JPH023941B2 - - Google Patents
Info
- Publication number
- JPH023941B2 JPH023941B2 JP53126773A JP12677378A JPH023941B2 JP H023941 B2 JPH023941 B2 JP H023941B2 JP 53126773 A JP53126773 A JP 53126773A JP 12677378 A JP12677378 A JP 12677378A JP H023941 B2 JPH023941 B2 JP H023941B2
- Authority
- JP
- Japan
- Prior art keywords
- rays
- sample
- intensity
- concentration
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000005855 radiation Effects 0.000 claims description 61
- 239000002245 particle Substances 0.000 claims description 50
- 239000012491 analyte Substances 0.000 claims description 10
- 239000011159 matrix material Substances 0.000 claims description 4
- 239000002002 slurry Substances 0.000 description 53
- 239000007787 solid Substances 0.000 description 49
- 238000005259 measurement Methods 0.000 description 28
- 238000000034 method Methods 0.000 description 24
- 238000004458 analytical method Methods 0.000 description 21
- 238000012545 processing Methods 0.000 description 21
- 230000000694 effects Effects 0.000 description 20
- 239000000203 mixture Substances 0.000 description 17
- 229910052703 rhodium Inorganic materials 0.000 description 16
- 239000010948 rhodium Substances 0.000 description 16
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 16
- 239000000126 substance Substances 0.000 description 16
- 230000001427 coherent effect Effects 0.000 description 13
- 239000010949 copper Substances 0.000 description 13
- 239000000463 material Substances 0.000 description 12
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 10
- 229910052802 copper Inorganic materials 0.000 description 10
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 9
- 230000005284 excitation Effects 0.000 description 9
- 230000008569 process Effects 0.000 description 9
- 239000011593 sulfur Substances 0.000 description 9
- 229910052717 sulfur Inorganic materials 0.000 description 9
- 239000003990 capacitor Substances 0.000 description 7
- 238000001228 spectrum Methods 0.000 description 7
- 238000000441 X-ray spectroscopy Methods 0.000 description 6
- 230000008901 benefit Effects 0.000 description 5
- 239000011575 calcium Substances 0.000 description 5
- 238000012937 correction Methods 0.000 description 5
- 239000000843 powder Substances 0.000 description 4
- 238000011084 recovery Methods 0.000 description 4
- 238000004611 spectroscopical analysis Methods 0.000 description 4
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- YZCKVEUIGOORGS-NJFSPNSNSA-N Tritium Chemical compound [3H] YZCKVEUIGOORGS-NJFSPNSNSA-N 0.000 description 3
- 229910052791 calcium Inorganic materials 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000000704 physical effect Effects 0.000 description 3
- 238000004886 process control Methods 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000011343 solid material Substances 0.000 description 3
- 238000011282 treatment Methods 0.000 description 3
- 229910052722 tritium Inorganic materials 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 239000010405 anode material Substances 0.000 description 2
- 230000002238 attenuated effect Effects 0.000 description 2
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 2
- 239000004327 boric acid Substances 0.000 description 2
- 239000013256 coordination polymer Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 229920002799 BoPET Polymers 0.000 description 1
- 229910001369 Brass Inorganic materials 0.000 description 1
- 101100421668 Caenorhabditis elegans slo-1 gene Proteins 0.000 description 1
- 241000196324 Embryophyta Species 0.000 description 1
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 239000005041 Mylar™ Substances 0.000 description 1
- 235000008331 Pinus X rigitaeda Nutrition 0.000 description 1
- 235000011613 Pinus brutia Nutrition 0.000 description 1
- 241000018646 Pinus brutia Species 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000000333 X-ray scattering Methods 0.000 description 1
- 238000002083 X-ray spectrum Methods 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 239000010951 brass Substances 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000003750 conditioning effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000010924 continuous production Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000003912 environmental pollution Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012067 mathematical method Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 238000011002 quantification Methods 0.000 description 1
- 239000012857 radioactive material Substances 0.000 description 1
- 238000010223 real-time analysis Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000004876 x-ray fluorescence Methods 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Dispersion Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/842,522 US4134012A (en) | 1977-10-17 | 1977-10-17 | X-ray analytical system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5481893A JPS5481893A (en) | 1979-06-29 |
| JPH023941B2 true JPH023941B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1990-01-25 |
Family
ID=25287524
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12677378A Granted JPS5481893A (en) | 1977-10-17 | 1978-10-14 | Method and device for xxray analysis |
Country Status (4)
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007116559A1 (ja) * | 2006-04-11 | 2007-10-18 | Rigaku Industrial Corporation | 蛍光ｘ線分析装置 |
| KR20140047654A (ko) * | 2011-06-23 | 2014-04-22 | 가부시기가이샤니레꼬 | 전기 유압 하이브리드 구동 장치 |
Families Citing this family (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3110944A1 (de) * | 1981-03-20 | 1982-09-30 | Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe | "einrichtung zur kontinuierlichen messung von elementgehalten in trueben" |
| US4317994A (en) * | 1979-12-20 | 1982-03-02 | Battelle Memorial Institute | Laser EXAFS |
| CA1170375A (en) * | 1980-06-11 | 1984-07-03 | Alan F. Reid | Method and apparatus for material analysis |
| JPS58184655U (ja) * | 1982-06-03 | 1983-12-08 | セイコーインスツルメンツ株式会社 | Ｘ線自動較正装置 |
| JPS5967449A (ja) * | 1982-09-24 | 1984-04-17 | Seiko Instr & Electronics Ltd | Ｘ線自動較正装置 |
| US4612660A (en) * | 1985-05-17 | 1986-09-16 | The United States Of America As Represented By The Secretary Of The Navy | Time resolved extended X-ray absorption fine structure spectrometer |
| FI80524C (fi) * | 1986-06-02 | 1990-06-11 | Outokumpu Oy | Foerfarande och anordning foer analysering av slamartade material. |
| USH922H (en) | 1988-08-01 | 1991-05-07 | United States Of America | Method for analyzing materials using x-ray fluorescence |
| US5133901A (en) * | 1991-03-01 | 1992-07-28 | Westinghouse Electric Corp. | System and method for on-line monitoring and control of heavy metal contamination in soil washing process |
| US5272745A (en) * | 1992-05-14 | 1993-12-21 | A.H.S. Consultants & Engineers, Inc. | Apparatus for analyzing, continuously flowing dry powder samples, by means of X-ray spectroscopy |
| RU94022820A (ru) * | 1994-06-14 | 1996-04-10 | К.В. Анисович | Рентгеновский флюоресцентный спектрометр |
| ES2114490B1 (es) * | 1996-05-07 | 1999-02-01 | Acerinox Sa | Metodo para el microanalisis cuantitativo de rayos x de aleaciones metalicas basado en un conjunto de muestras patron de la aleacion y un modelo matematico de ajuste. |
| JPH09166488A (ja) * | 1995-12-13 | 1997-06-24 | Shimadzu Corp | Ｘ線分光器 |
| US6023496A (en) * | 1997-04-30 | 2000-02-08 | Shimadzu Corporation | X-ray fluorescence analyzing apparatus |
| EP1097373A2 (en) * | 1998-10-29 | 2001-05-09 | PANalytical B.V. | X-ray diffraction apparatus with an x-ray optical reference channel |
| CN100336422C (zh) * | 2001-12-04 | 2007-09-05 | X射线光学系统公司 | 输出稳定性增强的x射线源组件及优化x射线传输的方法 |
| US7016462B1 (en) * | 2002-11-08 | 2006-03-21 | Interscience, Inc. | Ionic pre-concentration XRF identification and analysis device, system and method |
| CN101520422A (zh) * | 2003-03-27 | 2009-09-02 | 株式会社理学 | 荧光x射线分析装置 |
| JP4754957B2 (ja) * | 2005-12-08 | 2011-08-24 | 株式会社リガク | 多元素同時型蛍光ｘ線分析装置 |
| FI123359B (fi) * | 2009-07-17 | 2013-03-15 | Ima Engineering Ltd Oy | Menetelmä märän porasoijan analysoimiseksi |
| WO2011071651A1 (en) * | 2009-12-07 | 2011-06-16 | Exxonmobil Upstream Research Company | Solvent surveillance in solvent-based heavy oil recovery processes |
| AU2011336898B2 (en) | 2010-11-24 | 2016-06-16 | Hologic, Inc. | System for improved tissue handling and in line analysis of the tissue |
| WO2014132383A1 (ja) * | 2013-02-28 | 2014-09-04 | 一般社団法人ミネラル研究会 | 生体内元素検査方法 |
| WO2015134277A1 (en) | 2014-03-05 | 2015-09-11 | Faxitron Bioptics, Llc | System and method for multi-axis imaging of specimens |
| JP6283854B2 (ja) | 2014-07-01 | 2018-02-28 | 株式会社リガク | 蛍光ｘ線分析装置および方法 |
| JP2016017759A (ja) * | 2014-07-04 | 2016-02-01 | 株式会社リガク | Ｘ線測定モジュールおよびそれを複数備える蛍光ｘ線分析装置 |
| SE540581C2 (en) * | 2015-05-08 | 2018-10-02 | Hard X-Ray Photoelectron Spectroscopy Apparatus | |
| WO2017040977A1 (en) | 2015-09-04 | 2017-03-09 | Faxitron Bioptics, Llc | Multi-axis specimen imaging device with embedded orientation markers |
| EP3513177A4 (en) | 2016-09-15 | 2020-05-20 | University of Washington | X-RAY SPECTROMETER AND METHOD FOR USE |
| US11083426B2 (en) | 2016-11-04 | 2021-08-10 | Hologic, Inc. | Specimen radiography system comprising cabinet and a specimen drawer positionable by a controller in the cabinet |
| AU2018261651B2 (en) | 2017-05-03 | 2024-01-18 | Hologic, Inc. | Device for reducing fluid in the imaging field of a tissue handling apparatus for improving biopsy system imaging quality |
| US11317881B2 (en) | 2017-09-11 | 2022-05-03 | Faxitron Bioptics, Llc | Imaging system with adaptive object magnification |
| MX2020011106A (es) * | 2018-04-20 | 2021-01-29 | Outotec Finland Oy | Analizador de fluorescencia de rayos x y un metodo para realizar el analisis de fluorescencia de rayos x. |
| WO2020139687A1 (en) | 2018-12-26 | 2020-07-02 | Hologic, Inc. | Tissue imaging in presence of fluid during biopsy procedure |
| EP4125605B1 (en) | 2020-03-31 | 2024-07-10 | Hologic, Inc. | Systems and methods for x-ray imaging tissue specimens |
| EP4214672B1 (en) | 2020-09-16 | 2025-01-01 | Hologic, Inc. | Systems and methods for confirming tissue specimens removed using contrast-enhanced x-ray imaging |
| US11796491B2 (en) * | 2021-01-05 | 2023-10-24 | Shimadzu Corporation | X-ray spectroscopic analysis apparatus and elemental analysis method |
| AU2022352222A1 (en) * | 2021-09-24 | 2024-04-11 | Commonwealth Scientific And Industrial Research Organisation | An x-ray fluorescence system |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1389417A (fr) * | 1963-04-01 | 1965-02-19 | Commissariat Energie Atomique | Procédé de dosage et dispositifs en faisant application |
| US3710104A (en) * | 1969-11-04 | 1973-01-09 | Republic Steel Corp | Method and apparatus for x-ray interrogation of a sample |
-
1977
- 1977-10-17 US US05/842,522 patent/US4134012A/en not_active Expired - Lifetime
-
1978
- 1978-10-12 CA CA313,256A patent/CA1111150A/en not_active Expired
- 1978-10-13 DE DE19782844704 patent/DE2844704A1/de not_active Ceased
- 1978-10-14 JP JP12677378A patent/JPS5481893A/ja active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007116559A1 (ja) * | 2006-04-11 | 2007-10-18 | Rigaku Industrial Corporation | 蛍光ｘ線分析装置 |
| US7949093B2 (en) | 2006-04-11 | 2011-05-24 | Rigaku Industrial Corporation | X-ray fluorescence spectrometer |
| KR20140047654A (ko) * | 2011-06-23 | 2014-04-22 | 가부시기가이샤니레꼬 | 전기 유압 하이브리드 구동 장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| CA1111150A (en) | 1981-10-20 |
| JPS5481893A (en) | 1979-06-29 |
| US4134012A (en) | 1979-01-09 |
| DE2844704A1 (de) | 1979-04-26 |
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