corporal, agente hemostático ou vedante cirúrgico, composição para vedar um ferimento, uso da composição, composição para um veículo para entrega localizada de fármaco, composição para engenharia de tecido, e método para modificar uma composição |
| WO2012017415A2 (en) | 2010-08-05 | 2012-02-09 | Lifebond Ltd. | Dry composition wound dressings and adhesives |
| US11998654B2 (en) | 2018-07-12 | 2024-06-04 | Bard Shannon Limited | Securing implants and medical devices |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL92853C (esLanguage) * | 1952-02-20 | |||
| US2999937A (en) * | 1958-10-20 | 1961-09-12 | Philips Corp | X-ray apparatus |
| DE1773759A1 (de) * | 1968-07-03 | 1972-03-16 | Vnii Raswedotschnoj Geofisiki | Vorrichtung fuer Roentgenspektralanalyse |
| JPS5435078B1 (esLanguage) * | 1970-07-30 | 1979-10-31 | ||
| US3925660A (en) * | 1972-05-08 | 1975-12-09 | Richard D Albert | Selectable wavelength X-ray source, spectrometer and assay method |
| US4048496A (en) * | 1972-05-08 | 1977-09-13 | Albert Richard D | Selectable wavelength X-ray source, spectrometer and assay method |
| JPS5232593B2 (esLanguage) * | 1973-09-06 | 1977-08-23 | ||
| JPS5346062Y2 (esLanguage) * | 1973-11-06 | 1978-11-04 | ||
| JPS5139580U (esLanguage) * | 1974-09-18 | 1976-03-24 | ||
| US3963922A (en) * | 1975-06-09 | 1976-06-15 | Nuclear Semiconductor | X-ray fluorescence device |
| GB1537099A (en) * | 1976-06-15 | 1978-12-29 | United Scient Corp | X-ray fluorescence device |
-
1978
- 1978-06-21 SE SE7807078A patent/SE415804B/sv not_active IP Right Cessation
-
1979
- 1979-06-06 CA CA000329226A patent/CA1139021A/en not_active Expired
- 1979-06-07 FI FI791817A patent/FI72814C/fi not_active IP Right Cessation
- 1979-06-08 NL NL7904500A patent/NL7904500A/xx not_active Application Discontinuation
- 1979-06-15 DE DE2924244A patent/DE2924244C2/de not_active Expired
- 1979-06-18 JP JP7575179A patent/JPS552991A/ja active Pending
- 1979-06-19 GB GB7921398A patent/GB2025040B/en not_active Expired
- 1979-06-20 AU AU48236/79A patent/AU522334B2/en not_active Ceased
- 1979-06-21 ZA ZA793095A patent/ZA793095B/xx unknown
- 1979-06-21 FR FR7915882A patent/FR2429425A1/fr active Granted
-
1980
- 1980-12-09 US US06/214,862 patent/US4344181A/en not_active Expired - Lifetime
-
1988
- 1988-07-08 JP JP1988090072U patent/JPH0334681Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS552991A (en) | 1980-01-10 |
| GB2025040A (en) | 1980-01-16 |
| GB2025040B (en) | 1982-11-17 |
| NL7904500A (nl) | 1979-12-28 |
| SE7807078L (sv) | 1979-12-22 |
| US4344181A (en) | 1982-08-10 |
| FR2429425B1 (esLanguage) | 1985-04-26 |
| CA1139021A (en) | 1983-01-04 |
| JPH0334681Y2 (esLanguage) | 1991-07-23 |
| JPS6419160U (esLanguage) | 1989-01-31 |
| SE415804B (sv) | 1980-10-27 |
| ZA793095B (en) | 1980-08-27 |
| FI72814B (fi) | 1987-03-31 |
| FR2429425A1 (fr) | 1980-01-18 |
| AU522334B2 (en) | 1982-05-27 |
| FI72814C (fi) | 1987-07-10 |
| DE2924244A1 (de) | 1980-01-03 |
| FI791817A7 (fi) | 1979-12-22 |
| AU4823679A (en) | 1980-01-03 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8110 | Request for examination paragraph 44 | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |