DE2844704A1 - Verfahren und vorrichtung fuer eine roentgenanalyse von materialproben - Google Patents
Verfahren und vorrichtung fuer eine roentgenanalyse von materialprobenInfo
- Publication number
- DE2844704A1 DE2844704A1 DE19782844704 DE2844704A DE2844704A1 DE 2844704 A1 DE2844704 A1 DE 2844704A1 DE 19782844704 DE19782844704 DE 19782844704 DE 2844704 A DE2844704 A DE 2844704A DE 2844704 A1 DE2844704 A1 DE 2844704A1
- Authority
- DE
- Germany
- Prior art keywords
- sample
- rays
- concentration
- analysis
- ray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000004458 analytical method Methods 0.000 title claims description 42
- 238000000034 method Methods 0.000 title claims description 30
- 239000000463 material Substances 0.000 title claims description 19
- 230000005855 radiation Effects 0.000 claims description 100
- 239000000126 substance Substances 0.000 claims description 57
- 239000002245 particle Substances 0.000 claims description 37
- 239000010802 sludge Substances 0.000 claims description 33
- 239000007787 solid Substances 0.000 claims description 31
- 238000012545 processing Methods 0.000 claims description 24
- 239000000203 mixture Substances 0.000 claims description 22
- 230000000694 effects Effects 0.000 claims description 21
- 239000011159 matrix material Substances 0.000 claims description 19
- 230000001427 coherent effect Effects 0.000 claims description 11
- 238000002441 X-ray diffraction Methods 0.000 claims description 5
- 230000005284 excitation Effects 0.000 claims description 5
- YZCKVEUIGOORGS-NJFSPNSNSA-N Tritium Chemical compound [3H] YZCKVEUIGOORGS-NJFSPNSNSA-N 0.000 claims description 4
- 239000006185 dispersion Substances 0.000 claims description 4
- 229910052722 tritium Inorganic materials 0.000 claims description 4
- 239000013078 crystal Substances 0.000 claims description 3
- 230000005021 gait Effects 0.000 claims description 3
- 239000012491 analyte Substances 0.000 claims description 2
- 229910052751 metal Inorganic materials 0.000 claims description 2
- 239000002184 metal Substances 0.000 claims description 2
- 239000012857 radioactive material Substances 0.000 claims description 2
- 230000002285 radioactive effect Effects 0.000 claims 2
- 150000001875 compounds Chemical class 0.000 claims 1
- 150000002500 ions Chemical class 0.000 claims 1
- 239000008247 solid mixture Substances 0.000 claims 1
- 238000004846 x-ray emission Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 36
- 239000010949 copper Substances 0.000 description 12
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 10
- 229910052802 copper Inorganic materials 0.000 description 10
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 9
- 239000011593 sulfur Substances 0.000 description 9
- 229910052717 sulfur Inorganic materials 0.000 description 9
- 239000010948 rhodium Substances 0.000 description 7
- 229910052703 rhodium Inorganic materials 0.000 description 6
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 6
- 238000001228 spectrum Methods 0.000 description 6
- 238000000441 X-ray spectroscopy Methods 0.000 description 5
- 239000003990 capacitor Substances 0.000 description 5
- 238000012937 correction Methods 0.000 description 5
- 238000012360 testing method Methods 0.000 description 4
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 239000011575 calcium Substances 0.000 description 3
- 229910052791 calcium Inorganic materials 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 3
- 238000011109 contamination Methods 0.000 description 3
- 239000000575 pesticide Substances 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 230000002238 attenuated effect Effects 0.000 description 2
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 2
- 239000004327 boric acid Substances 0.000 description 2
- 230000001186 cumulative effect Effects 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 238000011084 recovery Methods 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- 229920002799 BoPET Polymers 0.000 description 1
- 229910001369 Brass Inorganic materials 0.000 description 1
- 239000004484 Briquette Substances 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 239000005041 Mylar™ Substances 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000000333 X-ray scattering Methods 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 239000010951 brass Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000013256 coordination polymer Substances 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000000763 evoking effect Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 239000003517 fume Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
- 235000021190 leftovers Nutrition 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012067 mathematical method Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000004886 process control Methods 0.000 description 1
- 238000004062 sedimentation Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000004876 x-ray fluorescence Methods 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Dispersion Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/842,522 US4134012A (en) | 1977-10-17 | 1977-10-17 | X-ray analytical system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2844704A1 true DE2844704A1 (de) | 1979-04-26 |
Family
ID=25287524
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19782844704 Ceased DE2844704A1 (de) | 1977-10-17 | 1978-10-13 | Verfahren und vorrichtung fuer eine roentgenanalyse von materialproben |
Country Status (4)
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3319984A1 (de) * | 1982-06-03 | 1983-12-08 | Daini Seikosha Co. Ltd., Tokyo | Automatische korrektureinrichtung fuer ein roentgenstrahl-fluoreszenz-analysegeraet |
| DE3334458A1 (de) * | 1982-09-24 | 1984-06-07 | Seiko Instruments and Electronics Ltd., Tokio/Tokyo | Korrektureinrichtung fuer ein roentgenanalysegeraet |
| DE112015003094B4 (de) * | 2014-07-01 | 2017-08-03 | Rigaku Corporation | Röntgenfluoreszenzspektrometer und Röntgenfluoreszenzanalyseverfahren |
Families Citing this family (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3110944A1 (de) * | 1981-03-20 | 1982-09-30 | Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe | "einrichtung zur kontinuierlichen messung von elementgehalten in trueben" |
| US4317994A (en) * | 1979-12-20 | 1982-03-02 | Battelle Memorial Institute | Laser EXAFS |
| JPS57500796A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1980-06-11 | 1982-05-06 | ||
| US4612660A (en) * | 1985-05-17 | 1986-09-16 | The United States Of America As Represented By The Secretary Of The Navy | Time resolved extended X-ray absorption fine structure spectrometer |
| FI80524C (fi) * | 1986-06-02 | 1990-06-11 | Outokumpu Oy | Foerfarande och anordning foer analysering av slamartade material. |
| USH922H (en) | 1988-08-01 | 1991-05-07 | United States Of America | Method for analyzing materials using x-ray fluorescence |
| US5133901A (en) * | 1991-03-01 | 1992-07-28 | Westinghouse Electric Corp. | System and method for on-line monitoring and control of heavy metal contamination in soil washing process |
| US5272745A (en) * | 1992-05-14 | 1993-12-21 | A.H.S. Consultants & Engineers, Inc. | Apparatus for analyzing, continuously flowing dry powder samples, by means of X-ray spectroscopy |
| RU94022820A (ru) * | 1994-06-14 | 1996-04-10 | К.В. Анисович | Рентгеновский флюоресцентный спектрометр |
| ES2114490B1 (es) * | 1996-05-07 | 1999-02-01 | Acerinox Sa | Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste. |
| JPH09166488A (ja) * | 1995-12-13 | 1997-06-24 | Shimadzu Corp | Ｘ線分光器 |
| US6023496A (en) * | 1997-04-30 | 2000-02-08 | Shimadzu Corporation | X-ray fluorescence analyzing apparatus |
| WO2000026649A2 (en) * | 1998-10-29 | 2000-05-11 | Koninklijke Philips Electronics N.V. | X-ray diffraction apparatus with an x-ray optical reference channel |
| CN101183083B (zh) * | 2001-12-04 | 2013-03-20 | X射线光学系统公司 | 用于冷却和电绝缘高压、生热部件的方法和设备 |
| US7016462B1 (en) * | 2002-11-08 | 2006-03-21 | Interscience, Inc. | Ionic pre-concentration XRF identification and analysis device, system and method |
| WO2004086018A1 (ja) * | 2003-03-27 | 2004-10-07 | Rigaku Industrial Corporation | 蛍光ｘ線分析装置 |
| JP4754957B2 (ja) * | 2005-12-08 | 2011-08-24 | 株式会社リガク | 多元素同時型蛍光ｘ線分析装置 |
| JP3950156B1 (ja) * | 2006-04-11 | 2007-07-25 | 理学電機工業株式会社 | 蛍光ｘ線分析装置 |
| FI123359B (fi) * | 2009-07-17 | 2013-03-15 | Ima Engineering Ltd Oy | Menetelmä märän porasoijan analysoimiseksi |
| US9222929B2 (en) | 2009-12-07 | 2015-12-29 | Exxonmobil Upstream Research Company | Solvent surveillance in solvent-based heavy oil recovery processes |
| EP2642928B1 (en) | 2010-11-24 | 2019-07-17 | Hologic Inc. | System for improved tissue handling and in line analysis of the tissue |
| CN103620232B (zh) * | 2011-06-23 | 2015-11-25 | 株式会社尼利可 | 液电混合驱动装置 |
| WO2014132383A1 (ja) * | 2013-02-28 | 2014-09-04 | 一般社団法人ミネラル研究会 | 生体内元素検査方法 |
| WO2015134277A1 (en) | 2014-03-05 | 2015-09-11 | Faxitron Bioptics, Llc | System and method for multi-axis imaging of specimens |
| JP2016017759A (ja) * | 2014-07-04 | 2016-02-01 | 株式会社リガク | Ｘ線測定モジュールおよびそれを複数備える蛍光ｘ線分析装置 |
| SE540581C2 (en) * | 2015-05-08 | 2018-10-02 | Hard X-Ray Photoelectron Spectroscopy Apparatus | |
| WO2017040977A1 (en) | 2015-09-04 | 2017-03-09 | Faxitron Bioptics, Llc | Multi-axis specimen imaging device with embedded orientation markers |
| WO2018053272A1 (en) | 2016-09-15 | 2018-03-22 | University Of Washington | X-ray spectrometer and methods for use |
| US11083426B2 (en) | 2016-11-04 | 2021-08-10 | Hologic, Inc. | Specimen radiography system comprising cabinet and a specimen drawer positionable by a controller in the cabinet |
| JP7204669B2 (ja) | 2017-05-03 | 2023-01-16 | ホロジック， インコーポレイテッド | 生検システム撮像品質を改善するために組織取り扱い装置の撮像フィールド内の流体を低減させるデバイス |
| US11317881B2 (en) | 2017-09-11 | 2022-05-03 | Faxitron Bioptics, Llc | Imaging system with adaptive object magnification |
| CN112313505B (zh) * | 2018-04-20 | 2025-01-03 | 美卓奥图泰芬兰有限公司 | X射线荧光分析仪和用于执行x射线荧光分析的方法 |
| EP4183347B1 (en) | 2018-12-26 | 2024-05-15 | Hologic, Inc. | Tissue imaging in presence of fluid during biopsy procedure |
| CA3173541A1 (en) | 2020-03-31 | 2021-10-07 | Hologic, Inc. | Systems and methods for x-ray imaging tissue specimens |
| US12396693B2 (en) | 2020-09-16 | 2025-08-26 | Hologic, Inc. | Systems and methods for confirming tissue specimens removed using contrast-enhanced x-ray imaging |
| US11796491B2 (en) * | 2021-01-05 | 2023-10-24 | Shimadzu Corporation | X-ray spectroscopic analysis apparatus and elemental analysis method |
| CA3232838A1 (en) * | 2021-09-24 | 2023-03-30 | Commonwealth Scientific And Industrial Research Organisation | An x-ray fluorescence system |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1389417A (fr) * | 1963-04-01 | 1965-02-19 | Commissariat Energie Atomique | Procédé de dosage et dispositifs en faisant application |
| US3710104A (en) * | 1969-11-04 | 1973-01-09 | Republic Steel Corp | Method and apparatus for x-ray interrogation of a sample |
-
1977
- 1977-10-17 US US05/842,522 patent/US4134012A/en not_active Expired - Lifetime
-
1978
- 1978-10-12 CA CA313,256A patent/CA1111150A/en not_active Expired
- 1978-10-13 DE DE19782844704 patent/DE2844704A1/de not_active Ceased
- 1978-10-14 JP JP12677378A patent/JPS5481893A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3319984A1 (de) * | 1982-06-03 | 1983-12-08 | Daini Seikosha Co. Ltd., Tokyo | Automatische korrektureinrichtung fuer ein roentgenstrahl-fluoreszenz-analysegeraet |
| DE3334458A1 (de) * | 1982-09-24 | 1984-06-07 | Seiko Instruments and Electronics Ltd., Tokio/Tokyo | Korrektureinrichtung fuer ein roentgenanalysegeraet |
| DE112015003094B4 (de) * | 2014-07-01 | 2017-08-03 | Rigaku Corporation | Röntgenfluoreszenzspektrometer und Röntgenfluoreszenzanalyseverfahren |
| US9746433B2 (en) | 2014-07-01 | 2017-08-29 | Rigaku Corporation | X-ray fluorescence spectrometer and X-ray fluorescence analyzing method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH023941B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1990-01-25 |
| US4134012A (en) | 1979-01-09 |
| JPS5481893A (en) | 1979-06-29 |
| CA1111150A (en) | 1981-10-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8110 | Request for examination paragraph 44 | ||
| 8131 | Rejection |