SE415804B - Sett att medelst rontgenstralning meta halten eller mengden av ett forutbestemt grundemne i ett prov, samt anordning for utforande av settet - Google Patents

Sett att medelst rontgenstralning meta halten eller mengden av ett forutbestemt grundemne i ett prov, samt anordning for utforande av settet

Info

Publication number
SE415804B
SE415804B SE7807078A SE7807078A SE415804B SE 415804 B SE415804 B SE 415804B SE 7807078 A SE7807078 A SE 7807078A SE 7807078 A SE7807078 A SE 7807078A SE 415804 B SE415804 B SE 415804B
Authority
SE
Sweden
Prior art keywords
anode
ray
radiation
sample
characteristic
Prior art date
Application number
SE7807078A
Other languages
English (en)
Swedish (sv)
Other versions
SE7807078L (sv
Inventor
Nils Johannes Baecklund
Original Assignee
Nils Johannes Baecklund
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nils Johannes Baecklund filed Critical Nils Johannes Baecklund
Priority to SE7807078A priority Critical patent/SE415804B/sv
Priority to CA000329226A priority patent/CA1139021A/en
Priority to FI791817A priority patent/FI72814C/fi
Priority to NL7904500A priority patent/NL7904500A/xx
Priority to DE2924244A priority patent/DE2924244C2/de
Priority to JP7575179A priority patent/JPS552991A/ja
Priority to GB7921398A priority patent/GB2025040B/en
Priority to AU48236/79A priority patent/AU522334B2/en
Priority to FR7915882A priority patent/FR2429425A1/fr
Priority to ZA793095A priority patent/ZA793095B/xx
Publication of SE7807078L publication Critical patent/SE7807078L/
Publication of SE415804B publication Critical patent/SE415804B/sv
Priority to US06/214,862 priority patent/US4344181A/en
Priority to JP1988090072U priority patent/JPH0334681Y2/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/10—Power supply arrangements for feeding the X-ray tube
    • H05G1/12—Power supply arrangements for feeding the X-ray tube with DC or rectified single-phase AC or double-phase
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H01J35/116—Transmissive anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H01J35/186—Windows used as targets or X-ray converters

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
SE7807078A 1978-06-21 1978-06-21 Sett att medelst rontgenstralning meta halten eller mengden av ett forutbestemt grundemne i ett prov, samt anordning for utforande av settet SE415804B (sv)

Priority Applications (12)

Application Number Priority Date Filing Date Title
SE7807078A SE415804B (sv) 1978-06-21 1978-06-21 Sett att medelst rontgenstralning meta halten eller mengden av ett forutbestemt grundemne i ett prov, samt anordning for utforande av settet
CA000329226A CA1139021A (en) 1978-06-21 1979-06-06 Method and apparatus for measuring the content or quantity of a given element by means of x-ray radiation
FI791817A FI72814C (fi) 1978-06-21 1979-06-07 Saett och anordning att medelst roentgenstraolning maeta halten eller maengden av ett foerutbestaemt grundaemne.
NL7904500A NL7904500A (nl) 1978-06-21 1979-06-08 Werkwijze en inrichting voor het meten van de inhoud of hoeveelheid van een gegeven element door middel van roentgenstraling.
DE2924244A DE2924244C2 (de) 1978-06-21 1979-06-15 Röntgenfluoreszenz-Verfahren zum Messen des Gehaltes oder der Menge eines bestimmten Elementes in einer Probe mittels einer Röntgenröhre und Vorrichtung zur Durchführung des Verfahrens
JP7575179A JPS552991A (en) 1978-06-21 1979-06-18 Measurement of specific element content by x ray radiation and apparatus therefor
GB7921398A GB2025040B (en) 1978-06-21 1979-06-19 Rayfluorescence analysis
AU48236/79A AU522334B2 (en) 1978-06-21 1979-06-20 Measuring the content or quantity of a given element by x-ray radiation
FR7915882A FR2429425A1 (fr) 1978-06-21 1979-06-21 Procede et appareil de mesure de la teneur ou valeur d'un element donne au moyen d'un rayonnement de rayons x
ZA793095A ZA793095B (en) 1978-06-21 1979-06-21 A method and apparatus for measuring the content or quantity of a given element by means of x-ray-radiation
US06/214,862 US4344181A (en) 1978-06-21 1980-12-09 Method and apparatus for measuring the content or quantity of a given element by means of X-ray radiation
JP1988090072U JPH0334681Y2 (esLanguage) 1978-06-21 1988-07-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE7807078A SE415804B (sv) 1978-06-21 1978-06-21 Sett att medelst rontgenstralning meta halten eller mengden av ett forutbestemt grundemne i ett prov, samt anordning for utforande av settet

Publications (2)

Publication Number Publication Date
SE7807078L SE7807078L (sv) 1979-12-22
SE415804B true SE415804B (sv) 1980-10-27

Family

ID=20335268

Family Applications (1)

Application Number Title Priority Date Filing Date
SE7807078A SE415804B (sv) 1978-06-21 1978-06-21 Sett att medelst rontgenstralning meta halten eller mengden av ett forutbestemt grundemne i ett prov, samt anordning for utforande av settet

Country Status (11)

Country Link
US (1) US4344181A (esLanguage)
JP (2) JPS552991A (esLanguage)
AU (1) AU522334B2 (esLanguage)
CA (1) CA1139021A (esLanguage)
DE (1) DE2924244C2 (esLanguage)
FI (1) FI72814C (esLanguage)
FR (1) FR2429425A1 (esLanguage)
GB (1) GB2025040B (esLanguage)
NL (1) NL7904500A (esLanguage)
SE (1) SE415804B (esLanguage)
ZA (1) ZA793095B (esLanguage)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE428974B (sv) * 1979-02-07 1983-08-01 Nils Johannes Baecklund Sett att medelst rontgenstralning meta halten av ett forutbestemt emne i ett prov
US4484341A (en) * 1981-10-02 1984-11-20 Radiation Dynamics, Inc. Method and apparatus for selectively radiating materials with electrons and X-rays
US4731804A (en) * 1984-12-31 1988-03-15 North American Philips Corporation Window configuration of an X-ray tube
FR2600422B1 (fr) * 1986-05-29 1989-10-13 Instruments Sa Appareil et procede d'analyses chimiques locales a la surface de materiaux solides par spectroscopie de photo-electrons x
GB8621983D0 (en) * 1986-09-12 1986-10-22 K X Technology Ltd Ore analysis
US5442678A (en) * 1990-09-05 1995-08-15 Photoelectron Corporation X-ray source with improved beam steering
US5153900A (en) * 1990-09-05 1992-10-06 Photoelectron Corporation Miniaturized low power x-ray source
US5452720A (en) * 1990-09-05 1995-09-26 Photoelectron Corporation Method for treating brain tumors
US5369679A (en) * 1990-09-05 1994-11-29 Photoelectron Corporation Low power x-ray source with implantable probe for treatment of brain tumors
US5115457A (en) * 1990-10-01 1992-05-19 E. I. Du Pont De Nemours And Company Method of determining titanium dioxide content in paint
US6377846B1 (en) 1997-02-21 2002-04-23 Medtronic Ave, Inc. Device for delivering localized x-ray radiation and method of manufacture
EP0847249A4 (en) 1995-08-24 2004-09-29 Medtronic Ave Inc X-RAYS CATHETER
EP0860181B1 (en) * 1997-02-21 2004-04-28 Medtronic Ave, Inc. X-ray device having a dilatation structure for delivering localized radiation to an interior of a body
FI102697B (fi) * 1997-06-26 1999-01-29 Metorex Internat Oy Polarisoitua herätesäteilyä hyödyntävä röntgenfluoresenssimittausjärje stely ja röntgenputki
US5854822A (en) * 1997-07-25 1998-12-29 Xrt Corp. Miniature x-ray device having cold cathode
US6108402A (en) * 1998-01-16 2000-08-22 Medtronic Ave, Inc. Diamond vacuum housing for miniature x-ray device
US6069938A (en) * 1998-03-06 2000-05-30 Chornenky; Victor Ivan Method and x-ray device using pulse high voltage source
US6195411B1 (en) 1999-05-13 2001-02-27 Photoelectron Corporation Miniature x-ray source with flexible probe
JP2003142294A (ja) * 2001-10-31 2003-05-16 Ge Medical Systems Global Technology Co Llc 高電圧発生回路およびｘ線発生装置
RU2272278C1 (ru) * 2004-11-22 2006-03-20 Государственное образовательное учреждение высшего профессионального образования Томский политехнический университет Способ определения рения, рения в присутствии молибдена и вольфрама методом рентгенофлуоресцентного анализа
US9017664B2 (en) 2006-12-15 2015-04-28 Lifebond Ltd. Gelatin-transglutaminase hemostatic dressings and sealants
EP2133069A1 (en) 2008-06-12 2009-12-16 Lifebond Process for manufacture of gelatin solutions and products thereof
EP2543394A1 (en) * 2008-06-18 2013-01-09 Lifebond Ltd A method for enzymatic cross-linking of a protein
EP2303344A2 (en) * 2008-06-18 2011-04-06 Lifebond Ltd Methods and devices for use with sealants
WO2009153750A2 (en) * 2008-06-18 2009-12-23 Lifebond Ltd Improved cross-linked compositions
BR112012015029A2 (pt) 2009-12-22 2017-06-27 Lifebond Ltd matriz reticulada, método para controlar a formação de uma matriz, método ou matriz, método para vedar um tecido contra vazamento de um fluído corporal, agente hemostático ou vedante cirúrgico, composição para vedar um ferimento, uso da composição, composição para um veículo para entrega localizada de fármaco, composição para engenharia de tecido, e método para modificar uma composição
WO2012017415A2 (en) 2010-08-05 2012-02-09 Lifebond Ltd. Dry composition wound dressings and adhesives
US11998654B2 (en) 2018-07-12 2024-06-04 Bard Shannon Limited Securing implants and medical devices

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL92853C (esLanguage) * 1952-02-20
US2999937A (en) * 1958-10-20 1961-09-12 Philips Corp X-ray apparatus
DE1773759A1 (de) * 1968-07-03 1972-03-16 Vnii Raswedotschnoj Geofisiki Vorrichtung fuer Roentgenspektralanalyse
JPS5435078B1 (esLanguage) * 1970-07-30 1979-10-31
US3925660A (en) * 1972-05-08 1975-12-09 Richard D Albert Selectable wavelength X-ray source, spectrometer and assay method
US4048496A (en) * 1972-05-08 1977-09-13 Albert Richard D Selectable wavelength X-ray source, spectrometer and assay method
JPS5232593B2 (esLanguage) * 1973-09-06 1977-08-23
JPS5346062Y2 (esLanguage) * 1973-11-06 1978-11-04
JPS5139580U (esLanguage) * 1974-09-18 1976-03-24
US3963922A (en) * 1975-06-09 1976-06-15 Nuclear Semiconductor X-ray fluorescence device
GB1537099A (en) * 1976-06-15 1978-12-29 United Scient Corp X-ray fluorescence device

Also Published As

Publication number Publication date
JPS552991A (en) 1980-01-10
GB2025040A (en) 1980-01-16
GB2025040B (en) 1982-11-17
NL7904500A (nl) 1979-12-28
SE7807078L (sv) 1979-12-22
US4344181A (en) 1982-08-10
FR2429425B1 (esLanguage) 1985-04-26
CA1139021A (en) 1983-01-04
JPH0334681Y2 (esLanguage) 1991-07-23
JPS6419160U (esLanguage) 1989-01-31
DE2924244C2 (de) 1987-05-07
ZA793095B (en) 1980-08-27
FI72814B (fi) 1987-03-31
FR2429425A1 (fr) 1980-01-18
AU522334B2 (en) 1982-05-27
FI72814C (fi) 1987-07-10
DE2924244A1 (de) 1980-01-03
FI791817A7 (fi) 1979-12-22
AU4823679A (en) 1980-01-03

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