JPS5481893A - Method and device for xxray analysis - Google Patents

Method and device for xxray analysis

Info

Publication number
JPS5481893A
JPS5481893A JP12677378A JP12677378A JPS5481893A JP S5481893 A JPS5481893 A JP S5481893A JP 12677378 A JP12677378 A JP 12677378A JP 12677378 A JP12677378 A JP 12677378A JP S5481893 A JPS5481893 A JP S5481893A
Authority
JP
Japan
Prior art keywords
xxray
analysis
xxray analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12677378A
Other languages
English (en)
Japanese (ja)
Other versions
JPH023941B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Eichi Sumooruboon Aran
Emu Guuabuitsuchi Yuuri
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bausch and Lomb Inc
Original Assignee
Bausch and Lomb Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bausch and Lomb Inc filed Critical Bausch and Lomb Inc
Publication of JPS5481893A publication Critical patent/JPS5481893A/ja
Publication of JPH023941B2 publication Critical patent/JPH023941B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP12677378A 1977-10-17 1978-10-14 Method and device for xxray analysis Granted JPS5481893A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/842,522 US4134012A (en) 1977-10-17 1977-10-17 X-ray analytical system

Publications (2)

Publication Number Publication Date
JPS5481893A true JPS5481893A (en) 1979-06-29
JPH023941B2 JPH023941B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-01-25

Family

ID=25287524

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12677378A Granted JPS5481893A (en) 1977-10-17 1978-10-14 Method and device for xxray analysis

Country Status (4)

Country Link
US (1) US4134012A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS5481893A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CA (1) CA1111150A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE2844704A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57169663A (en) * 1981-03-20 1982-10-19 Kernforschungsz Karlsruhe Apparatus for continuously measuring element content in mineral liquid
JP2007155651A (ja) * 2005-12-08 2007-06-21 Rigaku Industrial Co 多元素同時型蛍光ｘ線分析装置
JP2016017759A (ja) * 2014-07-04 2016-02-01 株式会社リガク Ｘ線測定モジュールおよびそれを複数備える蛍光ｘ線分析装置

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4317994A (en) * 1979-12-20 1982-03-02 Battelle Memorial Institute Laser EXAFS
CA1170375A (en) * 1980-06-11 1984-07-03 Alan F. Reid Method and apparatus for material analysis
JPS58184655U (ja) * 1982-06-03 1983-12-08 セイコーインスツルメンツ株式会社 Ｘ線自動較正装置
JPS5967449A (ja) * 1982-09-24 1984-04-17 Seiko Instr & Electronics Ltd Ｘ線自動較正装置
US4612660A (en) * 1985-05-17 1986-09-16 The United States Of America As Represented By The Secretary Of The Navy Time resolved extended X-ray absorption fine structure spectrometer
FI80524C (fi) * 1986-06-02 1990-06-11 Outokumpu Oy Foerfarande och anordning foer analysering av slamartade material.
USH922H (en) 1988-08-01 1991-05-07 United States Of America Method for analyzing materials using x-ray fluorescence
US5133901A (en) * 1991-03-01 1992-07-28 Westinghouse Electric Corp. System and method for on-line monitoring and control of heavy metal contamination in soil washing process
US5272745A (en) * 1992-05-14 1993-12-21 A.H.S. Consultants & Engineers, Inc. Apparatus for analyzing, continuously flowing dry powder samples, by means of X-ray spectroscopy
RU94022820A (ru) * 1994-06-14 1996-04-10 К.В. Анисович Рентгеновский флюоресцентный спектрометр
ES2114490B1 (es) * 1996-05-07 1999-02-01 Acerinox Sa Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste.
JPH09166488A (ja) * 1995-12-13 1997-06-24 Shimadzu Corp Ｘ線分光器
US6023496A (en) * 1997-04-30 2000-02-08 Shimadzu Corporation X-ray fluorescence analyzing apparatus
EP1097373A2 (en) * 1998-10-29 2001-05-09 PANalytical B.V. X-ray diffraction apparatus with an x-ray optical reference channel
CN101183083B (zh) * 2001-12-04 2013-03-20 X射线光学系统公司 用于冷却和电绝缘高压、生热部件的方法和设备
US7016462B1 (en) * 2002-11-08 2006-03-21 Interscience, Inc. Ionic pre-concentration XRF identification and analysis device, system and method
WO2004086018A1 (ja) * 2003-03-27 2004-10-07 Rigaku Industrial Corporation 蛍光ｘ線分析装置
JP3950156B1 (ja) * 2006-04-11 2007-07-25 理学電機工業株式会社 蛍光ｘ線分析装置
FI123359B (fi) * 2009-07-17 2013-03-15 Ima Engineering Ltd Oy Menetelmä märän porasoijan analysoimiseksi
US9222929B2 (en) 2009-12-07 2015-12-29 Exxonmobil Upstream Research Company Solvent surveillance in solvent-based heavy oil recovery processes
WO2012074885A1 (en) 2010-11-24 2012-06-07 Hologic, Inc. System for improved tissue handling and in line analysis of the tissue
JP5645236B2 (ja) * 2011-06-23 2014-12-24 株式会社ニレコ 電油ハイブリッド駆動装置
JP5372304B1 (ja) * 2013-02-28 2013-12-18 一般社団法人ミネラル研究会 生体内元素検査方法
WO2015134277A1 (en) 2014-03-05 2015-09-11 Faxitron Bioptics, Llc System and method for multi-axis imaging of specimens
JP6283854B2 (ja) 2014-07-01 2018-02-28 株式会社リガク 蛍光ｘ線分析装置および方法
SE540581C2 (en) * 2015-05-08 2018-10-02 Hard X-Ray Photoelectron Spectroscopy Apparatus
WO2017040977A1 (en) 2015-09-04 2017-03-09 Faxitron Bioptics, Llc Multi-axis specimen imaging device with embedded orientation markers
WO2018053272A1 (en) * 2016-09-15 2018-03-22 University Of Washington X-ray spectrometer and methods for use
WO2018085719A1 (en) 2016-11-04 2018-05-11 Hologic, Inc. Specimen radiography system
EP3618721A1 (en) 2017-05-03 2020-03-11 Hologic, Inc. Device for reducing fluid in the imaging field of a tissue handling apparatus for improving biopsy system imaging quality
EP3682228A4 (en) 2017-09-11 2021-06-16 Faxitron Bioptics, LLC Imaging system with adaptive object magnification
CA3097462C (en) * 2018-04-20 2023-09-05 Outotec (Finland) Oy X-ray fluorescence analyser, and a method for performing x-ray fluorescence analysis
US11986170B2 (en) 2018-12-26 2024-05-21 Hologic, Inc. Tissue imaging in presence of fluid during biopsy procedure
ES2994319T3 (en) 2020-03-31 2025-01-22 Hologic Inc Systems and methods for x-ray imaging tissue specimens
WO2022060566A1 (en) 2020-09-16 2022-03-24 Hologic, Inc. Systems and methods for confirming tissue specimens removed using contrast-enhanced x-ray imaging
US11796491B2 (en) * 2021-01-05 2023-10-24 Shimadzu Corporation X-ray spectroscopic analysis apparatus and elemental analysis method
PE20241239A1 (es) * 2021-09-24 2024-06-19 Commw Scient Ind Res Org Un sistema de fluorescencia de rayos x

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1389417A (fr) * 1963-04-01 1965-02-19 Commissariat Energie Atomique Procédé de dosage et dispositifs en faisant application
US3710104A (en) * 1969-11-04 1973-01-09 Republic Steel Corp Method and apparatus for x-ray interrogation of a sample

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57169663A (en) * 1981-03-20 1982-10-19 Kernforschungsz Karlsruhe Apparatus for continuously measuring element content in mineral liquid
JP2007155651A (ja) * 2005-12-08 2007-06-21 Rigaku Industrial Co 多元素同時型蛍光ｘ線分析装置
JP2016017759A (ja) * 2014-07-04 2016-02-01 株式会社リガク Ｘ線測定モジュールおよびそれを複数備える蛍光ｘ線分析装置

Also Published As

Publication number Publication date
CA1111150A (en) 1981-10-20
JPH023941B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-01-25
DE2844704A1 (de) 1979-04-26
US4134012A (en) 1979-01-09

Similar Documents

Publication Publication Date Title
JPS5481893A (en) Method and device for xxray analysis
JPS53130897A (en) Method and device for measuring stimulative matter
JPS548435A (en) Method of and device for identifying document
JPS53109194A (en) Connection method and connection device
JPS5451892A (en) Quantitatively anlysing method and reagent for alphaaamylase
JPS53120572A (en) Facility monitoring method and device
GB1556144A (en) Plasma-mig welding method and device
GB2011297B (en) Roller-dies-processing method and apparatus
JPS5450391A (en) Method and device for checking button
JPS53135057A (en) Freezeedrying method using micowave and apparatus therefor
JPS5465079A (en) Method and device for detecting temperature
JPS55126848A (en) Method and device for analyzing silicone
AU3750478A (en) Goods-handling method and apparatus
GB2003274B (en) Measurement method and apparatus
GB2005408B (en) Method and device for identifying objects
JPS54156695A (en) Method and device for detection and method and device for analysis
JPS53103844A (en) Separating method and device
GB2002664B (en) Sampling device and method
JPS55140144A (en) Method and device for electrochemical analysis
JPS5471684A (en) Method and device for measuring and analyzing light
JPS5492840A (en) Method and device for making space for slide fastener
JPS5435471A (en) Deeoiling method and its device
JPS5483194A (en) Method and device for drilling
JPS5491265A (en) Method and device for measuring distance
GB2009414B (en) Thickness measuring device and method